Likelihood ratio-based distribution-free sequential change-point detection

Most existing control charts are for monitoring location or scale parameters, rather than any change in process distribution such as shift in shape. Goodness-of-fit (GOF) test can detect any change in distribution. This paper develops a new distribution-free control chart by integrating a powerful two-sample nonparametric likelihood ratio GOF test into the effective change-point model. Our proposed chart is easy in computation, convenient to use, and very efficient in detecting any change in process distribution, including shifts in location, scale, and shape. It is also robust in detecting various magnitudes of shifts and especially powerful in monitoring any distributional change involving a decrease in scale.     

Double-sampling control charts for attributes

In this article, we propose a double-sampling (DS) np control chart. We assume that the time interval between samples is fixed. The choice of the design parameters of the proposed chart and also comparisons between charts are based on statistical properties, such as the average number of samples until a signal. The optimal design parameters of the proposed control chart are obtained. During the optimization procedure, constraints are imposed on the in-control average sample size and on the in-control average run length. In this way, required statistical properties can be assured. Varying some input parameters, the proposed DS np chart is compared with the single-sampling np chart, variable sample size np chart, CUSUM np and EWMA np charts. The comparisons are carried out considering the optimal design for each chart. For the ranges of parameters considered, the DS scheme is the fastest one for the detection of increases of 100% or more in the fraction non-conforming and, moreover, the DS np chart is easy to operate.     

An optimal design of CUSUM control charts for binomial counts

The Shewhart p-chart or np-chart is commonly used for monitoring the counts of non-conforming items which are usually well modelled by a binomial distribution with parameters n and p where n is the number of items inspected each time and p is the process fraction of non-conforming items produced. It is well known that the Shewhart chart is not sensitive to small shifts in p. The cumulative sum (CUSUM) chart is a far more powerful charting procedure for detecting small shifts in p and only marginally less powerful in detecting large shifts in p. The choice of chart parameters of a Shewhart chart is well documented in the quality control literature. On the other hand, very little has been done for the more powerful CUSUM chart, possibly due to the fact that the run length distribution of a CUSUM chart is much harder to compute. An optimal design strategy is given here which allows the chart parameters of an optimal CUSUM chart to be determined easily. Optimal choice of n and the relationship between the CUSUM chart and the sequential probability ratio test are also investigated.     

Optimal Statistical Design of a Multivariate EWMA Chart Based on ARL and MRL

Statistical design is applied to a multivariate exponentially weighted moving average (MEWMA) control chart. The chart parameters are control limit H and smoothing constant r. The choices of the parameters depend on the number of variables p and the size of the process mean shift δ. The MEWMA statistic is modeled as a Markov chain and the Markov chain approach is used to determine the properties of the chart. Although average run length has become a traditional measure of the performance of control schemes, some authors have suggested other measures, such as median and other percentiles of the run length distribution to explain run length properties of a control scheme. This will allow a thorough study of the performance of the control scheme. Consequently, conclusions based on these measures would provide a better and comprehensive understanding of a scheme. In this article, we present the performance of the MEWMA control chart as measured by the average run length and median run length. Graphs are given so that the chart parameters of an optimal MEWMA chart can be determined easily.     

A Semi‐empirical Bayesian Chart to Monitor Weibull Percentiles

This paper develops a Bayesian control chart for the percentiles of the Weibull distribution, when both its in‐control and out‐of‐control parameters are unknown. The Bayesian approach enhances parameter estimates for small sample sizes that occur when monitoring rare events such as in high‐reliability applications. The chart monitors the parameters of the Weibull distribution directly, instead of transforming the data as most Weibull‐based charts do in order to meet normality assumption. The chart uses accumulated knowledge resulting from the likelihood of the current sample combined with the information given by both the initial prior knowledge and all the past samples. The chart is adapting because its control limits change (e.g. narrow) during Phase I. An example is presented and good average run length properties are demonstrated.     

The effect of Phase I sample size on the run length performance of control charts for autocorrelated data

Traditional control charts assume independence of observations obtained from the monitored process. However, if the observations are autocorrelated, these charts often do not perform as intended by the design requirements. Recently, several control charts have been proposed to deal with autocorrelated observations. The residual chart, modified Shewhart chart, EWMAST chart, and ARMA chart are such charts widely used for monitoring the occurrence of assignable causes in a process when the process exhibits inherent autocorrelation. Besides autocorrelation, one other issue is the unknown values of true process parameters to be used in the control chart design, which are often estimated from a reference sample of in-control observations. Performances of the above-mentioned control charts for autocorrelated processes are significantly affected by the sample size used in a Phase I study to estimate the control chart parameters. In this study, we investigate the effect of Phase I sample size on the run length performance of these four charts for monitoring the changes in the mean of an autocorrelated process, namely an AR(1) process. A discussion of the practical implications of the results and suggestions on the sample size requirements for effective process monitoring are provided.     

Design of an attribute np control chart for process monitoring based on repetitive group sampling under truncated life tests

In this paper, an attribute control chart under repetitive group sampling is designed for monitoring the production process where the lifetime of the product is considered as quality of the product. We assume that the lifetime follows the Pareto distribution of second kind with known shape parameter. The performance of the proposed chart is evaluated by average run length. The control limits coefficients as well as the repetitive group sampling parameter such as sample size are determined such that the in-control average run length is as close as to the specified average run length. Out-of-control average run length is also reported for different shift constants with corresponding optimal parameters. In addition, performance of proposed control chart is compared with the performance of existing chart. An economical designing of proposed control chart is also discussed.     

Continuous single attribute control chart for Markov-dependent processes

Most of the times, the observations related to the quality characteristic of a process do not need to be independent. In such cases, control charts based on the assumption of independence of the observations are not appropriate. When the characteristic under study is qualitative, Markov model serves as a simple model to account for the dependency of the observations. For this purpose, we develop an attribute control chart under 100% inspection for a Markov dependent process by controlling the error probabilities. This chart consists of two sub-charts. For a given sample, depending upon the state of the last observation of previous sample (if any), one of these two will be used. Optimal values of the design parameters of the control chart are obtained. Chart’s performance is studied by using its capability (probability) of detecting a shift in process parameters.     

Likelihood ratio test-based chart for monitoring the process variability

This article proposes a new chart with the generalized likelihood ratio (GLR) test statistics for monitoring the process variance of a normally distributed process. The new chart can be easily designed and constructed and the computation results show that it provides quite a satisfactory performance, including the detection of the decrease in the variance and the individual observation at the sampling point which are very important in many practical applications. Average run length (ARL) comparisons between other procedures and the new chart are presented. The optimal parameters that can be used as a design aid in selecting specific parameter values based on the ARL are described. The application of our proposed method is illustrated by a real data example from chemical process control.     

A Robust Control Chart for Monitoring the Mean of an Autocorrelated Process

Residual control charts are frequently used for monitoring autocorrelated processes. In the design of a residual control chart, values of the true process parameters are often estimated from a reference sample of in-control observations by using least squares (LS) estimators. We propose a robust control chart for autocorrelated data by using Modified Maximum Likelihood (MML) estimators in constructing a residual control chart. Average run length (ARL) is simulated for the proposed chart when the underlying process is AR(1). The results show the superiority of the new chart under several situations. Moreover, the chart is robust to plausible deviations from assumed distribution of errors.     

Monitoring Variability and Analyzing Multivariate Autocorrelated Processes

Traditional multivariate quality control charts are based on independent observations. In this paper, we explain how to extend univariate residual charts to multivariate cases and how to combine the traditional statistical process control (SPC) approaches to monitor changes in process variability in a dynamic environment. We propose using Alt's (1984) W chart on vector autoregressive (VAR) residuals to monitor the variability for multivariate processes in the presence of autocorrelation. We study examples jointly using the Hotelling T² chart on VAR residuals, the W chart, and the Portmanteau test to diagnose the types of shift in process parameters.     

Monitoring paper production using a spectral control chart designed to detect in the presence of multiple cycles

In this paper we introduce a spectral control chart that is designed to detect the onset of cyclic behaviour in a process, even in the presence of multiple cycles. This new spectral control chart is based on the periodogram test proposed by Bølviken (1983a, b). While no more difficult to implement than the traditional spectral control based on Fisher's test statistic, this new control chart shows improvement in detecting the presence of compound periodicity, which the chart based on Fisher's test is not designed to handle. This is assessed using Monte Carlo simulations to estimate and compare the average run lengths of several spectral control charts. In addition, the spectral control charts are applied to paper production data, published by Pandit & Wu (1993), in which the stock flow and paper thickness are monitored. The application of the new spectral control chart to the stock flow process detects out-of-control behaviour that is not found using standard control charts. This behaviour, in turn, appears to be related to out-of-control behaviour that is observed in the paper thickness measurements later in the production process.     

A control chart for monitoring process variation using multiple dependent state sampling

A control chart for monitoring process variation by using multiple dependent state (MDS) sampling is constructed in the present article. The operational formulas for in-control and out-of-control average run lengths (ARLs) are derived. Control constants are established by considering the target in-control ARL at a normal process. The extensive ARL tables are reported for various parameters and shifted values of process parameters. The performance of the proposed control chart has been evaluated with several existing charts in regard of ARLs, which empowered the presented chart and proved far better for timely detection of assignable causes. The application of the proposed concept is illustrated with a real-life industrial example and a simulation-based study to elaborate strength of the proposed chart over the existing concepts.     

A CUSUM control chart for monitoring the variance when parameters are estimated

CUSUM control chart has been widely used for monitoring the process variance. It is usually used assuming that the nominal process variance is known. However, several researchers have shown that the ability of control charts to signal when a process is out of control is seriously affected unless process parameters are estimated from a large in-control Phase I data set. In this paper we derive the run length properties of a CUSUM chart for monitoring dispersion with estimated process variance and we evaluate the performance of this chart by comparing it with the same chart but with assumed known process parameters.     

Globally applicable control chart for online monitoring of stability of process mean

The shape features of run chart patterns of the most recent m observations arising from stable and unstable processes are different. Using this fact, a new monitoring statistic is defined whose value for given m depends on the pattern parameters but not on the process parameters. A control chart for this statistic for given m, therefore, will be globally applicable to normal processes. The simulation study reveals that the proposed statistic approximately follows normal distribution. The performances of the globally applicable control chart in terms of average run lengths (ARLs) are evaluated and compared with the X chart. Both in-control ARL and out-of-control ARLs with respect to different abnormal process conditions are found to be larger than the X chart. However, the proposed concept is promising because it can eliminate the burden of designing separate control charts for different quality characteristics or processes in a manufacturing set-up.     

Conditional design of the CUSUM median chart for the process position when process parameters are unknown

In practice, different practitioners will use different Phase I samples to estimate the process parameters, which will lead to different Phase II control chart's performance. Researches refer to this variability as between-practitioners-variability of control charts. Since between-practitioners-variability is important in the design of the CUSUM median chart with estimated process parameters, the standard deviation of average run length (SDARL) will be used to study its properties. It is shown that the CUSUM median chart requires a larger amount of Phase I samples to sufficiently reduce the variation in the in-control ARL of the CUSUM median chart. Considering the limitation of the amount of the Phase I samples, a bootstrap approach is also used here to adjust the control limits of the CUSUM median chart. Comparisons are made for the CUSUM and Shewhart median charts with estimated parameters when using the adjusted- and unadjusted control limits and some conclusions are made.     

A new economic scheme for CCC charts with run rules based on average number of inspected items

New statistical techniques and procedures have been developed to control high-yield processes along with looking for process improvement opportunities and minimizing production cost. Cumulative count of conforming control chart is generally a technique for high-quality processes, when nonconforming items are rarely produced. The objective of this study is to design control chart based on cumulative count of conforming items and run rules that develops an economic model based on the average number of inspected items to design m-of-m CCC chart in order to facilitate minimum average cost per item produced. The optimal design parameters for different values of nonconforming fraction and different cost parameters in each scenario are determined. Finally, to analyze the behavior of optimal economic solutions, sensitivity analysis of the model parameters is performed.     

The economic design of multivariate binomial EWMA VSSI control charts

Since multi-attribute control charts have received little attention compared with multivariate variable control charts, this research is concerned with developing a new methodology to employ the multivariate exponentially weighted moving average (MEWMA) charts for m-attribute binomial processes; the attributes being the number of nonconforming items. Moreover, since the variable sample size and sampling interval (VSSI) MEWMA charts detect small process mean shifts faster than the traditional MEWMA, an economic design of the VSSI MEWMA chart is proposed to obtain the optimum design parameters of the chart. The sample size, the sampling interval, and the warning/action limit coefficients are obtained using a genetic algorithm such that the expected total cost per hour is minimized. At the end, a sensitivity analysis has been carried out to investigate the effects of the cost and the model parameters on the solution of the economic design of the VSSI MEWMA chart.     

Short run spc based upon the second order dynamic linear model for trend detection

Recently, several new applications of control chart procedures for short production runs have been introduced. Bothe (1989) and Burr (1989) proposed the use of control chart statistics which are obtained by scaling the quality characteristic by target values or process estimates of a location and scale parameter. The performance of these control charts can be significantly affected by the use of incorrect scaling parameters, resulting in either an excessive "false alarm rate," or insensitivity to the detection of moderate shifts in the process. To correct for these deficiencies, Quesenberry (1990, 1991) has developed the Q-Chart which is formed from running process estimates of the sample mean and variance. For the case where both the process mean and variance are unknown, the Q-chaxt statistic is formed from the standard inverse Z-transformation of a t-statistic. Q-charts do not perform correctly, however, in the presence of special cause disturbances at process startup. This has recently been supported by results published by Del Castillo and Montgomery (1992), who recommend the use of an alternative control chart procedure which is based upon a first-order adaptive Kalman filter model Consistent with the recommendations by Castillo and Montgomery, we propose an alternative short run control chart procedure which is based upon the second order dynamic linear model (DLM). The control chart is shown to be useful for the early detection of unwanted process trends. Model and control chart parameters are updated sequentially in a Bayesian estimation framework, providing the greatest degree of flexibility in the level of prior information which is incorporated into the model. The result is a weighted moving average control chart statistic which can be used to provide running estimates of process capability. The average run length performance of the control chart is compared to the optimal performance of the exponentially weighted moving average (EWMA) chart, as reported by Gan (1991). Using a simulation approach, the second order DLM control chart is shown to provide better overall performance than the EWMA for short production run applications