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Analysis of single classification experiments based on censored samples from the two-parameter Weibull distribution |
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| Authors: | JI McCool |
| Institution: | SKF Industries, Inc. Technology Services Center King of Prussia, PA, U.S.A. |
| Abstract: | |
| Keywords: | 62N05 62F05 Life Testing Maximum Likelihood Likelihood Ratio Sample Size Selection One-way Layout |
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