Copula-based reliability analysis for a parallel system with a cold standby

The traditional reliability models cannot well reflect the effect of performance dependence of subsystems on the reliability of system, and neglect the problems of initial reliability and standby redundancy. In this paper, the reliability of a parallel system with active multicomponents and a single cold-standby unit has been investigated. The simultaneously working components are dependent and the dependence is expressed by a copula function. Based on the theories of conditional probability, the explicit expressions for the reliability and the MTTF of the system, in terms of the copula function and marginal lifetime distributions, are obtained. Let the copula function be the FGM copula and the marginal lifetime distribution be exponential distribution, a system with two parallel dependent units and a single cold-standby unit is taken as an example. The effect of different degrees of dependence among components on system reliability is analyzed, and the system reliability can be expressed as the linear combination of exponential reliability functions with different failure rates. For investigating how the degree of dependence affects the mean lifetime, furthermore, the parallel system with a single cold standby, comprising different number of active components, is also presented. The effectiveness of the modeling method is verified, and the method presented provides a theoretical basis for reliability design of engineering systems and physics of failure.     

Reliability estimation of generalized inverted exponential distribution

A generalized version of inverted exponential distribution (IED) is introduced in this paper. This lifetime distribution is capable of modelling various shapes of failure rates, and hence various shapes of ageing criteria. The model can be considered as another useful two-parameter generalization of the IED. Statistical and reliability properties of the generalized inverted exponential distribution are derived. Maximum likelihood estimation and least square estimation are used to evaluate the parameters and the reliability of the distribution. Properties of the estimates are also studied.     

Reliability modeling of systems with two dependent degrading components based on gamma processes

Abstract

Many engineering systems have multiple components with more than one degradation measure which is dependent on each other due to their complex failure mechanisms, which results in some insurmountable difficulties for reliability work in engineering. To overcome these difficulties, the system reliability prediction approaches based on performance degradation theory develop rapidly in recent years, and show their superiority over the traditional approaches in many applications. This paper proposes reliability models of systems with two dependent degrading components. It is assumed that the degradation paths of the components are governed by gamma processes. For a parallel system, its failure probability function can be approximated by the bivariate Birnbaum–Saunders distribution. According to the relationship of parallel and series systems, it is easy to find that the failure probability function of a series system can be expressed by the bivariate Birnbaum–Saunders distribution and its marginal distributions. The model in such a situation is very complicated and analytically intractable, and becomes cumbersome from a computational viewpoint. For this reason, the Bayesian Markov chain Monte Carlo method is developed for this problem that allows the maximum likelihood estimates of the parameters to be determined in an efficient manner. After that, the confidence intervals of the failure probability of systems are given. For an illustration of the proposed model, a numerical example about railway track is presented.     

The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing

Due to the high reliability and high testing cost of electro-explosive devices, even though an accelerated test is performed, one may observe very few failures or even no failures at all due to censoring. In this paper, we consider modelling the reliability of such devices by an exponential lifetime distribution in which the failure rate is assumed to be a function of some covariates and that the observed data are binary. The Bayesian approach, with three different prior settings, is used to develop inference on the failure rate, lifetime and the reliability under some settings. A Monte Carlo simulation study is carried out to show that this approach is quite useful and suitable for analysing data of the considered form, especially when the failure rates are very small. Finally, illustrative data are analysed using this approach.     

Statistical Analysis of Linear Degradation and Failure Time Data with Multiple Failure Modes

The paper considers linear degradation and failure time models with multiple failure modes. Dependence of traumatic failure intensities on the degradation level are included into the models. Estimators of traumatic event cumulative intensities, and of various reliability characteristics are proposed. Prediction of residual reliability characteristics given a degradation value at a given moment is discussed. Non-parametric, semiparametric and parametric estimation methods are given. Theorems on simultaneous asymptotic distribution of random functions characterising degradation and intensities of traumatic events are proposed. Asymptotic properties of unconditional and residual reliability characteristics estimators are given. Real tire wear and failure time data are analysed.     

Independent or dependent competing risks: does it make a difference

This article investigates the consequences of departures from independence when the component lifetimes in a series system are exponentially distributed. Such departures are studied when the joint distribution is assumed to follow either one of the three Gumbel bivariate exponential models, the Downton bivariate exponential model, or the Oakes bivariate exponential model. Two distinct situations are considered. First, in theoretical modeling of series systems, when the distribution of the component lifetimes is assumed, one wishes to compute system reliability and mean system life. Second, errors in parametric and nonparametric estimation of component reliability and component mean life are studied based on life-test data collected on series systems when the assumption of independence is made     

Non-parametric Estimation for NHPP Software Reliability Models

The non-homogeneous Poisson process (NHPP) model is a very important class of software reliability models and is widely used in software reliability engineering. NHPPs are characterized by their intensity functions. In the literature it is usually assumed that the functional forms of the intensity functions are known and only some parameters in intensity functions are unknown. The parametric statistical methods can then be applied to estimate or to test the unknown reliability models. However, in realistic situations it is often the case that the functional form of the failure intensity is not very well known or is completely unknown. In this case we have to use functional (non-parametric) estimation methods. The non-parametric techniques do not require any preliminary assumption on the software models and then can reduce the parameter modeling bias. The existing non-parametric methods in the statistical methods are usually not applicable to software reliability data. In this paper we construct some non-parametric methods to estimate the failure intensity function of the NHPP model, taking the particularities of the software failure data into consideration.     

Report of the ASA Technical Panel on the Census Undercount

A new model is proposed for the joint distribution of paired survival times generated from clinical trials and certain reliability settings. The new model can be considered an extension to the bivariate exponential models studied in the literature. Here, a more flexible bivariate Weibull model will be derived, and two exact parametric tests for testing the equality of marginal survival distributions are developed.     

Failure probability estimation under additional subsystem information with application to semiconductor burn-in

In the classical approach to qualitative reliability demonstration, system failure probabilities are estimated based on a binomial sample drawn from the running production. In this paper, we show how to take account of additional available sampling information for some or even all subsystems of a current system under test with serial reliability structure. In that connection, we present two approaches, a frequentist and a Bayesian one, for assessing an upper bound for the failure probability of serial systems under binomial subsystem data. In the frequentist approach, we introduce (i) a new way of deriving the probability distribution for the number of system failures, which might be randomly assembled from the failed subsystems and (ii) a more accurate estimator for the Clopper–Pearson upper bound using a beta mixture distribution. In the Bayesian approach, however, we infer the posterior distribution for the system failure probability on the basis of the system/subsystem testing results and a prior distribution for the subsystem failure probabilities. We propose three different prior distributions and compare their performances in the context of high reliability testing. Finally, we apply the proposed methods to reduce the efforts of semiconductor burn-in studies by considering synergies such as comparable chip layers, among different chip technologies.     

Bayesian estimation of reliability using time-to-failure distribution of parametric degradation models

This paper focusses on computing the Bayesian reliability of components whose performance characteristics (degradation – fatigue and cracks) are observed during a specified period of time. Depending upon the nature of degradation data collected, we fit a monotone increasing or decreasing function for the data. Since the components are supposed to have different lifetimes, the rate of degradation is assumed to be a random variable. At a critical level of degradation, the time to failure distribution is obtained. The exponential and power degradation models are studied and exponential density function is assumed for the random variable representing the rate of degradation. The maximum likelihood estimator and Bayesian estimator of the parameter of exponential density function, predictive distribution, hierarchical Bayes approach and robustness of the posterior mean are presented. The Gibbs sampling algorithm is used to obtain the Bayesian estimates of the parameter. Illustrations are provided for the train wheel degradation data.     

Bayesian inference for semiparametric regression using a Fourier representation

This paper presents the Bayesian analysis of a semiparametric regression model that consists of parametric and nonparametric components. The nonparametric component is represented with a Fourier series where the Fourier coefficients are assumed a priori to have zero means and to decay to 0 in probability at either algebraic or geometric rates. The rate of decay controls the smoothness of the response function. The posterior analysis automatically selects the amount of smoothing that is coherent with the model and data. Posterior probabilities of the parametric and semiparametric models provide a method for testing the parametric model against a non-specific alternative. The Bayes estimator's mean integrated squared error compares favourably with the theoretically optimal estimator for kernel regression.     

Parametric Modeling for Survival with Competing Risks and Masked Failure Causes

We consider a life testing situation in which systems are subject to failure from independent competing risks. Following a failure, immediate (stage-1) procedures are used in an attempt to reach a definitive diagnosis. If these procedures fail to result in a diagnosis, this phenomenon is called masking. Stage-2 procedures, such as failure analysis or autopsy, provide definitive diagnosis for a sample of the masked cases. We show how stage-1 and stage-2 information can be combined to provide statistical inference about (a) survival functions of the individual risks, (b) the proportions of failures associated with individual risks and (c) probability, for a specified masked case, that each of the masked competing risks is responsible for the failure. Our development is based on parametric distributional assumptions and the special case for which the failure times for the competing risks have a Weibull distribution is discussed in detail.     

A family of distributions to model load sharing systems

The main characteristic of a load sharing system is that after the failure of one component the surviving components have to shoulder extra load and hence are prone to failure at an earlier time than what is expected under the original model. In others, the failure of one component may release extra resources to the survivors, thus delaying the system failure. In this paper we consider such m component systems and some observation schemes and identifiability issues under them. Then we construct a general semiparametric multivariate family of distributions which explicitly models this phenomenon through proportional conditional hazards. We suggest estimates for the constant of proportionality. We propose a nonparametric test for the hypothesis that the failures take place independently according to the common distribution against the alternative hypothesis that the second failure takes place earlier than warranted, study its properties and illustrate its use.     

Simulation-Extrapolation via the Bezier Curve in Measurement Error Models

Simulation-extrapolation (SIMEX) is a method for correcting for bias in measurement error models, and parametric SIMEX estimates are often used. In this paper, we propose a nonparametric method for computing the SIMEX estimate via the Bezier curve, which is a popular smoothing technique in the computer graphics area. Comparisons are done for the bias of the limit values of parametric SIMEX estimates and the Bezier estimate in the various nonlinear measurement error models.     

Modelling forces of infection by using monotone local polynomials

Summary. On the basis of serological data from prevalence studies of rubella, mumps and hepatitis A, the paper describes a flexible local maximum likelihood method for the estimation of the rate at which susceptible individuals acquire infection at different ages. In contrast with parametric models that have been used before in the literature, the local polynomial likelihood method allows this age-dependent force of infection to be modelled without making any assumptions about the parametric structure. Moreover, this method allows for simultaneous nonparametric estimation of age-specific incidence and prevalence. Unconstrained models may lead to negative estimates for the force of infection at certain ages. To overcome this problem and to guarantee maximal flexibility, the local smoother can be constrained to be monotone. It turns out that different parametric and nonparametric estimates of the force of infection can exhibit considerably different qualitative features like location and the number of maxima, emphasizing the importance of a well-chosen flexible statistical model.     

Nonparametric survival regression using the beta-Stacy process

A novel class of hierarchical nonparametric Bayesian survival regression models for time-to-event data with uninformative right censoring is introduced. The survival curve is modeled as a random function whose prior distribution is defined using the beta-Stacy (BS) process. The prior mean of each survival probability and its prior variance are linked to a standard parametric survival regression model. This nonparametric survival regression can thus be anchored to any reference parametric form, such as a proportional hazards or an accelerated failure time model, allowing substantial departures of the predictive survival probabilities when the reference model is not supported by the data. Also, under this formulation the predictive survival probabilities will be close to the empirical survival distribution near the mode of the reference model and they will be shrunken towards its probability density in the tails of the empirical distribution.     

Reliability estimation in generalized inverted exponential distribution with progressively type II censored sample

In this paper, a generalization of inverted exponential distribution is considered as a lifetime model [A.M. Abouammoh and A.M. Alshingiti, Reliability estimation of generalized inverted exponential distribution, J. Statist. Comput. Simul. 79(11) (2009), pp. 1301–1315]. Its reliability characteristics and important distributional properties are discussed. Maximum likelihood estimation of the two parameters involved along with reliability and failure rate functions are derived. The method of least square estimation of parameters is also studied here. In view of cost and time constraints, type II progressively right censored sampling scheme has been used. For illustration of the performance of the estimates, a Monte Carlo simulation study is carried out. Finally, a real data example is given to show the practical applications of the paper.     

Estimation of parameters of yamada et al. model and modification of the model

Yamada, Ohba and Osaki (1983) suggested an important NHPP model for software failure phenomenon. So far little work has been done on the problem of estimating its parameters. We present here some conditions for the likelihood estimates to be finite, positive and unique. We also suggest a modification of the model. The performance measures and statistical inferences of the modified model are discussed here. The modified model is applied to software failure data and the results are compared with Jelinski-Moranda [4] and some existing important NHPP models     

A semi-parametric approach to robust parameter design

Parameter design or robust parameter design (RPD) is an engineering methodology intended as a cost-effective approach for improving the quality of products and processes. The goal of parameter design is to choose the levels of the control variables that optimize a defined quality characteristic. An essential component of RPD involves the assumption of well estimated models for the process mean and variance. Traditionally, the modeling of the mean and variance has been done parametrically. It is often the case, particularly when modeling the variance, that nonparametric techniques are more appropriate due to the nature of the curvature in the underlying function. Most response surface experiments involve sparse data. In sparse data situations with unusual curvature in the underlying function, nonparametric techniques often result in estimates with problematic variation whereas their parametric counterparts may result in estimates with problematic bias. We propose the use of semi-parametric modeling within the robust design setting, combining parametric and nonparametric functions to improve the quality of both mean and variance model estimation. The proposed method will be illustrated with an example and simulations.     

Outlier Resistant Estimation in Difference-Based Semiparametric Partially Linear Models

Partially linear models are extensions of linear models that include a nonparametric function of some covariate allowing an adequate and more flexible handling of explanatory variables than in linear models. The difference-based estimation in partially linear models is an approach designed to estimate parametric component by using the ordinary least squares estimator after removing the nonparametric component from the model by differencing. However, it is known that least squares estimates do not provide useful information for the majority of data when the error distribution is not normal, particularly when the errors are heavy-tailed and when outliers are present in the dataset. This paper aims to find an outlier-resistant fit that represents the information in the majority of the data by robustly estimating the parametric and the nonparametric components of the partially linear model. Simulations and a real data example are used to illustrate the feasibility of the proposed methodology and to compare it with the classical difference-based estimator when outliers exist.