Robust first-order rotatable lifetime improvement experimental designs |
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Authors: | Rabindra Nath Das Jinseog Kim Youngjo Lee |
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Affiliation: | 1. Department of Statistics, The University of Burdwan, Burdwan, West Bengal, India;2. Department of Statistics and Information Science, Dongguk University, Gyeongju, Korea;3. Department of Statistics, Seoul National University, Seoul 151-747, Korea |
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Abstract: | Experimental designs are widely used in predicting the optimal operating conditions of the process parameters in lifetime improvement experiments. The most commonly observed lifetime distributions are log-normal, exponential, gamma and Weibull. In the present article, invariant robust first-order rotatable designs are derived for autocorrelated lifetime responses having log-normal, exponential, gamma and Weibull distributions. In the process, robust first-order D-optimal and rotatable conditions have been derived under these situations. For these lifetime distributions with correlated errors, it is shown that robust first-order D-optimal designs are always robust rotatable but the converse is not true. Moreover, it is observed that robust first-order D-optimal and rotatable designs depend on the respective error variance–covariance structure but are independent from these considered lifetime response distributions. |
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Keywords: | correlated error lifetime distribution mean life response surface robust rotatability |
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