A Bayesian semi-parametric approach to the ordinal calibration problem |
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Authors: | María Paz Casanova Yasna Orellana |
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Affiliation: | 1. Departamento de Estadística, Facultad de Ciencias Físicas y Matemáticas, Universidad de Concepción, Concepción, Chilemacasanova@udec.cl;3. Instituto de Nutrición y Tecnología de los Alimentos INTA, Universidad de Chile, Santiago, Chile |
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Abstract: | ABSTRACTWe introduce a semi-parametric Bayesian approach based on skewed Dirichlet processes priors for location parameters in the ordinal calibration problem. This approach allows the modeling of asymmetrical error distributions. Conditional posterior distributions are implemented, thus allowing the use of Markov chains Monte Carlo to generate the posterior distributions. The methodology is applied to both simulated and real data. |
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Keywords: | Calibration problem MCMC Ordinal regression Skewed Dirichlet processes |
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