Three New Multivariate Process Capability Indices

Different multivariate process capability indices are developed by researchers to evaluate process capability when vectors of quality characteristics are considered in a study. This article presents three indices referred to as NCpM, MCpM, and NMC _PM in order to evaluate process capability in multivariate environment. The performance of the proposed indices is investigated numerically. Simulation results indicate that the proposed indices have descended estimation error and improved performance compared to the existing ones. These results can be important to researchers and practitioners who are interested in evaluating process capability in multivariate domain.     

An asymptotic confidence interval for the process capability index Cpm

Abstract

The use of indices as an estimation tool of process capability is long-established among the statistical quality professionals. Numerous capability indices have been proposed in last few years. C_pm constitutes one of the most widely used capability indices and its estimation has attracted much interest. In this paper, we propose a new method for constructing an approximate confidence interval for the index C_pm. The proposed method is based on the asymptotic distribution of the index C_pm obtained by the Delta Method. Under some regularity conditions, the distribution of an estimator of the process capability index C_pm is asymptotically normal.     

Probability-Based Process Capability Indices

This article deals with alternative process capability indices (PCIs) to traditional basic PCIs C _p , C _pk , and C _pm based on different fraction conforming type of probabilities. In view of various problems of constructing capability indices for univariate as well as multivariate set up, these alternative PCIs are very useful as compared to C _p , C _pk , and C _pm . Computing aspects of proposed PCIs are discussed for normal and non normal processes when process tolerance is symmetric as well as asymmetric. Generalization of these PCIs for multivariate set up is also discussed. Some simulation study results and real life problems are given for applications of proposed PCIs.     

A new generation of process capability indices based on fuzzy measurements

Process capability indices (PCIs) provide numerical measures on whether a process conforms to the defined manufacturing capability prerequisite. These have been successfully applied by companies to compete with and to lead high-profit markets by evaluating the quality and productivity performance. The PCI C_p compares the output of a process to the specification limits (SLs) by forming the ratio of the width between the process SLs with the width of the natural tolerance limits which is measured by six process standard deviation units. As another common PCI, C_pm incorporates two variation components which are variation to the process mean and deviation of the process mean from the target. A meaningful generalized version of above PCIs is introduced in this paper which is able to handle in a fuzzy environment. These generalized PCIs are able to measure the capability of a fuzzy-valued process in producing products on the basis of a fuzzy quality. Fast computing formulas for the generalized PCIs are computed for normal and symmetric triangular fuzzy observations, where the fuzzy quality is defined by linear and exponential fuzzy SLs. A practical example is presented to show the performance of proposed indices.     

Lower confidence bounds as precision measure for truncated processes

Process capability index C_p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C_p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.     

A general class of capability indices in the case of asymmetric tolerances

Vannman has earlier studied a class of capability indices, containing the indices C _p , C _pk , C _pm and C _pmk , when the tolerances are symmetric. We study the properties of this class when the tolerances are asymmetric and suggest a new enlargened class of indices. Under the assumption of normality an explicit form of the distribution of the new class of the estimated indices is provided. Numerical investigations are made to explore the behavior of the estimators of the indices for different values of the parameters. Based on the estimator a decision rule that can be used to determine whether the process can be considered capable or not is provided and suitable criteria for choosing an index from the family are suggested.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

A General Class of Test Procedures for Left-Truncated and Right-Censored Data

When the distribution of one of the characteristics of a process is non normal, methods based on empirical percentiles suggest the use of several process capability indices (PCIs) which are similar to the usual C _p , C _pk , C _pm , and C _pmk indices. However most of these PCIs apply only to the case of symmetrical tolerances. To take into account the asymmetry of the tolerances as well as the asymmetry of the process distribution, new PCIs which improve the previous ones are proposed. In the end and in order to validate the method proposed here, we apply it to a real production case.     

A Bayesian procedure for assessing process performance based on the third-generation capability index

Capability indices that qualify process potential and process performance are practical tools for successful quality improvement activities and quality program implementation. Most existing methods to assess process capability were derived on the basis of the traditional frequentist point of view. This paper considers the problem of estimating and testing process capability based on the third-generation capability index C _pmk from the Bayesian point of view. We first derive the posterior probability p for the process under investigation is capable. The one-sided credible interval, a Bayesian analog of the classical lower confidence interval, can be obtained to assess process performance. To investigate the effectiveness of the derived results, a series of simulation was undertaken. The results indicate that the performance of the proposed Bayesian approach depends strongly on the value of ξ=(μ?T)/σ. It performs very well with the accurate coverage rate when μ is sufficiently far from T. In those cases, they have the same acceptable performance even though the sample size n is as small as 25.     

A comparison of methods forsing loss-based capability index

The process capability index C _pm, sometimes called the loss-based index, has been proposed to the manufacturing industry for measuring process reproduction capability. This index incorporates the variation of production items with respect to the target value and the specification limits preset in the factory. To estimate the loss-based index properly and accurately, certain frequentist and Bayesian perspectives have been proposed to obtain lower confidence bounds (LCBs) for providing minimum process capability. The LCBs not only provide critical information regarding process performance but are also used to determine whether an improvement was made in a capability index and by extension in reducing the fraction of non-conforming items. In this paper, under the assumption of normality, based on frequentist and Bayesian senses, several existing approaches for constructing LCBs of C _pm are presented. Depending on the statistical methods used, we then classify these existing approaches into three categories and compared them in terms of the coverage rates and the mean values of the LCBs via simulations. The relative advantages and disadvantages of these approaches are summarized with some highlights of the relevant findings.     

On a Process Capability Index for Asymmetric Specifications

Abstract

Among the process capability indices considered in the literature C _pm is one of the most widely used, despite the fact that its performance often becomes unsatisfactory in the case of processes with asymmetric specifications, i.e., processes whose target value is not located at the midpoint of the specification area. In this article, a new index that is a variant of C _pm , is introduced and shown to overcome this deficiency. In particular, the proposed index performs satisfactorily for processes with symmetric or asymmetric specifications. Moreover, the article compares the suggested index with the existing indices for asymmetric specifications, investigates the distributional properties of its estimator under the assumption of normality and deals with the assessment of confidence intervals using three bootstrap methods. The coverage achieved by each of these methods is investigated via simulation.     

Statistical analysis of process capability indices with measurement errors: The case ofC p

Process capability indices (PCIs) have been widely used in manufacturing industries to previde a quantitative measure of process potential and performance. While some efforts have been dedicated in the literature to the statistical properties of PCIs estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated with reference toC _p , i.e. the simplest and most common measure suggested to evaluate process capability. The authors would like to thank two anonymous referees for their comments and suggestion that were useful in the preparation and improvement of this paper. This work was partially supported by a MURST research grant.     

Multivariate process capability a bayesian perspective

In this paper an attempt has been made to examine the multivariate versions of the common process capability indices (PCI's) denoted by C_p and C_pk . Markov chain Monte Carlo (MCMC) methods are used to generate sampling distributions for the various PCI's from where inference is performed. Some Bayesian model checking techniques are developed and implemented to examine how well our model fits the data. Finally the methods are exemplified on a historical aircraft data set collected by the Pratt and Whitney Company.     

Estimating process capability index Cpk: classical approach versus Bayesian approach

Process capability index C_pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C_pk using two approaches, Classical method and Bayesian method.     

Elliptical safety region plots for C pk

The process capability index C _pk is widely used when measuring the capability of a manufacturing process. A process is defined to be capable if the capability index exceeds a stated threshold value, e.g. C _pk >4/3. This inequality can be expressed graphically using a process capability plot, which is a plot in the plane defined by the process mean and the process standard deviation, showing the region for a capable process. In the process capability plot, a safety region can be plotted to obtain a simple graphical decision rule to assess process capability at a given significance level. We consider safety regions to be used for the index C _pk . Under the assumption of normality, we derive elliptical safety regions so that, using a random sample, conclusions about the process capability can be drawn at a given significance level. This simple graphical tool is helpful when trying to understand whether it is the variability, the deviation from target, or both that need to be reduced to improve the capability. Furthermore, using safety regions, several characteristics with different specification limits and different sample sizes can be monitored in the same plot. The proposed graphical decision rule is also investigated with respect to power.     

Construction of closed interval for process capability indices Cpu,Cpl, and Spk based on Boole’s inequality and de Morgan’s laws

ABSTRACT

Considerable effort has been spent on the development of confidence intervals for process capability indices (PCIs) based on the sampling distribution of the PCI or the transferred PCI. However, there is still no definitive way to construct a closed interval for a PCI. The aim of this study is to develop closed intervals for the PCIs C_pu, C_pl, and S_pk based on Boole's inequality and de Morgan's laws. The relationships between different sample sizes, the significance levels, and the confidence intervals of the PCIs C_pu, C_pl, and S_pk are investigated. Then, a testing model for interval estimation for the PCIs C_pu, C_pl, and S_pk is built as a powerful tool for measuring the quality performance of a product. Finally, an applied example is given to demonstrate the effectiveness and applicability of the proposed method and the testing model.     

Multivariate Capability Indices: Distributional and Inferential Properties

Process capability indices have been widely used in the manufacturing industry for measuring process reproduction capability according to manufacturing specifications. Properties of the univariate processes have been investigated extensively, but are comparatively neglected for multivariate processes where multiple dependent characteristics are involved in quality measurement. In this paper, we consider two commonly used multivariate capability indices MC_p and MC_pm, to evaluate multivariate process capability. We investigate the statistical properties of the estimated MC_p and obtain the lower confidence bound for MC_p. We also consider testing MC_p, and provide critical values for testing if a multivariate process meets the preset capability requirement. In addition, an approximate confidence interval for MC_pm is derived. A simulation study is conducted to ascertain the accuracy of the approximation. Three examples are presented to illustrate the applicability of the obtained results.     

Estimating Process Capability Index C PM Using a Bootstrap Sequential Sampling Procedure

Construction of a confidence interval for process capability index C _PM is often based on a normal approximation with fixed sample size. In this article, we describe a different approach in constructing a fixed-width confidence interval for process capability index C _PM with a preassigned accuracy by using a combination of bootstrap and sequential sampling schemes. The optimal sample size required to achieve a preassigned confidence level is obtained using both two-stage and modified two-stage sequential procedures. The procedure developed is also validated using an extensive simulation study.     

Developing a variables repetitive group sampling plan based on process capability index C pk with unknown mean and variance

In this paper, variables repetitive group sampling plans are developed based on the process capability index C _pk when the quality characteristic follows a normal distribution with unknown mean and variance. The sampling plan parameters such as the sample size and the acceptance constant are determined to minimize the average sample number. Symmetric and asymmetric cases, in percent defectives due to two specification limits, are dealt with for specified combinations of acceptable quality level and limiting quality level. Tables are provided and examples are given to use proposed plans in practice.     

Selection of Variables in Multivariate Regression Models for Large Dimensions

The Akaike information criterion, AIC, and Mallows’ C _p statistic have been proposed for selecting a smaller number of regressors in the multivariate regression models with fully unknown covariance matrix. All of these criteria are, however, based on the implicit assumption that the sample size is substantially larger than the dimension of the covariance matrix. To obtain a stable estimator of the covariance matrix, it is required that the dimension of the covariance matrix is much smaller than the sample size. When the dimension is close to the sample size, it is necessary to use ridge-type estimators for the covariance matrix. In this article, we use a ridge-type estimators for the covariance matrix and obtain the modified AIC and modified C _p statistic under the asymptotic theory that both the sample size and the dimension go to infinity. It is numerically shown that these modified procedures perform very well in the sense of selecting the true model in large dimensional cases.