Alternative posterior consistency results in nonparametric binary regression using Gaussian process priors |
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Authors: | Taeryon Choi |
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Affiliation: | Department of Mathematics and Statistics, University of Maryland, Baltimore County, USA |
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Abstract: | We establish consistency of posterior distribution when a Gaussian process prior is used as a prior distribution for the unknown binary regression function. Specifically, we take the work of Ghosal and Roy [2006. Posterior consistency of Gaussian process prior for nonparametric binary regression. Ann. Statist. 34, 2413–2429] as our starting point, and then weaken their assumptions on the smoothness of the Gaussian process kernel while retaining a stronger yet applicable condition about design points. Furthermore, we extend their results to multi-dimensional covariates under a weaker smoothness condition on the Gaussian process. Finally, we study the extent to which posterior consistency can be achieved under a general model where, when additional hyperparameters in the covariance function of a Gaussian process are involved. |
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Keywords: | Binary regression Existence of tests Gaussian processes In-measure metric In-probability consistency |
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