Locally best invariant test for outliers in a gamma type distribution |
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Authors: | Nariaki Sugiura Hiromi Sasamoto |
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Affiliation: | Department of Mathematics , University of Tsukuba , 305, Japan , Ibaraki |
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Abstract: | It is shown that the locally best invariant test for the existence of outliers for scale parameters of the gamma distribution is given by Bartholomew's test for exponentiality which is the ratio of the sum of squares of the data to the square of the sample mean. The optimality robustness, including null and nonnull robustness of the test is shown. A small simulation study to compare the power among the other eight competitive tests for testing exponentiality is performed. It is seen that the locally best invariant test is not always best but is reasonably good. It is slightly better than Cochran's test and suffers less from the limiting masking effect. |
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Keywords: | discordant observations exponential distribution power comparison masking effect Cochran's test Greenwood statistic |
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