A binomial CUSUM chart for detecting large shifts in fraction nonconforming

This article studies a unique feature of the binomial CUSUM chart in which the difference (d _t ?d ₀) is replaced by (d _t ?d ₀)² in the formulation of the cumulative sum C _t (where d _t and d ₀ are the actual and in-control numbers of nonconforming units, respectively, in a sample). Performance studies are reported and the results reveal that this new feature is able to increase the detection effectiveness when fraction nonconforming p becomes three to four times as large as the in-control value p ₀. The design of the new binomial CUSUM chart is presented along with the calculation of the in-control and out-of-control Average Run Lengths (ARL₀ and ARL₁).     

A single-featured EWMA-X control chart for detecting shifts in process mean and standard deviation

The combined EWMA-X chart is a commonly used tool for monitoring both large and small process shifts. However, this chart requires calculating and monitoring two statistics along with two sets of control limits. Thus, this study develops a single-featured EWMA-X (called SFEWMA-X) control chart which has the ability to simultaneously monitor both large and small process shifts using only one set of statistic and control limits. The proposed SFEWMA-X chart is further extended to monitoring the shifts in process standard deviation. A set of simulated data are used to demonstrate the proposed chart's superior performance in terms of average run length compared with that of the traditional charts. The experimental examples also show that the SFEWMA-X chart is neater and easier to visually interpret than the original EWMA-X chart.     

Performance of the zone control chart

Average run lengths of the zone control chart are presented, The performance of this chart is compared with that of several Shewhart charts with and without runs rules, It is shown that the standard zone control chart has performance similar to some even simpler charts and a much higher false alarm rate than the Shewhart chart with all of the common runs rules. It is also shown that a slightly modified zone control chart outperforms the Shewhart chart with the common runs rules.     

CUSUM chart for detecting range shifts when monotonicity of likelihood ratio is invalid

It is often encountered in the literature that the log-likelihood ratios (LLR) of some distributions (e.g. the student t distribution) are not monotonic. Existing charts for monitoring such processes may suffer from the fact that the average run length (ARL) curve is a discontinuous function of control limit. It implies that some pre-specified in-control (IC) ARLs of these charts may not be reached. To guarantee the false alarm rate of a control chart lower than the nominal level, a larger IC ARL is usually suggested in the literature. However, the large IC ARL may weaken the performance of a control chart when the process is out-of-control (OC), compared with a just right IC ARL. To overcome it, we adjust the LLR to be a monotonic one in this paper. Based on it, a multiple CUSUM chart is developed to detect range shifts in IC distribution. Theoretical result in this paper ensures the continuity of its ARL curve. Numerical results show our proposed chart performs well under the range shifts, especially under the large shifts. In the end, a real data example is utilized to illustrate our proposed chart.     

Development of a multiattribute synthetic-np chart

Over the last few decades, multiattribute control charts have been widely recommended in practice. They outperform the simultaneous uniattribute charts for monitoring multiattribute processes in many applications. Jolayemi [A statistical model for the design of multiattribute control charts. Indian J Stat. 1999;61:351–365] developed a statistical model for the design of a multiattribute np (Mnp) chart. Based on this model, a multiattribute synthetic (MSyn) chart is proposed in this article. Furthermore, the main features of the MSyn chart and Mnp chart are integrated to build a multiattribute Syn-np (MSyn-np) chart. The results of the comparative studies indicate that the new MSyn-np chart significantly outperforms the Mnp chart and MSyn chart by 83% and 27%, respectively, in terms of the average number of defectives over a wide range of process shifts under different circumstances.     

A new synthetic control chart for monitoring process mean using auxiliary information

ABSTRACT

Quality control charts have been widely recognized as a potentially powerful statistical process monitoring tool in statistical process control because of their superior ability in detecting shifts in the process parameters. Recently, auxiliary-information-based control charts have been proposed and shown to have excellent speed in detecting process shifts than those based without it. In this paper, we design a new synthetic control chart that is based on a statistic that utilizes information from both the study and auxiliary variables. The proposed synthetic chart encompasses the classical synthetic chart. The construction, optimal design, run length profiles, and the performance evaluation of the new chart are discussed in detail. It turns out that the proposed synthetic chart performs uniformly better than the classical synthetic chart when detecting different kinds of shifts in the process mean under both zero-state and steady-state run length performances. Moreover, with reasonable assumptions, the proposed chart also surpasses the exponentially weighted moving average control chart. An application with a simulated data set is also presented to explain the implementation of the proposed control chart.     

Improving the performance of the zone control chart

A general model for the zone control chart is presented. Using this model, it is shown that there are score vectors for zone control charts which result in superior average run length performance in comparison to Shewhart charts with common runs rules.

A fast initial response (FIR) feature for the zone control chart is also proposed. Average run lengths of the zone control chart with this feature are calculated. It is shown that the FIR feature improves zone control chart performance by providing significantly earlier signals when the process is out of control.     

A rational sequential probability ratio test control chart for monitoring process shifts in mean and variance

The sequential probability ratio test (SPRT) chart is a very effective tool for monitoring manufacturing processes. This paper proposes a rational SPRT chart to monitor both process mean and variance. This SPRT chart determines the sampling interval d based on the rational subgroup concept according to the process conditions and administrative considerations. Since the rational subgrouping is widely adopted in the design and implementation of control charts, the studies of the rational SPRT have a practical significance. The rational SPRT chart is designed optimally in order to minimize the index average extra quadratic loss for the best overall performance. A systematic performance study has also been conducted. From an overall viewpoint, the rational SPRT chart is more effective than the cumulative sum chart by more than 63%. Furthermore, this article provides a design table, which contains the optimal values of the parameters of the rational SPRT charts for different specifications. This will greatly facilitate the potential users to select an appropriate SPRT chart for their applications. The users can also justify the application of the rational SPRT chart according to the achievable enhancement in detection effectiveness.     

A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection

Abstract

In this paper, a synthetic control chart is proposed by integrating the salient features of the np_x chart and the CRL chart. The synthetic chart achieves higher detection effectiveness on both small and large mean shifts while retaining the operational simplicity of the attribute charts owing to only using attribute inspection. Both statistical and economic design of the synthetic chart are considered and numerical tests have indicated that the synthetic chart has a higher power for detecting mean shifts than the np_x chart, MON chart and CUSUM chart. In addition, sensitivity analyses are also performed under both the statistical and economic design model.     

Parameter estimation and design considerations in prospective applications of the � chart

The effects of parameter estimation on the in-control performance of the Shewhart X¯ chart are studied in prospective (phase 2 or stage 2) applications via a thorough examination of the attained false alarm rate (AFAR), the conditional false alarm rate (CFAR), the conditional and the unconditional run-length distributions, some run-length characteristics such as the ARL, the conditional ARL (CARL), some selected percentiles including the median, and cumulative run-length probabilities. The examination involves both numerical evaluations and graphical displays. The effects of parameter estimation need to be accounted for in designing the chart. To this end, as an application of the exact formulations, chart constants are provided for a specified in-control average run-length of 370 and 500 for a number of subgroups and subgroup sizes. These will be useful in the implementation of the X¯ chart in practice.     

Economic design of non parametric sign control chart

An economic design of sign chart to control the median is proposed. Since the sign chart is distribution free, it can easily be applied to any process without prior knowledge of process quality distribution. The effect on loss cost observed for different shifts in location shows that the sign chart performs better for large shifts. The economic statistical performance study reveals that statistical performance of sign chart can be improved sufficiently for moderate shifts in the process. Sensitivity study shows that design is more sensitive for change in values of penalty loss cost and time required for search and repair of an assignable cause.     

A new multivariate CUSUM chart using principal components with a revision of Crosier's chart

In this article, we introduce a new multivariate cumulative sum chart, where the target mean shift is assumed to be a weighted sum of principal directions of the population covariance matrix. This chart provides an attractive performance in terms of average run length (ARL) for large-dimensional data and it also compares favorably to existing multivariate charts including Crosier's benchmark chart with updated values of the upper control limit and the associated ARL function. In addition, Monte Carlo simulations are conducted to assess the accuracy of the well-known Siegmund's approximation of the average ARL function when observations are normal distributed. As a byproduct of the article, we provide updated values of upper control limits and the associated ARL function for Crosier's multivariate CUSUM chart.     

An EWMA chart for monitoring process mean

In the statistical process control literature, there exists several improved quality control charts based on cost-effective sampling schemes, including the ranked set sampling (RSS) and median RSS (MRSS). A generalized cost-effective RSS scheme has been recently introduced for efficiently estimating the population mean, namely varied L RSS (VLRSS). In this article, we propose a new exponentially weighted moving average (EWMA) control chart for monitoring the process mean using VLRSS, named the EWMA-VLRSS chart, under both perfect and imperfect rankings. The EWMA-VLRSS chart encompasses the existing EWMA charts based on RSS and MRSS (named the EWMA-RSS and EWMA-MRSS charts). We use extensive Monte Carlo simulations to compute the run length characteristics of the EWMA-VLRSS chart. The proposed chart is then compared with the existing EWMA charts. It is found that, with either perfect or imperfect rankings, the EWMA-VLRSS chart is more sensitive than the EWMA-RSS and EWMA-MRSS charts in detecting small to large shifts in the process mean. A real dataset is also used to explain the working of the EWMA-VLRSS chart.     

Economic design based on a multivariate Bayesian VSI chart with a dual control limit

In this paper, a multivariate Bayesian variable sampling interval (VSI) control chart for the economic design and optimization of statistical parameters is designed. Based on the VSI sampling strategy of a multivariate Bayesian control chart with dual control limits, the optimal expected cost function is constructed. The proposed model allows the determination of the scheme parameters that minimize the expected cost per time of the process. The effectiveness of the Bayesian VSI chart is estimated through economic comparisons with the Bayesian fixed sampling interval and the Hotelling's T² chart. This study is an in-depth study on a Bayesian multivariate control chart with variable parameter. Furthermore, it is shown that significant cost improvement may be realized through the new model.     

A new S2 control chart using repetitive sampling

A new S² control chart is presented for monitoring the process variance by utilizing a repetitive sampling scheme. The double control limits called inner and outer control limits are proposed, whose coefficients are determined by considering the average run length (ARL) and the average sample number when the process is in control. The proposed control chart is compared with the existing Shewhart S² control chart in terms of the ARLs. The result shows that the proposed control chart is more efficient than the existing control chart in detecting the process shift.     

A distribution-free multivariate CUSUM control chart using dynamic control limits

In modern quality control, it is becoming common to simultaneously monitor several quality characteristics of a process with rapid evolving data-acquisition technology. When the multivariate process distribution is unknown and only a set of in-control data is available, the bootstrap technique can be used to adjust the constant limit of the multivariate cumulative sum (MCUSUM) control chart. To further improve the performance of the control chart, we extend the constant control limit to a sequence of dynamic control limits which are determined by the conditional distribution of the charting statistics given the sprint length. Simulation results show that the novel control chart with dynamic control limits offers a better ARL performance, compared with the traditional MCUSUM control chart. Despite it, the proposed control chart is considerably computer-intensive. This leads to the development of a more flexible control chart which uses a continuous function of the sprint length as the control limit sequences. More importantly, the control chart is easy to implement and can reduce the computational time significantly. A white wine data illustrates that the novel control chart performs quite well in applications.     

A side sensitive modified group runs control chart to detect shifts in the process mean

Gadre and Rattihalli [5 Gadre, M. P. and Rattihalli, R. N. 2006. Modified group runs control charts to detect increases in fraction non-conforming and shifts in the process mean. Commun. Stat. Simul. Comput., 35: 225–240. [Taylor & Francis Online], [Web of Science ®] [Google Scholar]] have introduced the Modified Group Runs (MGR) control chart to identify the increases in fraction non-conforming and to detect shifts in the process mean. The MGR chart reduces the out-of-control average time-to-signal (ATS), as compared with most of the well-known control charts. In this article, we develop the Side Sensitive Modified Group Runs (SSMGR) chart to detect shifts in the process mean. With the help of numerical examples, it is illustrated that the SSMGR chart performs better than the Shewhart's X¯ chart, the synthetic chart [12 Wu, Z. and Spedding, T. A. 2000. A synthetic control chart for detecting small shifts in the process mean. J. Qual. Technol., 32: 32–38. [Taylor & Francis Online], [Web of Science ®] [Google Scholar]], the Group Runs chart [4 Gadre, M. P. and Rattihalli, R. N. 2004. A group runs control chart for detecting shifts in the process mean. Econ. Qual. Control, 19: 29–43. [Crossref] [Google Scholar]], the Side Sensitive Group Runs chart [6 Gadre, M. P. and Rattihalli, R. N. 2007. A side sensitive group runs control chart for detecting shifts in the process mean. Stat. Methods Appl., 16: 27–37. [Crossref], [Web of Science ®] [Google Scholar]], as well as the MGR chart [5 Gadre, M. P. and Rattihalli, R. N. 2006. Modified group runs control charts to detect increases in fraction non-conforming and shifts in the process mean. Commun. Stat. Simul. Comput., 35: 225–240. [Taylor & Francis Online], [Web of Science ®] [Google Scholar]]. In some situations it is also superior to the Cumulative Sum chart p9 Page, E. S. 1954. Continuous inspection schemes. Biometrika, 41: 100–114. [Crossref], [Web of Science ®] [Google Scholar]] and the exponentially weighed moving average chart [10 Roberts, S. W. 1959. Control chart tests based on geometric moving averages. Technometrics, 1: 239–250. [Taylor & Francis Online] [Google Scholar]]. In the steady state also, its performance is better than the above charts.     

The robust economic statistical design of the Hotelling's T2 chart

ABSTRACT

Economic statistical designs aim at minimizing the cost of process monitoring when a specific scenario or a set of estimated process and cost parameters is given. But, in practice the process may be affected by more than one scenario which may lead to severe cost penalties if the wrong design is used. Here, we investigate the robust economic statistical design (RESD) of the T² chart in an attempt to reduce these cost penalties when there are multiple scenarios. Our method is to employ the genetic algorithm (GA) optimization method to minimize the total expected monitoring cost across all distinct scenarios. We illustrate the effectiveness of the method using two numerical examples. Simulation studies indicate that robust economic statistical designs should be encouraged in practice.     

A new nonparametric synthetic EWMA control chart for monitoring process mean

The exponentially weighted moving average (EWMA) control charts are widely used in chemical and process industries because of their excellent speed in catching small to moderate shifts in the process target. In usual practice, many data come from a process where the monitoring statistic is non-normally distributed or it follows an unknown probability distribution. This necessitates the use of distribution-free/nonparametric control charts for monitoring the deviations from the process target. In this paper, we integrate the existing EWMA sign chart with the conforming run length chart to propose a new synthetic EWMA (SynEWMA) sign chart for monitoring the process mean. The SynEWMA sign chart encompasses the synthetic sign and EWMA sign charts. Monte Carlo simulations are used to compute the run length profiles of the SynEWMA sign chart. Based on a comprehensive comparison, it turns out that the SynEWMA sign chart is able to perform substantially better than the existing EWMA sign chart. Both real and simulated data sets are used to explain the working and implementation of existing and proposed control charts.     

Ewma control chart under linear drift

An accurate numerical procedure is presented for computing the average run length (ARL) of an exponentially weighted moving average (EWMA) chart under a linear drift in the process mean. The performance of an EWMA chart is then evaluated under a linear drift in the mean. In processes where gradual linear drifts rather than abrupt changes in the mean model the shifts in the mean more accurately, an evaluation of the performance of an EWMA chart under a linear drift is more appropriate. Tables of optimal smoothing parameters and control chart limits are given which make the design of EWMA charts easy.