A generalized procedure for selection of attribute double sampling plan

A compact table, yielding attribute double sampling plan indexed by AQL, AOQL and LQL and double sampling scheme indexed by AQL is presented. Method of selecting the plans are indicated through examples.     

Multiple Sampling Inspection Plans for Attributes

A set of tables is presented enabling one to design multiple (Group sequential) sampling plans when various entry parameters are given. Table yielding item by item sequential sampling plans indexed by (AQL, AOQL) is also presented.     

Modified tables for the selection of qss–1 quick switching system for a given (aql,lql)

This paper presents a set of new tables and procedures for the selection of the following three types of Quick Switching (QS) systems for a given Acceptable Quality Level (AQL), Limiting Quality Level (LQL), producer's risk and consumer's risk.

(1) A Single sampling QS system with equal sample sizes but with different acceptance numbers

(2) A Single sampling QS system with two different sample sizes but with same acceptance number and

(3) A QS systen with double sampling normal inspection and single sampling tightened inspection

The third type of QS systen is the one newly presented in this paper. The tables provide unique plans for a given set of conditions as well as providing a smaller sample size or a smaller sum of Average Sample Numbers(ASN) at the AQL and LQL     

Double sampling attributes plans indexed by aql and aoql

Tables yielding double sampling attributes inspection plans indexed by AQL and AOQL are presented. The corresponding LQL values are also presented in the table.     

Selection of conditional sampling plans for given AQL and LQL

This paper presents procedures and tables for the selection of conditional sampling plans, viz. conditional double sampling plan, chain-deferred sampling plan, link sampling plan, and ChSP-4A chain sampling plan for given acceptable quality level (AQL), producer's risk, limiting quality level and consumer's risk giving minimum sample size at AQL under the conditions of the Poisson model for the operating characteristic curve.     

Selection of csp-t plans

Various continuous sampling plans have been proposed for monitoring the quality of continuous production processes. The multi-level continuous sampling plan of MIL-STD-1235C (1988) is designated as CSP-T Plan. CSP-T plan is a three-level tightened continuous sampling plan. It requires a switch to 100% inspection, at any level, whenever a nonconforming unit is found. This provides quick rectification in the event of a shift in quality. In this paper certain performance characteristics of CSP-T plan are derived using the approach of Stephens (1979) under the assumption that the production process is in statistical control. For the selection of CSP-T plans, two tables are given. These tables can be used to obtain parameters i (clearance interval) and f (sampling fraction) of the CSP-T plan for given acceptable quality level (AQL) with producer’ risk α=0.05 or the limiting quality level(LQL) with consumer’ risk β=0.10 and the outgoing quality limit(AOQL). Two examples are also given to illustrate the selection of plans from these tables     

Selection of multiple deferred (dependent) state sampling plans

This paper presents procedures and tables for the selection of minimum sample size multiple deferred (dependent) state sampling plan of type MDS and MDS - 1 for various entry conditions such as (AQL, LQL), (AQL, AOQL) etc.     

Modified tables for the selection of double sampling attribute plan indexed by aql and lql

This paper presents modified tables for the selection of double sampling plans for given Acceptable Qualtiy Level (AQL), producer’s risk (α) Limiting Quality Level (LQL), and consumer’s risk (ß) giving the minimum sum of Average Sample Numbers (ASN) at AQL and LQL under the conditions of the Poisson model for the Operating Characteristic (OC) curve.     

Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles

Acceptance sampling plans based on process yield indices provide a proven resource for the lot-sentencing problem when the required fraction defective is very low. In this study, a new sampling plan based on the exponentially weighted moving average (EWMA) model with yield index for lot sentencing for autocorrelation between polynomial profiles is proposed. The advantage of the EWMA statistic is the accumulation of quality history from previous lots. In addition, the number of profiles required for lot sentencing is more economical than in the traditional single sampling plan. Considering the acceptable quality level (AQL) at the producer's risk and the lot tolerance percent defective (LTPD) at the consumer's risk, we proposed a new search algorithm to determine the optimal plan parameters. The plan parameters are tabulated for various combinations of the smoothing constant of the EWMA statistic, AQL, LTPD, and two risks. A comparison study and two numerical examples are provided to show the applicability of the proposed sampling plan.     

Modified tightened two-level continuous sampling plans

In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.     

Dodge-Romig AOQL single sampling plans for inspection by variables

Acceptance sampling plans for inspection by variables, which minimize the mean inspection cost per lot of process average quality (assuming that the remainder of rejected lots is inspected), are derived under the condition that the maximum value of the mean fraction defective after sampling inspection, replacing all defective items found by good ones, shall be equal top _L . These plans are tabulated for chosen values of the given parameters, and compared with the Dodge-Romig AOQL attribute sampling plans. From the comparison it follows that under the same protection of consumer the AOQL plans for inspection by variables are in some situations more economical than the corresponding Dodge-Romig plans.     

Quick switching variables single sampling (QSVSS) system indexed by AQL and AOQL

Procedures and tables are given for the selection of a 'Quick Switching Single Sampling Variable System' for given AQL and AOQL, whenever rejected lots are 100% inspected and for replacement of non-conforming units.     

Improved attribute acceptance sampling plans based on maxima nomination sampling

This paper demonstrates the use of maxima nomination sampling (MNS) technique in design and evaluation of single AQL, LTPD, and EQL acceptance sampling plans for attributes. We exploit the effect of sample size and acceptance number on the performance of our proposed MNS plans using operating characteristic (OC) curve. Among other results, we show that MNS acceptance sampling plans with smaller sample size and bigger acceptance number perform better than commonly used acceptance sampling plans for attributes based on simple random sampling (SRS) technique. Indeed, MNS acceptance sampling plans result in OC curves which, compared to their SRS counterparts, are much closer to the ideal OC curve. A computer program is designed which can be used to specify the optimum MNS acceptance sampling plan and to show, visually, how the shape of the OC curve changes when parameters of the acceptance sampling plan vary. Theoretical results and numerical evaluations are given.     

Closed-Form Approximation for the AOQL of Attributes Acceptance Sample Plans

We derive upper and lower bounds at the point at which the average outgoing quality limit (AOQL) of an attributes acceptance sampling plan is achieved. Using a simple average of these bounds to approximate the ordinate of the AOQL, we develop an accurate, closed-form approximation to the AOQL. The bounds and approximation show how the parameters of a sampling plan affect the AOQL and can be used to study the behavior of the AOQL and other measures of the plan's performance.     

Designing of a variables two-plan system by minimizing the average sample number

This article proposes a variables two-plan sampling system called tightened-normal-tightened (TNT) sampling inspection scheme where the quality characteristic follows a normal distribution or a lognormal distribution and has an upper or a lower specification limit. The TNT variables sampling inspection scheme will be useful when testing is costly and destructive. The advantages of the variables TNT scheme over variables single and double sampling plans and attributes TNT scheme are discussed. Tables are also constructed for the selection of parameters of known and unknown standard deviation variables TNT schemes for a given acceptable quality level (AQL) and limiting quality level (LQL). The problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at AQL and LQL under the operating characteristic curve.     

A new sampling plan under the exponential distribution

This article considers a sampling plan when the quality characteristic follows the exponential distribution. We provide the exact approach and propose an approximated approach. In the proposed approximation, a new statistic combined with a Weibull transformation is used for the normal approximation. The plan parameters are obtained through the two-point approach at the acceptable quality level (AQL) and the limiting quality level (LQL). The tables for plan parameters are reported according to various values of the AQL and the LQL when the producer's and the consumer's risks are given. A real example is given to illustrate the proposed approximation approach.     

Dodge-roming AOQL plans for inspection by variables from numerical point of view

In this paper we shall deal with the AOQL single sampling plans for inspection by variables when the remainder of rejected lots is inspected. We shall report on an algorithm allowing calculation¹ of these plans. For the calculation we shall derive a new theorem (see Theorem 4) and we shall use an original method. Prepared with support from the Grant Agency of the Czech Republic. The calculation is considerably difficult, we must use sequently three numerical methods.     

Selection of ChSP-1 chain sampling plans for given acceptable quality level and limiting quality level

Procedures and tables are given for the selection of chain sampling plans of type ChSP-1 for given acceptable quality level, producer's risk, limiting quality level and consumer's risk. Selection of ChSP-1 plan is discussed for both proportion nonconforming and the number of nonconformities per unit.     

Exact two-sided Lieberman-Resnikoff sampling plans

We deal sith sampling by variables with two-way-protection in the case of aN(μσ²) distributed characteristic with unknown σ². For the sampling plan by Lieberman and Resnikoff (1955), which is based on the MVU estimator of the percent defective, we prove a formula for the OC. If the sampling parametersp ₁ (AQL),p ₂ (LQ) and α, β (type I, II errors) are given, we are able to compute the true type I and II errors of the usual (one-sided) approximation plans. Furthermore it is possible to compute exact two-sided Lieberman-Resnikoff sampling plans.     

Design of a CSP-1 plan based on regret-balanced criterion

This article explores the problem of designing a CSP-1 plan with the specified average outgoing quality limit (AOQL), the acceptable quality level (AQL), and the limiting quality level (LQL) value. By adopting the regret-balanced criterion under the producer's and consumer's interests of quality, we can design the optimal CSP-1 plan.