Statistical analysis of process capability indices with measurement errors: The case ofC p

Process capability indices (PCIs) have been widely used in manufacturing industries to previde a quantitative measure of process potential and performance. While some efforts have been dedicated in the literature to the statistical properties of PCIs estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated with reference toC _p , i.e. the simplest and most common measure suggested to evaluate process capability. The authors would like to thank two anonymous referees for their comments and suggestion that were useful in the preparation and improvement of this paper. This work was partially supported by a MURST research grant.     

Estimating capability index cpk for processes with asymmetric tolerances

Pearn and Chen (1996) considered the process capability index C_pk, and investigated the statistical properties of its natural estimator under various process conditions. Their investigation, however, was restricted to processes with symmetric tolerances. Recently, Pearn and Chen (1998) considered a generalization of C_pk, referred to as C^? _pk, to cover processes with asymmetric tolerances. They investigated the statistical properties of the natural estimator of C^? _pk, and obtained the exact formulae for the expected value and variance. In this paper, we consider a new estimator of C^? _pk, assuming the knowledge on P(LI > T) = p is available, where 0 > p > 1, which can be obtained from historical information of a stable process. We obtain the exact distribution of the new estimator assuming the process characteristic follows the normal distribution. We show that the new estimator is consistent, asymptotically unbiased, which converges to a mixture of two normal distributions. We also show that by adding suitable correction factors to the new estimator, we may obtain the UMVUE and the MLE of the generalization C^? _pk.     

Testing process capability based on Cpm in the presence of random measurement errors

Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index C_p provides measures on process precision (or product consistency). The index C_pm, sometimes called the Taguchi index, meditates on process centring ability and process loss. Most research work related to C_p and C_pm assumes no gauge measurement errors. This assumption insufficiently reflects real situations even with highly advanced measuring instruments. Conclusions drawn from process capability analysis are therefore unreliable and misleading. In this paper, we conduct sensitivity investigation on process capability C_p and C_pm in the presence of gauge measurement errors. Due to the randomness of variations in the data, we consider capability testing for C_p and C_pm to obtain lower confidence bounds and critical values for true process capability when gauge measurement errors are unavoidable. The results show that the estimator with sample data contaminated by the measurement errors severely underestimates the true capability, resulting in imperceptible smaller test power. To obtain the true process capability, adjusted confidence bounds and critical values are presented to practitioners for their factory applications.     

A new generation of process capability indices

In quality control, we may confront imprecise concepts. One case is a situation in which upper and lower specification limits (SLs) are imprecise. If we introduce vagueness into SLs, we face quite new, reasonable and interesting processes, and the ordinary capability indices are not appropriate for measuring the capability of these processes. In this paper, similar to the traditional process capability indices (PCIs), we develop a fuzzy analogue by a distance defined on a fuzzy limit space and introduce PCIs, where instead of precise SLs we have two membership functions for upper and lower SLs. These indices are necessary when SLs are fuzzy, and they are helpful for comparing manufacturing process with fuzzy SLs. Some interesting relations among these introduced indices are proved. Numerical examples are given to clarify the method.     

Fuzzy process capability indices for simple linear profile

Process capability indices are numerical tools that quantify how well a process can meet customer requirements, specifications or engineering tolerances. Fuzzy logic is incorporated to deal imprecise, incomplete data along with uncertainty. This paper develops two fuzzy methods for measuring the process capability in simple linear profiles for the circumstances in which lower and upper specification limits are imprecise. To guide practitioners, numerical example is provided.     

Inference on C pk for autocorrelated data in the presence of random measurement errors

The present paper examines the properties of the C _pk estimator when observations are autocorrelated and affected by measurement errors. The underlying reason for this choice of subject matter is that in industrial applications, process data are often autocorrelated, especially when sampling frequency is not particularly low, and even with the most advanced measuring instruments, gauge imprecision needs to be taken into consideration. In the case of a first-order stationary autoregressive process, we compare the statistical properties of the estimator in the error case with those of the estimator in the error-free case. Results indicate that the presence of gauge measurement errors leads the estimator to behave differently depending on the entity of error variability.     

A new generation of process capability indices based on fuzzy measurements

Process capability indices (PCIs) provide numerical measures on whether a process conforms to the defined manufacturing capability prerequisite. These have been successfully applied by companies to compete with and to lead high-profit markets by evaluating the quality and productivity performance. The PCI C_p compares the output of a process to the specification limits (SLs) by forming the ratio of the width between the process SLs with the width of the natural tolerance limits which is measured by six process standard deviation units. As another common PCI, C_pm incorporates two variation components which are variation to the process mean and deviation of the process mean from the target. A meaningful generalized version of above PCIs is introduced in this paper which is able to handle in a fuzzy environment. These generalized PCIs are able to measure the capability of a fuzzy-valued process in producing products on the basis of a fuzzy quality. Fast computing formulas for the generalized PCIs are computed for normal and symmetric triangular fuzzy observations, where the fuzzy quality is defined by linear and exponential fuzzy SLs. A practical example is presented to show the performance of proposed indices.     

Estimating process capability index Cpk: classical approach versus Bayesian approach

Process capability index C_pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C_pk using two approaches, Classical method and Bayesian method.     

Skewed zero-bound distributions and process capability indices for upper specifications

A common practical situation in process capability analysis, which is not well developed theoretically, is when the quality characteristic of interest has a skewed distribution with a long tail towards relatively large values and an upper specification limit only exists. In such situations, it is not uncommon that the smallest possible value of the characteristic is 0 and this is also the best value to obtain. Hence a target value 0 is assumed to exist. We investigate a new class of process capability indices for this situation. Two estimators of the proposed index are studied and the asymptotic distributions of these estimators are derived. Furthermore, we suggest a decision procedure useful when drawing conclusions about the capability at a given significance level, based on the estimated indices and their asymptotic distributions. A simulation study is also performed, assuming that the quality characteristic is Weibull-distributed, to investigate the true significance level when the sample size is finite.     

Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors

ABSTRACT

In this study, the generalized confidence interval method is applied to evaluate the performances of processes with asymmetric tolerances taking into account the gauge measurement errors (GME). To examine the performance of the proposed method, a series of simulations is conducted. Moreover, a sensitivity study is carried out to analyze the effects of ignoring GME. The proposed method performs very well and can be recommended for assessing the performances of processes with asymmetric tolerances in the presence of GME.     

Developing a variables repetitive group sampling plan based on process capability index C pk with unknown mean and variance

In this paper, variables repetitive group sampling plans are developed based on the process capability index C _pk when the quality characteristic follows a normal distribution with unknown mean and variance. The sampling plan parameters such as the sample size and the acceptance constant are determined to minimize the average sample number. Symmetric and asymmetric cases, in percent defectives due to two specification limits, are dealt with for specified combinations of acceptable quality level and limiting quality level. Tables are provided and examples are given to use proposed plans in practice.     

A Bayesian model for measurement and misclassification errors alongside missing data,with an application to higher education participation in Australia

In this paper we consider the impact of both missing data and measurement errors on a longitudinal analysis of participation in higher education in Australia. We develop a general method for handling both discrete and continuous measurement errors that also allows for the incorporation of missing values and random effects in both binary and continuous response multilevel models. Measurement errors are allowed to be mutually dependent and their distribution may depend on further covariates. We show that our methodology works via two simple simulation studies. We then consider the impact of our measurement error assumptions on the analysis of the real data set.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

A Bayesian approach of joint models for clustered zero-inflated count data with skewness and measurement errors

Count data with excess zeros are widely encountered in the fields of biomedical, medical, public health and social survey, etc. Zero-inflated Poisson (ZIP) regression models with mixed effects are useful tools for analyzing such data, in which covariates are usually incorporated in the model to explain inter-subject variation and normal distribution is assumed for both random effects and random errors. However, in many practical applications, such assumptions may be violated as the data often exhibit skewness and some covariates may be measured with measurement errors. In this paper, we deal with these issues simultaneously by developing a Bayesian joint hierarchical modeling approach. Specifically, by treating intercepts and slopes in logistic and Poisson regression as random, a flexible two-level ZIP regression model is proposed, where a covariate process with measurement errors is established and a skew-t-distribution is considered for both random errors and random effects. Under the Bayesian framework, model selection is carried out using deviance information criterion (DIC) and a goodness-of-fit statistics is also developed for assessing the plausibility of the posited model. The main advantage of our method is that it allows for more robustness and correctness for investigating heterogeneity from different levels, while accommodating the skewness and measurement errors simultaneously. An application to Shanghai Youth Fitness Survey is used as an illustrate example. Through this real example, it is showed that our approach is of interest and usefulness for applications.     

Designing of a mixed-chain sampling plan based on the process capability index with chain sampling as the attributes plan

In this article, we propose a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest having double specification limits and follows the normal distribution with unknown mean and variance. In the proposed mixed plan, the chain sampling inspection plan is used for the inspection of attribute quality characteristics. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications by formulating the problem as a non linear programming in which the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.