Generalized tightened two-level continuous sampling plans

In 1955, Lieberman and Solomon introduced multi-level (MLP) continuous sampling plans. Derman et al . then extended the multi-level plans as tightened multi-level plans (MLP-T). In this paper, a generalization of MLP-T with two sampling levels is presented. Using a Markov chain model, expressions for the performance measures of the general MLP-T plans are derived. Tables are also presented for the selection of general MLP-T plans with two sampling levels when the acceptable quality level, limiting quality level, indiff erence quality level and average outgoing quality level are specified.     

Modified tightened two-level continuous sampling plans

In this paper, a modification is proposed on the tightened two-level continuous sampling plan. The tightened two-level plan is one of the three tightened multi-level continuous sampling plans of Derman et al. (1957) with two sampling levels. A modified tightened two-level continuous sampling plan is considered, for which the rules concerning partial inspection depend, in part, on the length of time it takes to decide that the process quality is good enough that 100% inspection may be suspended (e.g. the time required to find i consecutive items free of defects). Using a Markov chain model, expressions for the performance measures of the modified MLP-T-2 plan are derived. The modified MLP-T-2 plan is shown to be identical to the MLP-T-2 plan. Tables are also presented for the selection of the modified MLP-T-2 plan when the AQL or LQL and AOQL are specified.     

Selection of csp-t plans

Various continuous sampling plans have been proposed for monitoring the quality of continuous production processes. The multi-level continuous sampling plan of MIL-STD-1235C (1988) is designated as CSP-T Plan. CSP-T plan is a three-level tightened continuous sampling plan. It requires a switch to 100% inspection, at any level, whenever a nonconforming unit is found. This provides quick rectification in the event of a shift in quality. In this paper certain performance characteristics of CSP-T plan are derived using the approach of Stephens (1979) under the assumption that the production process is in statistical control. For the selection of CSP-T plans, two tables are given. These tables can be used to obtain parameters i (clearance interval) and f (sampling fraction) of the CSP-T plan for given acceptable quality level (AQL) with producer’ risk α=0.05 or the limiting quality level(LQL) with consumer’ risk β=0.10 and the outgoing quality limit(AOQL). Two examples are also given to illustrate the selection of plans from these tables     

Selection of CSP-V continuous sampling plans

MIL-STD-1235C establishes standard procedures for the selection and implementation of single- and multi-level continuous sampling plans, such as CSP-1, CSP-F, CSP-2, CSP-T and CSP-V. CSP-V is a single-level continuous sampling procedure which provides for alternating sequences of 100%inspection (either at full or reduced clearance number) and sampling inspection. It requires a return to 100% inspection whenever a non-confirming unit is found during sampling inspection, but provides for a reduced clearance number upon demonstration of superior product quality. The CSP-V procedure serves as an alternative to the CSP-T procedure where a reduction in sampling frequency has no economic merit. In this paper, expressions for the average outgoing quality, the average fraction inspected and the operating characteristic function are derived using a Markov chain model. Four tables are given to enable the selection of CSP-V plans when the acceptable quality level or the limiting quality level and the

average outgoing quality limit are specified.     

Tightened single-level continuous sampling plan

In this paper, a new tightening concept has been incorporated into the single-level continuous sampling plan CSP-1, such that quality degradation will warrant sampling inspection to cease beyond a certain number of sampled items, until new evidence of good quality is established. The expressions of the performance measures for this new plan, such as the operating characteristic, average outgoing quality and average fraction inspected, are derived using a Markov chain model. The advantage of the tightened CSP-1 plan is that it is possible to lower the average outgoing quality limit.     

Construction and selection of skip-lot sampling inspection plans of type SkSP-2 indexed by indifference quality level and maximum allowable per cent defective

This paper presents tables based on the Poisson model, for the selection of skip-lot sampling plans of type SKSP-2, with a single-sampling plan which has a zero acceptance number as a reference plan. The indifference quality level (IQL) and the maximum allowable per cent defective (MAPD) are the criteria used for fixing the plan. Procedures for the selection of plans for given conditions of (IQL, average outgoing quality limit) and (MAPD, average outgoing quality limit) are also discussed.     

Minimum average fraction inspected for TCSP-1 plan

This paper presents the calculation of the average outgoing quality limit (AOQL) for the tightened single-level continuous sampling plan (TCSP-1 plan) based on a numerical method. A solution procedure is developed to find the parameters (i, f, k) that will meet the AOQL requirement, while also minimizing the average fraction inspected (AFI) for the TCSP-1 plan when the process average [pbar] (> AOQL) is known.     

Matching Performance of Continuous Sampling Plans with Single Sampling Plans

Single sampling plans are widely used for appraising incoming product quality. However, for situations where a continuous product flow exists, lot-by-lot demarcations may not exist, and it may be necessary to use alternate procedures, such as CSP-1, for continuous processes. In this case, one would like to be able to understand how average performance of the continuous sampling procedures compares to the more commonly used single sampling plans.

In this study, a model is devised which can be used to relate plan performance between single sample lot acceptance procedures and Dodge's(1943) CSP-1 continuous sampling plan. It is shown that it is generally not possible to match up performance based upon operating characteristic curve expressions for the two plans. Instead, the plans are matched by equating expressions for π(p), the long run proportion of product which is accepted, under both procedures. This is shown to be equivalent to matching up properties on an average outgoing quality basis. The methodology may be extended for any derivative plan under MIL-STD-1235B (1982), the military standard for continuous acceptance sampling.     

Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.     

Designing ChSP-4(c1, c2) plans

In this paper, the notion of average total inspection (ATI) is introduced to ChSP-4(c1,c2) sampling plans. Procedures have been developed for the construction and selection of ChSP-4(c1, c2 plans, minimizing ATI at a given process average, while protection to the consumer is given in terms of the (i) average outgoing quality limit and (ii) limiting quality level.A wide range of c1 and c2 values are considered for developing tables which cover almost all practical situations. The procedure described is similar to that of Dodge and Romig.     

Single sampling plans indexed by point op control and inflection point

Three tables for selection of single sampling plans with any one of the following combinations of entry parameters are givens.

1) the indifference quality level and the average outgoing quality limit.

2) the indifference quality level with relative slope of the OC curve at that quality leve land.

3) the quality level corresponding to the inflection point with relative slope of the OC curve at that quality level.

A table enabling the transition from one set of parameters to match the OC curve of other similar sets is also given.     

Modified CSP-C Continuous Sampling Plan for Consumer Protection

Dodge (1943) introduced a single level attribute continuous sampling plan designated as CSP-1 for the application of continuous production processes. Govindaraju & Kandasamy (2000) developed a new single level continuous sampling plan whose sampling inspection phase is characterized by a maximum allowable number of non-conforming units c, and a constant sampling rate f and was designated as CSP-C. In this paper, a modification is proposed on the CSP-C continuous sampling plan. In this modified plan, sampling inspection is continued until the occurrence of c+1 non-conforming units, provided the first m sampled units have been found conforming during the sampling phase. Using a Markov chain model, expressions for the performance measures of the modified CSP-C plan are derived. The main advantage of the modified plan is that it is possible to lower the average outgoing quality limit.     

Construction and selection of quick switching double-sampling system: sample size tightening

A new sampling inspection system involving normal and tightened plans is presented. Performance measures are developed. The average sample number of the newly developed system is compared with those of existing plans. Procedures are indicated an tables are constructed for designing the system indexed by various combinations of parameters.     

Economic design of continuous sampling plan under linear inspection cost

The article explores the problem of an economically based type I continuous sampling plan (CSP-1 plan) under linear inspection cost. By assuming that the per unit inspection cost is linearly proportional to the average number of inspections per inspection cycle, and by solving the modified Cassady et al.'s model, we not only have the required level of product quality but also obtain the minimum total expected cost per unit produced.     

Procedures and tables for the construction and selection of chain sampling plans ChSP-4A(c1, c2,)r-Part 4

In this part of the series, the notion of average total inspection (ATI) is introduced to ChSP-4A(c1, c2)r plans, minimizing ATI at a given process average, while protection to the consumer is given in terms of average outgoing quality limit and limiting quality level. The procedure is similar to that of Dodge and Roming.     

Minimum Variance and VOQL Chain Sampling Plans–ChSP-4(c 1, c 2)

In this article the outgoing quality and the total inspection for the chain sampling plan ChSP-4(c ₁, c ₂) are introduced as well-defined random variables. The probability distributions of outgoing quality and total inspection are stated based on total rectification of non conforming units. The variances of these random variables are studied. The aim of this article is to develop procedures for minimum variance ChSP-4(c ₁, c ₂) sampling plans and their determination. In addition to minimum variance sampling plans, a procedure is developed for designing plans with a designated maximum variance, a VOQL (Variance of Outgoing Quality Limit) plan. The VOQL concept is analogous to the AOQL (Average Outgoing Quality Limit) except in the VOQL plan, it is the maximum variance which is established instead of the usual maximum AOQ.     

Average outgoing quality of CSP-C continuous sampling plan under short run production processes

A CSP-C continuous sampling plan is a new single-level continuous sampling procedure developed by Govindaraju & Kandasamy (2000) by incorporating the concept of acceptance number to the CSP-1 plan for the application of continuous production processes. In this new plan, the sampling inspection phase is characterized by a maximum allowable number of non-conforming units, c, and a constant sampling rate, f. Govindaraju & Kandasamy (2000) derived the performance measures such as average outgoing quality (AOQ), average fraction inspected (AFI) etc, of the CSP-C plan using a Markov chain model for long run production processes. Yang (1983) has observed that the AOQ and AFI, being long run average measures, are not satisfactory measures of performance for short run production processes. Hence, formulas are derived in this paper, using the renewal theory approach enabling one to compute AOQ and AFI for both long run and short run production processes. Numerical illustrations are also given. By simulation, the accuracy of the short run measures is studied.     

Minimum Average Total Inspection of Variable Lot-size Sampling Plan for Continuous Production

This paper explores the problem of minimizing the average total inspection (ATI) of Read & Beattie's variable lot-size sampling plan for continuous production. The solution procedure is developed to find the optimal parameters (n,  c) that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the ATI for this variable lot-size plan.     

Minimum average fraction inspected for continuous sampling plan CSP-1 under inspection error

SUMMARY In this paper, we present a further modification of Endres's method to construct the problem of minimizing the average fraction inspected (AFI) for the continuous sampling plan CSP-1 under inspection error. The measures of average outgoing quality under perfect and imperfect replacement conditions are considered. The formulae for searching the smallest clearance number i for minimizing the AFI for a CSP-1 plan are also provided. The solution procedure of the proposed method is more reliable, clearer and easier than that of Endres.     

Comment on “Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring”

Lin et al. [Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring, J. Stat. Comput. Simul. 81 (2011), pp. 873–882] claimed to have derived exact Bayesian sampling plans for exponential distributions with progressive hybrid censoring. We comment on the accuracy of the design parameters of their proposed sampling plans and the associated Bayes risks given in tables of Lin et al. [Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring, J. Stat. Comput. Simul. 81 (2011), pp. 873–882]. Counter-examples to their claim are provided.