A new t-chart using process capability index

Control charts play a vital role to enhance the efficiency of the manufacturing process. In many situations, the quality characteristic of interest to be monitored follows a non-normal distribution. In this article, we propose a new control chart using the process capability index when the quality characteristic follows the exponential distribution. The performance of the proposed chart is evaluated using the Monte Carlo simulation. Tables are presented for various values of specified average run length and sample size. The use of the proposed control chart is discussed with the help of an example.     

A process capability index for discrete processes

Perakis and Xekalaki 2002, A process capability index that is based on the proportion of conformance. Journal of Statistical Computation and Simulation, 72(9), 707–718. introduced a process capability index that is based on the proportion of conformance of the process under study and has several appealing features. One of its advantages is that it can be used not only for continuous processes, as is the case with the majority of the indices considered in the literature, but also for discrete processes as well. In this article, the use of this index is investigated for discrete data under two alternative models, which are frequently considered in statistical process control. In particular, distributional properties and estimation of the index are considered for Poisson processes and for processes resulting in modeling attribute data. The performance of the suggested estimators and confidence limits is tested via simulation.     

SkSP-R sampling plan based on process capability index

In this paper, we present an optimal designing methodology for the skip-lot sampling plan (SkSP) of type SkSP-R based on the most widely used process capability index (PCI) C_pk. The SkSP-R plan is one of the SkSPs that incorporate the provision of the reinspection concept. In order to design the optimal parameters, we consider both symmetric and asymmetric fraction non conforming cases. Tables are also constructed to determine the optimal parameters by formulating an optimization problem. The advantages of the proposed plan over the existing plan are also discussed. Application of the plan is explained with a real-life example.     

Optimal designing of a new mixed variable lot-size chain sampling plan based on the process capability index

In this paper, a new mixed sampling plan based on the process capability index (PCI) C_pk is proposed and the resultant plan is called mixed variable lot-size chain sampling plan (ChSP). The proposed mixed plan comprises of both attribute and variables inspections. The variable lot-size sampling plan can be used for inspection of attribute quality characteristics and for the inspection of measurable quality characteristics, the variables ChSP based on PCI will be used. We have considered both symmetric and asymmetric fraction non conforming cases for the variables ChSP. Tables are developed for determining the optimal parameters of the proposed mixed plan based on two points on the operating characteristic (OC) approach. In order to construct the tables, the problem is formulated as a non linear programming where the average sample number function is considered as an objective function to be minimized and the lot acceptance probabilities at acceptable quality level and limiting quality level under the OC curve are considered as constraints. The practical implementation of the proposed mixed sampling plan is explained with an illustrative real time example. Advantages of the proposed sampling plan are also discussed in terms of comparison with other existing sampling plans.     

On the distributions of the estimated process capability indices

The exact distributions of the estimated process capability indices are presented and their means, variances, and mean-squared errors are given. The basic assumption is that the process measurements are taken from a normal distribution. Theresults in this article are useful in evaluating process capability.     

Designing optimal double-sampling plan based on process capability index

Process capability analysis is applied to monitor the process quality. Process capability can be quantified by process capability index. These indices have wide application in quality control methods and acceptance sampling plans. In this paper, we introduce a double-sampling plan based on process capability index. In this type of scheme, under a decision rule and with the specified rejection and acceptance numbers, the second sample is selected and the decision of rejection or acceptance is made based on the information obtained from two samples. The purpose of this scheme is to reduce the average sample number in order to reduce the time and cost of sampling. A comparison study has been conducted in order to evaluate the performance of proposed method in comparison with classical single sampling plans.     

A general class of capability indices in the case of asymmetric tolerances

Vannman has earlier studied a class of capability indices, containing the indices C _p , C _pk , C _pm and C _pmk , when the tolerances are symmetric. We study the properties of this class when the tolerances are asymmetric and suggest a new enlargened class of indices. Under the assumption of normality an explicit form of the distribution of the new class of the estimated indices is provided. Numerical investigations are made to explore the behavior of the estimators of the indices for different values of the parameters. Based on the estimator a decision rule that can be used to determine whether the process can be considered capable or not is provided and suitable criteria for choosing an index from the family are suggested.     

A new mixed chain sampling plan based on the process capability index for product acceptance

This article proposes a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest follows the normal distribution with unknown mean and variance. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications. In order to construct the tables, the problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.     

Repetitive group sampling plan based on the process capability index for the lot acceptance problem

An acceptance sampling plan is a method used to make a decision about acceptance or rejection of a product, based on adherence to a standard. Meanwhile, process capability indices (PCIs) have been applied in different manufacturing industries as capability measures based on specified criteria which include process departure from a target, process consistency, process yield and process loss. In this paper, a repetitive group sampling (RGS) plan based on PCI is introduced for variables’ inspection. First, the optimal parameters of the developed RGS plan are obtained considering constraints related to the risk of consumers and producers and also a double sampling plan, a multiple dependent state sampling plan and a sampling plan for resubmitted lots have been designed. Finally, after the development of variable sampling plans based on the Bayesian and exact approach, a comparison study has been performed between the developed RGS plan and other types of sampling plans and the results are elaborated.     

A Bayesian procedure for assessing process performance based on the third-generation capability index

Capability indices that qualify process potential and process performance are practical tools for successful quality improvement activities and quality program implementation. Most existing methods to assess process capability were derived on the basis of the traditional frequentist point of view. This paper considers the problem of estimating and testing process capability based on the third-generation capability index C _pmk from the Bayesian point of view. We first derive the posterior probability p for the process under investigation is capable. The one-sided credible interval, a Bayesian analog of the classical lower confidence interval, can be obtained to assess process performance. To investigate the effectiveness of the derived results, a series of simulation was undertaken. The results indicate that the performance of the proposed Bayesian approach depends strongly on the value of ξ=(μ?T)/σ. It performs very well with the accurate coverage rate when μ is sufficiently far from T. In those cases, they have the same acceptable performance even though the sample size n is as small as 25.     

A Note on the Use of Confidence Limits following Rejection of a Null Hypothesis

The equivalence of some tests of hypothesis and confidence limits is well known. When, however, the confidence limits are computed only after rejection of a null hypothesis, the usual unconditional confidence limits are no longer valid. This refers to a strict two-stage inference procedure: first test the hypothesis of interest and if the test results in a rejection decision, then proceed with estimating the relevant parameter. Under such a situation, confidence limits should be computed conditionally on the specified outcome of the test under which estimation proceeds. Conditional confidence sets will be longer than unconditional confidence sets and may even contain values of the parameter previously rejected by the test of hypothesis. Conditional confidence limits for the mean of a normal population with known variance are used to illustrate these results. In many applications, these results indicate that conditional estimation is probably not good practice.     

A note on the asymptotic distribution of the process capability index C pmk

Process capability indices have been widely used to evaluate the process performance to the continuous improvement of quality and productivity. The distribution of the estimator of the process capability index C _pmk is very complicated and the asymptotic distribution is proposed by Chen and Hsu [The asymptotic distribution of the processes capability index C _pmk , Comm. Statist. Theory Methods 24(5) (1995), pp. 1279–1291]. However, we found a critical error for the asymptotic distribution when the population mean is not equal to the midpoint of the specification limits. In this paper, a correct version of the asymptotic distribution is given. An asymptotic confidence interval of C _pmk by using the correct version of asymptotic distribution is proposed and the lower bound can be used to test if the process is capable. A simulation study of the coverage probability of the proposed confidence interval is shown to be satisfactory. The relation of six sigma technique and the index C _pmk is also discussed in this paper. An asymptotic testing procedure to determine if a process is capable based on the index of C _pmk is also given in this paper.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

Tests of Fit for Exponentiality based on the Empirical Laplace Transform

The Laplace transform \psi(t)=E[{\rm exp}(-tX)] of a random variable X with exponential density u exp( m u x ), x S 0, satisfies the equation (\lambda+t)\psi(t)-\lambda=0 , t S 0. We study the behavior of a class of consistent tests for exponentiality based on a suitably weighted integral of [({\hat\lambda}_n+t)\psi_n(t)-{\hat\lambda}_n]^2 , where {\hat\lambda}_n is the maximum-likelihood estimate of u , and é n is the empirical Laplace transform, each based on an i.i.d. sample X 1 , …, X n . As the decay of the weight function tends to infinity, the test statistic approaches the square of the first nonzero component of Neyman's smooth test for exponentiality. The new tests are compared with other omnibus tests for exponentiality.     

On the distribution of a test for exponentiality based on progressively type-II right censored spacings

A test for exponentiality based on progressively Type-II right censored spacings has been proposed recently by Balakrishnan et al. (2002). They derived the asymptotic null distribution of the test statistic. In this work, we utilize the algorithm of Huffer and Lin (2001) to evaluate the exact null probabilities and the exact critical values of this test statistic.     

A new generation of process capability indices based on fuzzy measurements

Process capability indices (PCIs) provide numerical measures on whether a process conforms to the defined manufacturing capability prerequisite. These have been successfully applied by companies to compete with and to lead high-profit markets by evaluating the quality and productivity performance. The PCI C_p compares the output of a process to the specification limits (SLs) by forming the ratio of the width between the process SLs with the width of the natural tolerance limits which is measured by six process standard deviation units. As another common PCI, C_pm incorporates two variation components which are variation to the process mean and deviation of the process mean from the target. A meaningful generalized version of above PCIs is introduced in this paper which is able to handle in a fuzzy environment. These generalized PCIs are able to measure the capability of a fuzzy-valued process in producing products on the basis of a fuzzy quality. Fast computing formulas for the generalized PCIs are computed for normal and symmetric triangular fuzzy observations, where the fuzzy quality is defined by linear and exponential fuzzy SLs. A practical example is presented to show the performance of proposed indices.     

Determination of a new mixed variable lot-size multiple dependent state sampling plan based on the process capability index

This article proposes a new mixed variable lot-size multiple dependent state sampling plan in which the attribute sampling plan can be used in the first stage and the variables multiple dependent state sampling plan based on the process capability index will be used in the second stage for the inspection of measurable quality characteristics. The proposed mixed plan is developed for both symmetric and asymmetric fraction non conforming. The optimal plan parameters can be determined by considering the satisfaction levels of the producer and the consumer simultaneously at an acceptable quality level and a limiting quality level, respectively. The performance of the proposed plan over the mixed single sampling plan based on C_pk and the mixed variable lot size plan based on C_pk with respect to the average sample number is also investigated. Tables are constructed for easy selection of plan parameters for both symmetric and asymmetric fraction non conforming and real world examples are also given for the illustration and practical implementation of the proposed mixed variable lot-size plan.     

Designing of a mixed-chain sampling plan based on the process capability index with chain sampling as the attributes plan

In this article, we propose a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest having double specification limits and follows the normal distribution with unknown mean and variance. In the proposed mixed plan, the chain sampling inspection plan is used for the inspection of attribute quality characteristics. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications by formulating the problem as a non linear programming in which the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.