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Au(111)取向膜的制备与结构表征
引用本文:邓文礼,杨大本.Au(111)取向膜的制备与结构表征[J].电子科技大学学报(社会科学版),1995(4).
作者姓名:邓文礼  杨大本
作者单位:成都电子科技大学材料科学与工程系
摘    要:在羊晶硅Si(111)上,通过电子束蒸发沉积方法制备Au(111)取向膜,用扫描电子显微镜(SEM)、X-射线光电子能谱(XPS)和原子力显微镜(AFM)分析在征Au(111)膜的表面微结构和表面晶格取向的原子图像。实验结果表明,在超高真空的条件下,控制优化实验条件能制备高度取向的Au(111)膜,这在分子自组装技术中起着关键作用,在纳米薄膜材料科学中具有重要意义。

关 键 词:取向膜  制备  扫描电子显微镜  x-射线光电子能谱仪  原子力显微镜  结构表征

Preparation and Structure Characterization of Au(111)Oriented Film
Deng Wenli,Yand Daben.Preparation and Structure Characterization of Au(111)Oriented Film[J].Journal of University of Electronic Science and Technology of China(Social Sciences Edition),1995(4).
Authors:Deng Wenli  Yand Daben
Abstract:Au(111) oriented film is prepared by electron-beam evaporation deposition on single crystal Si(111).Surface microstructure and atomic images of surface lattice orientation of Au (111) film are characterized by scanning electron microscope,X-ray photoelectron sperctrometer and atomic force microscope.experimental results suggest that oriented Au (111)film can be prepared by controlling better experimental procedure at ultra-high vacuum condition ,which play a key part in a molecular self-assembly technique and have important significance in nanometer thin film materials science.
Keywords:oriented film  preparation  scanning electron microsccpe  X-ray photoelectron spectrometer  atomic force microscope  structure characterization  
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