A note on the asymptotic distribution of the process capability index C pmk

Process capability indices have been widely used to evaluate the process performance to the continuous improvement of quality and productivity. The distribution of the estimator of the process capability index C _pmk is very complicated and the asymptotic distribution is proposed by Chen and Hsu [The asymptotic distribution of the processes capability index C _pmk , Comm. Statist. Theory Methods 24(5) (1995), pp. 1279–1291]. However, we found a critical error for the asymptotic distribution when the population mean is not equal to the midpoint of the specification limits. In this paper, a correct version of the asymptotic distribution is given. An asymptotic confidence interval of C _pmk by using the correct version of asymptotic distribution is proposed and the lower bound can be used to test if the process is capable. A simulation study of the coverage probability of the proposed confidence interval is shown to be satisfactory. The relation of six sigma technique and the index C _pmk is also discussed in this paper. An asymptotic testing procedure to determine if a process is capable based on the index of C _pmk is also given in this paper.     

An asymptotic confidence interval for the process capability index Cpm

Abstract

The use of indices as an estimation tool of process capability is long-established among the statistical quality professionals. Numerous capability indices have been proposed in last few years. C_pm constitutes one of the most widely used capability indices and its estimation has attracted much interest. In this paper, we propose a new method for constructing an approximate confidence interval for the index C_pm. The proposed method is based on the asymptotic distribution of the index C_pm obtained by the Delta Method. Under some regularity conditions, the distribution of an estimator of the process capability index C_pm is asymptotically normal.     

A Bayesian procedure for assessing process performance based on the third-generation capability index

Capability indices that qualify process potential and process performance are practical tools for successful quality improvement activities and quality program implementation. Most existing methods to assess process capability were derived on the basis of the traditional frequentist point of view. This paper considers the problem of estimating and testing process capability based on the third-generation capability index C _pmk from the Bayesian point of view. We first derive the posterior probability p for the process under investigation is capable. The one-sided credible interval, a Bayesian analog of the classical lower confidence interval, can be obtained to assess process performance. To investigate the effectiveness of the derived results, a series of simulation was undertaken. The results indicate that the performance of the proposed Bayesian approach depends strongly on the value of ξ=(μ?T)/σ. It performs very well with the accurate coverage rate when μ is sufficiently far from T. In those cases, they have the same acceptable performance even though the sample size n is as small as 25.     

Reliable confidence intervals for assessing normal process incapability

This study aims to provide a reliable confidence interval for assessing the process incapability index [C_pp]. The concept of the generalized pivotal quantities is utilized for constructing the generalized confidence interval for [C_pp]. And, simulations are performed for demonstrating our proposed method and one existent method. The results show that the empirical confidences of these two methods are significantly affected by the degree of process departure. Therefore, we suggest the practitioners to select proper one for capability testing purpose based on the information of degree of process departure.     

Elliptical safety region plots for C pk

The process capability index C _pk is widely used when measuring the capability of a manufacturing process. A process is defined to be capable if the capability index exceeds a stated threshold value, e.g. C _pk >4/3. This inequality can be expressed graphically using a process capability plot, which is a plot in the plane defined by the process mean and the process standard deviation, showing the region for a capable process. In the process capability plot, a safety region can be plotted to obtain a simple graphical decision rule to assess process capability at a given significance level. We consider safety regions to be used for the index C _pk . Under the assumption of normality, we derive elliptical safety regions so that, using a random sample, conclusions about the process capability can be drawn at a given significance level. This simple graphical tool is helpful when trying to understand whether it is the variability, the deviation from target, or both that need to be reduced to improve the capability. Furthermore, using safety regions, several characteristics with different specification limits and different sample sizes can be monitored in the same plot. The proposed graphical decision rule is also investigated with respect to power.     

Estimating process capability index Cpk: classical approach versus Bayesian approach

Process capability index C_pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C_pk using two approaches, Classical method and Bayesian method.     

A program to calculate bootstrap confidence intervals for the process capability index Cpk

Franklin and Wasserman (1991) introduced the use of Bootstrap sampling procedures for deriving nonparametric confidence intervals for the process capability index, C_pk, which are applicable for instances when at least twenty data points are available. This represents a significant reduction in the usually recommended sample requirement of 100 observations (see Gunther 1989). To facilitate and encourage the use of these procedures. a FORTRAN program is provided for computation of confidence intervals for C_pk. Three methods are provided for this calculation including the standard method, the percentile confidence interval, and the biased - corrected percentile confidence interval.     

Construction of closed interval for process capability indices Cpu,Cpl, and Spk based on Boole’s inequality and de Morgan’s laws

ABSTRACT

Considerable effort has been spent on the development of confidence intervals for process capability indices (PCIs) based on the sampling distribution of the PCI or the transferred PCI. However, there is still no definitive way to construct a closed interval for a PCI. The aim of this study is to develop closed intervals for the PCIs C_pu, C_pl, and S_pk based on Boole's inequality and de Morgan's laws. The relationships between different sample sizes, the significance levels, and the confidence intervals of the PCIs C_pu, C_pl, and S_pk are investigated. Then, a testing model for interval estimation for the PCIs C_pu, C_pl, and S_pk is built as a powerful tool for measuring the quality performance of a product. Finally, an applied example is given to demonstrate the effectiveness and applicability of the proposed method and the testing model.     

Lower confidence bounds as precision measure for truncated processes

Process capability index C_p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C_p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.     

A robust process capability index

The existing process capability indices (PCI's) assume that the distribution of the process being investigated is normal. For non-normal distributions, PCI's become unreliable in that PCI's may indicate the process is capable when in fact it is not. In this paper, we propose a new index which can be applied to any distribution. The proposed indexC_f:, is directly related to the probability of non-conformance of the process. For a given random sample, the estimation of C_f boils down to estimating non-parametrically the tail probabilities of an unknown distribution. The approach discussed in this paper is based on the works by Pickands (1975) and Smith (1987). We also discuss the construction of bootstrap confidence intervals of C_f: based on the so-called accelerated bias correction method (BC _a:). Several simulations are carried out to demonstrate the flexibility and applicability of C_f:. Two real life data sets are analyzed using the proposed index.     

On Confidence Intervals for Process Capability Indices in a One-Way Random Model

In this article, we investigated the bootstrap calibrated generalized confidence limits for process capability indices C _pk for the one-way random effect model. Also, we derived Bissell's approximation formula for the lower confidence limit using Satterthwaite's method and calculated its coverage probabilities and expected values. Then we compared it with standard bootstrap (SB) method and generalized confidence interval method. The simulation results indicate that the confidence limit obtained offers satisfactory coverage probabilities. The proposed method is illustrated with the help of simulation studies and data sets.     

Construction of fixed width confidence intervals for a Bernoulli success probability using sequential sampling: a simulation study

This article considers the construction of level 1?α fixed width 2d confidence intervals for a Bernoulli success probability p, assuming no prior knowledge about p and so p can be anywhere in the interval [0, 1]. It is shown that some fixed width 2d confidence intervals that combine sequential sampling of Hall [Asymptotic theory of triple sampling for sequential estimation of a mean, Ann. Stat. 9 (1981), pp. 1229–1238] and fixed-sample-size confidence intervals of Agresti and Coull [Approximate is better than ‘exact’ for interval estimation of binomial proportions, Am. Stat. 52 (1998), pp. 119–126], Wilson [Probable inference, the law of succession, and statistical inference, J. Am. Stat. Assoc. 22 (1927), pp. 209–212] and Brown et al. [Interval estimation for binomial proportion (with discussion), Stat. Sci. 16 (2001), pp. 101–133] have close to 1?α confidence level. These sequential confidence intervals require a much smaller sample size than a fixed-sample-size confidence interval. For the coin jamming example considered, a fixed-sample-size confidence interval requires a sample size of 9457, while a sequential confidence interval requires a sample size that rarely exceeds 2042.     

Sample size determination for estimating multivariate process capability indices based on lower confidence limits

With the advent of modern technology, manufacturing processes have become very sophisticated; a single quality characteristic can no longer reflect a product's quality. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, several new multivariate capability (NMC) indices, such as NMC _p and NMC _pm , have been developed over the past few years. However, the sample size determination for multivariate process capability indices has not been thoroughly considered in previous studies. Generally, the larger the sample size, the more accurate an estimation will be. However, too large a sample size may result in excessive costs. Hence, the trade-off between sample size and precision in estimation is a critical issue. In this paper, the lower confidence limits of NMC _p and NMC _pm indices are used to determine the appropriate sample size. Moreover, a procedure for conducting the multivariate process capability study is provided. Finally, two numerical examples are given to demonstrate that the proper determination of sample size for multivariate process indices can achieve a good balance between sampling costs and estimation precision.     

A comparison of methods forsing loss-based capability index

The process capability index C _pm, sometimes called the loss-based index, has been proposed to the manufacturing industry for measuring process reproduction capability. This index incorporates the variation of production items with respect to the target value and the specification limits preset in the factory. To estimate the loss-based index properly and accurately, certain frequentist and Bayesian perspectives have been proposed to obtain lower confidence bounds (LCBs) for providing minimum process capability. The LCBs not only provide critical information regarding process performance but are also used to determine whether an improvement was made in a capability index and by extension in reducing the fraction of non-conforming items. In this paper, under the assumption of normality, based on frequentist and Bayesian senses, several existing approaches for constructing LCBs of C _pm are presented. Depending on the statistical methods used, we then classify these existing approaches into three categories and compared them in terms of the coverage rates and the mean values of the LCBs via simulations. The relative advantages and disadvantages of these approaches are summarized with some highlights of the relevant findings.     

Exact confidence limits for the probability of response in two-stage designs

In addition to point estimate for the probability of response in a two-stage design (e.g. Simon's two-stage design for binary endpoints), confidence limits should be computed and reported. The current method of inverting the p-value function to compute the confidence interval does not guarantee coverage probability in a two-stage setting. The existing exact approach to calculate one-sided limits is based on the overall number of responses to order the sample space. This approach could be conservative because many sample points have the same limits. We propose a new exact one-sided interval based on p-value for the sample space ordering. Exact intervals are computed by using binomial distributions directly, instead of a normal approximation. Both exact intervals preserve the nominal confidence level. The proposed exact interval based on the p-value generally performs better than the other exact interval with regard to expected length and simple average length of confidence intervals.     

Fixed-width sequential confidence interval for the correlation coefficient of a bivariate normal distribution

A sequential confidence interval of fixed width 2d d > 0, is constructed for the correlation coefficient of a bivariate normal distribution. It is shown that the coverage probability is approximately equal to a preassigned number γ, 0 < γ < as d → 0.     

An Improved Approach for Estimating Product Performance Based on the Capability Index C pmk

In this article, we construct an improved procedure for estimating the process capability index C _pmk . We propose a new C _pmk lower-bound approach based on the GCI concept, and compare it with other existing methods. Based on the comparison results, we conclude with a recommendation, and construct a step-by-step procedure for the recommended approach to estimate the actual process capability C _pmk for various sample sizes. The lower bound attended by our recommended approach, indeed, improves other existing lower bound methods. We also investigate a real-world application to illustrate how we could apply the recommended approach to the actual manufacturing processes.     

Asymptotic expansions for sequential confidence levels in inverse linear regression

Non-linear renewal theory is used to derive second order asymptotic expansions for the coverage probability of a fixed-width sequential confidence interval for an unknown parameter xin the inverse linear regression model. These expansions are obtained for a two-stage sequential procedure, proposed by Perng and Tong (1974) for the construction of a confidence interval for x.     

On a Process Capability Index for Asymmetric Specifications

Abstract

Among the process capability indices considered in the literature C _pm is one of the most widely used, despite the fact that its performance often becomes unsatisfactory in the case of processes with asymmetric specifications, i.e., processes whose target value is not located at the midpoint of the specification area. In this article, a new index that is a variant of C _pm , is introduced and shown to overcome this deficiency. In particular, the proposed index performs satisfactorily for processes with symmetric or asymmetric specifications. Moreover, the article compares the suggested index with the existing indices for asymmetric specifications, investigates the distributional properties of its estimator under the assumption of normality and deals with the assessment of confidence intervals using three bootstrap methods. The coverage achieved by each of these methods is investigated via simulation.     

Developing a variables repetitive group sampling plan based on process capability index C pk with unknown mean and variance

In this paper, variables repetitive group sampling plans are developed based on the process capability index C _pk when the quality characteristic follows a normal distribution with unknown mean and variance. The sampling plan parameters such as the sample size and the acceptance constant are determined to minimize the average sample number. Symmetric and asymmetric cases, in percent defectives due to two specification limits, are dealt with for specified combinations of acceptable quality level and limiting quality level. Tables are provided and examples are given to use proposed plans in practice.