Certain observations on lot sensitive sampling plan

This paper compares the sample size efficiency of the lot sensitive plan over the equivalent double and multiple sampling plans. It is shown that a fully curtailed lot sensitive plan will involve smaller average sample number than the equivalent double and multiple plans.     

Effects of industrial inspection errors on some plans that utilise the surrounding lot information

The effect of the inspector's accuracy on types I and II errors on Dependent and Deferred double sampling plans by Baker et al. (1978) and Chain-deferred inspection plans by Osanaiye (1983) which utilise the surrounding lot information on sentencing a lot is examined. The proportion of production that is wrongly accepted or rejected by each of the plans are also examined drawing particular attention to the effect of making resorts. A linear trend in process quality is assumed. The Chain-deferred plan in general has more tendency to reject defective items more than any of the other plans irrespective of the magnitude of the inspector's error. Although it has slightly higher tendency to reject good items, this is not very significant compared with the other plan as can be seen in the results.     

Modified chain sampling plans for lot inspection by variables and attributes

The purpose of acceptance sampling is to develop decision rules to accept or reject production lots based on sample data. When testing is destructive or expensive, dependent sampling procedures cumulate results from several preceding lots. This chaining of past lot results reduces the required size of the samples. A large part of these procedures only chain past lot results when defects are found in the current sample. However, such selective use of past lot results only achieves a limited reduction of sample sizes. In this article, a modified approach for chaining past lot results is proposed that is less selective in its use of quality history and, as a result, requires a smaller sample size than the one required for commonly used dependent sampling procedures, such as multiple dependent sampling plans and chain sampling plans of Dodge. The proposed plans are applicable for inspection by attributes and inspection by variables. Several properties of their operating characteristic-curves are derived, and search procedures are given to select such modified chain sampling plans by using the two-point method.     

Selection of csp-t plans

Various continuous sampling plans have been proposed for monitoring the quality of continuous production processes. The multi-level continuous sampling plan of MIL-STD-1235C (1988) is designated as CSP-T Plan. CSP-T plan is a three-level tightened continuous sampling plan. It requires a switch to 100% inspection, at any level, whenever a nonconforming unit is found. This provides quick rectification in the event of a shift in quality. In this paper certain performance characteristics of CSP-T plan are derived using the approach of Stephens (1979) under the assumption that the production process is in statistical control. For the selection of CSP-T plans, two tables are given. These tables can be used to obtain parameters i (clearance interval) and f (sampling fraction) of the CSP-T plan for given acceptable quality level (AQL) with producer’ risk α=0.05 or the limiting quality level(LQL) with consumer’ risk β=0.10 and the outgoing quality limit(AOQL). Two examples are also given to illustrate the selection of plans from these tables     

Matching Performance of Continuous Sampling Plans with Single Sampling Plans

Single sampling plans are widely used for appraising incoming product quality. However, for situations where a continuous product flow exists, lot-by-lot demarcations may not exist, and it may be necessary to use alternate procedures, such as CSP-1, for continuous processes. In this case, one would like to be able to understand how average performance of the continuous sampling procedures compares to the more commonly used single sampling plans.

In this study, a model is devised which can be used to relate plan performance between single sample lot acceptance procedures and Dodge's(1943) CSP-1 continuous sampling plan. It is shown that it is generally not possible to match up performance based upon operating characteristic curve expressions for the two plans. Instead, the plans are matched by equating expressions for π(p), the long run proportion of product which is accepted, under both procedures. This is shown to be equivalent to matching up properties on an average outgoing quality basis. The methodology may be extended for any derivative plan under MIL-STD-1235B (1982), the military standard for continuous acceptance sampling.     

Estimating general variable acceptance sampling plans by bootstrap methods

We consider variable acceptance sampling plans that control the lot or process fraction defective, where a specification limit defines acceptable quality. The problem is to find a sampling plan that fulfils some conditions, usually on the operation characteristic. Its calculation heavily depends on distributional properties that, in practice, might be doubtful. If prior data are already available, we propose to estimate the sampling plan by means of bootstrap methods. The bias and standard error of the estimated plan can be assessed easily by Monte Carlo approximation to the respective bootstrap moments. This resampling approach does not require strong assumptions and, furthermore, is a flexible method that can be extended to any statistic that might be informative for the fraction defective in a lot.     

Repetitive group sampling plan based on the process capability index for the lot acceptance problem

An acceptance sampling plan is a method used to make a decision about acceptance or rejection of a product, based on adherence to a standard. Meanwhile, process capability indices (PCIs) have been applied in different manufacturing industries as capability measures based on specified criteria which include process departure from a target, process consistency, process yield and process loss. In this paper, a repetitive group sampling (RGS) plan based on PCI is introduced for variables’ inspection. First, the optimal parameters of the developed RGS plan are obtained considering constraints related to the risk of consumers and producers and also a double sampling plan, a multiple dependent state sampling plan and a sampling plan for resubmitted lots have been designed. Finally, after the development of variable sampling plans based on the Bayesian and exact approach, a comparison study has been performed between the developed RGS plan and other types of sampling plans and the results are elaborated.     

Average outgoing quality of CSP-C continuous sampling plan under short run production processes

A CSP-C continuous sampling plan is a new single-level continuous sampling procedure developed by Govindaraju & Kandasamy (2000) by incorporating the concept of acceptance number to the CSP-1 plan for the application of continuous production processes. In this new plan, the sampling inspection phase is characterized by a maximum allowable number of non-conforming units, c, and a constant sampling rate, f. Govindaraju & Kandasamy (2000) derived the performance measures such as average outgoing quality (AOQ), average fraction inspected (AFI) etc, of the CSP-C plan using a Markov chain model for long run production processes. Yang (1983) has observed that the AOQ and AFI, being long run average measures, are not satisfactory measures of performance for short run production processes. Hence, formulas are derived in this paper, using the renewal theory approach enabling one to compute AOQ and AFI for both long run and short run production processes. Numerical illustrations are also given. By simulation, the accuracy of the short run measures is studied.     

Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles

Acceptance sampling plans based on process yield indices provide a proven resource for the lot-sentencing problem when the required fraction defective is very low. In this study, a new sampling plan based on the exponentially weighted moving average (EWMA) model with yield index for lot sentencing for autocorrelation between polynomial profiles is proposed. The advantage of the EWMA statistic is the accumulation of quality history from previous lots. In addition, the number of profiles required for lot sentencing is more economical than in the traditional single sampling plan. Considering the acceptable quality level (AQL) at the producer's risk and the lot tolerance percent defective (LTPD) at the consumer's risk, we proposed a new search algorithm to determine the optimal plan parameters. The plan parameters are tabulated for various combinations of the smoothing constant of the EWMA statistic, AQL, LTPD, and two risks. A comparison study and two numerical examples are provided to show the applicability of the proposed sampling plan.     

Assessment of acceptance sampling plans using posterior distribution for a dependent process

In this study, performance of single acceptance sampling plans by attribute is investigated by using the distribution of fraction nonconformance (i.e. lot quality distribution) for a dependent production process. It is the aim of this study to demonstrate that, in order to emphasize consumer risk (i.e. the risk of accepting a bad lot), it is better to evaluate a sampling plan based upon its performance as assessed by the posterior distribution of fractions nonconforming in accepted lots. Similarly, it is the desired posterior distribution that sets the basis for designing a sampling plan. The prior distribution used in this study is derived from a Markovian model of dependence.     

Selection of tightened two-level continuous sampling plans

Lieberman and Solomon (1955) introduced multi-level continuous sampling plans and Derman et al. (1957) extended them as tightened multi-level continuous plans. MLP-T plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957). In this paper, we restrict our discussion to MLP-T plans with two sampling levels. Using a Markov chain model, expressions for the average outgoing quality, the average fraction inspected and the operating characteristic function are derived. Four tables are given to enable selection of MLP-T plans with two sampling levels when the acceptable quality level or the limiting quality level and the average outgoing quality limit are specified.     

Acceptance sampling by variables when the remainder of rejected lots is inspected

Acceptance sampling plans for inspection by variables, which minimize the mean inspection cost per lot of process average quality (assuming that the remainder of rejected lots is, inspected), were derived under the condition that the probability of accepting a submitted lot of tolerance quality, shall be 0.1. These plans were tabulated for chosen values of the given parameters, and compared with the Dodge-Romig LTPD attribute sampling plans. From the comparison it follows that under the same protection of consumer the LTPD plans for inspection by variables are in many situations more economical than the corresponding Dodge-Romig plans. This result is valid especially for the large lots and for the small values of the tolerance fraction defective.     

Repetitive variable acceptance sampling plan for one-sided specification

In this paper, a variable repetitive group sampling plans based on one-sided process capability indices is proposed to deal with lot sentencing for one-sided specifications. The parameters of the proposed plans are tabulated for some combinations of acceptance quality levels with commonly used producer's risk and consumer's risk. The efficiency of the proposed plan is compared with the Pearn and Wu [Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives. Omega – Int J Manag Sci. 2006;34(1):90–101] plan in terms of sample size and the power curve. One example is given to illustrate the proposed methodology.     

Predictive design of single sampling attribute plans

The design of a sampling inspection plan is usually based on the properties of the operating characteristic curve. This approach ensures that the plan has adequate power to discriminate a lot of acceptable quality from a lot rejectable quality. However, the designed plan need not necessarily have adequate predictive power when the sentenced lot is re-inspected using the same sampling plan. The paper introduces a new design approach for the single sampling attributes plan ensuring the decision of acceptance or rejection is consistent for both current and any future inspection of the lot. The proposed design controls the risks of a future sample leading to a contradictory decision of acceptance or rejection of the lot. An increase in sample size is required to achieve the required predictive power if the true lot quality fails to be at very low fraction non-conforming levels. A Bayesian analysis is also provided.     

A recursive approach for lot sentencing problem in the presence of inspection errors

In this paper, a new sequential acceptance sampling plans in the presence of inspection errors is developed. A suitable profit objective function is employed for optimizing the lot sentencing problem. A backward recursive approach is applied for obtaining the profit of different decisions in each stage of sampling. Required probabilities are obtained using Bayesian rule. A case study is solved for illustrating the application of proposed models and sensitivity analysis are carried out on the parameters of the proposed methodologies and the behaviour of models by changing the parameters are investigated.     

Modified tightened two-level continuous sampling plans

In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.     

Optimal designing of a new mixed variable lot-size chain sampling plan based on the process capability index

In this paper, a new mixed sampling plan based on the process capability index (PCI) C_pk is proposed and the resultant plan is called mixed variable lot-size chain sampling plan (ChSP). The proposed mixed plan comprises of both attribute and variables inspections. The variable lot-size sampling plan can be used for inspection of attribute quality characteristics and for the inspection of measurable quality characteristics, the variables ChSP based on PCI will be used. We have considered both symmetric and asymmetric fraction non conforming cases for the variables ChSP. Tables are developed for determining the optimal parameters of the proposed mixed plan based on two points on the operating characteristic (OC) approach. In order to construct the tables, the problem is formulated as a non linear programming where the average sample number function is considered as an objective function to be minimized and the lot acceptance probabilities at acceptable quality level and limiting quality level under the OC curve are considered as constraints. The practical implementation of the proposed mixed sampling plan is explained with an illustrative real time example. Advantages of the proposed sampling plan are also discussed in terms of comparison with other existing sampling plans.     

Variables acceptance reliability sampling plan for items subject to inverse Gaussian degradation process

Until now, in the literature, a variety of acceptance reliability sampling plans have been developed based on different life test plans. In most of the reliability sampling plans, the decision procedures to accept or reject the corresponding lot are developed based on the lifetimes of the items observed on tests, or the number of failures observed during a pre-specified testing time. However, frequently, the items are subject to degradation phenomena and, in these cases, the observed degradation level of the item can be used as a decision statistic. In this paper, we develop a variables acceptance sampling plan based on the information on the degradation process of the items, assuming that the degradation process follows the inverse Gaussian process. It is shown that the developed sampling plan improves the reliability performance of the items conditional on the acceptance in the test and that the lifetimes of items after the reliability sampling test are stochastically larger than those before the test. A study comparing the proposed degradation-based sampling plan with the conventional sampling plan which is based on a life test is also performed.KEYWORDS: Variables sampling plan, degradation test, inverse Gaussian process, mixture distribution, stochastic ordering     

Lot Sampling Distributions for Bounded Number of Nonconformities

Attributes sampling is an important inspection tool in areas like product quality control, service quality control or auditing. The classical item quality scheme of attributes sampling distinguishes between conforming and nonconforming items, and measures lot quality by the lot fraction nonconforming. A more refined quality scheme rates item quality by the number of nonconformities occurring on the item, e.g., the number of defective components in a composite product or the number of erroneous entries in an accounting record, where lot quality is measured by the average number of nonconformities occurring on items in the lot. Statistical models of sampling for nonconformities rest on the idealizing assumption that the number of nonconformities on an item is unbounded. In most real cases, however, the number of nonconformities on an item has an upper bound, e.g., the number of product components or the number of entries in an accounting record. The present study develops two statistical models of sampling lots for nonconformities in the presence of an upper bound a for the number of nonconformities on each single item. For both models, the statistical properties of the sample statistics and the operating characteristics of single sampling plans are investigated. A broad numerical study compares single sampling plans with prescribed statistical properties under the bounded and unbounded quality schemes. In a large number of cases, the sample sizes for the realistic bounded models are smaller than the sample sizes for the idealizing unbounded model.     

Developing of a new system of skip-lot reinspection schemes

The skip-lot sampling plans are widely used in industries for quality inspection of products in order to reduce the sampling costs and inspection efforts when products have good quality history. Also, the skip-lot sampling plan concept is sound and useful and it is economically advantageous to use the skip-lot approach in the design of sampling plans. Thus, the skip-lot sampling plans are useful to minimize the cost of the inspection particularly in costly and destructive testing. Hence, a new system of skip-lot sampling plans designated as SkSP-2-R plan is developed in this article by incorporating the idea of resampling procedure in the skip-lot sampling plans of type SkSP-2. A Markov chain formulation and derivation of performance measures for this new plan are presented. The properties and advantages of the SkSP-2-R plan are studied with single sampling plan as the reference plan. The response-to-change characteristics of the SkSP-2-R plan are also investigated, based on the average run length.