The double sampling S2 chart with estimated process variance

This paper proposes useful exact bounds for the parameters of the double sampling S² chart with known process variance and it also investigates the properties of the double sampling S² chart with estimated process variance, in terms of the average run length, the standard deviation of the run length and the average sample size, providing a numerical comparison with the known process variance case. It also provides guidelines to systematically design the double sampling S² chart both with known and estimated process variance and proposes two optimal design procedures with estimated process variance, for (a) minimizing the out-of-control average run length and (b) minimizing the out-of-control average sample size.     

Optimal designs of multivariate synthetic |S| control chart based on median run length

The multivariate synthetic generalized sample variance |S| (synthetic |S|) chart is a combination of the |S| sub-chart and the conforming run length sub-chart. A procedure for optimal designs of the synthetic |S| chart, based on the median run length (MRL), for both zero and steady-state modes are provided by minimizing the out-of-control MRL. The comparative results show that the synthetic |S| chart performs better than the standard |S| chart for detecting shifts in the covariance matrix of a multivariate normally distributed process, in terms of the MRL. An example is given to illustrate the operation of the synthetic |S| chart.     

On the improvement of one-sided S control charts

The most common charting procedure used for monitoring the variance of the distribution of a quality characteristic is the S control chart. As a Shewhart-type control chart, it is relatively insensitive in the quick detection of small and moderate shifts in process variance. The performance of the S chart can be improved by supplementing it with runs rules or by varying the sample size and the sampling interval. In this work, we introduce and study one-sided adaptive S control charts, supplemented or not with one powerful runs rule, for detecting increases or decreases in process variation. The properties of the proposed control schemes are obtained by using a Markov chain approach. Furthermore, a practical guidance for the choice of the most suitable control scheme is also provided.     

A new S2 control chart using repetitive sampling

A new S² control chart is presented for monitoring the process variance by utilizing a repetitive sampling scheme. The double control limits called inner and outer control limits are proposed, whose coefficients are determined by considering the average run length (ARL) and the average sample number when the process is in control. The proposed control chart is compared with the existing Shewhart S² control chart in terms of the ARLs. The result shows that the proposed control chart is more efficient than the existing control chart in detecting the process shift.     

A mean deviation-based approach to monitor process variability

The study proposes a Shewhart-type control chart, namely an MD chart, based on average absolute deviations taken from the median, for monitoring changes (especially moderate and large changes – a major concern of Shewhart control charts) in process dispersion assuming normality of the quality characteristic to be monitored. The design structure of the proposed MD chart is developed and its comparison is made with those of two well-known dispersion control charts, namely the R and S charts. Using power curves as a performance measure, it has been observed that the design structure of the proposed MD chart is more powerful than that of the R chart and is very close competitor to that of the S chart, in terms of discriminatory power for detecting shifts in the process dispersion. The non-normality effect is also examined on design structures of the three charts, and it has been observed that the design structure of the proposed MD chart is least affected by departure from normality.     

A New Chart for Monitoring the Covariance Matrix of Bivariate Processes

In this article we consider a control chart based on the sample variances of two quality characteristics. The points plotted on the chart correspond to the maximum value of these two statistics. The main reason to consider the proposed chart instead of the generalized variance | S | chart is its better diagnostic feature, that is, with the new chart it is easier to relate an out-of-control signal to the variables whose parameters have moved away from their in-control values. We study the control chart efficiency considering different shifts in the covariance matrix. In this way, we obtain the average run length (ARL) that measures the effectiveness of a control chart in detecting process shifts. The proposed chart always detects process disturbances faster than the generalized variance | S | chart. The same is observed when the size of the samples is variable, except in a few cases in which the size of the samples switches between small size and very large size.     

Multivariate Synthetic |S| Control Chart with Variable Sampling Interval

A variable sampling interval (VSI) feature is introduced to the multivariate synthetic generalized sample variance |S| control chart. This multivariate synthetic control chart is a combination of the |S| sub-chart and the conforming run length sub-chart. The VSI feature enhances the performance of the multivariate synthetic control chart. The comparative results show that the VSI multivariate synthetic control chart performs better than other types of multivariate control charts for detecting shifts in the covariance matrix of a multivariate normally distributed process. An example is given to illustrate the operation of the VSI multivariate synthetic chart.     

Improved R and s control charts for monitoring the process variance

The Shewhart R control chart and s control chart are widely used to monitor shifts in the process spread. One fact is that the distributions of the range and sample standard deviation are highly skewed. Therefore, the R chart and s chart neither provide an in-control average run length (ARL) of approximately 370 nor guarantee the desired type I error of 0.0027. Another disadvantage of these two charts is their failure in detecting an improvement in the process variability. In order to overcome these shortcomings, we propose the improved R chart (IRC) and s chart (ISC) with accurate approximation of the control limits by using cumulative distribution functions of the sample range and standard deviation. Simulation studies show that the IRC and ISC perform very well. We also compare the type II error risks and ARLs of the IRC and ISC and found that the s chart is generally more efficient than the R chart. Examples are given to illustrate the use of the developed charts.     

Monitoring simple linear profiles using variable sample size schemes

ABSTRACT

Profile monitoring is one of the new research areas in statistical process control. Most of the control charts in this area are designed with fixed sampling rate which makes the control chart slow in detecting small to moderate shifts. In order to improve the performance of the conventional fixed control charts, adaptive features are proposed in which, one or more design parameters vary during the process. In this paper the variable sample size feature of EWMA₃ and MEWMA schemes are proposed for monitoring simple linear profiles. The EWMA₃ method is based on the combination of three exponentially weighted moving average (EWMA) charts for monitoring three parameters of a simple linear profile separately and the Multivariate EWMA (MEWMA) chart is based on the using a single chart to monitor the coefficients and variance of a general linear profile. Also a two-sided control chart is proposed for monitoring the standard deviation in the EWMA₃ method. The performance of the proposed charts is compared in terms of the average time to signal. Numerical examples show that using adaptive features increase the power of control charts in detecting the parameter shifts. Finally, the performance of the proposed variable sample size schemes is illustrated through a real case in the leather industry.     

Runs rules schemes for monitoring process variability

To increase the sensitivity of Shewhart control charts in detecting small process shifts sensitizing rules based on runs and scans are often used in practice. Shewhart control charts supplemented with runs rules for detecting shifts in process variance have not received as much attention as their counterparts for detecting shifts in process mean. In this article, we examine the performance of simple runs rules schemes for monitoring increases and/or decreases in process variance based on the sample standard deviation. We introduce one-sided S charts that overcome the weakness of high false-alarm rates when runs rules are added to a Shewhart control chart. The average run length performance and design aspects of the charts are studied thoroughly. The performance of associated two-sided control schemes is investigated as well.     

Double sampling |S| control chart with variable sample size and variable sampling interval

This study presents a control chart for monitoring shifts in the covariance matrix of a multivariate normally distributed process. This chart combines the double sampling, variable sample size and variable sampling interval features, and is called the DSVSSI |S| chart. A Markov chain approach is developed to design the DSVSSI |S| chart, by minimizing the average time to signal (ATS), for a specified shift size in the covariance matrix. The DSVSSI |S| chart has a better ATS performance compared to other existing charts. An example is given to illustrate the operation of the DSVSSI |S| chart.     

Combined synthetic and |S| chart for monitoring process dispersion

This article proposes a multivariate control chart, the syn-|S| chart, which comprises a standard |S| subchart and a multivariate synthetic sample generalized variance |S| (synthetic |S|) subchart, for detecting shifts in the covariance matrix of a multivariate normally distributed process. A procedure for the optimal design of the syn-|S| chart by minimizing the average extra quadratic loss is provided. The syn-|S| chart has better overall performance compared to the synthetic |S| chart and the standard |S| chart, based on the zero-state and steady-state modes. An example is given to illustrate the operation of the synthetic |S| chart.     

Hotelling’s T2 control chart with double warning lines

Recent studies have shown that the T ² control chart with variable sampling intervals (VSI) and/or variable sample sizes (VSS) detects process shifts faster than the traditional T ² chart. This article extends these studies for processes that are monitored with VSI and VSS using double warning lines (T ² —DWL). It is assumed that the length of time the process remains in control has exponential distribution. The properties of T ² —DWL chart are obtained using Markov chains. The results show that the T ² —DWL chart is quicker than VSI and/or VSS charts in detecting almost all shifts in the process mean.     

Multivariate EWMA Control Chart with Adaptive Sample Sizes

Standard multivariate control charts usually employ fixed sample sizes at equal sampling intervals to monitor a process. In this study, a multivariate exponential weighted moving average (MEWMA) chart with adaptive sample sizes is investigated. Performance measure of the adaptive-sample-size MEWMA chart is obtained through a Markov chain approach. The performance of the adaptive-sample-size MEWMA chart is compared with the fixed-sample-size control chart in terms of steady-state average run length for different magnitude of shifts in the process mean. It is shown that the adaptive-sample-size chart is more efficient than the fixed-sample-size MEWMA control chart in detecting shifts in the process mean.     

Economic and economic statistical design of T 2 control chart with two adaptive sample sizes

The Hotelling's T ² control chart, a direct analogue of the univariate Shewhart X¯ chart, is perhaps the most commonly used tool in industry for simultaneous monitoring of several quality characteristics. Recent studies have shown that using variable sampling size (VSS) schemes results in charts with more statistical power when detecting small to moderate shifts in the process mean vector. In this paper, we build a cost model of a VSS T ² control chart for the economic and economic statistical design using the general model of Lorenzen and Vance [The economic design of control charts: A unified approach, Technometrics 28 (1986), pp. 3–11]. We optimize this model using a genetic algorithm approach. We also study the effects of the costs and operating parameters on the VSS T ² parameters, and show, through an example, the advantage of economic design over statistical design for VSS T ² charts, and measure the economic advantage of VSS sampling versus fixed sample size sampling.     

Optimal design of the variable sampling size and sampling interval variable dimension T2 control chart for monitoring the mean vector of a multivariate normal process

This paper develops the algorithm for the optimization designs of the adaptive T² Control Chart for Monitoring the Mean Vector of a Multivariate Normal Process. It includes the variable sample size, variable sampling interval and variable dimensional chart. The VDT² control chart performs well for moderate and large shifts in the mean vector. However, its performance for small shifts is poor. To improve the chart's performance in detecting such shifts, we propose the application of the variable sample size and sampling interval technique to the VDT² control chart, resulting in the VSSIVDT² control chart.     

Monitoring Nonlinear Profiles with Random Effects by Nonparametric Regression

The monitoring of process/product profiles is presently a growing and promising area of research in statistical process control. This study is aimed at developing monitoring schemes for nonlinear profiles with random effects. We utilize the technique of principal components analysis to analyze the covariance structure of the profiles and propose monitoring schemes based on principal component (PC) scores. The number of the PC scores used in constructing control charts is crucial to the detecting power. In the Phase I analysis of historical data, due to the dependency of the PC-scores, we adopt the usual Hotelling T ² chart to check the stability. For Phase II monitoring, we study individual PC-score control charts, a combined chart scheme that combines all the PC-score charts, and a T ² chart. Although an individual PC-score chart may be perfect for monitoring a particular mode of variation, a chart that can detect general shifts, such as the T ² chart and the combined chart scheme, is more feasible in practice. The performances of the schemes under study are evaluated in terms of the average run length.     

A statistically adaptive sampling policy to the Hotelling's T2 control chart: Markov chain approach

ABSTRACT

We present an alternative sampling scheme for the Hotelling's T² control chart with variable parameters (VP T²) which allows the sampling interval h, the sample size n, and control limit k to vary between minimum and maximum values while keeping the warning line fixed over time. Our method uses only one measurement scale to overcome the difficulties of using two scales in practice. Later, we demonstrate the merits of the method in terms of its performance in detecting small-to-moderate shifts and its ease of application.     

The Design of the Multivariate Synthetic Exponentially Weighted Moving Average Control Chart

A multivariate synthetic exponentially weighted moving average (MSEWMA) control chart is presented in this study. The MSEWMA control chart consists of a multivariate exponentially weighted moving average (MEWMA) control chart and a conforming run length control chart. The average run length of the MSEWMA control chart is obtained using a Markov chain approach. From the numerical comparisons, it is shown that the MSEWMA control chart is more efficient than the multivariate synthetic T ² control chart and the MEWMA control chart for detecting shifts in the process mean vector.