An exact two-sample test based on the baumgartner-weiss-schindler statistic and a modification of lepage's test |
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Authors: | Markus Neuhäuser |
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Affiliation: | Department of Biometry , Byk Gulden Pharmaceuticals , Byk-Gulden-Str. 2, Konstanz, D-78467, Germany |
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Abstract: | It is shown that the nonparametric two-saniDle test recently proposed by Baumgartner, WeiB, Schindler (1998, Biometrics, 54, 1129-1135) does not control the type I error rate in case of small sample sizes. We investigate the exact permutation test based on their statistic and demonstrate that this test is almost not conservative. Comparing exact tests, the procedure based on the new statistic has a less conservative size and is, according to simulation results, more powerful than the often employed Wilcoxon test. Furthermore, the new test is also powerful with regard to less restrictive settings than the location-shift model. For example, the test can detect location-scale alternatives. Therefore, we use the test to create a powerful modification of the nonparametric location-scale test according to Lepage (1971, Biometrika, 58, 213-217). Selected critical values for the proposed tests are given. |
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Keywords: | nonparametric statistics exact permutation test location-scale test |
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