Robust Hotelling's T2 control charts under non-normality: the case of t-Student distribution

Traditional multivariate control charts are based upon the assumption that the observations follow a multivariate normal distribution. In many practical applications, however, this supposition may be difficult to verify. In this paper, we use control charts based on robust estimators of location and scale to improve the capability of detection observations out of control under non-normality in the presence of multiple outliers. Concretely, we use a simulation process to analyse the behaviour of the robust alternatives to Hotelling's T ², which use minimum volume ellipsoidal (MVE) and minimum covariance determinant (MCD) in the presence of observations with a Student's t-distribution. The results show that these robust control charts are good alternatives for small deviations from normality due to the fact that the percentage of out-of-control observations detected for these charts in the Phase II are higher.     

Bounds for the t-tail area

The bounds of Birnbaum (1942) and Sampford (1953) for the upper tail area of the normal distribution are extended to the upper tail of the t-distribution. Numerical and theoretical comparisons are made with the bounds of Peizer and Pratt (1968), Wallace (1959) and Soms (1977).     

Normal quantile estimation based on minimizing the error in predicted distribution functions

Estimators of the form [Xbar] + kS for estimating the p quantile of a normal distribution are studied when k is chosen to either minimize the mean square error in the predicted distribution function or to make the predicted distribution function unbiased for p. Here, [Xbar] and S are the usual sample mean and standard deviation, respectively, and the predicted distribution function is the true (normal) distribution function evaluated at the estimated quantile.

These k values are presented for various sample sizes and values of p, and application to warranty determination is discussed.     

Note on an extension of rational bounds for the t-tail area to arbitrary degrees of freedom

The bounds of Soms (1980a) for the tail area of the t-distribution with integral degrees of freedom are extended to arbitrary positive degrees of freedom, Comparisons are made with the bounds of Shenton and Carpenter (1965) and some numerical examples are provided.     

A partitioning of the power in the one sample Student t-test

The power of Student's t-test is partitioned to determine* the proportion of time the sample standard deviation is too small or the mean is misestimated given that rejection of the hypothesis under test has occurred     

Testing process capability based on Cpm in the presence of random measurement errors

Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index C_p provides measures on process precision (or product consistency). The index C_pm, sometimes called the Taguchi index, meditates on process centring ability and process loss. Most research work related to C_p and C_pm assumes no gauge measurement errors. This assumption insufficiently reflects real situations even with highly advanced measuring instruments. Conclusions drawn from process capability analysis are therefore unreliable and misleading. In this paper, we conduct sensitivity investigation on process capability C_p and C_pm in the presence of gauge measurement errors. Due to the randomness of variations in the data, we consider capability testing for C_p and C_pm to obtain lower confidence bounds and critical values for true process capability when gauge measurement errors are unavoidable. The results show that the estimator with sample data contaminated by the measurement errors severely underestimates the true capability, resulting in imperceptible smaller test power. To obtain the true process capability, adjusted confidence bounds and critical values are presented to practitioners for their factory applications.     

Sensitivity analysis of the t-distribution under truncated normal populations

In recent literature, the truncated normal distribution has been used to model the stochastic structure for a variety of random structures. In this paper, the sensitivity of the t-random variable under a left-truncated normal population is explored. Simulation results are used to assess the errors associated when applying the student t-distribution to the case of an underlying left-truncated normal population. The maximum errors are modelled as a linear function of the magnitude of the truncation and sample size. In the case of a left-truncated normal population, adjustments to standard inferences for the mean, namely confidence intervals and observed significance levels, based on the t-random variable are introduced.     

On C pk Assessment in the Presence of Tool Wear

Process capability indices are routinely used in manufacturing industries for process monitoring. A basic assumption while using process capability indices is that there are no assignable causes of variation present. However, when variation due to an assignable cause is present and is tolerated, the conventional methods of capability measurement become inaccurate. In this article, we suggest an estimate of C_pk assuming that the process capability changes dynamically. We obtain an exact form of the sampling distribution in the presence of a systematic assignable cause. We discuss the problem of testing whether a given process is capable. The critical values for different sample sizes are obtained based on the sampling distribution. An example involving tool wear problem is presented.     

Estimating total and specific process capability indices in three-stage processes with measurement errors

In multistage processes, two kinds of process capability indices (specific and total process capability indices) are defined in each stage. The total process capability index calculates the capability of each stage when it is affected by the previous stages and the specific process capability index calculates the capability of the stage when the effects of the previous stages are eliminated. Process capability indices in multistage processes are proposed under the assumption of no measurement errors. However, sometimes this assumption may be violated and leads to misleading interpretations. In this paper, the effects of measurement errors on the specific and total process capability indices in the second and third stages of the three-stage processes are statistically analysed. In addition, the effects of the measurement errors on the bias and the mean square error value of the total and specific process capability indices in the second and third stages are studied. Finally, the effects of the measurement errors on the specific and total process capability indices are shown through a numerical example.     

Multivariate process capability using principal component analysis in the presence of measurement errors

Various different definitions of multivariate process capability indices have been proposed in the literature. Most of the research works related to multivariate process capability indices assume no gauge measurement errors. However, in industrial applications, despite the use of highly advanced measuring instruments, account needs to be taken of gauge imprecision. In this paper we are going to examine the effects of measurement errors on multivariate process capability indices computed using the principal components analysis. We show that measurement errors alter the results of a multivariate process capability analysis, resulting in either a decrease or an increase in the capability of the process. In order to achieve accurate process capability assessments, we propose a method useful for overcoming the effects of gauge measurement errors.     

A simple approximation for the doubly noncentral t-distribution

A simple approximation for the doubly noncentral t-distribution, based upon the Fieller-Geary Theorem (1930) and approximate normality of the square root of the noncentral chi-square variable observed by Patnaik (1949), is developed, This approximation and an Edgeworth series expansion associated with it are evaluated. The simple approximation is seen to be reasonably accurate for most practical purposes.     

Estimating process capability indexes for autocorrelated data

Process capability indexes are widely used in the manufacturing industries and by supplier companies in process assessments and in the evaluation of purchasing decisions. One concern about using the process capability indexes is the assumption of the mutual independence of the process data, because, in process industries, process data are often autocorrelated. This paper discusses the use of the process capability indexes Cp and Cpk when the process data are autocorrelated. Interval estimation procedures for Cp and Cpk are proposed and their properties are studied.     

Generalized confidence intervals for the process capability indices in general random effect model with balanced data

In this paper, we consider the interval estimation problem on the process capability indices in general random effect model with balanced data. The confidence intervals for three commonly used process capability indices are developed by using the concept of generalized confidence interval. Furthermore, some simulation results on the coverage probability and expected value of the generalized lower confidence limits are reported. The simulation results indicate that the proposed confidence intervals do provide quite satisfactory coverage probabilities.     

On level and powee of anderson and hauck's peocedure for testing equivalence in compative bioavailability

The paper refers to a new procedure of Anderson and Hauck for the well-known problem of deciding whether two means of normal distributions with common but unknown variance differ within an admissible range. Analytical expressions for level and power of this method are derived and some numerical examples are given. A bound for the difference between real and no¬minal level is obtained which does not involve the variance.     

Three New Multivariate Process Capability Indices

Different multivariate process capability indices are developed by researchers to evaluate process capability when vectors of quality characteristics are considered in a study. This article presents three indices referred to as NCpM, MCpM, and NMC _PM in order to evaluate process capability in multivariate environment. The performance of the proposed indices is investigated numerically. Simulation results indicate that the proposed indices have descended estimation error and improved performance compared to the existing ones. These results can be important to researchers and practitioners who are interested in evaluating process capability in multivariate domain.     

A skew extension of the t-distribution, with applications

Summary. A tractable skew t -distribution on the real line is proposed. This includes as a special case the symmetric t -distribution, and otherwise provides skew extensions thereof. The distribution is potentially useful both for modelling data and in robustness studies. Properties of the new distribution are presented. Likelihood inference for the parameters of this skew t -distribution is developed. Application is made to two data modelling examples.     

On the procedure of hodges and lehmann for testing composite hypotheses of the mean of a normal distribution with unknown variance

In 1954 Hodges and Lehmann gave a test procedure for testing the hypothesis that the mean of an identically independently normally distributed random sample with unknown variance is contained within a certain interval [μ1, μ2]. The test is similar on the boundary of the zero-hypothesis and superior in power to the composite t-test usually applied to this problem. However Hodges and Lehmann could prove the unbiasedness of their test only for the special case that the sample consists of two elements. From numerical computations they guessed that unbiasedness would be valid for arbitrary sample sizes. This question is discussed here and partially answered.     

An analysis of the type I error in the one sample Student t-test

In the one-sample Student t-test, the occurrence of a type-I error is dependent on the estimates of the mean and standard deviation for a fixed sample size, n. The statistic can achieve significance either by the sample mean being too different from the hypothesized mean or by the sample standard deviation being too small. The critical region is partitioned to determine the characteristics of samples in the critical region, assuming the null hypothesis is true. As might be conjectured from the use of the t-statistic, mis-estimation of the mean is shown to be the predominant characteristic of samples in the critical region for sample sizes larger than 20 and significance level greater than 0.01. Underestimation of the variance, unless accompanied by a misestimation of the mean, is a far less frequent characteristic of critical region samples.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

Computer generation of random variates from the tail of t and normal distributions

An algorithm is developed for the efficient generation of random variates from the tail of a t-distribution. This is specialised to the case of a Normal distribution. Theoretical measures of efficiency are derived. Computer timings for the algorithms are given, and, in the Normal case, compared with existing tail generation procedures.