| 简易晶体管特性图示仪 |
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| 引用本文： | 吴幼芬,李曼. 简易晶体管特性图示仪[J]. 江汉大学学报(社会科学版), 2001, 18(6): 47-50 |
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| 作者姓名： | 吴幼芬 李曼 |
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| 作者单位： | 1. 武汉大学,电子信息学院,武汉,430079
2. 江汉大学,计算中心,武汉,430019 |
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| 摘 要： | 介绍了一种以单片机为核心,结合普通双踪示波器的简易晶体管特性图示仪,对该仪器的结构组成框图和软硬的设计作了较详细的介绍。
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| 关 键 词： | 单片机 输入特性 输入特性 阶梯信号 扫描信号 晶体管特性图示仪 测量原理 |
| 文章编号： | 1006-639X(2001)06-0047-04 |
The Simplified Transistor Characteristic Curve Tracer |
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| WU You-fen. The Simplified Transistor Characteristic Curve Tracer[J]. Journal of JIanghan University:Social Sciences, 2001, 18(6): 47-50 |
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| Authors: | WU You-fen |
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| Affiliation: | WU You-fen (School of electrical information Wuhan University Wuhan 430079) LI Man (Department of computer center Jianghan University Wuhan 430019) |
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| Abstract: | This paper introduces a simplified transistor characteristic curve trace, which is based on the single chip microcomputer and the two-track oscilloscope. The main focus of the paper is on explaining the structure of the instrument and the design of software and hardware. |
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| Keywords: | Single chip microcomputer Input characteristic Output characteristic Stair-case signal Scanning signal Small power Amplification |
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