Bayes estimation of reliability for the two-parameter lognormal distribution |
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Authors: | W.J. Padgett L.J. Wei |
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Affiliation: | Department of Mathematics and Computer Science , University of South Carolina , Columbia, South Carolina, 29208 |
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Abstract: | Bayes estimators of reliability for the lognormal failure distribution with two parameters (M,∑) are obtained both for informative priors of normal-gamma type and for the vague prior of Jeffreys. The estimators are in terms of the t-distribution function. The Bayes estimators are compared with the maximum likelihood and minimum variance unbiased estimators of reliabil-ity using Monte Carlo simulations. |
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Keywords: | life testing lognormal failure model normal-gamma and vague priors estimation of normal distribution function |
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