Estimating Long and Short Run Effects in Static Panel Models

This paper assesses the biases of four different estimators with respect to the short run and the long run parameters if a static panel model is used, although the data generating process is a dynamic error components model. We analytically derive the associated biases and provide a discussion of the determinants thereof. Our analytical and numerical results as well as Monte Carlo simulations illustrate that the asymptotic bias of both the within and the between parameter with respect to the short run and long run impact can be substantial, depending on the memory of the data generating process, the length of the time series and the importance of the cross-sectional variation in the explanatory variables.     

Generalized run tests for statistical process control

ABSTRACT

In a sequence of elements, a run is defined as a maximal subsequence of like elements. The number of runs or the length of the longest run has been widely used to test the randomness of an ordered sequence. Based on two different sampling methods and two types of test statistics used, run tests can be classified into one of four cases. Numerous researchers have derived the probability distributions in many different ways, treating each case separately. In the paper, we propose a unified approach which is based on recurrence arguments of two mutually exclusive sub-sequences. We also consider the sequence of nominal data that has more than two classes. Thus, the traditional run tests for a binary sequence are special cases of our generalized run tests. We finally show that the generalized run tests can be applied to many quality management areas, such as testing changes in process variation, developing non-parametric multivariate control charts, and comparing the shapes and locations of more than two process distributions.     

Optimal designs of multivariate synthetic |S| control chart based on median run length

The multivariate synthetic generalized sample variance |S| (synthetic |S|) chart is a combination of the |S| sub-chart and the conforming run length sub-chart. A procedure for optimal designs of the synthetic |S| chart, based on the median run length (MRL), for both zero and steady-state modes are provided by minimizing the out-of-control MRL. The comparative results show that the synthetic |S| chart performs better than the standard |S| chart for detecting shifts in the covariance matrix of a multivariate normally distributed process, in terms of the MRL. An example is given to illustrate the operation of the synthetic |S| chart.     

The Robustness of the MaxEWMA Chart to Non-normality

Abstract

The MaxEWMA chart has recently been introduced as an improvement over the standard EWMA chart for detecting changes in the mean and/or standard deviation of a normally distributed process. Although this chart was originally developed for normally distributed process data, its robustness to violations of the normality assumption is the central theme of this study. For data distributions with heavy tails or displaying strong skewness, the in-control average run lengths (ARLs) for the MaxEWMA chart are shown to be significantly shorter than expected. On the other hand, out-of-control ARLs are comparable to normal theory values for a variety of symmetric non-normal distributions. The MaxEWMA chart is not robust to skewness.     

Distribution-Free Quality Control Charts Based on Signed-Rank-Like Statistics

In this article we propose three distribution-free (or nonparametric) statistical quality control charts for monitoring a process center when an in-control target center is not specified. These charts are of the Shewhart-type, the exponentially moving average-type, and the cumulative sum-type. The constructions of the proposed charts require the availability of an initial reference sample taken when the process was operating in-control to calculate an estimator for the unknown in-control target process center. This estimated center is then used in the calculation of signed-rank-like statistics based on grouped observations taken periodically from the process output. As long as the in-control process underlying distribution is continuous and symmetric, the proposed charts have a constant in-control average run length and a constant false alarm rate irrespective of the process underlying distribution. Other advantages of the proposed distribution-free charts include their robustness against outliers and their superior efficiency over the traditional normal-based control charts when applied to processes with moderate- or heavy-tailed underlying distributions, such as the double exponential or the Cauchy distributions.     

Average outgoing quality of CSP-C continuous sampling plan under short run production processes

A CSP-C continuous sampling plan is a new single-level continuous sampling procedure developed by Govindaraju & Kandasamy (2000) by incorporating the concept of acceptance number to the CSP-1 plan for the application of continuous production processes. In this new plan, the sampling inspection phase is characterized by a maximum allowable number of non-conforming units, c, and a constant sampling rate, f. Govindaraju & Kandasamy (2000) derived the performance measures such as average outgoing quality (AOQ), average fraction inspected (AFI) etc, of the CSP-C plan using a Markov chain model for long run production processes. Yang (1983) has observed that the AOQ and AFI, being long run average measures, are not satisfactory measures of performance for short run production processes. Hence, formulas are derived in this paper, using the renewal theory approach enabling one to compute AOQ and AFI for both long run and short run production processes. Numerical illustrations are also given. By simulation, the accuracy of the short run measures is studied.     

Run rules based phase II c and np charts when process parameters are unknown

Abstract

The performance of attributes control charts is usually evaluated under the assumption of known process parameters (i.e., the nominal proportion of non conforming units or the nominal average number of nonconformities). However, in practice, these process parameters are rarely known and have to be estimated from an in-control Phase I data set. The major contributions of this paper are (a) the derivation of the run length properties of the Run Rules Phase II c and np charts with estimated parameters, particularly focusing on the ARL, SDRL, and 0.05, 0.5, and 0.95 quantiles of the run length distribution; (b) the investigation of the number m of Phase I samples that is needed by these charts in order to obtain similar in-control ARLs to the known parameters case; and (c) the proposition of new specific chart parameters that allow these charts to have approximately the same in-control ARLs as the ones obtained in the known parameters case.     

Parameter estimation by minimizing a probability generating function-based power divergence

Abstract

Generating function-based statistical inference is an attractive approach if the probability (density) function is complicated when compared with the generating function. Here, we propose a parameter estimation method that minimizes a probability generating function (pgf)-based power divergence with a tuning parameter to mitigate the impact of data contamination. The proposed estimator is linked to the M-estimators and hence possesses the properties of consistency and asymptotic normality. In terms of parameter biases and mean squared errors from simulations, the proposed estimation method performs better for smaller value of the tuning parameter as data contamination percentage increases.     

Globally applicable control chart for online monitoring of stability of process mean

The shape features of run chart patterns of the most recent m observations arising from stable and unstable processes are different. Using this fact, a new monitoring statistic is defined whose value for given m depends on the pattern parameters but not on the process parameters. A control chart for this statistic for given m, therefore, will be globally applicable to normal processes. The simulation study reveals that the proposed statistic approximately follows normal distribution. The performances of the globally applicable control chart in terms of average run lengths (ARLs) are evaluated and compared with the X chart. Both in-control ARL and out-of-control ARLs with respect to different abnormal process conditions are found to be larger than the X chart. However, the proposed concept is promising because it can eliminate the burden of designing separate control charts for different quality characteristics or processes in a manufacturing set-up.     

A new synthetic control chart for monitoring process mean using auxiliary information

ABSTRACT

Quality control charts have been widely recognized as a potentially powerful statistical process monitoring tool in statistical process control because of their superior ability in detecting shifts in the process parameters. Recently, auxiliary-information-based control charts have been proposed and shown to have excellent speed in detecting process shifts than those based without it. In this paper, we design a new synthetic control chart that is based on a statistic that utilizes information from both the study and auxiliary variables. The proposed synthetic chart encompasses the classical synthetic chart. The construction, optimal design, run length profiles, and the performance evaluation of the new chart are discussed in detail. It turns out that the proposed synthetic chart performs uniformly better than the classical synthetic chart when detecting different kinds of shifts in the process mean under both zero-state and steady-state run length performances. Moreover, with reasonable assumptions, the proposed chart also surpasses the exponentially weighted moving average control chart. An application with a simulated data set is also presented to explain the implementation of the proposed control chart.     

Modeling the density of US yield curve using Bayesian semiparametric dynamic Nelson-Siegel model

Abstract

This paper proposes the Bayesian semiparametric dynamic Nelson-Siegel model for estimating the density of bond yields. Specifically, we model the distribution of the yield curve factors according to an infinite Markov mixture (iMM). The model allows for time variation in the mean and covariance matrix of factors in a discrete manner, as opposed to continuous changes in these parameters such as the Time Varying Parameter (TVP) models. Estimating the number of regimes using the iMM structure endogenously leads to an adaptive process that can generate newly emerging regimes over time in response to changing economic conditions in addition to existing regimes. The potential of the proposed framework is examined using US bond yields data. The semiparametric structure of the factors can handle various forms of non-normalities including fat tails and nonlinear dependence between factors using a unified approach by generating new clusters capturing these specific characteristics. We document that modeling parameter changes in a discrete manner increases the model fit as well as forecasting performance at both short and long horizons relative to models with fixed parameters as well as the TVP model with continuous parameter changes. This is mainly due to fact that the discrete changes in parameters suit the typical low frequency monthly bond yields data characteristics better.     

A EWMA control chart based on an auxiliary variable and repetitive sampling for monitoring process location

ABSTRACT

This article develops an exponentially weighted moving average (EWMA) control chart using an auxiliary variable and repetitive sampling for efficient detection of small to moderate shifts in location. A EWMA statistic of a product estimator of the average (which utilities the information of auxiliary variables as well as repetitive sampling) is plotted on the proposed chart. The control chart coefficients of the proposed EWMA chart are determined for two strategic limits known as outer and inner control limits for the target in-control average run length. The performance of the proposed EWMA chart is studied using average run length when a shift occurs in the process average. The efficiency of the developed chart is compared with the competitive existing control charts. The results of the study revealed that proposed EWMA chart is more efficient than others to detect small changes in process mean.     

The run length distributions of the R,s and s2 control charts when is estimated

R, s and s2 charts with estimated control limits are widely used in practice. Common practice in control-chart theory is to estimate the control limits using data from the process and, once the process is determined to be in control, to treat the resulting control limits as though fixed. While there are empirical rules for setting up the control charts using past or trial data, little is known about the run length distributions of these charts when the fact that control limits are estimated is taken into account. In this paper, we derive and evaluate the run length distributions associated with the R, s and s2 charts when the process standard deviation a is estimated. The results are then used to discuss the appropriateness of the widely followed empirical rules for choosing the number m of samples and the sample size n.     

Robust dual-CUSUM control charts for contaminated processes

ABSTRACT

In this article, we improve the efficiency of the Dual CUSUM chart (which combines the designs of two CUSUM structures to detect a range of shift) by focusing on its robustness, ability to resist some disturbances in the process environment and violation of basic assumptions. We do that, by proposing some robust estimators for constructing the chart for both contaminated and uncontaminated environments. The average run length is used as the performance evaluation measure of the charts. After comparing the performances of the proposed charts based on the estimators, it is noticed that the tri-mean estimator out-performs others in all ramifications. Next to it in performance is the Hodges-Lehmann and midrange estimators. We substantiated the simulation results of the study by applying the scheme on a real-life data set.     

Design of a sign chart using a new EWMA statistic

Abstract

In this article, a new non parametric control chart based on the modified or controlled exponentially weighted moving average (EWMA) statistic is developed to monitor the process deviation from the target value. The proposed control chart is evaluated for different values of design parameters using the average run length as a performance criterion under various sample sizes. The proposed chart is compared with the existing non parametric EWMA sign control chart. It is observed that the proposed chart is better than the existing EWMA sign control chart in terms of run length characteristics. An empirical example is provided for the practical implementation of the proposed chart.     

Multivariate Synthetic |S| Control Chart with Variable Sampling Interval

A variable sampling interval (VSI) feature is introduced to the multivariate synthetic generalized sample variance |S| control chart. This multivariate synthetic control chart is a combination of the |S| sub-chart and the conforming run length sub-chart. The VSI feature enhances the performance of the multivariate synthetic control chart. The comparative results show that the VSI multivariate synthetic control chart performs better than other types of multivariate control charts for detecting shifts in the covariance matrix of a multivariate normally distributed process. An example is given to illustrate the operation of the VSI multivariate synthetic chart.     

The effect of parameter estimation on phase II monitoring of poisson regression profiles

ABSTRACT

The effect of parameters estimation on profile monitoring methods has only been studied by a few researchers and only the assumption of a normal response variable has been tackled. However, in some practical situation, the normality assumption is violated and the response variable follows a discrete distribution such as Poisson. In this paper, we evaluate the effect of parameters estimation on the Phase II monitoring of Poisson regression profiles by considering two control charts, namely the Hotelling’s T² and the multivariate exponentially weighted moving average (MEWMA) charts. Simulation studies in terms of the average run length (ARL) and the standard deviation of the run length (SDRL) are carried out to assess the effect of estimated parameters on the performance of Phase II monitoring approaches. The results reveal that both in-control and out-of-control performances of these charts are adversely affected when the regression parameters are estimated.     

Identification of average marginal effects under misspecification when covariates are normal

A previously known result in the econometrics literature is that when covariates of an underlying data generating process are jointly normally distributed, estimates from a nonlinear model that is misspecified as linear can be interpreted as average marginal effects. This has been shown for models with exogenous covariates and separability between covariates and errors. In this paper, we extend this identification result to a variety of more general cases, in particular for combinations of separable and nonseparable models under both exogeneity and endogeneity. So long as the underlying model belongs to one of these large classes of data generating processes, our results show that nothing else must be known about the true DGP—beyond normality of observable data, a testable assumption—in order for linear estimators to be interpretable as average marginal effects. We use simulation to explore the performance of these estimators using a misspecified linear model and show they perform well when the data are normal but can perform poorly when this is not the case.     

Bias Correction in the Dynamic Panel Data Model with a Nonscalar Disturbance Covariance Matrix

Abstract

Approximation formulae are developed for the bias of ordinary and generalized Least Squares Dummy Variable (LSDV) estimators in dynamic panel data models. Results from Kiviet [Kiviet, J. F. (1995), on bias, inconsistency, and efficiency of various estimators in dynamic panel data models, J. Econometrics68:53–78; Kiviet, J. F. (1999), Expectations of expansions for estimators in a dynamic panel data model: some results for weakly exogenous regressors, In: Hsiao, C., Lahiri, K., Lee, L‐F., Pesaran, M. H., eds., Analysis of Panels and Limited Dependent Variables, Cambridge: Cambridge University Press, pp. 199–225] are extended to higher‐order dynamic panel data models with general covariance structure. The focus is on estimation of both short‐ and long‐run coefficients. The results show that proper modelling of the disturbance covariance structure is indispensable. The bias approximations are used to construct bias corrected estimators which are then applied to quarterly data from 14 European Union countries. Money demand functions for M1, M2 and M3 are estimated for the EU area as a whole for the period 1991: I–1995: IV. Significant spillovers between countries are found reflecting the dependence of domestic money demand on foreign developments. The empirical results show that in general plausible long‐run effects are obtained by the bias corrected estimators. Moreover, finite sample bias, although of moderate magnitude, is present underlining the importance of more refined estimation techniques. Also the efficiency gains by exploiting the heteroscedasticity and cross‐correlation patterns between countries are sometimes considerable.