On the α-risks for shewhart control charts

The performance of the usual Shewhart control charts for monitoring process means and variation can be greatly affected by nonnormal data or subgroups that are correlated. Define the α_k-risk for a Shewhart chart to be the probability that at least one “out-of-control” subgroup occurs in k subgroups when the control limits are calculated from the k subgroups. Simulation results show that the α_k-risks can be quite large even for a process with normally distributed, independent subgroups. When the data are nonnormal, it is shown that the α_k-risk increases dramatically. A method is also developed for simulating an “in-control” process with correlated subgroups from an autoregressive model. Simulations with this model indicate marked changes in the α_k-risks for the Shewhart charts utilizing this type of correlated process data. Therefore, in practice a process should be investigated thoroughly regarding whether or not it is generating normal, independent data before out-of-control points on the control charts are interpreted to be due to some real assignable cause.     

Process monitoring of exponentially distributed characteristics through an optimal normalizing transformation

Many process characteristics follow an exponential distribution, and control charts based on such a distribution have attracted a lot of attention. However, traditional control limits may be not appropriate because of the lack of symmetry. In this paper, process monitoring through a normalizing power transformation is studied. The traditional individual measurement control charts can be used based on the transformed data. The properties of this control chart are investigated. A comparison with the chart when using probability limits is also carried out for cases of known and estimated parameters. Without losing much accuracy, even compared with the exact probability limits, the power transformation approach can easily be used to produce charts that can be interpreted when the normality assumption is valid.     

Synthetic exponential control charts with unknown parameter

The existing synthetic exponential control charts are based on the assumption of known in-control parameter. However, the in-control parameter has to be estimated from a Phase I dataset. In this article, we use the exact probability distribution, especially the percentiles, mean, and standard deviation of the conditional average run length (ARL) to evaluate the effect of parameter estimation on the performance of the Phase II synthetic exponential charts. This approach accounts for the variability in the conditional ARL values of the synthetic chart obtained by different practitioners. Since parameter estimation results in more false alarms than expected, we develop an exact method to design the adjusted synthetic charts with desired conditional in-control performance. Results of known and unknown in-control parameter cases show that the control limit of the conforming run length sub-chart of the synthetic chart should be as small as possible.     

Some issues in the design of EWMA Charts

The traditional design procedure for selecting the parameters of EWMA charts is based on the average run length (ARL). It is shown that for some types of EWMA charts, such a procedure may lead to high probability of a false out-of-control signal. An alternative procedure based on both the ARL and the standard deviation of run length (SRL) is recommended. It is shown that, with the new procedure, the EWMA chart using its exact variance can detect moderate and large shifts of the process mean faster.     

Detection of an unknown increase in the rate of a rare event

Control charts for detecting shifts in the rate of occurrences of rare events are usually implemented by fixing a priori the change to be optimally detected, i.e. under the assumption that the change is from a baseline in-control value to a known out-of-control value. In practice, this assumption is never satisfied. A solution to that problem, mainly devoted to the real world of continuous surveillance, is developed here in terms of a natural extension of the minimizing out-of-control averge run length (ARL) criterion. As an illustrative application, the procedure is analytically solved for the exponential Sets charts. In this case, exact numerical tables of the expected out-of-control ARL, based on the proposed criterion, are also given.     

Nonparametric control charts based on order statistics: Some advances

ABSTRACT

In this article, we introduce new nonparametric Shewhart-type control charts that take into account the location of two order statistics of the test sample as well as the number of observations in that sample that lie between the control limits. Exact formulae for the alarm rate, the run length distribution and the average run length (ARL) are all derived. A key advantage of the new charts is that, due to its nonparametric nature, the false alarm rate (FAR) and in-control run length distribution is the same for all continuous process distributions. Tables are provided for the implementation of the proposed charts for some typical FAR and ARL values. Furthermore, a numerical study carried out reveals that the new charts are quite flexible and efficient in detecting shifts to Lehmann-type out-of-control situations, while they seem preferable from a robustness point of view in comparison with the distribution-free control chart of Balakrishnan et al. (2009).     

Transforming the exponential by minimizing the sum of the absolute differences

This work presents an optimal value to be used in the power transformation to transform the exponential to normality for statistical process control (SPC) applications. The optimal value is found by minimizing the sum of absolute differences between two distinct cumulative probability functions. Based on this criterion, a numerical search yields a proposed value of 3.5142, so the transformed distribution is well approximated by the normal distribution. Two examples are presented to demonstrate the effectiveness of using the transformation method and its applications in SPC. The transformed data are almost normally distributed and the performance of the individual charts is satisfactory. Compared to charts that use the original exponential data and probability control limits, the individual charts constructed using the transformed distribution are superior in appearance, ease of interpretation and implementation by practitioners.     

Attribute Charts for Zero-Inflated Processes

The classical Shewhart c-chart and p-chart which are constructed based on the Poisson and binomial distributions are inappropriate in monitoring zero-inflated counts. They tend to underestimate the dispersion of zero-inflated counts and subsequently lead to higher false alarm rate in detecting out-of-control signals. Another drawback of these charts is that their 3-sigma control limits, evaluated based on the asymptotic normality assumption of the attribute counts, have a systematic negative bias in their coverage probability. We recommend that the zero-inflated models which account for the excess number of zeros should first be fitted to the zero-inflated Poisson and binomial counts. The Poisson parameter λ estimated from a zero-inflated Poisson model is then used to construct a one-sided c-chart with its upper control limit constructed based on the Jeffreys prior interval that provides good coverage probability for λ. Similarly, the binomial parameter p estimated from a zero-inflated binomial model is used to construct a one-sided np-chart with its upper control limit constructed based on the Jeffreys prior interval or Blyth–Still interval of the binomial proportion p. A simple two-of-two control rule is also recommended to improve further on the performance of these two proposed charts.     

Control charts for attributes with maxima nominated samples

We develop quality control charts for attributes using the maxima nomination sampling (MNS) method and compare them with the usual control charts based on simple random sampling (SRS) method, using average run length (ARL) performance, the required sample size in detecting quality improvement, and non-existence region for control limits. We study the effect of the sample size, the set size, and nonconformity proportion on the performance of MNS control charts using ARL curve. We show that MNS control chart can be used as a better benchmark for indicating quality improvement or quality deterioration relative to its SRS counterpart. We consider MNS charts from a cost perspective. We also develop MNS attribute control charts using randomized tests. A computer program is designed to determine the optimal control limits for an MNS p-chart such that, assuming known parameter values, the absolute deviation between the ARL and a specific nominal value is minimized. We provide good approximations for the optimal MNS control limits using regression analysis. Theoretical results are augmented with numerical evaluations. These show that MNS based control charts can yield substantial improvement over the usual control charts based on SRS.     

ARL-Design of S Charts with k-of-k Runs Rules

The standard S chart signals an out-of-control condition when one point exceeds a control limit. It can be augmented with runs rules to improve its performance in detecting assignable causes. A commonly used rule signals when k consecutive points exceed a control limit. This rule can be used alone or to supplement the standard chart. In this article we derive ARL expressions for charts with the k-of-k runs rule. We show how to design S charts with this runs rule, compare their ARL performance, and make a control chart recommendation when it is important to monitor for both increases and decreases in process dispersion.     

ARL-unbiased control charts for the monitoring of exponentially distributed characteristics based on type-II censored samples

In this paper, the problem of monitoring process data that can be modelled by exponential distribution is considered when observations are from type-II censoring. Such data are common in many practical inspection environment. An average run length unbiased (ARL-unbiased) control scheme is developed when the in-control scale parameter is known. The performance of the proposed control charts are investigated in terms of the ARL and standard deviation of the run length. The effects of parameter estimation on the proposed control charts are also evaluated. Then, we consider the design of the ARL-unbiased control charts when the in-control scale parameter is estimated. Finally, an example is used to illustrate the implementation of the proposed control charts.     

The performance of multivariate CUSUM control charts with estimated parameters

In this paper, we study the effect of estimating the vector of means and the variance–covariance matrix on the performance of two of the most widely used multivariate cumulative sum (CUSUM) control charts, the MCUSUM chart proposed by Crosier [Multivariate generalizations of cumulative sum quality-control schemes, Technometrics 30 (1988), pp. 291–303] and the MC1 chart proposed by Pignatiello and Runger [Comparisons of multivariate CUSUM charts, J. Qual. Technol. 22 (1990), pp. 173–186]. Using simulation, we investigate and compare the in-control and out-of-control performances of the competing charts in terms of the average run length measure. The in-control and out-of-control performances of the competing charts deteriorate significantly if the estimated parameters are used with control limits intended for known parameters, especially when only a few Phase I samples are used to estimate the parameters. We recommend the use of the MC1 chart over that of the MCUSUM chart if the parameters are estimated from a small number of Phase I samples.     

Moving range EWMA control charts for monitoring the Weibull shape parameter

In this article, we propose an exponentially weighted moving average (EWMA) control chart for the shape parameter β of Weibull processes. The chart is based on a moving range when a single measurement is taken per sampling period. We consider both one-sided (lower-sided and upper-sided) and two-sided control charts. We perform simulations to estimate control limits that achieve a specified average run length (ARL) when the process is in control. The control limits we derive are ARL unbiased in that they result in ARL that is shorter than the stable-process ARL when β has shifted. We also perform simulations to determine Phase I sample size requirements if control limits are based on an estimate of β. We compare the ARL performance of the proposed chart to that of the moving range chart proposed in the literature.     

CUSUM chart for detecting range shifts when monotonicity of likelihood ratio is invalid

It is often encountered in the literature that the log-likelihood ratios (LLR) of some distributions (e.g. the student t distribution) are not monotonic. Existing charts for monitoring such processes may suffer from the fact that the average run length (ARL) curve is a discontinuous function of control limit. It implies that some pre-specified in-control (IC) ARLs of these charts may not be reached. To guarantee the false alarm rate of a control chart lower than the nominal level, a larger IC ARL is usually suggested in the literature. However, the large IC ARL may weaken the performance of a control chart when the process is out-of-control (OC), compared with a just right IC ARL. To overcome it, we adjust the LLR to be a monotonic one in this paper. Based on it, a multiple CUSUM chart is developed to detect range shifts in IC distribution. Theoretical result in this paper ensures the continuity of its ARL curve. Numerical results show our proposed chart performs well under the range shifts, especially under the large shifts. In the end, a real data example is utilized to illustrate our proposed chart.     

Modified S-charts for controlling process variability

To help in the detection of variance increases and decreases, three modified versions of traditional Shewhart S-charts are evaluated in terms of their average run length values. One scheme uses control limits based on equal tail chi-square distribution probabilities. The second uses control limits based on unequal tail probabilities. The third uses warning limits based on equal tail probabilities, but requires two successive points beyond the warning limit to give an out-of-control signal. They all result in better average run length values than the traditional S-chart. Also, if the only concern is the detection of variance increases, then both S-charts and warning limit charts without lower control limits are shown to have better average run length values than those of the traditional charts.     

Some Comments Regarding the Synthetic Chart

The steady-state average run length (ARL) is a function of the in-control probabilities of being in each nonabsorbing state. Davis and Woodall (2002) tabulated values that are significantly smaller than the steady-state ARLs, because they used the out-of-control probabilities. The synthetic chart signals when a second sample point falls beyond the control limits, no matter whether one of them falls above the centerline and the other falls below it. The side-sensitive version of the synthetic chart does not signal when the points beyond the control limits are on opposite sides. With this rule, the chart detects mean changes more quickly.     

Statistical quality control based on ranked set sampling

Different quality control charts for the sample mean are developed using ranked set sampling (RSS), and two of its modifications, namely median ranked set sampling (MRSS) and extreme ranked set sampling (ERSS). These new charts are compared to the usual control charts based on simple random sampling (SRS) data. The charts based on RSS or one of its modifications are shown to have smaller average run length (ARL) than the classical chart when there is a sustained shift in the process mean. The MRSS and ERSS methods are compared with RSS and SRS data, it turns out that MRSS dominates all other methods in terms of the out-of-control ARL performance. Real data are collected using the RSS, MRSS, and ERSS in cases of perfect and imperfect ranking. These data sets are used to construct the corresponding control charts. These charts are compared to usual SRS chart. Throughout this study we are assuming that the underlying distribution is normal. A check of the normality for our example data set indicated that the normality assumption is reasonable.     

Generalized Control Charts for Non-Normal Data Using g-and-k Distributions

Statistical control charts are often used in industry to monitor processes in the interests of quality improvement. Such charts assume independence and normality of the control statistic, but these assumptions are often violated in practice. To better capture the true shape of the underlying distribution of the control statistic, we utilize the g-and-k distributions to estimate probability limits, the true ARL, and the error in confidence that arises from incorrectly assuming normality. A sensitivity assessment reveals that the extent of error in confidence associated with control chart decision-making procedures increases more rapidly as the distribution becomes more skewed or as the tails of the distribution become longer than those of the normal distribution. These methods are illustrated using both a frequentist and computational Bayesian approach to estimate the g-and-k parameters in two different practical applications. The Bayesian approach is appealing because it can account for prior knowledge in the estimation procedure and yields posterior distributions of parameters of interest such as control limits.