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Double acceptance sampling plan based on truncated life tests for half exponential power distribution |
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| Affiliation: | 1. Department of Mathematics, Beijing Jiaotong University, Beijing 100044, PR China;2. School of Science, Beijing Technology and Business University, Beijing 100048, PR China;1. Department of Statistics, Daejeon University, South Korea;2. Department of Statistics, Kyungpook National University, South Korea;1. Quantitative Methods and Operations Management Area, Indian Institute of Management, Kozhikode, Kerala, India;2. Santipur College, Department of Mathematics, West Bengal, India |
| Abstract: | In this paper, we develop a double acceptance sampling plan for half exponential power distribution when the lifetime experiment is truncated at a prefixed time. The zero and one failure schemes are considered. We obtain the minimum sample sizes of the first and second samples necessary to ensure the specified mean life at the given consumer’s confidence level. The operating characteristic values and the minimum ratios of the mean life to the specified life are also analyzed. Numerical example is provided to illustrate the double acceptance sampling plan. |
| Keywords: | Double acceptance sampling plan Operating characteristic function value Producer’s risk Truncated life test Half exponential power distribution |
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