Estimating process capability index Cpk: classical approach versus Bayesian approach

Process capability index C_pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C_pk using two approaches, Classical method and Bayesian method.     

Testing process capability based on Cpm in the presence of random measurement errors

Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index C_p provides measures on process precision (or product consistency). The index C_pm, sometimes called the Taguchi index, meditates on process centring ability and process loss. Most research work related to C_p and C_pm assumes no gauge measurement errors. This assumption insufficiently reflects real situations even with highly advanced measuring instruments. Conclusions drawn from process capability analysis are therefore unreliable and misleading. In this paper, we conduct sensitivity investigation on process capability C_p and C_pm in the presence of gauge measurement errors. Due to the randomness of variations in the data, we consider capability testing for C_p and C_pm to obtain lower confidence bounds and critical values for true process capability when gauge measurement errors are unavoidable. The results show that the estimator with sample data contaminated by the measurement errors severely underestimates the true capability, resulting in imperceptible smaller test power. To obtain the true process capability, adjusted confidence bounds and critical values are presented to practitioners for their factory applications.     

A note on the asymptotic distribution of the process capability index C pmk

Process capability indices have been widely used to evaluate the process performance to the continuous improvement of quality and productivity. The distribution of the estimator of the process capability index C _pmk is very complicated and the asymptotic distribution is proposed by Chen and Hsu [The asymptotic distribution of the processes capability index C _pmk , Comm. Statist. Theory Methods 24(5) (1995), pp. 1279–1291]. However, we found a critical error for the asymptotic distribution when the population mean is not equal to the midpoint of the specification limits. In this paper, a correct version of the asymptotic distribution is given. An asymptotic confidence interval of C _pmk by using the correct version of asymptotic distribution is proposed and the lower bound can be used to test if the process is capable. A simulation study of the coverage probability of the proposed confidence interval is shown to be satisfactory. The relation of six sigma technique and the index C _pmk is also discussed in this paper. An asymptotic testing procedure to determine if a process is capable based on the index of C _pmk is also given in this paper.     

Generalized confidence limits for the performance index of the exponentially distributed lifetime

Under a two-parameter exponential distribution, this study constructs the generalized lower confidence limit of the lifetime performance index C_L based on type-II right-censored data. The confidence limit has to be numerically obtained; however, the required computations are simple and straightforward. Confidence limits of C_L computed under the generalized paradigm are compared with those of C_L computed under the classical paradigm, citing an illustrative example with real data and two examples with simulated data, to demonstrate the merits and advantages of the proposed generalized variable method over the classical method.     

An asymptotic confidence interval for the process capability index Cpm

Abstract

The use of indices as an estimation tool of process capability is long-established among the statistical quality professionals. Numerous capability indices have been proposed in last few years. C_pm constitutes one of the most widely used capability indices and its estimation has attracted much interest. In this paper, we propose a new method for constructing an approximate confidence interval for the index C_pm. The proposed method is based on the asymptotic distribution of the index C_pm obtained by the Delta Method. Under some regularity conditions, the distribution of an estimator of the process capability index C_pm is asymptotically normal.     

A comparison of methods forsing loss-based capability index

The process capability index C _pm, sometimes called the loss-based index, has been proposed to the manufacturing industry for measuring process reproduction capability. This index incorporates the variation of production items with respect to the target value and the specification limits preset in the factory. To estimate the loss-based index properly and accurately, certain frequentist and Bayesian perspectives have been proposed to obtain lower confidence bounds (LCBs) for providing minimum process capability. The LCBs not only provide critical information regarding process performance but are also used to determine whether an improvement was made in a capability index and by extension in reducing the fraction of non-conforming items. In this paper, under the assumption of normality, based on frequentist and Bayesian senses, several existing approaches for constructing LCBs of C _pm are presented. Depending on the statistical methods used, we then classify these existing approaches into three categories and compared them in terms of the coverage rates and the mean values of the LCBs via simulations. The relative advantages and disadvantages of these approaches are summarized with some highlights of the relevant findings.     

The asymptotic distribution of the process capability index Cpmk

The main result of this paper is that under some regularity conditions, the distribution of an estimator of the process capability index C_pmk is asymptotically normal.     

A process capability index for discrete processes

Perakis and Xekalaki 2002, A process capability index that is based on the proportion of conformance. Journal of Statistical Computation and Simulation, 72(9), 707–718. introduced a process capability index that is based on the proportion of conformance of the process under study and has several appealing features. One of its advantages is that it can be used not only for continuous processes, as is the case with the majority of the indices considered in the literature, but also for discrete processes as well. In this article, the use of this index is investigated for discrete data under two alternative models, which are frequently considered in statistical process control. In particular, distributional properties and estimation of the index are considered for Poisson processes and for processes resulting in modeling attribute data. The performance of the suggested estimators and confidence limits is tested via simulation.     

SkSP-R sampling plan based on process capability index

In this paper, we present an optimal designing methodology for the skip-lot sampling plan (SkSP) of type SkSP-R based on the most widely used process capability index (PCI) C_pk. The SkSP-R plan is one of the SkSPs that incorporate the provision of the reinspection concept. In order to design the optimal parameters, we consider both symmetric and asymmetric fraction non conforming cases. Tables are also constructed to determine the optimal parameters by formulating an optimization problem. The advantages of the proposed plan over the existing plan are also discussed. Application of the plan is explained with a real-life example.     

Parametric inference of the process capability index for exponentiated exponential distribution

Process capability indices (PCIs) are most effective devices/techniques used in industries for determining the quality of products and performance of manufacturing processes. In this article, we consider the PCI C_pc which is based on the proportion of conformance and is applicable to normally as well as non-normally and continuous as well as discrete distributed processes. In order to estimate the PCI C_pc when the process follows exponentiated exponential distribution, we have used five classical methods of estimation. The performances of these classical estimators are compared with respect to their biases and mean squared errors (MSEs) of the index C_pc through simulation study. Also, the confidence intervals for the index C_pc are constructed using five bootstrap confidence interval (BCIs) methods. Monte Carlo simulation study has been carried out to compare the performances of these five BCIs in terms of their average width and coverage probabilities. Besides, net sensitivity (NS) analysis for the given PCI C_pc is considered. We use two data sets related to electronic and food industries and two failure time data sets to illustrate the performance of the proposed methods of estimation and BCIs. Additionally, we have developed PCI C_pc using aforementioned methods for generalized Rayleigh distribution.     

Developing a variables repetitive group sampling plan based on process capability index C pk with unknown mean and variance

In this paper, variables repetitive group sampling plans are developed based on the process capability index C _pk when the quality characteristic follows a normal distribution with unknown mean and variance. The sampling plan parameters such as the sample size and the acceptance constant are determined to minimize the average sample number. Symmetric and asymmetric cases, in percent defectives due to two specification limits, are dealt with for specified combinations of acceptable quality level and limiting quality level. Tables are provided and examples are given to use proposed plans in practice.     

A program to calculate bootstrap confidence intervals for the process capability index Cpk

Franklin and Wasserman (1991) introduced the use of Bootstrap sampling procedures for deriving nonparametric confidence intervals for the process capability index, C_pk, which are applicable for instances when at least twenty data points are available. This represents a significant reduction in the usually recommended sample requirement of 100 observations (see Gunther 1989). To facilitate and encourage the use of these procedures. a FORTRAN program is provided for computation of confidence intervals for C_pk. Three methods are provided for this calculation including the standard method, the percentile confidence interval, and the biased - corrected percentile confidence interval.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

A new mixed chain sampling plan based on the process capability index for product acceptance

This article proposes a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest follows the normal distribution with unknown mean and variance. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications. In order to construct the tables, the problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.     

Interval estimation of process capability index cpk

Several sampling distribution properties of the estimator for C_pk. are presented under the assumption that the data are normal, independent and identically distributed. In particular, the expectation, variance and skewness are derived. Since the sampling distribution is only weakly skewed, we concluded that a symmetric interval estimator for C_pk . might be reasonable. We developed such a symmetric interval estimator and conducted a simulation study to explore its coverage probabilities.     

Designing optimal double-sampling plan based on process capability index

Process capability analysis is applied to monitor the process quality. Process capability can be quantified by process capability index. These indices have wide application in quality control methods and acceptance sampling plans. In this paper, we introduce a double-sampling plan based on process capability index. In this type of scheme, under a decision rule and with the specified rejection and acceptance numbers, the second sample is selected and the decision of rejection or acceptance is made based on the information obtained from two samples. The purpose of this scheme is to reduce the average sample number in order to reduce the time and cost of sampling. A comparison study has been conducted in order to evaluate the performance of proposed method in comparison with classical single sampling plans.     

Repetitive group sampling plan based on the process capability index for the lot acceptance problem

An acceptance sampling plan is a method used to make a decision about acceptance or rejection of a product, based on adherence to a standard. Meanwhile, process capability indices (PCIs) have been applied in different manufacturing industries as capability measures based on specified criteria which include process departure from a target, process consistency, process yield and process loss. In this paper, a repetitive group sampling (RGS) plan based on PCI is introduced for variables’ inspection. First, the optimal parameters of the developed RGS plan are obtained considering constraints related to the risk of consumers and producers and also a double sampling plan, a multiple dependent state sampling plan and a sampling plan for resubmitted lots have been designed. Finally, after the development of variable sampling plans based on the Bayesian and exact approach, a comparison study has been performed between the developed RGS plan and other types of sampling plans and the results are elaborated.     

A new t-chart using process capability index

Control charts play a vital role to enhance the efficiency of the manufacturing process. In many situations, the quality characteristic of interest to be monitored follows a non-normal distribution. In this article, we propose a new control chart using the process capability index when the quality characteristic follows the exponential distribution. The performance of the proposed chart is evaluated using the Monte Carlo simulation. Tables are presented for various values of specified average run length and sample size. The use of the proposed control chart is discussed with the help of an example.     

Designing of a mixed-chain sampling plan based on the process capability index with chain sampling as the attributes plan

In this article, we propose a new mixed chain sampling plan based on the process capability index C_pk, where the quality characteristic of interest having double specification limits and follows the normal distribution with unknown mean and variance. In the proposed mixed plan, the chain sampling inspection plan is used for the inspection of attribute quality characteristics. The advantages of this proposed mixed sampling plan are also discussed. Tables are constructed to determine the optimal parameters for practical applications by formulating the problem as a non linear programming in which the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at acceptable quality level and limiting quality level under the operating characteristic curve. The practical application of the proposed mixed sampling plan is explained with an illustrative example. Comparison of the proposed sampling plan is also made with other existing sampling plans.     

Sample size determination for estimating multivariate process capability indices based on lower confidence limits

With the advent of modern technology, manufacturing processes have become very sophisticated; a single quality characteristic can no longer reflect a product's quality. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, several new multivariate capability (NMC) indices, such as NMC _p and NMC _pm , have been developed over the past few years. However, the sample size determination for multivariate process capability indices has not been thoroughly considered in previous studies. Generally, the larger the sample size, the more accurate an estimation will be. However, too large a sample size may result in excessive costs. Hence, the trade-off between sample size and precision in estimation is a critical issue. In this paper, the lower confidence limits of NMC _p and NMC _pm indices are used to determine the appropriate sample size. Moreover, a procedure for conducting the multivariate process capability study is provided. Finally, two numerical examples are given to demonstrate that the proper determination of sample size for multivariate process indices can achieve a good balance between sampling costs and estimation precision.