A new mixed chain sampling plan based on the process capability index for product acceptance

This article proposes a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest follows the normal distribution with unknown mean and variance. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications. In order to construct the tables, the problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.     

Optimal designing of a new mixed variable lot-size chain sampling plan based on the process capability index

In this paper, a new mixed sampling plan based on the process capability index (PCI) C_pk is proposed and the resultant plan is called mixed variable lot-size chain sampling plan (ChSP). The proposed mixed plan comprises of both attribute and variables inspections. The variable lot-size sampling plan can be used for inspection of attribute quality characteristics and for the inspection of measurable quality characteristics, the variables ChSP based on PCI will be used. We have considered both symmetric and asymmetric fraction non conforming cases for the variables ChSP. Tables are developed for determining the optimal parameters of the proposed mixed plan based on two points on the operating characteristic (OC) approach. In order to construct the tables, the problem is formulated as a non linear programming where the average sample number function is considered as an objective function to be minimized and the lot acceptance probabilities at acceptable quality level and limiting quality level under the OC curve are considered as constraints. The practical implementation of the proposed mixed sampling plan is explained with an illustrative real time example. Advantages of the proposed sampling plan are also discussed in terms of comparison with other existing sampling plans.     

A mixed double sampling plan based on Cpk

Abstract

Acceptance sampling plans are quality tools for the manufacturer and the customer. The ultimate result of reduction of nonconforming items will increase the profit of the manufacturer and enhance the satisfaction of the consumer. In this article, a mixed double sampling plan is proposed in which the attribute double sampling inspection is used in the first stage and a variables sampling plan based on the process capability index C_pk is used in the second stage. The optimal parameters are determined so that the producer’s and the consumer’s risks are to be satisfied with minimum average sample number. The optimal parameters of the proposed plan are estimated using different plan settings using two points on the operating characteristic curve approach. In designing the proposed mixed double sampling plan, we consider the symmetric and asymmetric nonconforming cases under variables inspection. The efficiency of the proposed plan is discussed and compared with the existing sampling plans. Tables are constructed for easy selection of the optimal plan parameters and an industrial example is also included for implementation of the proposed plan.     

Determination of a new mixed variable lot-size multiple dependent state sampling plan based on the process capability index

This article proposes a new mixed variable lot-size multiple dependent state sampling plan in which the attribute sampling plan can be used in the first stage and the variables multiple dependent state sampling plan based on the process capability index will be used in the second stage for the inspection of measurable quality characteristics. The proposed mixed plan is developed for both symmetric and asymmetric fraction non conforming. The optimal plan parameters can be determined by considering the satisfaction levels of the producer and the consumer simultaneously at an acceptable quality level and a limiting quality level, respectively. The performance of the proposed plan over the mixed single sampling plan based on C_pk and the mixed variable lot size plan based on C_pk with respect to the average sample number is also investigated. Tables are constructed for easy selection of plan parameters for both symmetric and asymmetric fraction non conforming and real world examples are also given for the illustration and practical implementation of the proposed mixed variable lot-size plan.     

Acceptance sampling plans for linear profiles with one-sided specifications

In this study, we propose three new sampling plans based on yield index C_puA for linear profiles with one-sided specifications, including the resubmitted sampling plan, the repetitive group sampling plan, and the multiple dependent state repetitive sampling plan. The operating characteristic functions of our proposed sampling plans are developed. The plan parameters of our proposed sampling plans are determined through nonlinear optimization. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The three sampling plans are compared with the existing single sampling plan in terms of the average sample number. A real example is used to illustrate the applications.     

Developing a variables repetitive group sampling plan based on process capability index C pk with unknown mean and variance

In this paper, variables repetitive group sampling plans are developed based on the process capability index C _pk when the quality characteristic follows a normal distribution with unknown mean and variance. The sampling plan parameters such as the sample size and the acceptance constant are determined to minimize the average sample number. Symmetric and asymmetric cases, in percent defectives due to two specification limits, are dealt with for specified combinations of acceptable quality level and limiting quality level. Tables are provided and examples are given to use proposed plans in practice.     

Optimal designing of skip-lot sampling plan of type SkSP-2 with group acceptance sampling plan as reference plan under Burr-type XII distribution

In this paper, skip-lot sampling plan of type SkSP-2 with group acceptance sampling plans is proposed when the lifetime of the product follows the Burr-type XII distributions. The optimal parameters of the proposed plan are determined when two points on operating characteristics curve namely acceptable quality level and limiting quality level and the number of testers are specified. We also considered the Burr-type XII distribution to find the plan parameters. Several tables are given for practical use. We compare the results of proposed plan with the existing plans. Results are explained using real-world examples.     

Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution

This paper introduces a double and group acceptance sampling plans based on time truncated lifetimes when the lifetime of an item follows the inverse log-logistic (ILL) distribution with known shape parameter. The operating characteristic function and average sample number (ASN) values of the double acceptance sampling inspection plan are provided. The values of the minimum number of groups and operating characteristic function for various quality levels are obtained for a group acceptance sampling inspection plan. A comparative study between single acceptance sampling inspection plan and double acceptance sampling inspection plan is carried out in terms of sample size. One simulated example and four real-life examples are discussed to show the applicability of the proposed double and group acceptance sampling inspection plans for ILL distributed quality parameters.     

Developing a variables two-plan sampling system for product acceptance determination

In this paper, a variables tightened-normal-tightened (TNT) two-plan sampling system based on the widely used capability index C_pk is developed for product acceptance determination when the quality characteristic of products has two-sided specification limits and follows a normal distribution. The operating procedure and operating characteristic (OC) function of the variables TNT two-plan sampling system, and the conditions for solving plan parameters are provided. The behavior of OC curves for the variables TNT sampling system under various parameters is also studied, and compared with the variables single tightened inspection plan and single normal inspection plan.     

SkSP-R sampling plan based on process capability index

In this paper, we present an optimal designing methodology for the skip-lot sampling plan (SkSP) of type SkSP-R based on the most widely used process capability index (PCI) C_pk. The SkSP-R plan is one of the SkSPs that incorporate the provision of the reinspection concept. In order to design the optimal parameters, we consider both symmetric and asymmetric fraction non conforming cases. Tables are also constructed to determine the optimal parameters by formulating an optimization problem. The advantages of the proposed plan over the existing plan are also discussed. Application of the plan is explained with a real-life example.     

Tightened single-level continuous sampling plan

In this paper, a new tightening concept has been incorporated into the single-level continuous sampling plan CSP-1, such that quality degradation will warrant sampling inspection to cease beyond a certain number of sampled items, until new evidence of good quality is established. The expressions of the performance measures for this new plan, such as the operating characteristic, average outgoing quality and average fraction inspected, are derived using a Markov chain model. The advantage of the tightened CSP-1 plan is that it is possible to lower the average outgoing quality limit.     

Designing an economic rectifying sampling plan in the presence of two markets

In this paper, an optimization model is developed for the economic design of a rectifying inspection sampling plan in the presence of two markets. A product with a normally distributed quality characteristic with unknown mean and variance is produced in the process. The quality characteristic has a lower specification limit. The aim of this paper is to maximize the profit, which consists the Taguchi loss function, under the constraints of satisfying the producer's and consumer's risk in two different markets simultaneously. Giveaway cost per unit of sold excess material is considered in the proposed model. A case study is presented to illustrate the application of proposed methodology. In addition, sensitivity analysis is performed to study the effect of model parameters on the expected profit and optimal solution. Optimal process adjustment problem and acceptance sampling plan is combined in the economical optimization model. Also, process mean and standard deviation are assumed to be unknown value, and their impact is analyzed. Finally, inspection error is considered, and its impact is investigated and analyzed.     

Designing a multiple state repetitive group sampling plan based on the coefficient of variation

A multiple state repetitive group sampling (MSRGS) plan is developed on the basis of the coefficient of variation (CV) of the quality characteristic which follows a normal distribution with unknown mean and variance. The optimal plan parameters of the proposed plan are solved by a nonlinear optimization model, which satisfies the given producer's risk and consumer's risk at the same time and minimizes the average sample number required for inspection. The advantages of the proposed MSRGS plan over the existing sampling plans are discussed. Finally an example is given to illustrate the proposed plan.     

Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

Designing an economically optimal repetitive group-sampling plan based on loss functions

Acceptance sampling is a quality assurance tool, which provides a rule for the producer and the consumer to make acceptance or rejection decision about a lot. This paper attempts to develop a more efficient sampling plan, variables repetitive group sampling plan, based on the total loss to the producer and consumer. To design this model, two constraints are considered to satisfy the opposing priorities and requirements of the producer and the consumer by using Acceptable quality level (AQL) and Limiting quality level (LQL) points on operating characteristic (OC) curve. The objective function of this model is constructed based on the total expected loss. In order to illustrate the application of the proposed model, an example is presented. In addition, the effects of process parameters on the optimal solution and the total expected loss are studied by performing a sensitivity analysis. Finally, the efficiency of the proposed model is compared with the variables single sampling plan, the variables double sampling plan and the repetitive group sampling plan of Balamurali and Jun (2006) in terms of average sample number, total expected loss and its difference with ideal OC curve.     

Minimum Variance and VOQL Chain Sampling Plans–ChSP-4(c 1, c 2)

In this article the outgoing quality and the total inspection for the chain sampling plan ChSP-4(c ₁, c ₂) are introduced as well-defined random variables. The probability distributions of outgoing quality and total inspection are stated based on total rectification of non conforming units. The variances of these random variables are studied. The aim of this article is to develop procedures for minimum variance ChSP-4(c ₁, c ₂) sampling plans and their determination. In addition to minimum variance sampling plans, a procedure is developed for designing plans with a designated maximum variance, a VOQL (Variance of Outgoing Quality Limit) plan. The VOQL concept is analogous to the AOQL (Average Outgoing Quality Limit) except in the VOQL plan, it is the maximum variance which is established instead of the usual maximum AOQ.     

Optimal designing of an SkSP-R double sampling plan

In this article, we propose a method of planning and determining the optimum parameters of a SkSP-R skip-lot sampling plan by using the attribute double sampling plan as the reference plan. The SkSP-R plan is a new type of skip-lot sampling plan which has a provision for re-inspecting the submitted lots. The optimal plan parameters of the suggested sampling plan are estimated with the target that the average sample number be minimized and satisfying both the specified producer's as well as the consumer's risks simultaneously. In order to obtain the optimum parameters, tables are also built for different combinations of the acceptable quality level and the limiting quality level in conjunctions with different producer's and consumer's risks. An illustrative example is provided for the implementation of the suggested plan. The advantages of the suggested plan over the existing conventional sampling plans and other existing skip-lot sampling plans are also described.     

Designing Variables Sampling Plans with Process Loss Consideration

For the implementation of an acceptance sampling plan, a problem the quality practitioners have to deal with is the determination of the critical acceptance values and inspection sample sizes that provide the desired levels of protection to both vendors and buyers. Traditionally, most acceptance sampling plans focus on the percentage of defective products instead of considering the process loss, which doesn't distinguish among the products that fall within the specification limits. However, the quality between products that fall within the specification limits may be very different. So how to design an acceptance sampling plan with process loss consideration is necessary. In this article, a variables sampling plan based on L _e is proposed to handle processes requiring low process loss. The required sample sizes n and the critical acceptance value c with various combination of acceptance quality level are tabulated. The proposed sampling plan provides a feasible policy, which can be applied to products requiring low process loss where classical sampling plans cannot be applied.