A new economic scheme for CCC charts with run rules based on average number of inspected items

New statistical techniques and procedures have been developed to control high-yield processes along with looking for process improvement opportunities and minimizing production cost. Cumulative count of conforming control chart is generally a technique for high-quality processes, when nonconforming items are rarely produced. The objective of this study is to design control chart based on cumulative count of conforming items and run rules that develops an economic model based on the average number of inspected items to design m-of-m CCC chart in order to facilitate minimum average cost per item produced. The optimal design parameters for different values of nonconforming fraction and different cost parameters in each scenario are determined. Finally, to analyze the behavior of optimal economic solutions, sensitivity analysis of the model parameters is performed.     

Optimization of design parameters for control charts with multiple assignable causes

Duncan's economic model of Shewhart's original x¯ chart has established its optimal and economic application for processes with the Markovian failure characteristic. As the sample statistics show some indications of process variations, the variable-sampling-interval (VSI) control charts perform more effectively than the fixed sampling interval (FSI) ones due to a higher frequency in the sampling rate. Regarding the economic design of control charts, most studies have been dedicated to the FSI scheme. In 1998, Bai & Lee considered the production process with a single assignable cause and proposed an economic VSI design for a general x¯ control chart. However, in real cases, there are multiple assignable causes in the production process. Therefore, concerning the operation characteristics of the real industry, this research develops an economic model for the VSI control chart with multiple assignable causes based on stochastic and statistics theory and determines the optimal design parameters of the chart. A numerical example is also provided to demonstrate the effectiveness of the proposed model and the result indicates that VSI performs more effectively than a FSI control chart.     

Variable Sampling Interval Cumulative Count of Conforming Chart with Runs Rules

The cumulative count of conforming (CCC) chart is effective in detecting very low fraction of nonconforming items for high yield manufacturing processes. In this study, a combination of runs rules and variable sampling interval feature is proposed to a lower sided CCC chart by inspecting the items one by one. The performance measures of the control chart are derived by using the Markov chain approach. The numerical comparisons show that the performance of the CCC chart can be improved by adding the runs rules and varying the sampling interval.     

A rational sequential probability ratio test control chart for monitoring process shifts in mean and variance

The sequential probability ratio test (SPRT) chart is a very effective tool for monitoring manufacturing processes. This paper proposes a rational SPRT chart to monitor both process mean and variance. This SPRT chart determines the sampling interval d based on the rational subgroup concept according to the process conditions and administrative considerations. Since the rational subgrouping is widely adopted in the design and implementation of control charts, the studies of the rational SPRT have a practical significance. The rational SPRT chart is designed optimally in order to minimize the index average extra quadratic loss for the best overall performance. A systematic performance study has also been conducted. From an overall viewpoint, the rational SPRT chart is more effective than the cumulative sum chart by more than 63%. Furthermore, this article provides a design table, which contains the optimal values of the parameters of the rational SPRT charts for different specifications. This will greatly facilitate the potential users to select an appropriate SPRT chart for their applications. The users can also justify the application of the rational SPRT chart according to the achievable enhancement in detection effectiveness.     

EWNA charts for monitoring the mean and the autocovariances of stationary processes

In this paper various types of EWMA control charts are introduced for the simultaneous monitoring of the mean and the autocovariances. The target process is assumed to be a stationary process up to fourth-order or an ARMA process with heavy tailed innovations. The case of a Gaussian process is included in our results as well. The charts are compared within a simulation study. As a measure of the performance the average run length is taken. The target process is an ARMA (1,1) process with Student-t distributed innovations. The behavior of the charts is analyzed with respect to several out-of-control models. The best design parameters are determined for each chart. Our comparisons show that the multivariate EWMA chart applied to the residuals has the best overall performance.     

Properties and performance of one-sided cumulative count of conforming chart with parameter estimation in high-quality processes

The one-sided cumulative count of conforming (CCC) chart is a useful method to monitor nonconforming fraction in high-quality manufacturing processes. The nonconforming fraction parameter is assumed to be known when implementing a one-sided CCC chart. In this study, we investigated the impact of estimated nonconforming fraction, [pcirc] ₀, in a one-sided CCC chart. The run length distribution is derived as well as the conditional probability of a false alarm rate (CFAR), conditional average run length (CARL) and its standard deviation (CSDRL). Simulation results are conducted to evaluate the effect of [pcirc] ₀ in a one-sided CCC chart. The results show that values of CFAR, CARL and CSDRL are close to the nominal values for a large sample. The impact of estimation errors was also studied. We find that CFAR decreases for large [pcirc] ₀. Thus, a large value of [pcirc] ₀ is suggested for fewer false alarms.     

The economic design of multivariate binomial EWMA VSSI control charts

Since multi-attribute control charts have received little attention compared with multivariate variable control charts, this research is concerned with developing a new methodology to employ the multivariate exponentially weighted moving average (MEWMA) charts for m-attribute binomial processes; the attributes being the number of nonconforming items. Moreover, since the variable sample size and sampling interval (VSSI) MEWMA charts detect small process mean shifts faster than the traditional MEWMA, an economic design of the VSSI MEWMA chart is proposed to obtain the optimum design parameters of the chart. The sample size, the sampling interval, and the warning/action limit coefficients are obtained using a genetic algorithm such that the expected total cost per hour is minimized. At the end, a sensitivity analysis has been carried out to investigate the effects of the cost and the model parameters on the solution of the economic design of the VSSI MEWMA chart.     

A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection

Abstract

In this paper, a synthetic control chart is proposed by integrating the salient features of the np_x chart and the CRL chart. The synthetic chart achieves higher detection effectiveness on both small and large mean shifts while retaining the operational simplicity of the attribute charts owing to only using attribute inspection. Both statistical and economic design of the synthetic chart are considered and numerical tests have indicated that the synthetic chart has a higher power for detecting mean shifts than the np_x chart, MON chart and CUSUM chart. In addition, sensitivity analyses are also performed under both the statistical and economic design model.     

Average run lengths for cusum control charts applied to residuals

A common approach to building control charts for autocorrelated data is to apply classical SPC to the residuals from a time series model of the process. However, Shewhart charts and even CUSUM charts are less sensitive to small shifts in the process mean when applied to residuals than when applied to independent data. Using an approximate analytical model, we show that the average run length of a CUSUM chart for residuals can be reduced substantially by modifying traditional chart design guidelines to account for the degree of autocorrelation in the data.     

An adaptive exponentially weighted moving average control chart for monitoring process variances

The exponentially weighted moving average (EWMA) control chart is efficient in detecting small changes in process parameters but less efficient when the changes are relatively large, due to what is known as the inertia problem. To diminish the inertia, an adaptive EWMA (AEWMA) chart has been proposed for monitoring process locations to improve over the traditional EWMA charts. The basic idea of the AEWMA scheme is to dynamically weight the past observations according to a suitable function of the current prediction error. This article extends the idea of the AEWMA chart for monitoring process locations to the case of monitoring process dispersion. A Markov chain model is established to analyze and design the suggested chart. It is shown that the AEWMA dispersion chart performs better than the EWMA and other dispersion charts in terms of its ability to perform relatively well at both small and large changes in process dispersion.     

The influence of parameter estimation on the ARL of Shewhart type charts for time series

In this paper we discuss the behavior of the Shewhart residual chart and the modified Shewhart chart if the parameters of the underlying process are unknown and thus have to be estimated. We focus on the estimation of the variance. For AR models we also consider the estimation of the AR coefficients. The average run length (ARL) of the control chart with estimated parameters is compared with the ARL of the scheme for known parameters and with the ARL for independent variables. Additionally, we give recommendations on the choice of the estimators in the context of Shewhart control schemes.     

Economic design of non parametric sign control chart

An economic design of sign chart to control the median is proposed. Since the sign chart is distribution free, it can easily be applied to any process without prior knowledge of process quality distribution. The effect on loss cost observed for different shifts in location shows that the sign chart performs better for large shifts. The economic statistical performance study reveals that statistical performance of sign chart can be improved sufficiently for moderate shifts in the process. Sensitivity study shows that design is more sensitive for change in values of penalty loss cost and time required for search and repair of an assignable cause.     

A mean deviation-based approach to monitor process variability

The study proposes a Shewhart-type control chart, namely an MD chart, based on average absolute deviations taken from the median, for monitoring changes (especially moderate and large changes – a major concern of Shewhart control charts) in process dispersion assuming normality of the quality characteristic to be monitored. The design structure of the proposed MD chart is developed and its comparison is made with those of two well-known dispersion control charts, namely the R and S charts. Using power curves as a performance measure, it has been observed that the design structure of the proposed MD chart is more powerful than that of the R chart and is very close competitor to that of the S chart, in terms of discriminatory power for detecting shifts in the process dispersion. The non-normality effect is also examined on design structures of the three charts, and it has been observed that the design structure of the proposed MD chart is least affected by departure from normality.     

Economic design based on a multivariate Bayesian VSI chart with a dual control limit

In this paper, a multivariate Bayesian variable sampling interval (VSI) control chart for the economic design and optimization of statistical parameters is designed. Based on the VSI sampling strategy of a multivariate Bayesian control chart with dual control limits, the optimal expected cost function is constructed. The proposed model allows the determination of the scheme parameters that minimize the expected cost per time of the process. The effectiveness of the Bayesian VSI chart is estimated through economic comparisons with the Bayesian fixed sampling interval and the Hotelling's T² chart. This study is an in-depth study on a Bayesian multivariate control chart with variable parameter. Furthermore, it is shown that significant cost improvement may be realized through the new model.     

An improved mean deviation exponentially weighted moving average control chart to monitor process dispersion under ranked set sampling

Quality-control charts are widely used to monitor and detect shifts in the process mean and dispersion. Abbasi and Miller [MDEWMA chart: an efficient and robust alternative to monitor process dispersion, J Stat Comput Simul 2013;83:247–268] suggested a robust mean deviation exponentially weighted moving average (MDEWMA) control chart for monitoring process dispersion under simple random sampling. In this study, an improved MDEWMA (IMDEWMA) control chart is proposed under ranked set sampling to monitor process dispersion. Detailed Monte Carlo simulations are performed from symmetric and asymmetric populations to investigate the performances of the proposed and existing control charts in terms of average run length (ARL), median run length and standard deviation of run length. An application to real-life data is also presented to illustrate the use of the IMDEWMA control chart. It is observed that the IMDEWMA control chart indicates a shift in process dispersion substantially quicker than the MDEWMA control chart, while maintaining comparable ARLs when the process is in control.     

Design of a sign chart using a new EWMA statistic

Abstract

In this article, a new non parametric control chart based on the modified or controlled exponentially weighted moving average (EWMA) statistic is developed to monitor the process deviation from the target value. The proposed control chart is evaluated for different values of design parameters using the average run length as a performance criterion under various sample sizes. The proposed chart is compared with the existing non parametric EWMA sign control chart. It is observed that the proposed chart is better than the existing EWMA sign control chart in terms of run length characteristics. An empirical example is provided for the practical implementation of the proposed chart.     

Double-sampling control charts for attributes

In this article, we propose a double-sampling (DS) np control chart. We assume that the time interval between samples is fixed. The choice of the design parameters of the proposed chart and also comparisons between charts are based on statistical properties, such as the average number of samples until a signal. The optimal design parameters of the proposed control chart are obtained. During the optimization procedure, constraints are imposed on the in-control average sample size and on the in-control average run length. In this way, required statistical properties can be assured. Varying some input parameters, the proposed DS np chart is compared with the single-sampling np chart, variable sample size np chart, CUSUM np and EWMA np charts. The comparisons are carried out considering the optimal design for each chart. For the ranges of parameters considered, the DS scheme is the fastest one for the detection of increases of 100% or more in the fraction non-conforming and, moreover, the DS np chart is easy to operate.     

Monitoring imprecise fraction of nonconforming items using p control charts

The quality characteristics, which are known as attributes, cannot be conveniently and numerically represented. Generally, the attribute data can be regarded as the fuzzy data, which are ubiquitous in the manufacturing process and cannot be measured precisely and often be collected by visual inspection. In this paper, we construct a p control chart for monitoring the fraction of nonconforming items in the process in which fuzzy sample data are collected from the manufacturing process. The resolution identity – a well-known theorem in the fuzzy set theory – is invoked to construct the control limits of fuzzy-p control charts using fuzzy data. In order to determine whether the plotted imprecise fraction of nonconforming items is within the fuzzy lower and upper control limits, we also propose a ranking method for a set of fuzzy numbers. Using the fuzzy-p control charts and the proposed acceptability function to classify the manufacturing process allows the decision-maker to make linguistic decisions such as rather in control or rather out of control. A practical example is provided to describe the applicability of the fuzzy set theory to a conventional p control chart.     

Integration of support vector machines and control charts for multivariate process monitoring

Statistical process control tools have been used routinely to improve process capabilities through reliable on-line monitoring and diagnostic processes. In the present paper, we propose a novel multivariate control chart that integrates a support vector machine (SVM) algorithm, a bootstrap method, and a control chart technique to improve multivariate process monitoring. The proposed chart uses as the monitoring statistic the predicted probability of class (PoC) values from an SVM algorithm. The control limits of SVM-PoC charts are obtained by a bootstrap approach. A simulation study was conducted to evaluate the performance of the proposed SVM–PoC chart and to compare it with other data mining-based control charts and Hotelling's T ² control charts under various scenarios. The results showed that the proposed SVM–PoC charts outperformed other multivariate control charts in nonnormal situations. Further, we developed an exponential weighed moving average version of the SVM–PoC charts for increasing sensitivity to small shifts.     

On the improvement of one-sided S control charts

The most common charting procedure used for monitoring the variance of the distribution of a quality characteristic is the S control chart. As a Shewhart-type control chart, it is relatively insensitive in the quick detection of small and moderate shifts in process variance. The performance of the S chart can be improved by supplementing it with runs rules or by varying the sample size and the sampling interval. In this work, we introduce and study one-sided adaptive S control charts, supplemented or not with one powerful runs rule, for detecting increases or decreases in process variation. The properties of the proposed control schemes are obtained by using a Markov chain approach. Furthermore, a practical guidance for the choice of the most suitable control scheme is also provided.