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PIN管结电容的代换测量与回归分析
引用本文:万钧力,汤建勋,杨开勇.PIN管结电容的代换测量与回归分析[J].三峡大学学报(人文社会科学版),2000(5).
作者姓名:万钧力  汤建勋  杨开勇
作者单位:湖北三峡学院理工学院机电工程系!湖北宜昌443003(万钧力),国防科技大学光学工程系!湖南长沙410073(汤建勋,杨开勇)
基金项目:院士基金资助项目! ( 19990 1)
摘    要:通过一组标准电容的代换测量 ,建立了测量电压与电容量的函数关系 ,并采用插值算法和回归分析得到结电容与偏压的特性曲线 ,该方法有效地克服了杂散电容及电路噪声对测量精度的影响 ,测试误差主要取决于标准电容的精度

关 键 词:结电容  代换测量  插值算法  回归分析

Substitution Measurement of Junction Capacitance of PIN Photodiode and Regression Analysis
WAN Jun-li ,TAN Jian-xun ,YANG Kai-yong.Substitution Measurement of Junction Capacitance of PIN Photodiode and Regression Analysis[J].Journal of China Three Gorges University(Humanities & Social Sciences),2000(5).
Authors:WAN Jun-li  TAN Jian-xun  YANG Kai-yong
Institution:WAN Jun-li 1,TAN Jian-xun 2,YANG Kai-yong 2
Abstract:The function relationship has been built up through substitution measurements of a series of standard capacitors and the characteristic curve between capacitance and bias voltage has been achieved using interpolation algorithm and regression analysis. This method effectively overcomes effects of stray capacitance and circuit noise. Measurement errors are determined mainly by the accuracy of standard capacitance.
Keywords:Junction capacitance  Substitution measurement  Interpolation algorithm  Regression analysis
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