Double-sampling control charts for attributes

In this article, we propose a double-sampling (DS) np control chart. We assume that the time interval between samples is fixed. The choice of the design parameters of the proposed chart and also comparisons between charts are based on statistical properties, such as the average number of samples until a signal. The optimal design parameters of the proposed control chart are obtained. During the optimization procedure, constraints are imposed on the in-control average sample size and on the in-control average run length. In this way, required statistical properties can be assured. Varying some input parameters, the proposed DS np chart is compared with the single-sampling np chart, variable sample size np chart, CUSUM np and EWMA np charts. The comparisons are carried out considering the optimal design for each chart. For the ranges of parameters considered, the DS scheme is the fastest one for the detection of increases of 100% or more in the fraction non-conforming and, moreover, the DS np chart is easy to operate.     

A new double sampling control chart for monitoring process mean using auxiliary information

Statistical quality control charts have been widely accepted as a potentially powerful process monitoring tool because of their excellent speed in tracking shifts in the underlying process parameter(s). In recent studies, auxiliary-information-based (AIB) control charts have shown superior run length performances than those constructed without using it. In this paper, a new double sampling (DS) control chart is constructed whose plotting-statistics requires information on the study variable and on any correlated auxiliary variable for efficiently monitoring the process mean, namely AIB DS chart. The AIB DS chart also encompasses the classical DS chart. We discuss in detail the construction, optimal design, run length profiles, and the performance evaluations of the proposed chart. It turns out that the AIB DS chart performs uniformly better than the DS chart when detecting different kinds of shifts in the process mean. It is also more sensitive than the classical synthetic and AIB synthetic charts when detecting a particular shift in the process mean. Moreover, with some realistic beliefs, the proposed chart outperforms the exponentially weighted moving average chart. An illustrative example is also presented to explain the working and implementation of the proposed chart.     

Synthetic double sampling s chart

This study proposes a synthetic double sampling s chart that integrates the double sampling (DS) s chart and the conforming run length chart. An optimization procedure is proposed to compute the optimal parameters of the synthetic DS s chart. The performance of the synthetic DS s chart is compared with other existing control charts for monitoring process standard deviation. The results show that the synthetic DS s chart is more effective for detecting increases in the process standard deviation for a wide range of shifts. An example is provided to illustrate the operation procedure of the synthetic DS s chart.     

A joint-adaptive np control chart with multiple dependent state sampling scheme

Although the classical Shewhart np control chart has been widely used to detect an out-of-control status of manufacturing process, it is static and there is lack of responsiveness to slight process changes. In this paper, an adaptive np control chart with a joint sampling strategy combining double sampling (DS) and variable sampling interval (VSI) is developed. The multiple dependent state sampling scheme is adopted to further improve the performance of the control chart. An economical design model to minimize the general cost of using the proposed chart is established and solved by a genetic algorithm. The numerical results show that comparing to traditional static np control chart, the proposed np chart yields better performance in terms of shorter time to signal an out-of-control process and less expected cost per unit of time. Comparisons are made to show the capability of the proposed chart in yielding average reductions of 5.01% and 8.89%, in the cost of the proposed model compared to situations in which either the DSVSI np chart or the traditional np chart is used.     

A Robust Control Chart for Monitoring the Mean of an Autocorrelated Process

Residual control charts are frequently used for monitoring autocorrelated processes. In the design of a residual control chart, values of the true process parameters are often estimated from a reference sample of in-control observations by using least squares (LS) estimators. We propose a robust control chart for autocorrelated data by using Modified Maximum Likelihood (MML) estimators in constructing a residual control chart. Average run length (ARL) is simulated for the proposed chart when the underlying process is AR(1). The results show the superiority of the new chart under several situations. Moreover, the chart is robust to plausible deviations from assumed distribution of errors.     

A generally weighted moving average chart for time between events

Shewhart-type attribute charts are known to be inefficient for small changes in monitoring nonconformities. An alternative way is to use a time-weighted chart to monitor the time between events (TBE). We propose a one-sided Generally Weighted Moving Average control chart to monitor the time between events (TBE); regarded as the GWMA-TBE chart. To aid the implementation of the chart, the necessary design parameters are provided. An extensive performance analysis shows that the GWMA-TBE chart is better than the well-known EWMA and Shewhart charts at detecting very small to moderate changes. Finally, a summary and some conclusions are provided.     

A mean deviation-based approach to monitor process variability

The study proposes a Shewhart-type control chart, namely an MD chart, based on average absolute deviations taken from the median, for monitoring changes (especially moderate and large changes – a major concern of Shewhart control charts) in process dispersion assuming normality of the quality characteristic to be monitored. The design structure of the proposed MD chart is developed and its comparison is made with those of two well-known dispersion control charts, namely the R and S charts. Using power curves as a performance measure, it has been observed that the design structure of the proposed MD chart is more powerful than that of the R chart and is very close competitor to that of the S chart, in terms of discriminatory power for detecting shifts in the process dispersion. The non-normality effect is also examined on design structures of the three charts, and it has been observed that the design structure of the proposed MD chart is least affected by departure from normality.     

The effect of Phase I sample size on the run length performance of control charts for autocorrelated data

Traditional control charts assume independence of observations obtained from the monitored process. However, if the observations are autocorrelated, these charts often do not perform as intended by the design requirements. Recently, several control charts have been proposed to deal with autocorrelated observations. The residual chart, modified Shewhart chart, EWMAST chart, and ARMA chart are such charts widely used for monitoring the occurrence of assignable causes in a process when the process exhibits inherent autocorrelation. Besides autocorrelation, one other issue is the unknown values of true process parameters to be used in the control chart design, which are often estimated from a reference sample of in-control observations. Performances of the above-mentioned control charts for autocorrelated processes are significantly affected by the sample size used in a Phase I study to estimate the control chart parameters. In this study, we investigate the effect of Phase I sample size on the run length performance of these four charts for monitoring the changes in the mean of an autocorrelated process, namely an AR(1) process. A discussion of the practical implications of the results and suggestions on the sample size requirements for effective process monitoring are provided.     

Time truncated attribute control chart for the Weibull distribution using multiple dependent state sampling

In this article, an attribute control chart is proposed for time truncated tests using the Weibull distribution. The design of proposed control chart is presented using the multiple dependent state (MDS) sampling. The control chart coefficients are determined for various specified average run length. The efficiency of the proposed control chart is elaborated with the help of a simulation data and a real data. The proposed control chart perform better than the existing control chart in terms of average run length.     

Development of a multiattribute synthetic-np chart

Over the last few decades, multiattribute control charts have been widely recommended in practice. They outperform the simultaneous uniattribute charts for monitoring multiattribute processes in many applications. Jolayemi [A statistical model for the design of multiattribute control charts. Indian J Stat. 1999;61:351–365] developed a statistical model for the design of a multiattribute np (Mnp) chart. Based on this model, a multiattribute synthetic (MSyn) chart is proposed in this article. Furthermore, the main features of the MSyn chart and Mnp chart are integrated to build a multiattribute Syn-np (MSyn-np) chart. The results of the comparative studies indicate that the new MSyn-np chart significantly outperforms the Mnp chart and MSyn chart by 83% and 27%, respectively, in terms of the average number of defectives over a wide range of process shifts under different circumstances.     

An adaptive exponentially weighted moving average control chart for monitoring process variances

The exponentially weighted moving average (EWMA) control chart is efficient in detecting small changes in process parameters but less efficient when the changes are relatively large, due to what is known as the inertia problem. To diminish the inertia, an adaptive EWMA (AEWMA) chart has been proposed for monitoring process locations to improve over the traditional EWMA charts. The basic idea of the AEWMA scheme is to dynamically weight the past observations according to a suitable function of the current prediction error. This article extends the idea of the AEWMA chart for monitoring process locations to the case of monitoring process dispersion. A Markov chain model is established to analyze and design the suggested chart. It is shown that the AEWMA dispersion chart performs better than the EWMA and other dispersion charts in terms of its ability to perform relatively well at both small and large changes in process dispersion.     

A new synthetic control chart for monitoring process mean using auxiliary information

ABSTRACT

Quality control charts have been widely recognized as a potentially powerful statistical process monitoring tool in statistical process control because of their superior ability in detecting shifts in the process parameters. Recently, auxiliary-information-based control charts have been proposed and shown to have excellent speed in detecting process shifts than those based without it. In this paper, we design a new synthetic control chart that is based on a statistic that utilizes information from both the study and auxiliary variables. The proposed synthetic chart encompasses the classical synthetic chart. The construction, optimal design, run length profiles, and the performance evaluation of the new chart are discussed in detail. It turns out that the proposed synthetic chart performs uniformly better than the classical synthetic chart when detecting different kinds of shifts in the process mean under both zero-state and steady-state run length performances. Moreover, with reasonable assumptions, the proposed chart also surpasses the exponentially weighted moving average control chart. An application with a simulated data set is also presented to explain the implementation of the proposed control chart.     

A rational sequential probability ratio test control chart for monitoring process shifts in mean and variance

The sequential probability ratio test (SPRT) chart is a very effective tool for monitoring manufacturing processes. This paper proposes a rational SPRT chart to monitor both process mean and variance. This SPRT chart determines the sampling interval d based on the rational subgroup concept according to the process conditions and administrative considerations. Since the rational subgrouping is widely adopted in the design and implementation of control charts, the studies of the rational SPRT have a practical significance. The rational SPRT chart is designed optimally in order to minimize the index average extra quadratic loss for the best overall performance. A systematic performance study has also been conducted. From an overall viewpoint, the rational SPRT chart is more effective than the cumulative sum chart by more than 63%. Furthermore, this article provides a design table, which contains the optimal values of the parameters of the rational SPRT charts for different specifications. This will greatly facilitate the potential users to select an appropriate SPRT chart for their applications. The users can also justify the application of the rational SPRT chart according to the achievable enhancement in detection effectiveness.     

Optimal design of the adaptive exponentially weighted moving average control chart over a range of mean shifts

The adaptive exponentially weighted moving average (AEWMA) control chart is a smooth combination of the Shewhart and exponentially weighted moving average (EWMA) control charts. This chart was proposed by Cappizzi and Masarotto (2003) to achieve a reasonable performance for both small and large shifts. Cappizzi and Masarotto (2003) used a pair of shifts in designing their control chart. In this study, however, the process mean shift is considered as a random variable with a certain probability distribution and the AEWMA control chart is optimized for a wide range of mean shifts according to that probability distribution and not just for a pair of shifts. Using the Markov chain technique, the results show that the new optimization design can improve the performance of the AEWMA control chart from an overall point of view relative to the various designs presented by Cappizzi and Masarotto (2003). Optimal design parameters that achieve the desired in-control average run length (ARL) are computed in several cases and formulas used to find approximately their values are given. Using these formulas, the practitioner can compute the optimal design parameters corresponding to any desired in-control ARL without the need to apply the optimization procedure. The results obtained by these formulas are very promising and would particularly facilitate the design of the AEWMA control chart for any in-control ARL value.     

Economic-statistical design of synthetic double sampling T2 chart

Abstract

An economic-statistical design of the synthetic double sampling (synDS) T² chart is presented in this study. The cost function is minimized to obtain the optimal design parameters of the synDS T² chart by incorporating the statistical constraints or the constraints on the average number of samples. An example is provided and a sensitivity analysis is conducted to study the effect of model parameters on the optimal solution of the design. The numerical comparison shows that the synDS T² chart performs better than the synthetic T² chart and the multivariate exponentially weighted moving average chart, in terms of the cost.     

An NP Control Chart Using Double Inspections

The np control chart is used widely in Statistical Process Control (SPC) for attributes. It is difficult to design an np chart that simultaneously satisfies a requirement on false alarm rate and has high detection effectiveness. This is mainly because one is often unable to make the in-control Average Run Length ARL₀ of an np chart close to a specified or desired value. This article proposes a new np control chart which is able to overcome the problems suffered by the conventional np chart. It is called the Double Inspection (DI) np chart, because it uses a double inspection scheme to decide the process status (in control or out of control). The first inspection decides the process status according to the number of non-conforming units found in a sample; and the second inspection makes a decision based on the location of a particular non-conforming unit in the sample. The double inspection scheme makes the in-control ARL₀ very close to a specified value and the out-of-control Average Run Length ARL₁ quite small. As a result, the requirement on a false alarm rate is satisfied and the detection effectiveness also achieves a high level. Moreover, the DI np chart retains the operational simplicity of the np chart to a large degree and achieves the performance improvement without requiring extra inspection (testing whether a unit is conforming or not).     

Optimal design of synthetic np control chart based on median run length

The synthetic np chart is a combination of the np sub-chart and the conforming run length sub-chart. A procedure for the optimal design of the synthetic np chart is provided by minimizing the out-of-control median run length (MRL). The comparative results show that the synthetic np chart performs better than the corresponding standard np chart for detecting process shifts in the fraction non conforming, in terms of the MRL. An example is given to illustrate the operation of the synthetic np chart.     

A synthetic control chart for monitoring the small shifts in a process mean based on an attribute inspection

Abstract

In this paper, a synthetic control chart is proposed by integrating the salient features of the np_x chart and the CRL chart. The synthetic chart achieves higher detection effectiveness on both small and large mean shifts while retaining the operational simplicity of the attribute charts owing to only using attribute inspection. Both statistical and economic design of the synthetic chart are considered and numerical tests have indicated that the synthetic chart has a higher power for detecting mean shifts than the np_x chart, MON chart and CUSUM chart. In addition, sensitivity analyses are also performed under both the statistical and economic design model.     

Design of a sign chart using a new EWMA statistic

Abstract

In this article, a new non parametric control chart based on the modified or controlled exponentially weighted moving average (EWMA) statistic is developed to monitor the process deviation from the target value. The proposed control chart is evaluated for different values of design parameters using the average run length as a performance criterion under various sample sizes. The proposed chart is compared with the existing non parametric EWMA sign control chart. It is observed that the proposed chart is better than the existing EWMA sign control chart in terms of run length characteristics. An empirical example is provided for the practical implementation of the proposed chart.     

Economic design of non parametric sign control chart

An economic design of sign chart to control the median is proposed. Since the sign chart is distribution free, it can easily be applied to any process without prior knowledge of process quality distribution. The effect on loss cost observed for different shifts in location shows that the sign chart performs better for large shifts. The economic statistical performance study reveals that statistical performance of sign chart can be improved sufficiently for moderate shifts in the process. Sensitivity study shows that design is more sensitive for change in values of penalty loss cost and time required for search and repair of an assignable cause.