Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals

This paper considers the design of accelerated life test (ALT) sampling plans under Type I progressive interval censoring with random removals. We assume that the lifetime of products follows a Weibull distribution. Two levels of constant stress higher than the use condition are used. The sample size and the acceptability constant that satisfy given levels of producer's risk and consumer's risk are found. In particular, the optimal stress level and the allocation proportion are obtained by minimizing the generalized asymptotic variance of the maximum likelihood estimators of the model parameters. Furthermore, for validation purposes, a Monte Carlo simulation is conducted to assess the true probability of acceptance for the derived sampling plans.     

Optimal design of accelerated degradation tests based on Wiener process models

Optimal accelerated degradation test (ADT) plans are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Unlike the previous works on planning ADTs based on stochastic process models, this article determines the test stress levels and the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum-likelihood estimator of the qth quantile of the lifetime distribution at the use condition is minimized. In addition, compromise plans are also developed for checking the validity of the relationship between the model parameters and the stress variable. Finally, using an example, sensitivity analysis procedures are presented for evaluating the robustness of optimal and compromise plans against the uncertainty in the pre-estimated parameter value, and the importance of optimally determining test stress levels and the proportion of units allocated to each stress level are illustrated.     

Optimal design of accelerated life tests under modified stress loading methods

SUMMARY Most of the previous work on optimal design of accelerated life test (ALT) plans has assumed instantaneous changes in stress levels, which may not be possible or desirable in practice, because of the limited capability of test equipment, possible stress shocks or the presence of undesirable failure modes. We consider the case in which stress levels are changed at a finite rate, and develop two types of ALT plan under the assumptions of exponential lifetimes of test units and type I censoring. One type of plan is the modified step-stress ALT plan, and the other type is the modified constant-stress ALT plan. These two plans are compared in terms of the asymptotic variance of the maximum likelihood estimator of the log mean lifetime for the use condition (i.e. avar\[ln (0)]). Computational results indicate that, for both types of plan, avar\[ln (0)] is not sensitive to the stress-increasing rate R, if R is greater than or equal to 10, say, in the standardized scale. This implies that the proposed stress loading method can be used effectively with little loss in statistical efficiency. In terms of avar\[ln (0)], the modified step-stress ALT generally performs better than the modified constant-stress ALT, unless R or the probability of failure until the censoring time under a certain stress-increasing rate is small. We also compare the progressive-stress ALT plan with the above two modified ALT plans in terms of avar\[ln (0)], using the optimal stress-increasing rate R* determined for the progressivestress ALT plan. We find that the proposed ALTs perform better than the progressivestress ALT for the parameter values considered.     

Economic design of acceptance sampling plans for truncated life test using Frechet distribution

In this article designing of acceptance sampling plans for the truncated life test is proposed using economic approach by assuming that the lifetime of a product follows Frechet distribution based on median. The optimal sampling plans to meet the consumer’s confidence level with minimum total cost are designed. Efficiency of the proposed plan is also analyzed.     

Optimal simple step stress accelerated life test design for reliability prediction

A step stress accelerated life testing model is presented to obtain the optimal hold time at which the stress level is changed. The experimental test is designed to minimize the asymptotic variance of reliability estimate at time ζ$\zeta$. A Weibull distribution is assumed for the failure time at any constant stress level. The scale parameter of the Weibull failure time distribution at constant stress levels is assumed to be a log-linear function of the stress level. The maximum likelihood function is given for the step stress accelerated life testing model with Type I censoring, from which the asymptotic variance and the Fisher information matrix are obtained. An optimal test plan with the minimum asymptotic variance of reliability estimate at time ζ$\zeta$ is determined.     

Failure Inference and Optimization for Step Stress Model Based on Bivariate Wiener Model

In this article, we consider the situation under a life test, in which the failure time of the test units are not related deterministically to an observable stochastic time varying covariate. In such a case, the joint distribution of failure time and a marker value would be useful for modeling the step stress life test. The problem of accelerating such an experiment is considered as the main aim of this article. We present a step stress accelerated model based on a bivariate Wiener process with one component as the latent (unobservable) degradation process, which determines the failure times and the other as a marker process, the degradation values of which are recorded at times of failure. Parametric inference based on the proposed model is discussed and the optimization procedure for obtaining the optimal time for changing the stress level is presented. The optimization criterion is to minimize the approximate variance of the maximum likelihood estimator of a percentile of the products’ lifetime distribution.     

Bayesian D-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure

This paper provides methods of obtaining Bayesian D-optimal Accelerated Life Test (ALT) plans for series systems with independent exponential component lives under the Type-I censoring scheme. Two different Bayesian D-optimality design criteria are considered. For both the criteria, first optimal designs for a given number of experimental points are found by solving a finite-dimensional constrained optimization problem. Next, the global optimality of such an ALT plan is ensured by applying the General Equivalence Theorem. A detailed sensitivity analysis is also carried out to investigate the effect of different planning inputs on the resulting optimal ALT plans. Furthermore, these Bayesian optimal plans are also compared with the corresponding (frequentist) locally D-optimal ALT plans.     

Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity

Accelerated life testing (ALT) provides a means of obtaining data on product lifetime and reliability relatively quickly by subjecting products to higher-than-usual levels of stress factors. We present methods for obtaining optimal designs for multiple-factor ALTs with time censoring and heteroscedasticity in order to estimate percentiles of product life at usage conditions. We assume a Weibull life distribution and log-linear life–stress relationships with non constant shape parameter for the ALT stress factors. The primary optimality criterion is the minimization of the asymptotic variance of maximum likelihood estimator of the percentile estimator at usage stress. We also consider a secondary criterion for our design optimization. The design construction methods are illustrated by two practical examples.     

Restricted optimal progressive censoring

Unlike traditional Type I and II censoring, progressive censoring allows for removal of surviving units throughout the life test. This feature has several benefits and in the literature, much work has been done on inference based on progressively censored samples and identifying optimal progressive censoring schemes. In this paper, we introduce restricted progressive censoring and within this class, the problem of identifying optimal schemes under different minimum variance criteria. We explore these plans geometrically as well as provide some useful properties. In particular, we look at the vertices of the set of admissible plans and their role in approximating optimal plans. We also provide computational results for illustrative purposes.     

Two-level minimum aberration designs in N =2 (mod 4) runs

For two-level factorials, we consider designs in N=2 (mod 4) runs as obtained by adding two runs, with a certain coincidence pattern, to an orthogonal array of strength two. These designs are known to be optimal main effect plans in a very broad sense in the absence of interactions. Among them, we explore the ones having minimum aberration, with a view to ensuring maximum model robustness even when interactions are possibly present. This is done by sequentially minimizing a measure of the bias caused by interactions of successively higher orders.     

Accelerated life test planning with independent lognormal competing risks

In accelerated life testing (ALT), products are exposed to stress levels higher than those at normal use in order to obtain information in a timely manner. Past work on planning ALT is predominantly on a single cause of failure. This article presents methods for planning ALT in the presence of k competing risks. Expressions for computing the Fisher information matrix are presented when risks are independently distributed lognormal. Optimal test plans are obtained under criteria that are based on determinants and maximum likelihood estimation. The proposed method is demonstrated on ALT of motor insulation.     

Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model

The purpose of this paper is to address the optimal design of the step-stress accelerated degradation test (SSADT) issue when the degradation process of a product follows the inverse Gaussian (IG) process. For this design problem, an important task is to construct a link model to connect the degradation magnitudes at different stress levels. In this paper, a proportional degradation rate model is proposed to link the degradation paths of the SSADT with stress levels, in which the average degradation rate is proportional to an exponential function of the stress level. Two optimization problems about the asymptotic variances of the lifetime characteristics' estimators are investigated. The optimal settings including sample size, measurement frequency and the number of measurements for each stress level are determined by minimizing the two objective functions within a given budget constraint. As an example, the sliding metal wear data are used to illustrate the proposed model.     

Design of accelerated life test plans under progressive Type II interval censoring with random removals

This paper investigates the design of accelerated life test (ALT) plans under progressive Type II interval censoring with random removals. Units’ lifetimes are assumed to follow a Weibull distribution, and the number of random removals at each inspection is assumed to follow a binomial distribution. The optimal ALT plans, which minimize the asymptotic variance of an estimated quantile at use condition, are determined. The expected duration of the test and the expected number of inspections on each stress level are calculated. A numerical study is conducted to investigate the properties of the derived ALT plans under different parameter values. For illustration purpose, a numerical example is also given.     

Optimal bivariate step-stress accelerated life test for Type-I hybrid censored data

This paper presents a step-stress accelerated life test for two stress variables to obtain optimal hold times under a Type-I hybrid censoring scheme. An exponentially distributed life and a cumulative exposure model are assumed. The maximum-likelihood estimates are given, from which the asymptotic variance and the Fisher information matrix are obtained. The optimal test plan is determined for each combination of stress levels by minimizing the asymptotic variance of reliability estimate at a typical operating condition. Finally, simulation results are discussed to illustrate the proposed criteria. Simulation results show that the proposed optimum plan is robust, and the initial estimates have a small effect on optimal values.     

Optimum constant-stress life test plans for Pareto distribution under type-I censoring

The paper considers the case of constant-stress partially accelerated life testing (CSPALT) when two stress levels are involved under type-I censoring. The lifetimes of test items are assumed to follow a two-parameter Pareto lifetime distribution. Maximum-likelihood method is used to estimate the parameters of CSPALT model. Confidence intervals for the model parameters are constructed. Optimum CSPALT plans that determine the best choice of the proportion of test units allocated to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance of the maximum-likelihood estimators of the model parameters. For illustration, Monte Carlo simulation studies are presented.     

Asymptotic Comparison Between Constant-stress Testing and Step-stress Testing for Type-I Censored Data from Exponential Distribution

By running the life tests at higher stress levels than normal operating conditions, accelerated life testing quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant-stress testing, a unit is tested at a fixed stress level until failure or the termination time point of the test, while step-stress testing allows the experimenter to gradually increase the stress levels at some pre-fixed time points during the test. In this article, the optimal k-level constant-stress and step-stress accelerated life tests are compared for the exponential failure data under Type-I censoring. The objective is to quantify the advantage of using the step-stress testing relative to the constant-stress one. A log-linear relationship between the mean lifetime parameter and stress level is assumed and the cumulative exposure model holds for the effect of changing stress in step-stress testing. The optimal design point is then determined under C-optimality, D-optimality, and A-optimality criteria. The efficiency of step-stress testing compared to constant-stress testing is discussed in terms of the ratio of optimal objective functions based on the information matrix.     

Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes

Manufacturers are often faced with the problem of how to select the most reliable design among several competing designs in the stage of development. It becomes complicated if products are highly reliable. Under the circumstances, recent work has focused on the study with degradation data by assuming that degradation paths follow Wiener processes or random-effect models. However, it is more appropriate to use gamma processes to model degradation data with monotone-increasing pattern. This article deals with the selection problem for such processes. With a minimum probability of correct decision, optimal test plans can be obtained by minimizing the total cost.     

Minimum and Maximum Information Censoring Plans in Progressive Censoring

Expressions for the entropy, the Kullback-Leibler information, and the I _α-information are established for distributions of progressively Type-II censored order statistics. These results are used to identify minimum and maximum information censoring plans. In particular, we find minimum and maximum entropy plans for DFR, exponential, Pareto, reflected power, and Weibull distributions. The results for Kullback-Leibler and I _α-information hold for any continuous distribution.     

Minimum Variance and VOQL Chain Sampling Plans–ChSP-4(c 1, c 2)

In this article the outgoing quality and the total inspection for the chain sampling plan ChSP-4(c ₁, c ₂) are introduced as well-defined random variables. The probability distributions of outgoing quality and total inspection are stated based on total rectification of non conforming units. The variances of these random variables are studied. The aim of this article is to develop procedures for minimum variance ChSP-4(c ₁, c ₂) sampling plans and their determination. In addition to minimum variance sampling plans, a procedure is developed for designing plans with a designated maximum variance, a VOQL (Variance of Outgoing Quality Limit) plan. The VOQL concept is analogous to the AOQL (Average Outgoing Quality Limit) except in the VOQL plan, it is the maximum variance which is established instead of the usual maximum AOQ.     

Economic design of quick switching sampling system for resubmitted lots

This paper proposes a quick switching sampling system for the inspection of attributes quality characteristics for resubmitted lots. The optimal parameters for both fraction non conforming items and fraction non conformities of the proposed sampling system are determined using an optimization procedure so that producer’s risk and consumer’s risk are simultaneously satisfied. Tables are also constructed for the selection of parameters for specified AQL and LQL. The advantage of the proposed plan over the existing plan is discussed and illustrate. An economic design of the proposed sampling system is also discussed and shown that the proposed sampling system has minimum total cost and average total inspection compared to other existing sampling plans.