Synthetic double sampling s chart

This study proposes a synthetic double sampling s chart that integrates the double sampling (DS) s chart and the conforming run length chart. An optimization procedure is proposed to compute the optimal parameters of the synthetic DS s chart. The performance of the synthetic DS s chart is compared with other existing control charts for monitoring process standard deviation. The results show that the synthetic DS s chart is more effective for detecting increases in the process standard deviation for a wide range of shifts. An example is provided to illustrate the operation procedure of the synthetic DS s chart.     

Improved R and s control charts for monitoring the process variance

The Shewhart R control chart and s control chart are widely used to monitor shifts in the process spread. One fact is that the distributions of the range and sample standard deviation are highly skewed. Therefore, the R chart and s chart neither provide an in-control average run length (ARL) of approximately 370 nor guarantee the desired type I error of 0.0027. Another disadvantage of these two charts is their failure in detecting an improvement in the process variability. In order to overcome these shortcomings, we propose the improved R chart (IRC) and s chart (ISC) with accurate approximation of the control limits by using cumulative distribution functions of the sample range and standard deviation. Simulation studies show that the IRC and ISC perform very well. We also compare the type II error risks and ARLs of the IRC and ISC and found that the s chart is generally more efficient than the R chart. Examples are given to illustrate the use of the developed charts.     

Runs rules schemes for monitoring process variability

To increase the sensitivity of Shewhart control charts in detecting small process shifts sensitizing rules based on runs and scans are often used in practice. Shewhart control charts supplemented with runs rules for detecting shifts in process variance have not received as much attention as their counterparts for detecting shifts in process mean. In this article, we examine the performance of simple runs rules schemes for monitoring increases and/or decreases in process variance based on the sample standard deviation. We introduce one-sided S charts that overcome the weakness of high false-alarm rates when runs rules are added to a Shewhart control chart. The average run length performance and design aspects of the charts are studied thoroughly. The performance of associated two-sided control schemes is investigated as well.     

Robustness of the EWMA and the combined X¯–EWMA control charts with variable sampling intervals to non-normality

The exponentially weighted moving average (EWMA) control charts with variable sampling intervals (VSIs) have been shown to be substantially quicker than the fixed sampling intervals (FSI) EWMA control charts in detecting process mean shifts. The usual assumption for designing a control chart is that the data or measurements are normally distributed. However, this assumption may not be true for some processes. In the present paper, the performances of the EWMA and combined X¯–EWMA control charts with VSIs are evaluated under non-normality. It is shown that adding the VSI feature to the EWMA control charts results in very substantial decreases in the expected time to detect shifts in process mean under both normality and non-normality. However, the combined X¯–EWMA chart has its false alarm rate and its detection ability is affected if the process data are not normally distributed.     

Robustness to non-normality and autocorrelation of individuals control charts

This paper studies the effects of non-normality and autocorrelation on the performances of various individuals control charts for monitoring the process mean and/or variance. The traditional Shewhart X chart and moving range (MR) chart are investigated as well as several types of exponentially weighted moving average (EWMA) charts and combinations of control charts involving these EWMA charts. It is shown that the combination of the X and MR charts will not detect small and moderate parameter shifts as fast as combinations involving the EWMA charts, and that the performana of the X and MR charts is very sensitive to the normality assumption. It is also shown that certain combinations of EWMA charts can be designed to be robust to non-normality and very effective at detecting small and moderate shifts in the process mean and/or variance. Although autocorrelation can have a significant effect on the in-control performances of these combinations of EWMA charts, their relative out-of-control performances under independence are generally maintained for low to moderate levels of autocorrelation.     

Economic and economic statistical design of T 2 control chart with two adaptive sample sizes

The Hotelling's T ² control chart, a direct analogue of the univariate Shewhart X¯ chart, is perhaps the most commonly used tool in industry for simultaneous monitoring of several quality characteristics. Recent studies have shown that using variable sampling size (VSS) schemes results in charts with more statistical power when detecting small to moderate shifts in the process mean vector. In this paper, we build a cost model of a VSS T ² control chart for the economic and economic statistical design using the general model of Lorenzen and Vance [The economic design of control charts: A unified approach, Technometrics 28 (1986), pp. 3–11]. We optimize this model using a genetic algorithm approach. We also study the effects of the costs and operating parameters on the VSS T ² parameters, and show, through an example, the advantage of economic design over statistical design for VSS T ² charts, and measure the economic advantage of VSS sampling versus fixed sample size sampling.     

Estimation of multiple correlation coefficient when observations are missing on one of the variables

This paper proposes a control chart with variable sampling intervals (VSI) to detect increases in the expected value of the number of defects in a random sample of constant size n the upper one-sided c-VSI chart

The performance of this chart is evaluated by means of the average time to signal (ATS).The comparisons made between the standard FSI (fixed sampling intervals) and the VSI upper one-sided c - charts indicate that using variable sampling intervals can substantially reduce the average time to signal. Using stochastic ordering we prove that this reduction always occurs.

Special attention is given to the choice of the proposed control chart parameters and to the chart graphical display.     

Monitoring simple linear profiles using variable sample size schemes

ABSTRACT

Profile monitoring is one of the new research areas in statistical process control. Most of the control charts in this area are designed with fixed sampling rate which makes the control chart slow in detecting small to moderate shifts. In order to improve the performance of the conventional fixed control charts, adaptive features are proposed in which, one or more design parameters vary during the process. In this paper the variable sample size feature of EWMA₃ and MEWMA schemes are proposed for monitoring simple linear profiles. The EWMA₃ method is based on the combination of three exponentially weighted moving average (EWMA) charts for monitoring three parameters of a simple linear profile separately and the Multivariate EWMA (MEWMA) chart is based on the using a single chart to monitor the coefficients and variance of a general linear profile. Also a two-sided control chart is proposed for monitoring the standard deviation in the EWMA₃ method. The performance of the proposed charts is compared in terms of the average time to signal. Numerical examples show that using adaptive features increase the power of control charts in detecting the parameter shifts. Finally, the performance of the proposed variable sample size schemes is illustrated through a real case in the leather industry.     

Economic design of VSI X̄ control chart with correlated non-normal data under multiple assignable causes

It has been recently revealed that the Shewhart control charts with variable sampling interval (VSI) perform better than the traditional Shewhart chart with the fixed sampling interval in detecting shifts in the process. In most of these research works, the normality and independency of the process data or measurements are assumed and that the process is subjected to only one assignable cause. While, in practice, these assumptions usually do not hold, some recent studies are focused on working with only one or two of these violations. In this paper, the situation in which the process data are correlated and follow a non-normal distribution and that there is multiplicity of assignable causes in the process is considered. For this case, a cost model for the economic design of the VSI X? control chart is developed, where the Burr distribution is employed to represent the non-normal distribution of the process data. To obtain the optimal values of the design parameters, a genetic algorithm is employed in which the response surface methodology is applied. A numerical example is presented to show the applicability and effectiveness of the proposed methodology. Sensitivity analysis is also carried out to evaluate the effects of cost and input parameters on the performance of the chart.     

A mean deviation-based approach to monitor process variability

The study proposes a Shewhart-type control chart, namely an MD chart, based on average absolute deviations taken from the median, for monitoring changes (especially moderate and large changes – a major concern of Shewhart control charts) in process dispersion assuming normality of the quality characteristic to be monitored. The design structure of the proposed MD chart is developed and its comparison is made with those of two well-known dispersion control charts, namely the R and S charts. Using power curves as a performance measure, it has been observed that the design structure of the proposed MD chart is more powerful than that of the R chart and is very close competitor to that of the S chart, in terms of discriminatory power for detecting shifts in the process dispersion. The non-normality effect is also examined on design structures of the three charts, and it has been observed that the design structure of the proposed MD chart is least affected by departure from normality.     

Performance of the zone control chart

Average run lengths of the zone control chart are presented, The performance of this chart is compared with that of several Shewhart charts with and without runs rules, It is shown that the standard zone control chart has performance similar to some even simpler charts and a much higher false alarm rate than the Shewhart chart with all of the common runs rules. It is also shown that a slightly modified zone control chart outperforms the Shewhart chart with the common runs rules.     

A New Procedure to Monitor the Mean of a Quality Characteristic

The Shewhart, Bonferroni-adjustment, and analysis of means (ANOM) control charts are typically applied to monitor the mean of a quality characteristic. The Shewhart and Bonferroni procedure are utilized to recognize special causes in production process, where the control limits are constructed by assuming normal distribution for known parameters (mean and standard deviation), and approximately normal distribution regarding to unknown parameters. The ANOM method is an alternative to the analysis of variance method. It can be used to establish the mean control charts by applying equicorrelated multivariate non central t distribution. In this article, we establish new control charts, in phases I and II monitoring, based on normal and t distributions having as a cause a known (or unknown) parameter (standard deviation). Our proposed methods are at least as effective as the classical Shewhart methods and have some advantages.     

Using a Single Average Loss Control Chart to Monitor Process Mean and Variability

A single chart, instead of X-bar and R charts or X-bar and S charts, to monitor simultaneously the process mean and the variability if found would cut down the time and effort. Some researches have been done in finding such charts. In reality, process target is more important than process mean. A much easier average loss chart is first proposed here to detect the increases in the difference of the process mean and the target and the variability simultaneously. An example of the customer complaint processing time of the customer service center of an IT company shows the application and the performance of the proposed average loss control chart. Furthermore, a more efficient optimal average loss chart with variable sampling intervals is proposed and performs better than the average loss chart with fixed sampling intervals and the Shewhart joint X-bar and S charts. Some numerical analyses demonstrated the findings.     

A Multivariate Synthetic Control Chart for Monitoring the Process Mean Vector of Skewed Populations Using Weighted Standard Deviations

This article proposes a multivariate synthetic control chart for skewed populations based on the weighted standard deviation method. The proposed chart incorporates the weighted standard deviation method into the standard multivariate synthetic control chart. The standard multivariate synthetic chart consists of the Hotelling's T ² chart and the conforming run length chart. The weighted standard deviation method adjusts the variance–covariance matrix of the quality characteristics and approximates the probability density function using several multivariate normal distributions. The proposed chart reduces to the standard multivariate synthetic chart when the underlying distribution is symmetric. In general, the simulation results show that the proposed chart performs better than the existing multivariate charts for skewed populations and the standard T ² chart, in terms of false alarm rates as well as moderate and large mean shift detection rates based on the various degrees of skewnesses.     

Combined Shewhart–EWMA control charts with estimated parameters

Shewhart and EWMA control charts can be suitably combined to obtain a simple monitoring scheme sensitive to both large and small shifts in the process mean. So far, the performance of the combined Shewhart–EWMA (CSEWMA) has been investigated under the assumption that the process parameters are known. However, parameters are often estimated from reference Phase I samples. Since chart performances may be even largely affected by estimation errors, we study the behaviour of the CSEWMA with estimated parameters in both in- and out-of-control situations. Comparisons with standard Shewhart and EWMA charts are presented. Recommendations are given for Phase I sample size requirements necessary to achieve desired in-control performance.     

The Design and Performance of the Multivariate Synthetic-T 2 Control Chart

One of the objectives of research in statistical process control is to obtain control charts that show few false alarms but, at the same time, are able to detect quickly the shifts in the distribution of the quality variables employed to monitor a productive process. In this article, the synthetic-T ² control chart is developed, which consists of the simultaneous use of a CRL chart and a Hotelling's T ² control chart. The ARL is calculated employing Markov chains for steady and zero-state scenarios. A procedure of optimization has been developed to obtain the optimum parameters of the synthetic-T ², for zero and steady cases, given the values of in-control ARL and magnitude of shift which needs to be detected rapidly. A comparison between (standard T ², MEWMA, T ² with variable sample size, and T ² with double sampling) charts reveals that the synthetic-T ² chart always performs better than the standard T ² chart. The comparison with the remaining charts demonstrate in which cases the performance of this new chart makes it interesting to employ in real applications.     

A new approach for monitoring process variance

ABSTRACT

Control charts are effective tools for signal detection in both manufacturing processes and service processes. Much service data come from a process with variables having non-normal or unknown distributions. The commonly used Shewhart variable control charts, which depend heavily on the normality assumption, should not be properly used in such circumstances. In this paper, we propose a new variance chart based on a simple statistic to monitor process variance shifts. We explore the sampling properties of the new monitoring statistic and calculate the average run lengths (ARLs) of the proposed variance chart. Furthermore, an arcsine transformed exponentially weighted moving average (EWMA) chart is proposed because the ARLs of this modified chart are more intuitive and reasonable than those of the variance chart. We compare the out-of-control variance detection performance of the proposed variance chart with that of the non-parametric Mood variance (NP-M) chart with runs rules, developed by Zombade and Ghute [Nonparametric control chart for variability using runs rules. Experiment. 2014;24(4):1683–1691], and the nonparametric likelihood ratio-based distribution-free exponential weighted moving average (NLE) chart and the combination of traditional exponential weighted moving average (EWMA) mean and EWMA variance (CEW) control chart proposed by Zou and Tsung [Likelihood ratio-based distribution-free EWMA control charts. J Qual Technol. 2010;42(2):174–196] by considering cases in which the critical quality characteristic has a normal, a double exponential or a uniform distribution. Comparison results showed that the proposed chart performs better than the NP-M with runs rules, and the NLE and CEW control charts. A numerical example of service times with a right-skewed distribution from a service system of a bank branch in Taiwan is used to illustrate the application of the proposed variance chart and of the arcsine transformed EWMA chart and to compare them with three existing variance (or standard deviation) charts. The proposed charts show better detection performance than those three existing variance charts in monitoring and detecting shifts in the process variance.     

An improved mean deviation exponentially weighted moving average control chart to monitor process dispersion under ranked set sampling

Quality-control charts are widely used to monitor and detect shifts in the process mean and dispersion. Abbasi and Miller [MDEWMA chart: an efficient and robust alternative to monitor process dispersion, J Stat Comput Simul 2013;83:247–268] suggested a robust mean deviation exponentially weighted moving average (MDEWMA) control chart for monitoring process dispersion under simple random sampling. In this study, an improved MDEWMA (IMDEWMA) control chart is proposed under ranked set sampling to monitor process dispersion. Detailed Monte Carlo simulations are performed from symmetric and asymmetric populations to investigate the performances of the proposed and existing control charts in terms of average run length (ARL), median run length and standard deviation of run length. An application to real-life data is also presented to illustrate the use of the IMDEWMA control chart. It is observed that the IMDEWMA control chart indicates a shift in process dispersion substantially quicker than the MDEWMA control chart, while maintaining comparable ARLs when the process is in control.     

Adaptive Hotelling's T 2 Control Charts with Run Rules

This study investigates the statistical properties of the adaptive Hotelling's T ² charts with run rules in which the sample size and sampling interval are allowed to vary according on the current and past sampling points. The adaptive charts include variable sample size (VSS), variable sampling interval (VSI), and variable sample size and sampling interval (VSSI) charts. The adaptive Hotelling's T ² charts with run rules are compared with the fixed sampling rate Hotelling's T ² chart with run rules. The numerical results show that the VSS, VSI, and VSSI features improve the performance of the Hotelling's T ² chart with run rules.     

On the α-risks for shewhart control charts

The performance of the usual Shewhart control charts for monitoring process means and variation can be greatly affected by nonnormal data or subgroups that are correlated. Define the α_k-risk for a Shewhart chart to be the probability that at least one “out-of-control” subgroup occurs in k subgroups when the control limits are calculated from the k subgroups. Simulation results show that the α_k-risks can be quite large even for a process with normally distributed, independent subgroups. When the data are nonnormal, it is shown that the α_k-risk increases dramatically. A method is also developed for simulating an “in-control” process with correlated subgroups from an autoregressive model. Simulations with this model indicate marked changes in the α_k-risks for the Shewhart charts utilizing this type of correlated process data. Therefore, in practice a process should be investigated thoroughly regarding whether or not it is generating normal, independent data before out-of-control points on the control charts are interpreted to be due to some real assignable cause.