Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor

This article presents a design approach for sequential constant-stress accelerated life tests (ALT) with an auxiliary acceleration factor (AAF). The use of an AAF, if it exists, is to further amplify the failure probability of highly reliability testing items at low stress levels while maintaining an acceptable degree of extrapolation for reliability inference. Based on a Bayesian design criterion, the optimal plan optimizes the sample allocation, stress combination, as well as the loading profile of the AAF. In particular, a step-stress loading profile based on an appropriate cumulative exposure (CE) model is chosen for the AAF such that the initial auxiliary stress will not be too harsh. A case study, providing the motivation and practical importance of our study, is presented to illustrate the proposed planning approach.     

Optimal design of accelerated life tests under modified stress loading methods

SUMMARY Most of the previous work on optimal design of accelerated life test (ALT) plans has assumed instantaneous changes in stress levels, which may not be possible or desirable in practice, because of the limited capability of test equipment, possible stress shocks or the presence of undesirable failure modes. We consider the case in which stress levels are changed at a finite rate, and develop two types of ALT plan under the assumptions of exponential lifetimes of test units and type I censoring. One type of plan is the modified step-stress ALT plan, and the other type is the modified constant-stress ALT plan. These two plans are compared in terms of the asymptotic variance of the maximum likelihood estimator of the log mean lifetime for the use condition (i.e. avar\[ln (0)]). Computational results indicate that, for both types of plan, avar\[ln (0)] is not sensitive to the stress-increasing rate R, if R is greater than or equal to 10, say, in the standardized scale. This implies that the proposed stress loading method can be used effectively with little loss in statistical efficiency. In terms of avar\[ln (0)], the modified step-stress ALT generally performs better than the modified constant-stress ALT, unless R or the probability of failure until the censoring time under a certain stress-increasing rate is small. We also compare the progressive-stress ALT plan with the above two modified ALT plans in terms of avar\[ln (0)], using the optimal stress-increasing rate R* determined for the progressivestress ALT plan. We find that the proposed ALTs perform better than the progressivestress ALT for the parameter values considered.     

A meta-analysis approach for step-stress experiments

The step-stress model is a special case of accelerated life testing that allows for testing of units under different levels of stress with changes occurring at various intermediate stages of the experiment. Interest then lies on inference for the mean lifetime at each stress level. All step-stress models discussed so far in the literature are based on a single experiment. For the situation when data have been collected from different experiments wherein all the test units had been exposed to the same levels of stress but with possibly different points of change of stress, we introduce a model that combines the different experiments and facilitates a meta-analysis for the estimation of the mean lifetimes. We then discuss in detail the likelihood inference for the case of simple step-stress experiments under exponentially distributed lifetimes with Type-II censoring.     

Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring

In reliability analysis, accelerated life-testing allows for gradual increment of stress levels on test units during an experiment. In a special class of accelerated life tests known as step-stress tests, the stress levels increase discretely at pre-fixed time points, and this allows the experimenter to obtain information on the parameters of the lifetime distributions more quickly than under normal operating conditions. Moreover, when a test unit fails, there are often more than one fatal cause for the failure, such as mechanical or electrical. In this article, we consider the simple step-stress model under Type-II censoring when the lifetime distributions of the different risk factors are independently exponentially distributed. Under this setup, we derive the maximum likelihood estimators (MLEs) of the unknown mean parameters of the different causes under the assumption of a cumulative exposure model. The exact distributions of the MLEs of the parameters are then derived through the use of conditional moment generating functions. Using these exact distributions as well as the asymptotic distributions and the parametric bootstrap method, we discuss the construction of confidence intervals for the parameters and assess their performance through Monte Carlo simulations. Finally, we illustrate the methods of inference discussed here with an example.     

Optimal step-stress test under type I progressive group-censoring with random removals

Some traditional life tests result in no or very few failures by the end of test. In such cases, one approach is to do life testing at higher-than-usual stress conditions in order to obtain failures quickly. This paper discusses a k-level step-stress accelerated life test under type I progressive group-censoring with random removals. An exponential failure time distribution with mean life that is a log-linear function of stress and a cumulative exposure model are considered. We derive the maximum likelihood estimators of the model parameters and establish the asymptotic properties of the estimators. We investigate four selection criteria which enable us to obtain the optimum test plans. One is to minimize the asymptotic variance of the maximum likelihood estimator of the logarithm of the mean lifetime at use-condition, and the other three criteria are to maximize the determinant, trace and the smallest eigenvalue of Fisher's information matrix. Some numerical studies are discussed to illustrate the proposed criteria.     

Optimum Design for Type-I Step-stress Accelerated Life Tests of Two-parameter Weibull Distributions

In this article, we focus on the general k-step step-stress accelerated life tests with Type-I censoring for two-parameter Weibull distributions based on the tampered failure rate (TFR) model. We get the optimum design for the tests under the criterion of the minimization of the asymptotic variance of the maximum likelihood estimate of the pth percentile of the lifetime under the normal operating conditions. Optimum test plans for the simple step-stress accelerated life tests under Type-I censoring are developed for the Weibull distribution and the exponential distribution in particular. Finally, an example is provided to illustrate the proposed design and a sensitivity analysis is conducted to investigate the robustness of the design.     

Weibull lagged effect step-stress model with competing risks

In many survival analysis studies, failure can come from one of several competing risks. Additionally, where survival times are lengthy, researchers can increase stress levels to cause units to fail faster. One type of accelerated testing is a step-stress test where the increase is presented in quantum jumps at predetermined time points. If the impact of the increase is not immediately attained, an interim lag period is modeled. In this article, we propose a two-competing risk step-stress model with a lag period where each independent risk follows a Weibull lifetime distribution, the interim lag period is linear, and the attainment point is assumed known. We obtain the maximum likelihood estimators and the observed information matrix; we construct confidence intervals and provide estimates of coverage probabilities using large sample theory, percentile bootstrap, and bias-corrected accelerated (BCa) bootstrap methods.     

Inference for step-stress accelerated life tests

In this paper we consider the more realistic aspect of accelerated life testing wherein the stress on an unfailed item is allowed to increase at a preassigned test time. Such tests are known as step-stress tests. Our approach is nonparametric in that we do not make any assumptions about the underlying distribution of life lengths. We introduce a model for step-stress testing which is based on the ideas of shock models and of wear processes. This model unifies and generalizes two previously proposed models for step-stress testing. We propose an estimator for the life distribution under use conditions stress and show that this estimator is strongly consistent.     

Inference and optimal design of multiple constant-stress testing for generalized half-normal distribution under type-II progressive censoring

The generalized half-normal (GHN) distribution and progressive type-II censoring are considered in this article for studying some statistical inferences of constant-stress accelerated life testing. The EM algorithm is considered to calculate the maximum likelihood estimates. Fisher information matrix is formed depending on the missing information law and it is utilized for structuring the asymptomatic confidence intervals. Further, interval estimation is discussed through bootstrap intervals. The Tierney and Kadane method, importance sampling procedure and Metropolis-Hastings algorithm are utilized to compute Bayesian estimates. Furthermore, predictive estimates for censored data and the related prediction intervals are obtained. We consider three optimality criteria to find out the optimal stress level. A real data set is used to illustrate the importance of GHN distribution as an alternative lifetime model for well-known distributions. Finally, a simulation study is provided with discussion.     

Models Comparison for Step-Stress Accelerated Life Testing

In this article, four basic models for step-stress accelerated life testing are introduced and compared: cumulative exposure model (CEM), linear cumulative exposure model (LCEM), tampered random variable model (TRVM), and tampered failure rate model (TFRM). Limitations of the four models are also introduced for better use of the models.     

Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model

The purpose of this paper is to address the optimal design of the step-stress accelerated degradation test (SSADT) issue when the degradation process of a product follows the inverse Gaussian (IG) process. For this design problem, an important task is to construct a link model to connect the degradation magnitudes at different stress levels. In this paper, a proportional degradation rate model is proposed to link the degradation paths of the SSADT with stress levels, in which the average degradation rate is proportional to an exponential function of the stress level. Two optimization problems about the asymptotic variances of the lifetime characteristics' estimators are investigated. The optimal settings including sample size, measurement frequency and the number of measurements for each stress level are determined by minimizing the two objective functions within a given budget constraint. As an example, the sliding metal wear data are used to illustrate the proposed model.     

Planning step-stress test under Type-I censoring for the exponential case

We consider in this work a k-level step-stress accelerated life-test (ALT) experiment with unequal duration steps τ=(τ₁, …, τ_k). Censoring is allowed only at the change-stress point in the final stage. An exponential failure time distribution with mean life that is a log-linear function of stress, along with a cumulative exposure model, is considered as the working model. The problem of choosing the optimal τ is addressed using the variance-optimality criterion. Under this setting, we then show that the optimal k-level step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.     

A tampered Brownian motion process model for partial step-stress accelerated life testing

In partial step-stress accelerated life testing, models extrapolating data obtained under more severe conditions to infer the lifetime distribution under normal use conditions are needed. Bhattacharyya (Invited paper for 46th session of the ISI, 1987) proposed a tampered Brownian motion process model and later derived the probability distribution from a decay process perspective without linear assumption. In this paper, the model is described and the features of the failure time distribution are discussed. The maximum likelihood estimates of the parameters in the model and their asymptotic properties are presented. An application of models for step-stress accelerated life test to fields other than engineering is described and illustrated by applying the tampered Brownian motion process model to data taken from a clinical trial.     

Optimal Multiple Constant-Stress Accelerated Life Tests for Generalized Exponential Distribution

Recently generalized exponential distribution has been discussed by many authors. In this article, we study the optimal constant-stress accelerated life tests with complete sample for the generalized exponential distribution. The problem of choosing the optimal proportions of test units allocated to each stress level is addressed by using V-optimality as well as D-optimality criteria. Some interesting conclusions are obtained. Finally, real data example and numerical examples have been analyzed to illustrate the proposed procedures.     

LSE method using the CHSS model

Testing the reliability at a nominal stress level may lead to extensive test time. Estimations of reliability parameters can be obtained faster thanks to step-stress accelerated life tests (ALT). Usually, a transfer functional defined among a given class of parametric functions is required, but Bagdonavi?ius and Nikulin showed that ALT tests are still possible without any assumption about this functional. When shape and scale parameters of the lifetime distribution change with the stress level, they suggested an ALT method using a model called CHanging Shape and Scale (CHSS). They estimated the lifetime parameters at the nominal stress with maximum likelihood estimation (MLE). However, this method usually requires an initialization of lifetime parameters, which may be difficult when no similar product has been tested before. This paper aims to face this issue by using an iterating least square estimation (LSE) method. It will enable one to initialize the optimization required to carry out the MLE and it will give estimations that can sometimes be better than those given by MLE.     

Optimal progressive interval censoring plan under accelerated life test with limited budget

In this paper, we investigate some inference and design problems related to multiple constant-stress accelerated life test with progressive type-I interval censoring. A Weibull lifetime distribution at each stress-level combination is considered. The scale parameter of Weibull distribution is assumed to be a log-linear function of stresses. We obtain the estimates of the unknown parameters through the method of maximum likelihood, and also derive the Fisher's information matrix. The optimal number of test units, number of inspections, and length of the inspection interval are determined under D-optimality, T-optimality, and E-optimality criteria with cost constraint. An algorithm based on nonlinear mixed-integer programming is proposed to the optimal solution. The sensitivity of the optimal solution to changes in the values of the different parameters is studied.     

Optimal simple step stress accelerated life test design for reliability prediction

A step stress accelerated life testing model is presented to obtain the optimal hold time at which the stress level is changed. The experimental test is designed to minimize the asymptotic variance of reliability estimate at time ζ$\zeta$. A Weibull distribution is assumed for the failure time at any constant stress level. The scale parameter of the Weibull failure time distribution at constant stress levels is assumed to be a log-linear function of the stress level. The maximum likelihood function is given for the step stress accelerated life testing model with Type I censoring, from which the asymptotic variance and the Fisher information matrix are obtained. An optimal test plan with the minimum asymptotic variance of reliability estimate at time ζ$\zeta$ is determined.     

Order restricted Bayesian inference for exponential simple step-stress model

A step-stress model has received a considerable amount of attention in recent years. In the usual step-stress experiment, a stress level is allowed to increase at each step to get rapid failure of the experimental units. The expected lifetime of the experimental unit is shortened as the stress level increases. Although extensive amount of work has been done on step-stress models, not enough attention has been paid to analyze step-stress models incorporating this information. We consider a simple step-stress model and provide Bayesian inference of the unknown parameters under cumulative exposure model assumption. It is assumed that the lifetime of the experimental units are exponentially distributed with different scale parameters at different stress levels. It is further assumed that the stress level increases at each step, hence the expected lifetime decreases. We try to incorporate this restriction using the prior assumptions. It is observed that different censoring schemes can be incorporated very easily under a general setup. Monte Carlo simulations have been performed to see the effectiveness of the proposed method, and two datasets have been analyzed for illustrative purposes.     

Optimum M-step,step-stress design with K stress variables

Most of the available literature on accelerated life testing deals with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a need to use more than one accelerating or other experimental variables. Examples include a test of capacitors at higher than usual levels of temperature and voltage, and a test of circuit boards at higher than usual levels of temperature, humidity, and voltage. M-step, step-stress models are extended to include k stress variables. Optimum M-step, step-stress designs with k stress variables are found. The polynomial model is considered as a special case, and a lack of fit test is discussed. Also a goodness-of-fit test is proposed and the appropriateness of using its asymptotic chi-square distribution for small samples is shown.     

Optimum constant-stress life test plans for Pareto distribution under type-I censoring

The paper considers the case of constant-stress partially accelerated life testing (CSPALT) when two stress levels are involved under type-I censoring. The lifetimes of test items are assumed to follow a two-parameter Pareto lifetime distribution. Maximum-likelihood method is used to estimate the parameters of CSPALT model. Confidence intervals for the model parameters are constructed. Optimum CSPALT plans that determine the best choice of the proportion of test units allocated to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance of the maximum-likelihood estimators of the model parameters. For illustration, Monte Carlo simulation studies are presented.