On a test for exponentiality against Laplace order dominance |
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Authors: | B. Klar |
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Affiliation: | 1. bernhard.klar@math.uni-karlsruhe.de |
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Abstract: | Surles and Padgett recently introduced two-parameter Burr Type X distribution, which can also be described as the generalized Rayleigh distribution. It is observed that the generalized Rayleigh and log-normal distributions have many common properties and both the distributions can be used quite effectively to analyze skewed data set. For a given data set the problem of selecting either generalized Rayleigh or log-normal distribution is discussed in this paper. The ratio of maximized likelihood (RML) is used in discriminating between the two distributing functions. Asymptotic distributions of the RML under null hypotheses are obtained and they are used to determine the minimum sample size required in discriminating between these two families of distributions for a used specified probability of correct selection and the tolerance limit. |
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Keywords: | ?-class Laplace transform Exponential distribution Characterization Goodness-of-fit test Fractional moment |
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