Exact two-sided Lieberman-Resnikoff sampling plans

We deal sith sampling by variables with two-way-protection in the case of aN(μσ²) distributed characteristic with unknown σ². For the sampling plan by Lieberman and Resnikoff (1955), which is based on the MVU estimator of the percent defective, we prove a formula for the OC. If the sampling parametersp ₁ (AQL),p ₂ (LQ) and α, β (type I, II errors) are given, we are able to compute the true type I and II errors of the usual (one-sided) approximation plans. Furthermore it is possible to compute exact two-sided Lieberman-Resnikoff sampling plans.     

Designing and construction of tightened-normal-tightened variables sampling scheme

The tightened-normal-tightened (TNT) attributes sampling scheme was devised by Calvin (1977). In this paper, a TNT Scheme with variables sampling plan as the reference plan, designated as TNTVSS (n_σ; k_T, k_N) is introduced, where n_σ is the sample size under the reference plan, and k_T and k_N are the acceptance constants corresponding to tightened and normal plans respectively. The behaviour of OC curves of the TNTVSS (n_σ; k_T, k_N) is studied. The efficiency of TNTVSS (n_σ; k_T, k_N) with respect to smaller sample sizes has been established over the attributes scheme. The TNTVSS is matched with the TNT (n; c_N, c_T) of Vijayaraghavan and Soundararajan (1996), for the specified points on the OC curves, namely (p₁, α) and (p₂, β) and it is shown that the sample size of the variables scheme is much smaller than that of the attributes scheme. The TNT scheme with an unknown σ variables plan as the reference plan is also introduced along with the procedure of selection of the parameters. The method of designing the scheme based on the given AQL (Acceptable Quality level), α (producer's risk), LQL (Limiting Quality Level) and β (consumer's risk) is indicated. Among the class of TNTVSS which exists, for a given (p₁,α) and (p₂, β), a scheme, which will have a more steeper OC curve than that of any other scheme, is identified and given.     

Two-stage chain sampling plans chsp-(0,2) and chsp-(l,2) - part 1

This article outlines the structure of a generalized family of two-stage chain sampling plans, extending the concept of two-stage chain sampling plans of Dodge and Stephens (1966) which is an extension of the original work of Dodge (1955). Expressions are derived for the OC curves for two-stage chain sampling plans with (c₁,c₂) = (0,2) and (1,2). In the original work of Dodge (1955) only acceptance numbers of 0,1 were used and in the extension work of Dodge and Stephens (1966) acceptance numbers of (c₁,c₂) = (0,1), (0,2), (1,2), (0,3), (1,3), (0,4) and (1,4) were used with selected sets of values of k₁ and k₂ (the number of lots considered for cumulation in the first and second stage respectively). In this paper the OC curves are derived more generally for any k₁ and k₂combination for two-stage chain sampling plans with (c₁,c₂) = (0,2) and (1,2) and comparisons are made with respect to sample sizes and discriminating power, with the corresponding single and double sampling plans.     

Failure–censored reliability sampling plans for the exponential distribution

In this paper we examine the failure-censored sampling plans for the two–parameter exponential distri- bution based on m random samples, each of size n. The suggested procedure is based on exact results and only the first failure time of each sample is needed. The values of the acceptability constant are also tabulated for selected values of p _α ¹ p _β ¹, α and β. Further, a comparison of the proposed sampling plans with ordinary sampling plans using a sample of size mn is made. When compared to ordinary sampling plans, the proposed plan has an advantage in terms of shorter test-time and a saving of resources.     

Dodge-Romig AOQL single sampling plans for inspection by variables

Acceptance sampling plans for inspection by variables, which minimize the mean inspection cost per lot of process average quality (assuming that the remainder of rejected lots is inspected), are derived under the condition that the maximum value of the mean fraction defective after sampling inspection, replacing all defective items found by good ones, shall be equal top _L . These plans are tabulated for chosen values of the given parameters, and compared with the Dodge-Romig AOQL attribute sampling plans. From the comparison it follows that under the same protection of consumer the AOQL plans for inspection by variables are in some situations more economical than the corresponding Dodge-Romig plans.     

Three-stage chain sampling plans

This article outlines the structure of a generalized family of three-stage chain sampling plans, extending the concept of two-stage chain sampling plans of Dodge and Stephens (1966) which is an extension of the original work of Dodge (1955). Expressions are derived for the OC curves for several sets of general sets of three-stage chain sampling plans, with cumulative acceptance numbers of (c₁,c₂,c₃) = (0,1,2), (0,1,3), (0,2,3), (1,2,3),(0,1,4),(0,2,4), (0,3,4), (1,2,4), (1,3,4) and (2,3,4). In the original work of Dodge (1955) only acceptance numbers of 0,1 were used and in the extension work of Dodge and Stephens (1966) acceptance numbers of (c₁,c₂) = (0,1) ,(0,2), (1,2), (0,3), (1,3), (0,4) and (1,4) were used with selected sets of values of k₁,and k₂ (the number of lots considered for cumulation in the first and second stage respectively). In this paper the 0C curves are derived more generally for any k₁, k₂and k₃(the number of lots considered for cumulation in the first, second and third stages respectively) combination and 0C curves of a number of plans are given and comparisons are made with some single sampling, two-stage chain sampling and multiple sampling plans.     

Determination of Single Sampling Plans by Attributes Under the Conditions of Zero-Inflated Poisson Distribution

When the manufacturing process is well monitored, occurrence of nondefects would be a frequent event in sampling inspection. The appropriate probability distribution of the number of defects is a zero-inflated Poisson (ZIP) distribution. In this article, determination of single sampling plans (SSPs) by attributes using unity values is considered, when the number of defects follows a ZIP distribution. The operating characteristic (OC) function of the sampling plan is derived. Plan parameters are obtained for some sets of values of (p₁, α, p₂, β). Numerical illustrations are given to describe the determination of SSP under ZIP distribution and to study its performance in comparison with Poisson SSP.     

Optimal designing of a new mixed variable lot-size chain sampling plan based on the process capability index

In this paper, a new mixed sampling plan based on the process capability index (PCI) C_pk is proposed and the resultant plan is called mixed variable lot-size chain sampling plan (ChSP). The proposed mixed plan comprises of both attribute and variables inspections. The variable lot-size sampling plan can be used for inspection of attribute quality characteristics and for the inspection of measurable quality characteristics, the variables ChSP based on PCI will be used. We have considered both symmetric and asymmetric fraction non conforming cases for the variables ChSP. Tables are developed for determining the optimal parameters of the proposed mixed plan based on two points on the operating characteristic (OC) approach. In order to construct the tables, the problem is formulated as a non linear programming where the average sample number function is considered as an objective function to be minimized and the lot acceptance probabilities at acceptable quality level and limiting quality level under the OC curve are considered as constraints. The practical implementation of the proposed mixed sampling plan is explained with an illustrative real time example. Advantages of the proposed sampling plan are also discussed in terms of comparison with other existing sampling plans.     

Double ASN Minimax sampling plans by variables when the standard deviation is unknown

We deal with the double sampling plans by variables proposed by Bowker and Goode (Sampling Inspection by Variables, McGraw–Hill, New York, 1952) when the standard deviation is unknown. Using the procedure for the calculation of the OC given by Krumbholz and Rohr (Allg. Stat. Arch. 90:233–251, 2006), we present an optimization algorithm allowing to determine the ASN Minimax plan. This plan, among all double plans satisfying the classical two-point-condition on the OC, has the minimal ASN maximum.     

Improved attribute acceptance sampling plans based on maxima nomination sampling

This paper demonstrates the use of maxima nomination sampling (MNS) technique in design and evaluation of single AQL, LTPD, and EQL acceptance sampling plans for attributes. We exploit the effect of sample size and acceptance number on the performance of our proposed MNS plans using operating characteristic (OC) curve. Among other results, we show that MNS acceptance sampling plans with smaller sample size and bigger acceptance number perform better than commonly used acceptance sampling plans for attributes based on simple random sampling (SRS) technique. Indeed, MNS acceptance sampling plans result in OC curves which, compared to their SRS counterparts, are much closer to the ideal OC curve. A computer program is designed which can be used to specify the optimum MNS acceptance sampling plan and to show, visually, how the shape of the OC curve changes when parameters of the acceptance sampling plan vary. Theoretical results and numerical evaluations are given.     

A mixed double sampling plan based on Cpk

Abstract

Acceptance sampling plans are quality tools for the manufacturer and the customer. The ultimate result of reduction of nonconforming items will increase the profit of the manufacturer and enhance the satisfaction of the consumer. In this article, a mixed double sampling plan is proposed in which the attribute double sampling inspection is used in the first stage and a variables sampling plan based on the process capability index C_pk is used in the second stage. The optimal parameters are determined so that the producer’s and the consumer’s risks are to be satisfied with minimum average sample number. The optimal parameters of the proposed plan are estimated using different plan settings using two points on the operating characteristic curve approach. In designing the proposed mixed double sampling plan, we consider the symmetric and asymmetric nonconforming cases under variables inspection. The efficiency of the proposed plan is discussed and compared with the existing sampling plans. Tables are constructed for easy selection of the optimal plan parameters and an industrial example is also included for implementation of the proposed plan.     

Comment on “Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring”

Lin et al. [Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring, J. Stat. Comput. Simul. 81 (2011), pp. 873–882] claimed to have derived exact Bayesian sampling plans for exponential distributions with progressive hybrid censoring. We comment on the accuracy of the design parameters of their proposed sampling plans and the associated Bayes risks given in tables of Lin et al. [Exact Bayesian variable sampling plans for the exponential distribution with progressive hybrid censoring, J. Stat. Comput. Simul. 81 (2011), pp. 873–882]. Counter-examples to their claim are provided.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

Double sampling plans indexed by point of control and inflection point

Three tables for selection of double sampling plans each for the cases when n₂ = n₁and when n₂ = 2n₁with anyu one of the following combination of entry parameters are given :

1) the indifference quality level and the average out-going quality limit;

2) the indifference quality level with relative slope of the curve at that quality level and

3) the quality level corresponding to the inflection point with relative slope of the OC curve at that quality level.

Two tables enabling the transition from one set of parameters to match the OC curve of other similar sets are also given.     

The operating characteristic of double sampling plans by variables when the standard deviation is unknown

Summary We deal with double sampling plans by variables for a one-sided specification limit when the quality characteristic is normally distributed with unknown standard deviation. An algorithm is presented that allows to calculate the OC of the sampling plans proposed by Bowker and Goode (1952). We give several examples. Furthermore, it is shown that the algorithm carries over to calculating the OC of the double-stage t-test. The authors wish to thank Yvonne K?llner and Timor Saffary for technical support.     

An improved sampling plan by variables inspection with consideration of process yield and quality loss

Repetitive group sampling (RGS) plan, a modified version of single sampling (SS) plan, has been shown to be more efficient than the SS plan for lot sentencing. However, because it does not consider the valuable sample information from preceding lots, that could reduce its sampling efficiency and discriminatory power. Therefore, this study proposes a modified-RGS plan by considering the quality history of preceding lots based on the C_pmk index. Additionally, the mathematical model for the plan parameters is formulated such that the objective function is to minimize the average sample number (ASN), and the required quality levels and risks as specified by producer and consumer are satisfied. The performance of the proposed plan is examined and compared with traditional sampling plans. Finally, an example is presented to illustrate its applicability.     

Acceptance sampling plans for linear profiles with one-sided specifications

In this study, we propose three new sampling plans based on yield index C_puA for linear profiles with one-sided specifications, including the resubmitted sampling plan, the repetitive group sampling plan, and the multiple dependent state repetitive sampling plan. The operating characteristic functions of our proposed sampling plans are developed. The plan parameters of our proposed sampling plans are determined through nonlinear optimization. The plan parameters are reported for various combinations of acceptable quality level and limiting quality level. The three sampling plans are compared with the existing single sampling plan in terms of the average sample number. A real example is used to illustrate the applications.     

Sequential Monte Carlo for counting vertex covers in general graphs

In this paper we describe a sequential importance sampling (SIS) procedure for counting the number of vertex covers in general graphs. The optimal SIS proposal distribution is the uniform over a suitably restricted set, but is not implementable. We will consider two proposal distributions as approximations to the optimal. Both proposals are based on randomization techniques. The first randomization is the classic probability model of random graphs, and in fact, the resulting SIS algorithm shows polynomial complexity for random graphs. The second randomization introduces a probabilistic relaxation technique that uses Dynamic Programming. The numerical experiments show that the resulting SIS algorithm enjoys excellent practical performance in comparison with existing methods. In particular the method is compared with cachet—an exact model counter, and the state of the art SampleSearch, which is based on Belief Networks and importance sampling.     

On two approximations to the F-distribution: Application to testing for intraclass correlation in family studies

Two approximations to the F-distribution are evaluated in the context of testing for intraclass correlation in the analysis of family data. The evaluation is based on a computation of empirical significance levels and a comparison between p-values associated with these approximations and the corresponding exact p-values. It is found that the approximate methods may give very unsatisfactory results, and exact methods are therefore recommended for general use.     

Autoregressive processes applied to acceptance sampling by varlables

The effect of serial correlation on acceptance sampling plans by variables has been examined in this paper assuming the quality measurements follow an AR(p) process. The effect of serial correlation can be examined by comparing OC curves, sample size and producer's risks, ∝, with that of the independent case when the process standard deviation, σ, is known. When σ is unknown and for large n, sampling plans can be constructed using the central limit theorem. However, for σ unknown and for small n, there is no satisfactory method of obtaining sampling plans.