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Improved Shewhart-type Runs-rules Nonparametric Sign Charts
Authors:P. Kritzinger  S. Chakraborti
Affiliation:1. Department of Statistics, University of Pretoria, Pretoria, South Africa;2. Department of Information Systems, Statistics and Management Science, University of Alabama, Tuscaloosa, Alabama, USA
Abstract:Runs-rules are typically incorporated in control charts to increase their sensitivity to detect small process shifts. However, a drawback of this approach is that runs-rules charts are unable to detect large shifts quickly. In this article improved runs-rules are introduced to the nonparametric sign chart to address this limitation. Improved runs-rules are incorporated to maintain sensitivity to small process shifts, while having the added ability to detect large shifts in the process more efficiently. Performance comparisons between sign charts with runs-rules and sign charts with improved runs-rules illustrate that the improved runs-rules are superior in performance for large shifts in the process, while maintaining the same sensitivity in the detection of small shifts.
Keywords:Distribution-free  Control chart  Runs-rules  Improved runs-rules  Average run-length (ARL)  Control limit  SPC
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