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1.
Acceptance sampling plans based on process yield indices provide a proven resource for the lot-sentencing problem when the required fraction defective is very low. In this study, a new sampling plan based on the exponentially weighted moving average (EWMA) model with yield index for lot sentencing for autocorrelation between polynomial profiles is proposed. The advantage of the EWMA statistic is the accumulation of quality history from previous lots. In addition, the number of profiles required for lot sentencing is more economical than in the traditional single sampling plan. Considering the acceptable quality level (AQL) at the producer's risk and the lot tolerance percent defective (LTPD) at the consumer's risk, we proposed a new search algorithm to determine the optimal plan parameters. The plan parameters are tabulated for various combinations of the smoothing constant of the EWMA statistic, AQL, LTPD, and two risks. A comparison study and two numerical examples are provided to show the applicability of the proposed sampling plan.  相似文献   

2.
This article considers a sampling plan when the quality characteristic follows the exponential distribution. We provide the exact approach and propose an approximated approach. In the proposed approximation, a new statistic combined with a Weibull transformation is used for the normal approximation. The plan parameters are obtained through the two-point approach at the acceptable quality level (AQL) and the limiting quality level (LQL). The tables for plan parameters are reported according to various values of the AQL and the LQL when the producer's and the consumer's risks are given. A real example is given to illustrate the proposed approximation approach.  相似文献   

3.
This paper presents tables and a computer program for determining single sampling plans for given AQL, producer's risk and AOQL for the case of nonconforming units and nonconformities. Comparison with Soundararajan's (1981) procedures for selection of single sampling plans for given (AQL, AOQL) is also given  相似文献   

4.
Various continuous sampling plans have been proposed for monitoring the quality of continuous production processes. The multi-level continuous sampling plan of MIL-STD-1235C (1988) is designated as CSP-T Plan. CSP-T plan is a three-level tightened continuous sampling plan. It requires a switch to 100% inspection, at any level, whenever a nonconforming unit is found. This provides quick rectification in the event of a shift in quality. In this paper certain performance characteristics of CSP-T plan are derived using the approach of Stephens (1979) under the assumption that the production process is in statistical control. For the selection of CSP-T plans, two tables are given. These tables can be used to obtain parameters i (clearance interval) and f (sampling fraction) of the CSP-T plan for given acceptable quality level (AQL) with producer’ risk α=0.05 or the limiting quality level(LQL) with consumer’ risk β=0.10 and the outgoing quality limit(AOQL). Two examples are also given to illustrate the selection of plans from these tables  相似文献   

5.
This paper proposes a quick switching sampling system for the inspection of attributes quality characteristics for resubmitted lots. The optimal parameters for both fraction non conforming items and fraction non conformities of the proposed sampling system are determined using an optimization procedure so that producer’s risk and consumer’s risk are simultaneously satisfied. Tables are also constructed for the selection of parameters for specified AQL and LQL. The advantage of the proposed plan over the existing plan is discussed and illustrate. An economic design of the proposed sampling system is also discussed and shown that the proposed sampling system has minimum total cost and average total inspection compared to other existing sampling plans.  相似文献   

6.
Procedures and tables are given for the selection of chain sampling plans of type ChSP-1 for given acceptable quality level, producer's risk, limiting quality level and consumer's risk. Selection of ChSP-1 plan is discussed for both proportion nonconforming and the number of nonconformities per unit.  相似文献   

7.
This paper presents a set of new tables and procedures for the selection of the following three types of Quick Switching (QS) systems for a given Acceptable Quality Level (AQL), Limiting Quality Level (LQL), producer's risk and consumer's risk.

(1) A Single sampling QS system with equal sample sizes but with different acceptance numbers

(2) A Single sampling QS system with two different sample sizes but with same acceptance number and

(3) A QS systen with double sampling normal inspection and single sampling tightened inspection

The third type of QS systen is the one newly presented in this paper. The tables provide unique plans for a given set of conditions as well as providing a smaller sample size or a smaller sum of Average Sample Numbers(ASN) at the AQL and LQL  相似文献   

8.
SUMMARY This paper presents a design procedure for ChSP-4A(c1,c2)r plans based on Kullback-Leibler information and the minimum sum of risks. A table that gives the values of the parameters n and k indexed by the acceptable quality level (AQL) and limiting quality level (LQL) is presented, from which one can select a plan which gives a desired AQL and LQL when the producer's risk alpha= 0.05 and the consumer's risk beta = 0.10. A concluding remark for this series of five papers is given at the end of this paper.  相似文献   

9.
In this article, we propose a method of planning and determining the optimum parameters of a SkSP-R skip-lot sampling plan by using the attribute double sampling plan as the reference plan. The SkSP-R plan is a new type of skip-lot sampling plan which has a provision for re-inspecting the submitted lots. The optimal plan parameters of the suggested sampling plan are estimated with the target that the average sample number be minimized and satisfying both the specified producer's as well as the consumer's risks simultaneously. In order to obtain the optimum parameters, tables are also built for different combinations of the acceptable quality level and the limiting quality level in conjunctions with different producer's and consumer's risks. An illustrative example is provided for the implementation of the suggested plan. The advantages of the suggested plan over the existing conventional sampling plans and other existing skip-lot sampling plans are also described.  相似文献   

10.
This paper presents modified tables for the selection of double sampling plans for given Acceptable Qualtiy Level (AQL), producer’s risk (α) Limiting Quality Level (LQL), and consumer’s risk (ß) giving the minimum sum of Average Sample Numbers (ASN) at AQL and LQL under the conditions of the Poisson model for the Operating Characteristic (OC) curve.  相似文献   

11.
A compact table, yielding attribute double sampling plan indexed by AQL, AOQL and LQL and double sampling scheme indexed by AQL is presented. Method of selecting the plans are indicated through examples.  相似文献   

12.
13.
This paper presents procedures and tables for the selection of minimum sample size multiple deferred (dependent) state sampling plan of type MDS and MDS - 1 for various entry conditions such as (AQL, LQL), (AQL, AOQL) etc.  相似文献   

14.
A multiple state repetitive group sampling (MSRGS) plan is developed on the basis of the coefficient of variation (CV) of the quality characteristic which follows a normal distribution with unknown mean and variance. The optimal plan parameters of the proposed plan are solved by a nonlinear optimization model, which satisfies the given producer's risk and consumer's risk at the same time and minimizes the average sample number required for inspection. The advantages of the proposed MSRGS plan over the existing sampling plans are discussed. Finally an example is given to illustrate the proposed plan.  相似文献   

15.
This article proposes a variables two-plan sampling system called tightened-normal-tightened (TNT) sampling inspection scheme where the quality characteristic follows a normal distribution or a lognormal distribution and has an upper or a lower specification limit. The TNT variables sampling inspection scheme will be useful when testing is costly and destructive. The advantages of the variables TNT scheme over variables single and double sampling plans and attributes TNT scheme are discussed. Tables are also constructed for the selection of parameters of known and unknown standard deviation variables TNT schemes for a given acceptable quality level (AQL) and limiting quality level (LQL). The problem is formulated as a nonlinear programming where the objective function to be minimized is the average sample number and the constraints are related to lot acceptance probabilities at AQL and LQL under the operating characteristic curve.  相似文献   

16.
This article explores the problem of designing a CSP-1 plan with the specified average outgoing quality limit (AOQL), the acceptable quality level (AQL), and the limiting quality level (LQL) value. By adopting the regret-balanced criterion under the producer's and consumer's interests of quality, we can design the optimal CSP-1 plan.  相似文献   

17.
In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.  相似文献   

18.
This article develops a variables sampling scheme for resubmitted lots by incorporating the concept of Taguchi loss function. The probability of lot acceptance is derived based on the exact sampling distribution and two-point condition on operating characteristic curve is used to determine the plan parameters that meet both the producer's and consumer's quality and risk requirements. Moreover, the performance of the proposed variables resubmitted sampling plan is investigated and compared with the classical variables single sampling plan. The results indicate that the developed resubmitted sampling plan can provide the same protection with less inspection when the submitted lot is good enough. Tables of the plan parameters under various conditions are provided and the use of the proposed plan is also illustrated with an example.  相似文献   

19.
The tightened-normal-tightened (TNT) attributes sampling scheme was devised by Calvin (1977). In this paper, a TNT Scheme with variables sampling plan as the reference plan, designated as TNTVSS (nσ; kT, kN) is introduced, where nσ is the sample size under the reference plan, and kT and kN are the acceptance constants corresponding to tightened and normal plans respectively. The behaviour of OC curves of the TNTVSS (nσ; kT, kN) is studied. The efficiency of TNTVSS (nσ; kT, kN) with respect to smaller sample sizes has been established over the attributes scheme. The TNTVSS is matched with the TNT (n; cN, cT) of Vijayaraghavan and Soundararajan (1996), for the specified points on the OC curves, namely (p1, α) and (p2, β) and it is shown that the sample size of the variables scheme is much smaller than that of the attributes scheme. The TNT scheme with an unknown σ variables plan as the reference plan is also introduced along with the procedure of selection of the parameters. The method of designing the scheme based on the given AQL (Acceptable Quality level), α (producer's risk), LQL (Limiting Quality Level) and β (consumer's risk) is indicated. Among the class of TNTVSS which exists, for a given (p1,α) and (p2, β), a scheme, which will have a more steeper OC curve than that of any other scheme, is identified and given.  相似文献   

20.
In this paper, we propose a multiple deferred state repetitive group sampling plan which is a new sampling plan developed by incorporating the features of both multiple deferred state sampling plan and repetitive group sampling plan, for assuring Weibull or gamma distributed mean life of the products. The quality of the product is represented by the ratio of true mean life and specified mean life of the products. Two points on the operating characteristic curve approach is used to determine the optimal parameters of the proposed plan. The plan parameters are determined by formulating an optimization problem for various combinations of producer's risk and consumer's risk for both distributions. The sensitivity analysis of the proposed plan is discussed. The implementation of the proposed plan is explained using real-life data and simulated data. The proposed plan under Weibull distribution is compared with the existing sampling plans. The average sample number (ASN) of the proposed plan and failure probability of the product are obtained under Weibull, gamma and Birnbaum–Saunders distributions for a specified value of shape parameter and compared with each other. In addition, a comparative study is made between the ASN of the proposed plan under Weibull and gamma distributions.  相似文献   

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