A Semi‐empirical Bayesian Chart to Monitor Weibull Percentiles

This paper develops a Bayesian control chart for the percentiles of the Weibull distribution, when both its in‐control and out‐of‐control parameters are unknown. The Bayesian approach enhances parameter estimates for small sample sizes that occur when monitoring rare events such as in high‐reliability applications. The chart monitors the parameters of the Weibull distribution directly, instead of transforming the data as most Weibull‐based charts do in order to meet normality assumption. The chart uses accumulated knowledge resulting from the likelihood of the current sample combined with the information given by both the initial prior knowledge and all the past samples. The chart is adapting because its control limits change (e.g. narrow) during Phase I. An example is presented and good average run length properties are demonstrated.     

An Improved Distribution-free EWMA Mean Chart

Control charts are effective tools for signal detection in both manufacturing processes and service processes. Much service data come from a process with variables having nonnormal or unknown distributions. The commonly used Shewhart variable control charts, which depend heavily on the normality assumption, should not be properly used here. In this article, we propose an improved asymmetric EWMA mean chart based on a simple statistic to monitor process mean shift. We explored the sampling properties of the new monitoring statistic and calculated the average run lengths of the proposed asymmetric EWMA mean chart. We recommend the proposed improved asymmetric EWMA mean chart because the average run lengths of the modified charts are more accurate and reasonable than those of the five existed mean charts. A numerical example of service times with a right skewed distribution from a service system of a bank branch is used to illustrate the application of the improved asymmetric EWMA mean chart and to compare it with the five existing mean charts. The proposed chart showed better detection performance than those of the five existing mean charts in monitoring and detecting shifts in the process mean.     

Process monitoring of exponentially distributed characteristics through an optimal normalizing transformation

Many process characteristics follow an exponential distribution, and control charts based on such a distribution have attracted a lot of attention. However, traditional control limits may be not appropriate because of the lack of symmetry. In this paper, process monitoring through a normalizing power transformation is studied. The traditional individual measurement control charts can be used based on the transformed data. The properties of this control chart are investigated. A comparison with the chart when using probability limits is also carried out for cases of known and estimated parameters. Without losing much accuracy, even compared with the exact probability limits, the power transformation approach can easily be used to produce charts that can be interpreted when the normality assumption is valid.     

The Design of and R Control Charts for Skew Normal Distributed Data

The Shewhart-type control chart is traditionally developed under the normality assumption. In practice, however, this assumption may not hold. Because the skew normal distribution represents a broad distribution class and is more flexible than is the normal distribution, we propose two new control charts to monitor process mean and spread for skew normal distributed data. Moreover, to facilitate practical implementation, tables of charting constants are provided. We conducted simulation studies to compare the false alarm rates, and the results show that new proposed charts perform better than others as skewness increases. Finally, an illustrative example is provided.     

A new approach for monitoring process variance

ABSTRACT

Control charts are effective tools for signal detection in both manufacturing processes and service processes. Much service data come from a process with variables having non-normal or unknown distributions. The commonly used Shewhart variable control charts, which depend heavily on the normality assumption, should not be properly used in such circumstances. In this paper, we propose a new variance chart based on a simple statistic to monitor process variance shifts. We explore the sampling properties of the new monitoring statistic and calculate the average run lengths (ARLs) of the proposed variance chart. Furthermore, an arcsine transformed exponentially weighted moving average (EWMA) chart is proposed because the ARLs of this modified chart are more intuitive and reasonable than those of the variance chart. We compare the out-of-control variance detection performance of the proposed variance chart with that of the non-parametric Mood variance (NP-M) chart with runs rules, developed by Zombade and Ghute [Nonparametric control chart for variability using runs rules. Experiment. 2014;24(4):1683–1691], and the nonparametric likelihood ratio-based distribution-free exponential weighted moving average (NLE) chart and the combination of traditional exponential weighted moving average (EWMA) mean and EWMA variance (CEW) control chart proposed by Zou and Tsung [Likelihood ratio-based distribution-free EWMA control charts. J Qual Technol. 2010;42(2):174–196] by considering cases in which the critical quality characteristic has a normal, a double exponential or a uniform distribution. Comparison results showed that the proposed chart performs better than the NP-M with runs rules, and the NLE and CEW control charts. A numerical example of service times with a right-skewed distribution from a service system of a bank branch in Taiwan is used to illustrate the application of the proposed variance chart and of the arcsine transformed EWMA chart and to compare them with three existing variance (or standard deviation) charts. The proposed charts show better detection performance than those three existing variance charts in monitoring and detecting shifts in the process variance.     

Bootstrap-Based T 2 Multivariate Control Charts

Control charts have been used effectively for years to monitor processes and detect abnormal behaviors. However, most control charts require a specific distribution to establish their control limits. The bootstrap method is a nonparametric technique that does not rely on the assumption of a parametric distribution of the observed data. Although the bootstrap technique has been used to develop univariate control charts to monitor a single process, no effort has been made to integrate the effectiveness of the bootstrap technique with multivariate control charts. In the present study, we propose a bootstrap-based multivariate T ² control chart that can efficiently monitor a process when the distribution of observed data is nonnormal or unknown. A simulation study was conducted to evaluate the performance of the proposed control chart and compare it with a traditional Hotelling's T ² control chart and the kernel density estimation (KDE)-based T ² control chart. The results showed that the proposed chart performed better than the traditional T ² control chart and performed comparably with the KDE-based T ² control chart. Furthermore, we present a case study to demonstrate the applicability of the proposed control chart to real situations.     

MDEWMA chart: an efficient and robust alternative to monitor process dispersion

Control chart is the most important statistical process control tool used to monitor changes in process location and dispersion. In this study, an EWMA control chart is proposed for efficient and robust monitoring of process dispersion. The proposed chart, namely the MDEWMA chart, is based on estimating the process standard deviation (σ) using the mean absolute deviations (MD), taken from the sample median. The performance of the proposed chart has been compared with the EWMASR chart (a dispersion EWMA chart based on sample range) and MD chart (a Shewhart-type dispersion chart based on MD), under the existence and violation of normality assumption. It has been observed that the proposed MDEWMA chart is more efficient and robust when compared with both EWMASR and MD charts in terms of run length (RL) characteristics such as average RL, median RL and standard deviation of the RL distribution.     

Comparison of different control charts for a Weibull process with type-I censoring

Some control charts have been proposed to monitor the mean of a Weibull process with type-I censoring. One type of control charts is to monitor changes in the scale parameter because it indicates changes in the mean. With this approach, we compare different control charts such as Shewhart-type and exponentially weighted moving average (EWMA) charts based on conditional expected value (CEV) and cumulative sum (CUSUM) chart based on likelihood-ratio. A simulation approach is employed to compute control limits and average run lengths. The results show that the CUSUM chart has the best performance. However, the EWMA-CEV chart is recommendable for practitioners with its competitive performance and ease of use advantage. An illustrative example is also provided.     

Acceptance control charts for non-normal data

Control charts are one of the most important methods in industrial process control. The acceptance control chart is generally applied in situations when an X¯ chart is used to control the fraction of conforming units produced by the process and where 6-sigma spread of the process is smaller than the spread in the specification limits. Traditionally, when designing control charts, one usually assumes that the data or measurements are normally distributed. However, this assumption may not be true in some processes. In this paper, we use the Burr distribution, which is employed to represent various non-normal distributions, to determine the appropriate control limits or sample size for the acceptance control chart under non-normality. Some numerical examples are given for illustration. From the presented examples, ignoring the effect of non-normality in the data leads to a higher type I or type II error probability.     

Generalized Control Charts for Non-Normal Data Using g-and-k Distributions

Statistical control charts are often used in industry to monitor processes in the interests of quality improvement. Such charts assume independence and normality of the control statistic, but these assumptions are often violated in practice. To better capture the true shape of the underlying distribution of the control statistic, we utilize the g-and-k distributions to estimate probability limits, the true ARL, and the error in confidence that arises from incorrectly assuming normality. A sensitivity assessment reveals that the extent of error in confidence associated with control chart decision-making procedures increases more rapidly as the distribution becomes more skewed or as the tails of the distribution become longer than those of the normal distribution. These methods are illustrated using both a frequentist and computational Bayesian approach to estimate the g-and-k parameters in two different practical applications. The Bayesian approach is appealing because it can account for prior knowledge in the estimation procedure and yields posterior distributions of parameters of interest such as control limits.     

An Extension of Economic Design of x-Bar Control Charts for Non Normally Distributed Data Under Weibull Shock Models

Three parameters—sample size, sampling intervals, and the control limits—must be determined when the x bar chart to monitor a manufacturing process. The constant sampling intervals were widely employed because of its administrative simplicity. However, the variable sampling interval (VSI) has recently been shown to give substantially faster detection of most process shifts than fixed-sampling-interval (FSI) for x-bar charts. In addition, these measurements in the subgroup are assumed to be normally distributed. That assumption may not be tenable. This investigation compares the economic design of x-bar control charts for non normal data under Weibull shock models with various sampling avenues.     

Normalization of the origin-shifted exponential distribution for control chart construction

This study demonstrates that a location parameter of an exponential distribution significantly influences normalization of the exponential. The Kullback–Leibler information number is shown to be an appropriate index for measuring data normality using a location parameter. Control charts based on probability limits and transformation are compared for known and estimated location parameters. The probabilities of type II error (β-risks) and average run length (ARL) without a location parameter indicate an ability to detect an out-of-control signal of an individual chart using a power transformation similar to using probability limits. The β-risks and ARL of control charts with an estimated location parameter deviate significantly from their theoretical values when a small sample size of n≤50 is used. Therefore, without taking into account of the existence of a location parameter, the control charts result in inaccurate detection of an out-of-control signal regardless of whether a power or natural logarithmic transformation is used. The effects of a location parameter should be eliminated before transformation. Two examples are presented to illustrate these findings.     

Control chart for monitoring the Weibull shape parameter under two competing risks

ABSTRACT

In this paper, we propose a control chart to monitor the Weibull shape parameter where the observations are censored due to competing risks. We assume that the failure occurs due to two competing risks that are independent and follow Weibull distribution with different shape and scale parameters. The control charts are proposed to monitor one or both of the shape parameters of competing risk distributions and established based on the conditional expected values. The proposed control chart for both shape parameters is used in certain situations and allows to monitor both shape parameters in only one chart. The control limits depend on the sample size, number of failures due to each risk and the desired stable average run length (ARL). We also consider the estimation problem of the target parameters when the Phase I sample is incomplete. We assumed that some of the products that fail during the life testing have a cause of failure that is only known to belong to a certain subset of all possible failures. This case is known as masking. In the presence of masking, the expectation-maximization (EM) algorithm is proposed to estimate the parameters. For both cases, with and without masking, the behaviour of ARLs of charts is studied through the numerical methods. The influence of masking on the performance of proposed charts is also studied through a simulation study. An example illustrates the applicability of the proposed charts.     

Data driven choice of control charts

Standard control charts are often seriously in error when the distributional form of the observations differs from normality. Recently, control charts have been developed for larger parametric families. A third possibility is to apply a suitable (modified version of a) nonparametric control chart. This paper deals with the question when to switch from the control chart based on normality to a parametric control chart, or even to a nonparametric one. This model selection problem is solved by using the estimated model error as yardstick. It is shown that the new combined control chart asymptotically behaves as each of the specific control charts in their own domain. Simulations exhibit that the combined control chart performs very well under a great variety of distributions and hence it is recommended as an omnibus control chart, nicely adapted to the distribution at hand. The combined control chart is illustrated by an application on real data. The new modified nonparametric control chart is an attractive alternative and can be recommended as well.     

Improved R and s control charts for monitoring the process variance

The Shewhart R control chart and s control chart are widely used to monitor shifts in the process spread. One fact is that the distributions of the range and sample standard deviation are highly skewed. Therefore, the R chart and s chart neither provide an in-control average run length (ARL) of approximately 370 nor guarantee the desired type I error of 0.0027. Another disadvantage of these two charts is their failure in detecting an improvement in the process variability. In order to overcome these shortcomings, we propose the improved R chart (IRC) and s chart (ISC) with accurate approximation of the control limits by using cumulative distribution functions of the sample range and standard deviation. Simulation studies show that the IRC and ISC perform very well. We also compare the type II error risks and ARLs of the IRC and ISC and found that the s chart is generally more efficient than the R chart. Examples are given to illustrate the use of the developed charts.     

An Examination of the Robustness to Non Normality of the EWMA Control Charts for the Dispersion

ABSTRACT

The EWMA control chart is used to detect small shifts in a process. It has been shown that, for certain values of the smoothing parameter, the EWMA chart for the mean is robust to non normality. In this article, we examine the case of non normality in the EWMA charts for the dispersion. It is shown that we can have an EWMA chart for dispersion robust to non normality when non normality is not extreme.     

Robustness of the EWMA and the combined X¯–EWMA control charts with variable sampling intervals to non-normality

The exponentially weighted moving average (EWMA) control charts with variable sampling intervals (VSIs) have been shown to be substantially quicker than the fixed sampling intervals (FSI) EWMA control charts in detecting process mean shifts. The usual assumption for designing a control chart is that the data or measurements are normally distributed. However, this assumption may not be true for some processes. In the present paper, the performances of the EWMA and combined X¯–EWMA control charts with VSIs are evaluated under non-normality. It is shown that adding the VSI feature to the EWMA control charts results in very substantial decreases in the expected time to detect shifts in process mean under both normality and non-normality. However, the combined X¯–EWMA chart has its false alarm rate and its detection ability is affected if the process data are not normally distributed.     

Synthetic exponential control charts with unknown parameter

The existing synthetic exponential control charts are based on the assumption of known in-control parameter. However, the in-control parameter has to be estimated from a Phase I dataset. In this article, we use the exact probability distribution, especially the percentiles, mean, and standard deviation of the conditional average run length (ARL) to evaluate the effect of parameter estimation on the performance of the Phase II synthetic exponential charts. This approach accounts for the variability in the conditional ARL values of the synthetic chart obtained by different practitioners. Since parameter estimation results in more false alarms than expected, we develop an exact method to design the adjusted synthetic charts with desired conditional in-control performance. Results of known and unknown in-control parameter cases show that the control limit of the conforming run length sub-chart of the synthetic chart should be as small as possible.     

Moving range EWMA control charts for monitoring the Weibull shape parameter

In this article, we propose an exponentially weighted moving average (EWMA) control chart for the shape parameter β of Weibull processes. The chart is based on a moving range when a single measurement is taken per sampling period. We consider both one-sided (lower-sided and upper-sided) and two-sided control charts. We perform simulations to estimate control limits that achieve a specified average run length (ARL) when the process is in control. The control limits we derive are ARL unbiased in that they result in ARL that is shorter than the stable-process ARL when β has shifted. We also perform simulations to determine Phase I sample size requirements if control limits are based on an estimate of β. We compare the ARL performance of the proposed chart to that of the moving range chart proposed in the literature.     

Progressive Variance Control Charts for Monitoring Process Dispersion

In a process, the deviation from location or scale parameters affects the quality of the process and waste resources. So it is essential to monitor such processes for possible changes due to any assignable causes. Control charts are the most famous tool used to meet this intention. It is useless to monitor process location until the assurance that process dispersion is in-control. This study proposes some new two-sided memory control charts named as progressive variance (PV) control charts which are based on sample variance to monitor changes in process dispersion assuming normality of quality characteristic to be monitored. Simulation studies are made, and an example is discussed to evaluate the performance of the proposed charts. The comparison of the proposed chart is made with exponentially weighted moving average- and cumulative sum-type charts for process dispersion. The study shows that performance of the proposed charts are uniformly better than its competitors for detecting positive shifts while for detecting negative shift in the variance their performance is better for small shifts and reasonably good for moderated shifts.