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Simulation-based performance assessment of master planning approaches in semiconductor manufacturing
Institution:1. Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany;2. Enterprise-wide Software Systems, Department of Mathematics and Computer Science, University of Hagen, Universitätsstraße 1, 58097 Hagen, Germany;1. Department of Management/ETSEIB, Universitat Politècnica de Catalunya, Av. Diagonal 647, 7th floor, 08028 Barcelona, Spain;2. Department of Management/IOC/ETSEIB, Universitat Politècnica de Catalunya, Av. Diagonal 647, 11th floor, 08028 Barcelona, Spain;1. School of Science, Henan University of Technology, Zhengzhou, Henan 450001, China;2. Department of Mathematics, Zhengzhou University, Zhengzhou, Henan 450001, China;1. University of Zagreb, Faculty of Electrical Engineering and Computing, Croatia;2. Infinum, Zagreb, Croatia
Abstract:Semiconductor manufacturing is confronted with a large number of products whose mix is changing over time, heterogeneous fabrication processes, re-entrant flows of material, and different sources of environmental and system uncertainty. In this context, the mid-term production planning approach, i.e., master planning, typically does not capture the entire complexity of the shop-floor. It deals with an aggregated representation of the production system. There is a need for evaluating the planning algorithm in use while taking the execution level into account. Therefore, we introduce in this paper a simulation-based framework that allows for modeling the behavior of the market demand and the production system. An appropriate performance assessment methodology is proposed. The performance of two heuristic approaches for master planning in semiconductor manufacturing, a genetic algorithm and a rule-based assignment procedure, is evaluated within a rolling horizon setting while considering demand and execution uncertainty. A reduced discrete-event simulation model is used to mimic a one-stage network of wafer fabrication facilities. The results of simulation experiments are discussed.
Keywords:Master planning  Semiconductor manufacturing  Rolling horizon  Uncertainty  Performance assessment  Discrete-event simulation
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