A new generation of process capability indices based on fuzzy measurements

Process capability indices (PCIs) provide numerical measures on whether a process conforms to the defined manufacturing capability prerequisite. These have been successfully applied by companies to compete with and to lead high-profit markets by evaluating the quality and productivity performance. The PCI C_p compares the output of a process to the specification limits (SLs) by forming the ratio of the width between the process SLs with the width of the natural tolerance limits which is measured by six process standard deviation units. As another common PCI, C_pm incorporates two variation components which are variation to the process mean and deviation of the process mean from the target. A meaningful generalized version of above PCIs is introduced in this paper which is able to handle in a fuzzy environment. These generalized PCIs are able to measure the capability of a fuzzy-valued process in producing products on the basis of a fuzzy quality. Fast computing formulas for the generalized PCIs are computed for normal and symmetric triangular fuzzy observations, where the fuzzy quality is defined by linear and exponential fuzzy SLs. A practical example is presented to show the performance of proposed indices.     

Developing and designing of an efficient variables sampling system based on the process capability index

Process capability indices (PCIs) are extensively used in the manufacturing industries in order to confirm whether the manufactured products meet their specifications or not. PCIs can be used to judge the process precision, process accuracy, and the process performance. So developing of sampling plans based on PCIs is inevitable and those plans will be very much useful for maintaining and improving the product quality in the manufacturing industries. In view of this, we propose a variables sampling system based on the process capability index C_pmk, which takes into account of process yield and process loss, when the quality characteristic under study will have double specification limits. The proposed sampling system will be effective in compliance testing. The advantages of this system over the existing sampling plans are also discussed. In order to determine the optimal parameters, tables are also constructed by formulating the problem as a nonlinear programming in which the average sample number is minimized by satisfying the producer and consumer risks.     

Probability-Based Process Capability Indices

This article deals with alternative process capability indices (PCIs) to traditional basic PCIs C _p , C _pk , and C _pm based on different fraction conforming type of probabilities. In view of various problems of constructing capability indices for univariate as well as multivariate set up, these alternative PCIs are very useful as compared to C _p , C _pk , and C _pm . Computing aspects of proposed PCIs are discussed for normal and non normal processes when process tolerance is symmetric as well as asymmetric. Generalization of these PCIs for multivariate set up is also discussed. Some simulation study results and real life problems are given for applications of proposed PCIs.     

Construction of closed interval for process capability indices Cpu,Cpl, and Spk based on Boole’s inequality and de Morgan’s laws

ABSTRACT

Considerable effort has been spent on the development of confidence intervals for process capability indices (PCIs) based on the sampling distribution of the PCI or the transferred PCI. However, there is still no definitive way to construct a closed interval for a PCI. The aim of this study is to develop closed intervals for the PCIs C_pu, C_pl, and S_pk based on Boole's inequality and de Morgan's laws. The relationships between different sample sizes, the significance levels, and the confidence intervals of the PCIs C_pu, C_pl, and S_pk are investigated. Then, a testing model for interval estimation for the PCIs C_pu, C_pl, and S_pk is built as a powerful tool for measuring the quality performance of a product. Finally, an applied example is given to demonstrate the effectiveness and applicability of the proposed method and the testing model.     

A General Class of Test Procedures for Left-Truncated and Right-Censored Data

When the distribution of one of the characteristics of a process is non normal, methods based on empirical percentiles suggest the use of several process capability indices (PCIs) which are similar to the usual C _p , C _pk , C _pm , and C _pmk indices. However most of these PCIs apply only to the case of symmetrical tolerances. To take into account the asymmetry of the tolerances as well as the asymmetry of the process distribution, new PCIs which improve the previous ones are proposed. In the end and in order to validate the method proposed here, we apply it to a real production case.     

Order statistics from trivariate normal and -distributions in terms of generalized skew-normal and skew- distributions

We consider here a generalization of the skew-normal distribution, GSN(λ₁,λ₂,ρ), defined through a standard bivariate normal distribution with correlation ρ, which is a special case of the unified multivariate skew-normal distribution studied recently by Arellano-Valle and Azzalini [2006. On the unification of families of skew-normal distributions. Scand. J. Statist. 33, 561–574]. We then present some simple and useful properties of this distribution and also derive its moment generating function in an explicit form. Next, we show that distributions of order statistics from the trivariate normal distribution are mixtures of these generalized skew-normal distributions; thence, using the established properties of the generalized skew-normal distribution, we derive the moment generating functions of order statistics, and also present expressions for means and variances of these order statistics.Next, we introduce a generalized skew-t_ν distribution, which is a special case of the unified multivariate skew-elliptical distribution presented by Arellano-Valle and Azzalini [2006. On the unification of families of skew-normal distributions. Scand. J. Statist. 33, 561–574] and is in fact a three-parameter generalization of Azzalini and Capitanio's [2003. Distributions generated by perturbation of symmetry with emphasis on a multivariate skew t distribution. J. Roy. Statist. Soc. Ser. B 65, 367–389] univariate skew-t_ν form. We then use the relationship between the generalized skew-normal and skew-t_ν distributions to discuss some properties of generalized skew-t_ν as well as distributions of order statistics from bivariate and trivariate t_ν distributions. We show that these distributions of order statistics are indeed mixtures of generalized skew-t_ν distributions, and then use this property to derive explicit expressions for means and variances of these order statistics.     

Lower confidence bounds as precision measure for truncated processes

Process capability index C_p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C_p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.     

Generalized Least Squares Model Averaging

In this article, we propose a method of averaging generalized least squares estimators for linear regression models with heteroskedastic errors. The averaging weights are chosen to minimize Mallows’ C_p-like criterion. We show that the weight vector selected by our method is optimal. It is also shown that this optimality holds even when the variances of the error terms are estimated and the feasible generalized least squares estimators are averaged. The variances can be estimated parametrically or nonparametrically. Monte Carlo simulation results are encouraging. An empirical example illustrates that the proposed method is useful for predicting a measure of firms’ performance.     

Impact of measurement errors on the performance and distributional properties of the multivariate capability index $$\mathbf{NMC }_\mathbf{pm }$$

Current industrial processes are sophisticated enough to be tied to only one quality variable to describe the process result. Instead, many process variables need to be analyze together to assess the process performance. In particular, multivariate process capability analysis (MPCIs) has been the focus of study during the last few decades, during which many authors proposed alternatives to build the indices. These measures are extremely attractive to people in charge of industrial processes, because they provide a single measure that summarizes the whole process performance regarding its specifications. In most practical applications, these indices are estimated from sampling information collected by measuring the variables of interest on the process outcome. This activity introduces an additional source of variation to data, that needs to be considered, regarding its effect on the properties of the indices. Unfortunately, this problem has received scarce attention, at least in the multivariate domain. In this paper, we study how the presence of measurement errors affects the properties of one of the MPCIs recommended in previous researches. The results indicate that even little measurement errors can induce distortions on the index value, leading to wrong conclusions about the process performance.     

Location adjustment for the minimum volume ellipsoid estimator

Estimating multivariate location and scatter with both affine equivariance and positive breakdown has always been difficult. A well-known estimator which satisfies both properties is the Minimum Volume Ellipsoid Estimator (MVE). Computing the exact MVE is often not feasible, so one usually resorts to an approximate algorithm. In the regression setup, algorithms for positive-breakdown estimators like Least Median of Squares typically recompute the intercept at each step, to improve the result. This approach is called intercept adjustment. In this paper we show that a similar technique, called location adjustment, can be applied to the MVE. For this purpose we use the Minimum Volume Ball (MVB), in order to lower the MVE objective function. An exact algorithm for calculating the MVB is presented. As an alternative to MVB location adjustment we propose L ₁ location adjustment, which does not necessarily lower the MVE objective function but yields more efficient estimates for the location part. Simulations compare the two types of location adjustment. We also obtain the maxbias curves of L ₁ and the MVB in the multivariate setting, revealing the superiority of L ₁.     

Testing process capability based on Cpm in the presence of random measurement errors

Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index C_p provides measures on process precision (or product consistency). The index C_pm, sometimes called the Taguchi index, meditates on process centring ability and process loss. Most research work related to C_p and C_pm assumes no gauge measurement errors. This assumption insufficiently reflects real situations even with highly advanced measuring instruments. Conclusions drawn from process capability analysis are therefore unreliable and misleading. In this paper, we conduct sensitivity investigation on process capability C_p and C_pm in the presence of gauge measurement errors. Due to the randomness of variations in the data, we consider capability testing for C_p and C_pm to obtain lower confidence bounds and critical values for true process capability when gauge measurement errors are unavoidable. The results show that the estimator with sample data contaminated by the measurement errors severely underestimates the true capability, resulting in imperceptible smaller test power. To obtain the true process capability, adjusted confidence bounds and critical values are presented to practitioners for their factory applications.     

A shift-dependent generalized cumulative entropy of order n

Recently, a shift-independent information measure known as generalized cumulative entropy of order n (GCE_n) was proposed by Kayal (2016 Kayal, S. 2016. On generalized cumulative entropies. Probability in Engineering and Informational Sciences 30:640–62. [Google Scholar]). In this communication, we propose a shift-dependent version of GCE_n. Various properties including the effect of transformations, bounds etc. have been discussed. Several relationships of the shift-dependent GCE_n with some well-known reliability measures are studied. Few characterization results are obtained. We derive an estimator for the proposed measure via empirical distribution function approach. Large sample properties of the estimator are studied when independent observations are taken from a Weibull distribution.     

Inference on C pk for autocorrelated data in the presence of random measurement errors

The present paper examines the properties of the C _pk estimator when observations are autocorrelated and affected by measurement errors. The underlying reason for this choice of subject matter is that in industrial applications, process data are often autocorrelated, especially when sampling frequency is not particularly low, and even with the most advanced measuring instruments, gauge imprecision needs to be taken into consideration. In the case of a first-order stationary autoregressive process, we compare the statistical properties of the estimator in the error case with those of the estimator in the error-free case. Results indicate that the presence of gauge measurement errors leads the estimator to behave differently depending on the entity of error variability.     

A robust process capability index

The existing process capability indices (PCI's) assume that the distribution of the process being investigated is normal. For non-normal distributions, PCI's become unreliable in that PCI's may indicate the process is capable when in fact it is not. In this paper, we propose a new index which can be applied to any distribution. The proposed indexC_f:, is directly related to the probability of non-conformance of the process. For a given random sample, the estimation of C_f boils down to estimating non-parametrically the tail probabilities of an unknown distribution. The approach discussed in this paper is based on the works by Pickands (1975) and Smith (1987). We also discuss the construction of bootstrap confidence intervals of C_f: based on the so-called accelerated bias correction method (BC _a:). Several simulations are carried out to demonstrate the flexibility and applicability of C_f:. Two real life data sets are analyzed using the proposed index.     

$${\mathcal{L}}_p$$ loss functions: a robust bayesian approach

In bayesian inference, the Bayes estimator is the alternative with the minimum expected loss. In most cases, the loss function shows the distance between the alternative and the parameter. Therefore, any distance can lead to a loss function. Among the best known distance functions is L _p one, where the choice of value p may be difficult and arbitrary. This paper examines robust models where the loss function is modelled by family L _p . Our solution concept is the non-dominated alternative. We characterize the non-dominated set by having the posterior distribution function satisfy a particular asymmetry property. We also include an example to illustrate the methodology described.     

Multinomial Selection Problem: A Study of BEM and AVC Algorithms

The two well-known and widely used multinomial selection procedures Bechhofor, Elmaghraby, and Morse (BEM) and all vector comparison (AVC) are critically compared in applications related to simulation optimization problems.

Two configurations of population probability distributions in which the best system has the greatest probability p _i of yielding the largest value of the performance measure and has or does not have the largest expected performance measure were studied.

The numbers achieved by our simulations clearly show that none of the studied procedures outperform the other in all situations. The user must take into consideration the complexity of the simulations and the performance measure probability distribution properties when deciding which procedure to employ.

An important discovery was that the AVC does not work in populations in which the best system has the greatest probability p _i of yielding the largest value of the performance measure but does not have the largest expected performance measure.     

Estimating process capability index Cpk: classical approach versus Bayesian approach

Process capability index C_pk has been the most popular one used in the manufacturing industry dealing with problems of measuring reproduction capability of processes to enhance product development with very low fraction of defectives. In the manufacturing industry, lower confidence bound (LCB) estimates the minimum process capability providing pivotal information for quality engineers to monitoring the process and assessing process performance for quality assurance. The main objective of this paper is to compare and contrast the LCBs on C_pk using two approaches, Classical method and Bayesian method.     

Three New Multivariate Process Capability Indices

Different multivariate process capability indices are developed by researchers to evaluate process capability when vectors of quality characteristics are considered in a study. This article presents three indices referred to as NCpM, MCpM, and NMC _PM in order to evaluate process capability in multivariate environment. The performance of the proposed indices is investigated numerically. Simulation results indicate that the proposed indices have descended estimation error and improved performance compared to the existing ones. These results can be important to researchers and practitioners who are interested in evaluating process capability in multivariate domain.     

Sample size determination for estimating multivariate process capability indices based on lower confidence limits

With the advent of modern technology, manufacturing processes have become very sophisticated; a single quality characteristic can no longer reflect a product's quality. In order to establish performance measures for evaluating the capability of a multivariate manufacturing process, several new multivariate capability (NMC) indices, such as NMC _p and NMC _pm , have been developed over the past few years. However, the sample size determination for multivariate process capability indices has not been thoroughly considered in previous studies. Generally, the larger the sample size, the more accurate an estimation will be. However, too large a sample size may result in excessive costs. Hence, the trade-off between sample size and precision in estimation is a critical issue. In this paper, the lower confidence limits of NMC _p and NMC _pm indices are used to determine the appropriate sample size. Moreover, a procedure for conducting the multivariate process capability study is provided. Finally, two numerical examples are given to demonstrate that the proper determination of sample size for multivariate process indices can achieve a good balance between sampling costs and estimation precision.     

A comparison of methods forsing loss-based capability index

The process capability index C _pm, sometimes called the loss-based index, has been proposed to the manufacturing industry for measuring process reproduction capability. This index incorporates the variation of production items with respect to the target value and the specification limits preset in the factory. To estimate the loss-based index properly and accurately, certain frequentist and Bayesian perspectives have been proposed to obtain lower confidence bounds (LCBs) for providing minimum process capability. The LCBs not only provide critical information regarding process performance but are also used to determine whether an improvement was made in a capability index and by extension in reducing the fraction of non-conforming items. In this paper, under the assumption of normality, based on frequentist and Bayesian senses, several existing approaches for constructing LCBs of C _pm are presented. Depending on the statistical methods used, we then classify these existing approaches into three categories and compared them in terms of the coverage rates and the mean values of the LCBs via simulations. The relative advantages and disadvantages of these approaches are summarized with some highlights of the relevant findings.