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遗传算法优化的SVM模拟电路故障诊断方法
引用本文:陈世杰,连可,王厚军.遗传算法优化的SVM模拟电路故障诊断方法[J].电子科技大学学报(社会科学版),2009(4).
作者姓名:陈世杰  连可  王厚军
作者单位:电子科技大学自动化工程学院;
基金项目:部级基础科研项目(A1420061264);;部级预研基金(9140A17030308DZ02)
摘    要:提出了一种利用遗传算法优化的SVM多分类决策树(GADT-SVM)实现模拟电路故障诊断的新方法。介绍了GADT-SVM的设计思想和算法原理;利用传递函数对模拟电路进行建模,并用小波分解提取电路冲激响应的能量分布作为故障特征;使用GADT-SVM对故障特征样本进行分类实现故障诊断。仿真结果表明,与未经优化的DAG-SVM和DT-SVM故障诊断方法相比,该方法可以减小诊断"误差积累"的影响,具有更好的误差控制能力。

关 键 词:模拟电路  故障诊断  遗传算法  支持向量机  

Method for Analog Circuit Fault Diagnosis Based on GA Optimized SVM
CHEN Shi-jie,LIAN Ke, WANG Hou-jun.Method for Analog Circuit Fault Diagnosis Based on GA Optimized SVM[J].Journal of University of Electronic Science and Technology of China(Social Sciences Edition),2009(4).
Authors:CHEN Shi-jie  LIAN Ke    WANG Hou-jun
Institution:School of Automation Engineering;University of Electronic Science and Technology of China Chengdu 610054
Abstract:A new method for analog circuit fault diagnosis is presented based on genetic algorithm optimized support vector machine multi-class decision tree (GADT-SVM). The design idea and algorithm principle of GADT-SVM is introduced firstly; then model of analog circuit is built by transfer function, and fault characteristic is picked-up by wavelet energy distribution of impulse response. Finally, fault samples are recognized by GADT-SVM. Experiment results show that our method can depress error accumulation phenom...
Keywords:analog circuit  fault diagnosis  genetic algorithm  support vector machine  
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