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Testing exponentiality based on the extropy of record values
Authors:Peihan Xiong  Weiwei Zhuang  Guoxin Qiu
Affiliation:aDepartment of Statistics and Finance, School of Management, University of Science and Technology of China, Hefei, People''s Republic of China;bDepartment of Business Administration, School of Business, Xinhua University of Anhui, Hefei, People''s Republic of China
Abstract:
Keywords:Adjusted power   extropy   exponentiality test   Monte Carlo simulation   record value
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