Design of a CSP-1 plan based on regret-balanced criterion

This article explores the problem of designing a CSP-1 plan with the specified average outgoing quality limit (AOQL), the acceptable quality level (AQL), and the limiting quality level (LQL) value. By adopting the regret-balanced criterion under the producer's and consumer's interests of quality, we can design the optimal CSP-1 plan.     

Minimum average fraction inspected for TCSP-1 plan

This paper presents the calculation of the average outgoing quality limit (AOQL) for the tightened single-level continuous sampling plan (TCSP-1 plan) based on a numerical method. A solution procedure is developed to find the parameters (i, f, k) that will meet the AOQL requirement, while also minimizing the average fraction inspected (AFI) for the TCSP-1 plan when the process average [pbar] (> AOQL) is known.     

Continuous inspection of Markov processes with a clearance interval

Dodge's continuous sampling plan-1 (CSP-1) with clearance interval zero may be inefficient if there is serial correlation between successive units which are Markov dependent and a clearance interval greater than zero is appropriate. For such a situation, the average outgoing quality limit (AOQL) expression has been obtained and, when the serial correlation coefficient of the Markov chain is assumed to be known a priori, it is numerically demonstrated that smaller AOQL values are achieved numerically for values of the clearance interval from 1 to 4, by improving the perform-ance ofCSP-L     

Closed-Form Approximation for the AOQL of Attributes Acceptance Sample Plans

We derive upper and lower bounds at the point at which the average outgoing quality limit (AOQL) of an attributes acceptance sampling plan is achieved. Using a simple average of these bounds to approximate the ordinate of the AOQL, we develop an accurate, closed-form approximation to the AOQL. The bounds and approximation show how the parameters of a sampling plan affect the AOQL and can be used to study the behavior of the AOQL and other measures of the plan's performance.     

Minimum average fraction inspected for continuous sampling plan CSP-1 under inspection error

SUMMARY In this paper, we present a further modification of Endres's method to construct the problem of minimizing the average fraction inspected (AFI) for the continuous sampling plan CSP-1 under inspection error. The measures of average outgoing quality under perfect and imperfect replacement conditions are considered. The formulae for searching the smallest clearance number i for minimizing the AFI for a CSP-1 plan are also provided. The solution procedure of the proposed method is more reliable, clearer and easier than that of Endres.     

Minimum Average Total Inspection of Variable Lot-size Sampling Plan for Continuous Production

This paper explores the problem of minimizing the average total inspection (ATI) of Read & Beattie's variable lot-size sampling plan for continuous production. The solution procedure is developed to find the optimal parameters (n,  c) that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the ATI for this variable lot-size plan.     

Comparison between count of cumulative conforming sampling plans and Dodge–Romig single sampling plan

In this research, a new sampling system is introduced based on the concept of count of cumulative conforming control charts (CCC-charts). The proposed method is based on Markov modeling and negative binomial distribution. The proposed sampling system is compared with traditional sampling methods like Dodge–Romig single sampling plan based on lot tolerance percent defective (LTPD) and Dodge–Romig single sampling plan based on average outgoing quality limit (AOQL) and its superiority for larger values of lot sizes and process average is denoted using a comparison study.     

Matching Performance of Continuous Sampling Plans with Single Sampling Plans

Single sampling plans are widely used for appraising incoming product quality. However, for situations where a continuous product flow exists, lot-by-lot demarcations may not exist, and it may be necessary to use alternate procedures, such as CSP-1, for continuous processes. In this case, one would like to be able to understand how average performance of the continuous sampling procedures compares to the more commonly used single sampling plans.

In this study, a model is devised which can be used to relate plan performance between single sample lot acceptance procedures and Dodge's(1943) CSP-1 continuous sampling plan. It is shown that it is generally not possible to match up performance based upon operating characteristic curve expressions for the two plans. Instead, the plans are matched by equating expressions for π(p), the long run proportion of product which is accepted, under both procedures. This is shown to be equivalent to matching up properties on an average outgoing quality basis. The methodology may be extended for any derivative plan under MIL-STD-1235B (1982), the military standard for continuous acceptance sampling.     

Tightened single-level continuous sampling plan

In this paper, a new tightening concept has been incorporated into the single-level continuous sampling plan CSP-1, such that quality degradation will warrant sampling inspection to cease beyond a certain number of sampled items, until new evidence of good quality is established. The expressions of the performance measures for this new plan, such as the operating characteristic, average outgoing quality and average fraction inspected, are derived using a Markov chain model. The advantage of the tightened CSP-1 plan is that it is possible to lower the average outgoing quality limit.     

Design of generalized CSP-C continuous sampling plan

In this paper, the concept acceptance number has been incorporated to the single level continuous sampling plan CSP-1. The advantage of the proposed plan, designated as the CSP-C plan, is to achieve a reduction in the average fraction inspected at good quality levels. Nomographs for the design of the proposed plan are presented. The expressions of the performance measures for this new plan such as OC, AOQ and AFI are also provided.     

Economic design of continuous sampling plan under linear inspection cost

The article explores the problem of an economically based type I continuous sampling plan (CSP-1 plan) under linear inspection cost. By assuming that the per unit inspection cost is linearly proportional to the average number of inspections per inspection cycle, and by solving the modified Cassady et al.'s model, we not only have the required level of product quality but also obtain the minimum total expected cost per unit produced.     

Average outgoing quality of CSP-C continuous sampling plan under short run production processes

A CSP-C continuous sampling plan is a new single-level continuous sampling procedure developed by Govindaraju & Kandasamy (2000) by incorporating the concept of acceptance number to the CSP-1 plan for the application of continuous production processes. In this new plan, the sampling inspection phase is characterized by a maximum allowable number of non-conforming units, c, and a constant sampling rate, f. Govindaraju & Kandasamy (2000) derived the performance measures such as average outgoing quality (AOQ), average fraction inspected (AFI) etc, of the CSP-C plan using a Markov chain model for long run production processes. Yang (1983) has observed that the AOQ and AFI, being long run average measures, are not satisfactory measures of performance for short run production processes. Hence, formulas are derived in this paper, using the renewal theory approach enabling one to compute AOQ and AFI for both long run and short run production processes. Numerical illustrations are also given. By simulation, the accuracy of the short run measures is studied.     

Modified CSP-C Continuous Sampling Plan for Consumer Protection

Dodge (1943) introduced a single level attribute continuous sampling plan designated as CSP-1 for the application of continuous production processes. Govindaraju & Kandasamy (2000) developed a new single level continuous sampling plan whose sampling inspection phase is characterized by a maximum allowable number of non-conforming units c, and a constant sampling rate f and was designated as CSP-C. In this paper, a modification is proposed on the CSP-C continuous sampling plan. In this modified plan, sampling inspection is continued until the occurrence of c+1 non-conforming units, provided the first m sampled units have been found conforming during the sampling phase. Using a Markov chain model, expressions for the performance measures of the modified CSP-C plan are derived. The main advantage of the modified plan is that it is possible to lower the average outgoing quality limit.     

Selection of multiple deferred (dependent) state sampling plans

This paper presents procedures and tables for the selection of minimum sample size multiple deferred (dependent) state sampling plan of type MDS and MDS - 1 for various entry conditions such as (AQL, LQL), (AQL, AOQL) etc.     

Dodge-Romig AOQL single sampling plans for inspection by variables

Acceptance sampling plans for inspection by variables, which minimize the mean inspection cost per lot of process average quality (assuming that the remainder of rejected lots is inspected), are derived under the condition that the maximum value of the mean fraction defective after sampling inspection, replacing all defective items found by good ones, shall be equal top _L . These plans are tabulated for chosen values of the given parameters, and compared with the Dodge-Romig AOQL attribute sampling plans. From the comparison it follows that under the same protection of consumer the AOQL plans for inspection by variables are in some situations more economical than the corresponding Dodge-Romig plans.     

Modified tightened two-level continuous sampling plans

In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.     

Selection of csp-t plans

Various continuous sampling plans have been proposed for monitoring the quality of continuous production processes. The multi-level continuous sampling plan of MIL-STD-1235C (1988) is designated as CSP-T Plan. CSP-T plan is a three-level tightened continuous sampling plan. It requires a switch to 100% inspection, at any level, whenever a nonconforming unit is found. This provides quick rectification in the event of a shift in quality. In this paper certain performance characteristics of CSP-T plan are derived using the approach of Stephens (1979) under the assumption that the production process is in statistical control. For the selection of CSP-T plans, two tables are given. These tables can be used to obtain parameters i (clearance interval) and f (sampling fraction) of the CSP-T plan for given acceptable quality level (AQL) with producer’ risk α=0.05 or the limiting quality level(LQL) with consumer’ risk β=0.10 and the outgoing quality limit(AOQL). Two examples are also given to illustrate the selection of plans from these tables     

Minimum Variance and VOQL Chain Sampling Plans–ChSP-4(c 1, c 2)

In this article the outgoing quality and the total inspection for the chain sampling plan ChSP-4(c ₁, c ₂) are introduced as well-defined random variables. The probability distributions of outgoing quality and total inspection are stated based on total rectification of non conforming units. The variances of these random variables are studied. The aim of this article is to develop procedures for minimum variance ChSP-4(c ₁, c ₂) sampling plans and their determination. In addition to minimum variance sampling plans, a procedure is developed for designing plans with a designated maximum variance, a VOQL (Variance of Outgoing Quality Limit) plan. The VOQL concept is analogous to the AOQL (Average Outgoing Quality Limit) except in the VOQL plan, it is the maximum variance which is established instead of the usual maximum AOQ.     

A generalized procedure for selection of attribute double sampling plan

A compact table, yielding attribute double sampling plan indexed by AQL, AOQL and LQL and double sampling scheme indexed by AQL is presented. Method of selecting the plans are indicated through examples.     

Determination of single sampling attributes plans for given (aql. aoql)

This paper presents tables and a computer program for determining single sampling plans for given AQL, producer's risk and AOQL for the case of nonconforming units and nonconformities. Comparison with Soundararajan's (1981) procedures for selection of single sampling plans for given (AQL, AOQL) is also given