A Bivariate Gamma Model for a Latent Degradation Process

A model is presented in this article based on a bivariate gamma process in which, the first component is latent and determines the failure time and the second represents the marker. This process is a more realistic model for a degradation process. After introducing the model, we obtain failure and survival probability distributions and discuss parametric and predictive inferences based on the Maximum Likelihood method and in a Bayesian setup.     

Failure Inference From a Marker Process Based on a Bivariate Wiener Model

Many models have been proposed that relate failure times and stochastic time-varying covariates. In some of these models, failure occurs when a particular observable marker crosses a threshold level. We are interested in the more difficult, and often more realistic, situation where failure is not related deterministically to an observable marker. In this case, joint models for marker evolution and failure tend to lead to complicated calculations for characteristics such as the marginal distribution of failure time or the joint distribution of failure time and marker value at failure. This paper presents a model based on a bivariate Wiener process in which one component represents the marker and the second, which is latent (unobservable), determines the failure time. In particular, failure occurs when the latent component crosses a threshold level. The model yields reasonably simple expressions for the characteristics mentioned above and is easy to fit to commonly occurring data that involve the marker value at the censoring time for surviving cases and the marker value and failure time for failing cases. Parametric and predictive inference are discussed, as well as model checking. An extension of the model permits the construction of a composite marker from several candidate markers that may be available. The methodology is demonstrated by a simulated example and a case application.     

Inference from Accelerated Degradation and Failure Data Based on Gaussian Process Models

An important problem in reliability and survival analysis is that of modeling degradation together with any observed failures in a life test. Here, based on a continuous cumulative damage approach with a Gaussian process describing degradation, a general accelerated test model is presented in which failure times and degradation measures can be combined for inference about system lifetime. Some specific models when the drift of the Gaussian process depends on the acceleration variable are discussed in detail. Illustrative examples using simulated data as well as degradation data observed in carbon-film resistors are presented.     

Modelling Accelerated Degradation Data Using Wiener Diffusion With A Time Scale Transformation

Engineering degradation tests allow industry to assess the potential life span of long-life products that do not fail readily under accelerated conditions in life tests. A general statistical model is presented here for performance degradation of an item of equipment. The degradation process in the model is taken to be a Wiener diffusion process with a time scale transformation. The model incorporates Arrhenius extrapolation for high stress testing. The lifetime of an item is defined as the time until performance deteriorates to a specified failure threshold. The model can be used to predict the lifetime of an item or the extent of degradation of an item at a specified future time. Inference methods for the model parameters, based on accelerated degradation test data, are presented. The model and inference methods are illustrated with a case application involving self-regulating heating cables. The paper also discusses a number of practical issues encountered in applications. This revised version was published online in July 2006 with corrections to the Cover Date.     

Storage Life Prediction for a High-Performance Capacitor Using Multi-Phase Wiener Degradation Model

Capacitance is a critical performance characteristic of high-voltage-pulse capacitor which is used to store and discharge electrical energy rapidly. The capacitors usually are stored for a long period of time before put into use. Experimental result and engineering experience indicate that the capacitance increases with storage time and will eventually exceed the failure threshold, which means that the capacitor may fail during storage. This is a typical mode of degradation failure for long storage products. Further, the capacitance degradation path can be extrapolated in several stages based on the shifting characteristics. That is, the capacitance increases slowly or fluctuates in the initial storage stage that lasts about three months. Then it increases sharply in the middle stage which lasts about four months. After the two stages, the capacitor enters into the third stage in which capacitance increases constantly. This degradation phenomenon motivates us to study the storage life prediction method based on multi-phase degradation path model. The storage performance degradation mechanism of high-voltage-pulse capacitor was investigated, which provides the physical basis for multi-phase Wiener degradation model. Identification procedure for the transition points in the degradation path was proposed using maximum likelihood principle (MLP). The result of Kruskal-Wallis test which is the method to test whether two populations are consistent or not in statistics showed that the transition points are statistically effective. Other parameters in the multi-phase degradation model are estimated with maximum likelihood estimation (MLE) after the transition points have been specified. The multi-phase Inverse Gaussian (IG) distribution for storage life was deduced for the capacitor, and the point and interval estimation procedure for reliable storage life are constructed with bootstrap method. The efficiency and effectiveness of the proposed multi-phase degradation model is compared with storage life prediction under single-phase condition.     

Bayesian Methods for a Growth-Curve Degradation Model with Repeated Measures

The increasingreliability of some manufactured products has led to fewer observedfailures in reliability testing. Thus, useful inference on thedistribution of failure times is often not possible using traditionalsurvival analysis methods. Partly as a result of this difficulty,there has been increasing interest in inference from degradationmeasurements made on products prior to failure. In the degradationliterature inference is commonly based on large-sample theoryand, if the degradation path model is nonlinear, their implementationcan be complicated by the need for approximations. In this paperwe review existing methods and then describe a fully Bayesianapproach which allows approximation-free inference. We focuson predicting the failure time distribution of both future unitsand those that are currently under test. The methods are illustratedusing fatigue crack growth data.     

Covariates and Random Effects in a Gamma Process Model with Application to Degradation and Failure

The gamma process is a natural model for degradation processes in which deterioration is supposed to take place gradually over time in a sequence of tiny increments. When units or individuals are observed over time it is often apparent that they degrade at different rates, even though no differences in treatment or environment are present. Thus, in applying gamma-process models to such data, it is necessary to allow for such unexplained differences. In the present paper this is accomplished by constructing a tractable gamma-process model incorporating a random effect. The model is fitted to some data on crack growth and corresponding goodness-of-fit tests are carried out. Prediction calculations for failure times defined in terms of degradation level passages are developed and illustrated.     

Bivariate Constant-Stress Accelerated Degradation Model and Inference

To assess the reliability of highly reliable products that have two or more performance characteristics (PCs) in an accurate manner, relations between the PCs should be taken duly into account. If they are not independent, it would then become important to describe the dependence of the PCs. For many products, the constant-stress degradation test cannot provide sufficient data for reliability evaluation and for this reason, accelerated degradation test is usually performed. In this article, we assume that a product has two PCs and that the PCs are governed by a Wiener process with a time scale transformation, and the relationship between the PCs is described by the Frank copula function. The copula parameter is dependent on stress and assumed to be a function of stress level that can be described by a logistic function. Based on these assumptions, a bivariate constant-stress accelerated degradation model is proposed here. The direct likelihood estimation of parameters of such a model becomes analytically intractable, and so the Bayesian Markov chain Monte Carlo (MCMC) method is developed here for this model for obtaining the maximum likelihood estimates (MLEs) efficiently. For an illustration of the proposed model and the method of inference, a simulated example is presented along with the associated computational results.     

Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test

In this paper, we propose a method to model the relationship between degradation and failure time for a simple step-stress test where the underlying degradation path is linear and different causes of failure are possible. It is assumed that the intensity function depends only on the degradation value. No assumptions are made about the distribution of the failure times. A simple step-stress test is used to induce failure experimentally and a tampered failure rate model is proposed to describe the effect of the changing stress on the intensities. We assume that some of the products that fail during the test have a cause of failure that is only known to belong to a certain subset of all possible failures. This case is known as masking. In the presence of masking, the maximum likelihood estimates of the model parameters are obtained through the expectation–maximization algorithm by treating the causes of failure as missing values. The effect of incomplete information on the estimation of parameters is studied through a Monte-Carlo simulation. Finally, a real-world example is analysed to illustrate the application of the proposed methods.     

Asymptotic Comparison Between Constant-stress Testing and Step-stress Testing for Type-I Censored Data from Exponential Distribution

By running the life tests at higher stress levels than normal operating conditions, accelerated life testing quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant-stress testing, a unit is tested at a fixed stress level until failure or the termination time point of the test, while step-stress testing allows the experimenter to gradually increase the stress levels at some pre-fixed time points during the test. In this article, the optimal k-level constant-stress and step-stress accelerated life tests are compared for the exponential failure data under Type-I censoring. The objective is to quantify the advantage of using the step-stress testing relative to the constant-stress one. A log-linear relationship between the mean lifetime parameter and stress level is assumed and the cumulative exposure model holds for the effect of changing stress in step-stress testing. The optimal design point is then determined under C-optimality, D-optimality, and A-optimality criteria. The efficiency of step-stress testing compared to constant-stress testing is discussed in terms of the ratio of optimal objective functions based on the information matrix.     

Optimal simple step stress accelerated life test design for reliability prediction

A step stress accelerated life testing model is presented to obtain the optimal hold time at which the stress level is changed. The experimental test is designed to minimize the asymptotic variance of reliability estimate at time ζ$\zeta$. A Weibull distribution is assumed for the failure time at any constant stress level. The scale parameter of the Weibull failure time distribution at constant stress levels is assumed to be a log-linear function of the stress level. The maximum likelihood function is given for the step stress accelerated life testing model with Type I censoring, from which the asymptotic variance and the Fisher information matrix are obtained. An optimal test plan with the minimum asymptotic variance of reliability estimate at time ζ$\zeta$ is determined.     

Time Series Modeling of Degradation Due to Outdoor Weathering

Environmental variables have an important effect on the reliability of many products such as coatings and polymeric composites. Long-term prediction of the performance or service life of such products must take into account the probabilistic/stochastic nature of the outdoor weather. In this article, we propose a time series modeling procedure to model the time series data of daily accumulated degradation. Daily accumulated degradation is the total amount of degradation accrued within one day and can be obtained by using a degradation rate model for the product and the weather data. The fitted model of the time series can then be used to estimate the future distribution of cumulative degradation over a period of time, and to compute reliability measures such as the probability of failure. The modeling technique and estimation method are illustrated using the degradation of a solar reflector material. We also provide a method to construct approximate confidence intervals for the probability of failure.     

Reliability statistical analysis about products of Birnbaum–Saunders fatigue life distribution for life test and progressive stress accelerated life test

Birnbaum–Saunders fatigue life distribution is an important failure model in the probability physical methods. It is more suitable for describing the life rules of fatigue failure products than common life distributions such as Weibull distribution and lognormal distribution. Besides, it is mainly applied to analytical research about fatigue failure and degradation failure of electronic product performance. The characteristic properties such as numerical characteristics and image features of density function and failure rate function are studied for generalized BS fatigue life distribution GBS(α, β, m) in this paper. Then the point estimates and approximate interval estimates of parameters are proposed for generalized BS fatigue life distribution GBS(α, β, m), and the precision of estimates are investigated by Monte Carlo simulations. Finally, when the scale parameter satisfies inverse power law model, the failure distribution model is given for the products of two-parameter BS fatigue life distribution BS(α, β) under progressive stress accelerated life test according to the time conversion idea of famous Nelson assumption, and then the points estimates of parameters are given.     

Joint modeling of degradation and failure time data

This paper surveys some approaches to model the relationship between failure time data and covariate data like internal degradation and external environmental processes. These models which reflect the dependency between system state and system reliability include threshold models and hazard-based models. In particular, we consider the class of degradation–threshold–shock models (DTS models) in which failure is due to the competing causes of degradation and trauma. For this class of reliability models we express the failure time in terms of degradation and covariates. We compute the survival function of the resulting failure time and derive the likelihood function for the joint observation of failure times and degradation data at discrete times. We consider a special class of DTS models where degradation is modeled by a process with stationary independent increments and related to external covariates through a random time scale and extend this model class to repairable items by a marked point process approach. The proposed model class provides a rich conceptual framework for the study of degradation–failure issues.     

A model for markers and latent health status

We extend the bivariate Wiener process considered by Whitmore and co-workers and model the joint process of a marker and health status. The health status process is assumed to be latent or unobservable. The time to reach the primary end point or failure (death, onset of disease, etc.) is the time when the latent health status process first crosses a failure threshold level. Inferences for the model are based on two kinds of data: censored survival data and marker measurements. Covariates, such as treatment variables, risk factors and base-line conditions, are related to the model parameters through generalized linear regression functions. The model offers a much richer potential for the study of treatment efficacy than do conventional models. Treatment effects can be assessed in terms of their influence on both the failure threshold and the health status process parameters. We derive an explicit formula for the prediction of residual failure times given the current marker level. Also we discuss model validation. This model does not require the proportional hazards assumption and hence can be widely used. To demonstrate the usefulness of the model, we apply the methods in analysing data from the protocol 116a of the AIDS Clinical Trials Group.     

Optimal design of accelerated degradation tests based on Wiener process models

Optimal accelerated degradation test (ADT) plans are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Unlike the previous works on planning ADTs based on stochastic process models, this article determines the test stress levels and the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum-likelihood estimator of the qth quantile of the lifetime distribution at the use condition is minimized. In addition, compromise plans are also developed for checking the validity of the relationship between the model parameters and the stress variable. Finally, using an example, sensitivity analysis procedures are presented for evaluating the robustness of optimal and compromise plans against the uncertainty in the pre-estimated parameter value, and the importance of optimally determining test stress levels and the proportion of units allocated to each stress level are illustrated.     

Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring

Various types of failure, censored and accelerated life tests, are commonly employed for life testing in some manufacturing industries and products that are highly reliable. In this article, we consider the tampered failure rate model as one of such types that relate the distribution under use condition to the distribution under accelerated condition. It is assumed that the lifetimes of products under use condition have generalized Pareto distribution as a lifetime model. Some estimation methods such as graphical, moments, probability weighted moments, and maximum likelihood estimation methods for the parameters are discussed based on progressively type-I censored data. The determination of optimal stress change time is discussed under two different criteria of optimality. Finally, a Monte Carlo simulation study is carried out to examine the performance of the estimation methods and the optimality criteria.     

Optimal sequential Bayesian analysis for degradation tests

Degradation tests are especially difficult to conduct for items with high reliability. Test costs, caused mainly by prolonged item duration and item destruction costs, establish the necessity of sequential degradation test designs. We propose a methodology that sequentially selects the optimal observation times to measure the degradation, using a convenient rule that maximizes the inference precision and minimizes test costs. In particular our objective is to estimate a quantile of the time to failure distribution, where the degradation process is modelled as a linear model using Bayesian inference. The proposed sequential analysis is based on an index that measures the expected discrepancy between the estimated quantile and its corresponding prediction, using Monte Carlo methods. The procedure was successfully implemented for simulated and real data.     

Accelerated Degradation Models for Failure Based on Geometric Brownian Motion and Gamma Processes

Based on a generalized cumulative damage approach with a stochastic process describing degradation, new accelerated life test models are presented in which both observed failures and degradation measures can be considered for parametric inference of system lifetime. Incorporating an accelerated test variable, we provide several new accelerated degradation models for failure based on the geometric Brownian motion or gamma process. It is shown that in most cases, our models for failure can be approximated closely by accelerated test versions of Birnbaum–Saunders and inverse Gaussian distributions. Estimation of model parameters and a model selection procedure are discussed, and two illustrative examples using real data for carbon-film resistors and fatigue crack size are presented.     

Optimal step-stress accelerated degradation test plans for inverse Gaussian process based on proportional degradation rate model

The purpose of this paper is to address the optimal design of the step-stress accelerated degradation test (SSADT) issue when the degradation process of a product follows the inverse Gaussian (IG) process. For this design problem, an important task is to construct a link model to connect the degradation magnitudes at different stress levels. In this paper, a proportional degradation rate model is proposed to link the degradation paths of the SSADT with stress levels, in which the average degradation rate is proportional to an exponential function of the stress level. Two optimization problems about the asymptotic variances of the lifetime characteristics' estimators are investigated. The optimal settings including sample size, measurement frequency and the number of measurements for each stress level are determined by minimizing the two objective functions within a given budget constraint. As an example, the sliding metal wear data are used to illustrate the proposed model.