An asymptotic confidence interval for the process capability index Cpm

Abstract

The use of indices as an estimation tool of process capability is long-established among the statistical quality professionals. Numerous capability indices have been proposed in last few years. C_pm constitutes one of the most widely used capability indices and its estimation has attracted much interest. In this paper, we propose a new method for constructing an approximate confidence interval for the index C_pm. The proposed method is based on the asymptotic distribution of the index C_pm obtained by the Delta Method. Under some regularity conditions, the distribution of an estimator of the process capability index C_pm is asymptotically normal.     

Probability-Based Process Capability Indices

This article deals with alternative process capability indices (PCIs) to traditional basic PCIs C _p , C _pk , and C _pm based on different fraction conforming type of probabilities. In view of various problems of constructing capability indices for univariate as well as multivariate set up, these alternative PCIs are very useful as compared to C _p , C _pk , and C _pm . Computing aspects of proposed PCIs are discussed for normal and non normal processes when process tolerance is symmetric as well as asymmetric. Generalization of these PCIs for multivariate set up is also discussed. Some simulation study results and real life problems are given for applications of proposed PCIs.     

A general class of capability indices in the case of asymmetric tolerances

Vannman has earlier studied a class of capability indices, containing the indices C _p , C _pk , C _pm and C _pmk , when the tolerances are symmetric. We study the properties of this class when the tolerances are asymmetric and suggest a new enlargened class of indices. Under the assumption of normality an explicit form of the distribution of the new class of the estimated indices is provided. Numerical investigations are made to explore the behavior of the estimators of the indices for different values of the parameters. Based on the estimator a decision rule that can be used to determine whether the process can be considered capable or not is provided and suitable criteria for choosing an index from the family are suggested.     

Estimation of the process incapability index

Greenwich and Jahr-Schaffrath (1995) introduced a new index C _pp a simple transformation of the index C _pm , which provides an uncontaminated separation between information concerning process accuracy and process precision. Under the assumption of normality, we first show that the estimators of C _pp proposed by Greenwich and Jahr-Schaffrath (1995) are UMVU estimators. We also show that for the inaccuracy index, the variance of the unbiased estimator is smaller than the mean squared error (MSE) of the natural (biased) estimator for n > 3. In addition, we obtain the r-th moment and the probability density function of these estimators.     

An Improved Approach for Estimating Product Performance Based on the Capability Index C pmk

In this article, we construct an improved procedure for estimating the process capability index C _pmk . We propose a new C _pmk lower-bound approach based on the GCI concept, and compare it with other existing methods. Based on the comparison results, we conclude with a recommendation, and construct a step-by-step procedure for the recommended approach to estimate the actual process capability C _pmk for various sample sizes. The lower bound attended by our recommended approach, indeed, improves other existing lower bound methods. We also investigate a real-world application to illustrate how we could apply the recommended approach to the actual manufacturing processes.     

An asymptotic distribution of wright’s process capability index sensitive to skewness

In a recent paper (J. Statist. Comput. Simul., 1995, Vol.53, pp. 195–203) P. A. Wright proposed a new process capability index C_s which generalizes the Pearn-Kotz-Johnson’s index C_pmk by taking into account the skewness (in addition to deviation of the mean from tliCrntarget already incorporated in C_pmk ). The purpose of this article is to study the consistency and asymptotics of an estimate ?_s of C_s The asymptotic distribution provides an insight into some desirable properties of the estimate which are not apparent from its original definition     

A process capability index for discrete processes

Perakis and Xekalaki 2002, A process capability index that is based on the proportion of conformance. Journal of Statistical Computation and Simulation, 72(9), 707–718. introduced a process capability index that is based on the proportion of conformance of the process under study and has several appealing features. One of its advantages is that it can be used not only for continuous processes, as is the case with the majority of the indices considered in the literature, but also for discrete processes as well. In this article, the use of this index is investigated for discrete data under two alternative models, which are frequently considered in statistical process control. In particular, distributional properties and estimation of the index are considered for Poisson processes and for processes resulting in modeling attribute data. The performance of the suggested estimators and confidence limits is tested via simulation.     

A General Class of Test Procedures for Left-Truncated and Right-Censored Data

When the distribution of one of the characteristics of a process is non normal, methods based on empirical percentiles suggest the use of several process capability indices (PCIs) which are similar to the usual C _p , C _pk , C _pm , and C _pmk indices. However most of these PCIs apply only to the case of symmetrical tolerances. To take into account the asymmetry of the tolerances as well as the asymmetry of the process distribution, new PCIs which improve the previous ones are proposed. In the end and in order to validate the method proposed here, we apply it to a real production case.     

A comparison of methods forsing loss-based capability index

The process capability index C _pm, sometimes called the loss-based index, has been proposed to the manufacturing industry for measuring process reproduction capability. This index incorporates the variation of production items with respect to the target value and the specification limits preset in the factory. To estimate the loss-based index properly and accurately, certain frequentist and Bayesian perspectives have been proposed to obtain lower confidence bounds (LCBs) for providing minimum process capability. The LCBs not only provide critical information regarding process performance but are also used to determine whether an improvement was made in a capability index and by extension in reducing the fraction of non-conforming items. In this paper, under the assumption of normality, based on frequentist and Bayesian senses, several existing approaches for constructing LCBs of C _pm are presented. Depending on the statistical methods used, we then classify these existing approaches into three categories and compared them in terms of the coverage rates and the mean values of the LCBs via simulations. The relative advantages and disadvantages of these approaches are summarized with some highlights of the relevant findings.     

Sample size determination for estimating multivariate process capability indices based on lower confidence limits

With the advent of modern technology, manufacturing processes have become very sophisticated; a single quality characteristic can no longer reflect a product's quality. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, several new multivariate capability (NMC) indices, such as NMC _p and NMC _pm , have been developed over the past few years. However, the sample size determination for multivariate process capability indices has not been thoroughly considered in previous studies. Generally, the larger the sample size, the more accurate an estimation will be. However, too large a sample size may result in excessive costs. Hence, the trade-off between sample size and precision in estimation is a critical issue. In this paper, the lower confidence limits of NMC _p and NMC _pm indices are used to determine the appropriate sample size. Moreover, a procedure for conducting the multivariate process capability study is provided. Finally, two numerical examples are given to demonstrate that the proper determination of sample size for multivariate process indices can achieve a good balance between sampling costs and estimation precision.     

Construction of closed interval for process capability indices Cpu,Cpl, and Spk based on Boole’s inequality and de Morgan’s laws

ABSTRACT

Considerable effort has been spent on the development of confidence intervals for process capability indices (PCIs) based on the sampling distribution of the PCI or the transferred PCI. However, there is still no definitive way to construct a closed interval for a PCI. The aim of this study is to develop closed intervals for the PCIs C_pu, C_pl, and S_pk based on Boole's inequality and de Morgan's laws. The relationships between different sample sizes, the significance levels, and the confidence intervals of the PCIs C_pu, C_pl, and S_pk are investigated. Then, a testing model for interval estimation for the PCIs C_pu, C_pl, and S_pk is built as a powerful tool for measuring the quality performance of a product. Finally, an applied example is given to demonstrate the effectiveness and applicability of the proposed method and the testing model.     

A hypothesis testing procedure for the evaluation on the lifetime performance index of products with Burr XII distribution under progressive type I interval censoring

ABSTRACT

It is a very important topic these days to assessing the lifetime performance of products in manufacturing or service industries. Lifetime performance indices C_L is used to measure the larger-the-better type quality characteristics to evaluate the process performance for the improvement of quality and productivity. The lifetimes of products are assumed to have Burr XII distribution. The maximum likelihood estimator is used to estimate the lifetime performance index based on the progressive type I interval censored sample. The asymptotic distribution of this estimator is also developed. We use this estimator to build the new hypothesis testing algorithmic procedure with respect to a lower specification limit. Finally, two practical examples are given to illustrate the use of this testing algorithmic procedure to determine whether the process is capable.     

Rejoinder

Abstract

In this article several formulae for the approximation of the critical values for tests on the actual values of the process capability indices CPL, CPU, and C_pk are provided. These formulae are based on different approximations of the percentiles of the noncentral t distribution and their performance is evaluated by comparing the values assessed through them from the exact critical values, for several significance levels, test values, and sample sizes. As supported by the obtained results, some of the presented techniques constitute valuable tools in situations where the exact critical values of the tests are not available, since one may approximate them readily and rather accurately through them.     

Parametric inference of the process capability index for exponentiated exponential distribution

Process capability indices (PCIs) are most effective devices/techniques used in industries for determining the quality of products and performance of manufacturing processes. In this article, we consider the PCI C_pc which is based on the proportion of conformance and is applicable to normally as well as non-normally and continuous as well as discrete distributed processes. In order to estimate the PCI C_pc when the process follows exponentiated exponential distribution, we have used five classical methods of estimation. The performances of these classical estimators are compared with respect to their biases and mean squared errors (MSEs) of the index C_pc through simulation study. Also, the confidence intervals for the index C_pc are constructed using five bootstrap confidence interval (BCIs) methods. Monte Carlo simulation study has been carried out to compare the performances of these five BCIs in terms of their average width and coverage probabilities. Besides, net sensitivity (NS) analysis for the given PCI C_pc is considered. We use two data sets related to electronic and food industries and two failure time data sets to illustrate the performance of the proposed methods of estimation and BCIs. Additionally, we have developed PCI C_pc using aforementioned methods for generalized Rayleigh distribution.     

On Confidence Intervals for Process Capability Indices in a One-Way Random Model

In this article, we investigated the bootstrap calibrated generalized confidence limits for process capability indices C _pk for the one-way random effect model. Also, we derived Bissell's approximation formula for the lower confidence limit using Satterthwaite's method and calculated its coverage probabilities and expected values. Then we compared it with standard bootstrap (SB) method and generalized confidence interval method. The simulation results indicate that the confidence limit obtained offers satisfactory coverage probabilities. The proposed method is illustrated with the help of simulation studies and data sets.     

A note on the asymptotic distribution of the process capability index C pmk

Process capability indices have been widely used to evaluate the process performance to the continuous improvement of quality and productivity. The distribution of the estimator of the process capability index C _pmk is very complicated and the asymptotic distribution is proposed by Chen and Hsu [The asymptotic distribution of the processes capability index C _pmk , Comm. Statist. Theory Methods 24(5) (1995), pp. 1279–1291]. However, we found a critical error for the asymptotic distribution when the population mean is not equal to the midpoint of the specification limits. In this paper, a correct version of the asymptotic distribution is given. An asymptotic confidence interval of C _pmk by using the correct version of asymptotic distribution is proposed and the lower bound can be used to test if the process is capable. A simulation study of the coverage probability of the proposed confidence interval is shown to be satisfactory. The relation of six sigma technique and the index C _pmk is also discussed in this paper. An asymptotic testing procedure to determine if a process is capable based on the index of C _pmk is also given in this paper.     

SkSP-R sampling plan based on process capability index

In this paper, we present an optimal designing methodology for the skip-lot sampling plan (SkSP) of type SkSP-R based on the most widely used process capability index (PCI) C_pk. The SkSP-R plan is one of the SkSPs that incorporate the provision of the reinspection concept. In order to design the optimal parameters, we consider both symmetric and asymmetric fraction non conforming cases. Tables are also constructed to determine the optimal parameters by formulating an optimization problem. The advantages of the proposed plan over the existing plan are also discussed. Application of the plan is explained with a real-life example.     

Lower confidence bounds as precision measure for truncated processes

Process capability index C_p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C_p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.