Optimal design of accelerated degradation tests based on Wiener process models

Optimal accelerated degradation test (ADT) plans are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Unlike the previous works on planning ADTs based on stochastic process models, this article determines the test stress levels and the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum-likelihood estimator of the qth quantile of the lifetime distribution at the use condition is minimized. In addition, compromise plans are also developed for checking the validity of the relationship between the model parameters and the stress variable. Finally, using an example, sensitivity analysis procedures are presented for evaluating the robustness of optimal and compromise plans against the uncertainty in the pre-estimated parameter value, and the importance of optimally determining test stress levels and the proportion of units allocated to each stress level are illustrated.     

Accelerated life test sampling plans for the Weibull distribution under Type I progressive interval censoring with random removals

This paper considers the design of accelerated life test (ALT) sampling plans under Type I progressive interval censoring with random removals. We assume that the lifetime of products follows a Weibull distribution. Two levels of constant stress higher than the use condition are used. The sample size and the acceptability constant that satisfy given levels of producer's risk and consumer's risk are found. In particular, the optimal stress level and the allocation proportion are obtained by minimizing the generalized asymptotic variance of the maximum likelihood estimators of the model parameters. Furthermore, for validation purposes, a Monte Carlo simulation is conducted to assess the true probability of acceptance for the derived sampling plans.     

Optimal design for constant-stress accelerated degradation test based on gamma process

This paper addresses the optimal design problems for constant-stress accelerated degradation test (CSADT) based on gamma processes with fixed effect and random effect. For three optimization criteria, we prove that optimal CSADT plans with multiple stress levels degenerate to two-stress-level test plans only using the minimum and maximum stress levels under model assumptions. Under each optimization criterion, the optimal sample size allocation proportions for the minimum and maximum stress levels are determined theoretically. The effect of the stress level on the objective functions is also discussed. A numerical example and a simulation study are provided to illustrate the obtained results.     

Optimal step-stress test under type I progressive group-censoring with random removals

Some traditional life tests result in no or very few failures by the end of test. In such cases, one approach is to do life testing at higher-than-usual stress conditions in order to obtain failures quickly. This paper discusses a k-level step-stress accelerated life test under type I progressive group-censoring with random removals. An exponential failure time distribution with mean life that is a log-linear function of stress and a cumulative exposure model are considered. We derive the maximum likelihood estimators of the model parameters and establish the asymptotic properties of the estimators. We investigate four selection criteria which enable us to obtain the optimum test plans. One is to minimize the asymptotic variance of the maximum likelihood estimator of the logarithm of the mean lifetime at use-condition, and the other three criteria are to maximize the determinant, trace and the smallest eigenvalue of Fisher's information matrix. Some numerical studies are discussed to illustrate the proposed criteria.     

Acceptance sampling plans under progressive interval censoring with likelihood ratio

The paper investigates the design of life test plans under progressively interval censored test. Based on the likelihood ratio, the proposed life test plans are established so that the required producer and consumer risks can be satisfied simultaneously. The advantage of the proposed method is that the developed sampling procedure depends on the likelihood ratio only so that the method can be applied to any lifetime distribution when only one parameter is unknown. A numerical study is conducted and some of the sampling plans for the Weibull lifetime distribution with different shape parameters are tabulated for illustration. Moreover, the influence of the removal schemes on the proposed sampling plans is discussed.     

Design of accelerated life test plans under progressive Type II interval censoring with random removals

This paper investigates the design of accelerated life test (ALT) plans under progressive Type II interval censoring with random removals. Units’ lifetimes are assumed to follow a Weibull distribution, and the number of random removals at each inspection is assumed to follow a binomial distribution. The optimal ALT plans, which minimize the asymptotic variance of an estimated quantile at use condition, are determined. The expected duration of the test and the expected number of inspections on each stress level are calculated. A numerical study is conducted to investigate the properties of the derived ALT plans under different parameter values. For illustration purpose, a numerical example is also given.     

An economic reliability test plan: Log-logistic distribution

Sampling plans in which items that are put to test, to collect the life of the items in order to decide upon accepting or rejecting a submitted lot, are called reliability test plans. The basic probability model of the life of the product is specified as the well-known log-logistic distribution with a known shape parameter. For a given producer's risk, sample size, termination number, and waiting time to terminate the test plan are computed. The preferability of the test plan over similar plans existing in the literature is established with respect to cost and time of the experiment.     

Statistical planning and inference in accelerated life testing using the CHSS model

Failures of highly reliable units are rare and it may be not possible to gather the failure time data needed for reliability estimation. One way of obtaining failures during the time given for experiments is to apply methods of accelerated life testing (ALT). In ALT units are tested at higher than usual (design) stress conditions. The purpose is to give estimators of the main reliability characteristics of units functioning under the usual stress using data of accelerated experiments. To treat such data accelerated life models are used. Here we consider special plans of experiments and the statistical analysis of the ALT data by numerical methods and simulation using the changing shape and scale (CHSS) model proposed by Bagdonavičius and Nikulin (1999). The CHSS model is a natural extension of the standard accelerated failure time (AFT) model. We give parametric and semiparametric estimation procedures for the CHSS model and a goodness-of-fit test for the AFT model.     

Inference on constant stress accelerated life tests for log-location-scale lifetime distributions with type-I hybrid censoring

In this paper, we consider a constant stress accelerated life test terminated by a hybrid Type-I censoring at the first stress level. The model is based on a general log-location-scale lifetime distribution with mean life being a linear function of stress and with constant scale. We obtain the maximum likelihood estimators (MLE) and the approximate maximum likelihood estimators (AMLE) of the model parameters. Approximate confidence intervals, likelihood ratio tests and two bootstrap methods are used to construct confidence intervals for the unknown parameters of the Weibull and lognormal distributions using the MLEs. Finally, a simulation study and two illustrative examples are provided to demonstrate the performance of the developed inferential methods.     

Optimal design of accelerated life tests under modified stress loading methods

SUMMARY Most of the previous work on optimal design of accelerated life test (ALT) plans has assumed instantaneous changes in stress levels, which may not be possible or desirable in practice, because of the limited capability of test equipment, possible stress shocks or the presence of undesirable failure modes. We consider the case in which stress levels are changed at a finite rate, and develop two types of ALT plan under the assumptions of exponential lifetimes of test units and type I censoring. One type of plan is the modified step-stress ALT plan, and the other type is the modified constant-stress ALT plan. These two plans are compared in terms of the asymptotic variance of the maximum likelihood estimator of the log mean lifetime for the use condition (i.e. avar\[ln (0)]). Computational results indicate that, for both types of plan, avar\[ln (0)] is not sensitive to the stress-increasing rate R, if R is greater than or equal to 10, say, in the standardized scale. This implies that the proposed stress loading method can be used effectively with little loss in statistical efficiency. In terms of avar\[ln (0)], the modified step-stress ALT generally performs better than the modified constant-stress ALT, unless R or the probability of failure until the censoring time under a certain stress-increasing rate is small. We also compare the progressive-stress ALT plan with the above two modified ALT plans in terms of avar\[ln (0)], using the optimal stress-increasing rate R* determined for the progressivestress ALT plan. We find that the proposed ALTs perform better than the progressivestress ALT for the parameter values considered.     

Economic design of quick switching sampling system for assuring Weibull distributed mean life

In this paper, we propose the quick switching sampling system for assuring mean life of a product under time truncated life test where the lifetime of the product follows the Weibull distribution and the mean life is considered as the quality of the product. The optimal parameters of the proposed system are determined using two points on the operating characteristic curve approach for various combinations of consumer's risk and ratio of true mean life time and specified life time. Tables are constructed to determine the optimal parameters for specified acceptable quality level and limiting quality level along with the corresponding probabilities of acceptance. The proposed system is compared with other existing sampling plans under Weibull lifetime model. In addition, an economical design of the proposed system is also discussed.     

Weibull accelerated life tests when there are competing causes of failure

Accelerated life testing of a product under more severe than normal conditions is commonly used to reduce test time and costs. Data collected at such accelerated conditions are used to obtain estimates of the parameters of a stress translation function. This function is then used to make inference about the product's life under normal operating conditions. We consider the problem of accelerated life tests when the product of interest is a p component series system. Each of the components is assumed to have an independent Weibull time to failure distribution with different shape parameters and different scale parameters which are increasing functions stress. A general model i s used for the scale parameter includes the standard engineering models as special This model also has an appealing biological interpretation     

A Bayesian Analysis for Accelerated Lifetime Tests Under an Exponential Power Law Model with Threshold Stress

In this paper, we present a Bayesian methodology for modelling accelerated lifetime tests under a stress response relationship with a threshold stress. Both Laplace and MCMC methods are considered. The methodology is described in detail for the case when an exponential distribution is assumed to express the behaviour of lifetimes, and a power law model with a threshold stress is assumed as the stress response relationship. We assume vague but proper priors for the parameters of interest. The methodology is illustrated by a accelerated failure test on an electrical insulation film.     

Analysis of simple step-stress model in presence of competing risks

ABSTRACT

In this article, we consider a simple step-stress life test in the presence of exponentially distributed competing risks. It is assumed that the stress is changed when a pre-specified number of failures takes place. The data is assumed to be Type-II censored. We obtain the maximum likelihood estimators of the model parameters and the exact conditional distributions of the maximum likelihood estimators. Based on the conditional distribution, approximate confidence intervals (CIs) of unknown parameters have been constructed. Percentile bootstrap CIs of model parameters are also provided. Optimal test plan is addressed. We perform an extensive simulation study to observe the behaviour of the proposed method. The performances are quite satisfactory. Finally we analyse two data sets for illustrative purposes.     

Statistical planning when the parameters in the model are of unequal importance

In this paper, we consider statistical planning of experiments when the parameters in the linear model assumed are divided into disjoint sets; the parameters in one set are more influential than the parameters in the other set and require more precise estimation. Me characterize the plans (or, designs) and discuss some symmetric designs which are easier to find.     

Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring

In reliability analysis, accelerated life-testing allows for gradual increment of stress levels on test units during an experiment. In a special class of accelerated life tests known as step-stress tests, the stress levels increase discretely at pre-fixed time points, and this allows the experimenter to obtain information on the parameters of the lifetime distributions more quickly than under normal operating conditions. Moreover, when a test unit fails, there are often more than one fatal cause for the failure, such as mechanical or electrical. In this article, we consider the simple step-stress model under Type-II censoring when the lifetime distributions of the different risk factors are independently exponentially distributed. Under this setup, we derive the maximum likelihood estimators (MLEs) of the unknown mean parameters of the different causes under the assumption of a cumulative exposure model. The exact distributions of the MLEs of the parameters are then derived through the use of conditional moment generating functions. Using these exact distributions as well as the asymptotic distributions and the parametric bootstrap method, we discuss the construction of confidence intervals for the parameters and assess their performance through Monte Carlo simulations. Finally, we illustrate the methods of inference discussed here with an example.     

Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions

We will discuss the reliability analysis of the constant stress accelerated life test on a series system connected with multiple components under independent Weibull lifetime distributions whose scale parameters are log-linear in the level of the stress variable. The system lifetimes are collected under Type I censoring but the components that cause the systems to fail may or may not be observed. The data are so called masked for the latter case. Maximum likelihood approach and the Bayesian method are considered when the data are masked. Statistical inference on the estimation of the underlying model parameters as well as the mean time to failure and the reliability function will be addressed. Simulation study for a three-component case shows that Bayesian analysis outperforms the maximum likelihood approach especially when the data are highly masked.     

An Empirical Comparison of Estimating Methods for the Ramberg–Osgood EIV Model

The standard tensile test is one of the most frequent tools performed for the evaluation of mechanical properties of metals. An empirical model proposed by Ramberg and Osgood fits the tensile test data using a nonlinear model for the strain in terms of the stress. It is an Error-In-Variables (EIV) model because of the uncertainty affecting both strain and stress measurement instruments. The SIMEX, a simulation-based method for the estimation of model parameters, is powerful in order to reduce bias due to the measurement error in EIV models. The plan of this article is the following. In Sec. 2, we introduce the Ramberg–Osgood model and another reparametrization according to different assumptions on the independent variable. In Sec. 3, there is a summary of SIMEX method for the case at hand. Section 4 is a comparison between SIMEX and others estimating methods in order to highlight the peculiarities of the different approaches. In the last section, there are some concluding remarks.     

Accelerated life tests under competing weibull causes of failure

Accelerated life testing of a product under more severe than normal conditions is cawiionly used to reduce test time and cost. Data collected at such accelerated conditions is used to obtain estimates of parameters of a stress translation function which is then used to make inference about the product's, per" formance under normal conditions. This problem is considered when the product is a p component series system with WeibuH distributed component lifetimes liaving a caimon shape parameter. A general stress translation function is used and estimates of model parameters are obtained for various censoring schemes.     

Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test

In this paper, we propose a method to model the relationship between degradation and failure time for a simple step-stress test where the underlying degradation path is linear and different causes of failure are possible. It is assumed that the intensity function depends only on the degradation value. No assumptions are made about the distribution of the failure times. A simple step-stress test is used to induce failure experimentally and a tampered failure rate model is proposed to describe the effect of the changing stress on the intensities. We assume that some of the products that fail during the test have a cause of failure that is only known to belong to a certain subset of all possible failures. This case is known as masking. In the presence of masking, the maximum likelihood estimates of the model parameters are obtained through the expectation–maximization algorithm by treating the causes of failure as missing values. The effect of incomplete information on the estimation of parameters is studied through a Monte-Carlo simulation. Finally, a real-world example is analysed to illustrate the application of the proposed methods.