A Design of s Control Charts with a Combined Double Sampling and Variable Sampling Interval Scheme

In this paper, we propose new estimation techniques in connection with the system of S-distributions. Besides “exact” maximum likelihood (ML), we propose simulated ML and a characteristic function-based procedure. The “exact” and simulated likelihoods can be used to provide numerical, MCMC-based Bayesian inferences.     

Reliability Properties of Systems with Two Exchangeable Log-Logistic Components

In this article, we study the reliability properties of systems under bivariate log-logistic model which comes out from a particular stress-strength analysis. For this model, we obtain basic reliability characteristics of series and parallel systems and investigate their properties. We also derive distribution and moments of cold standby system under the abovementioned exchangeable model.     

Grey Predictive Process Control Charts

The present article intends to develop some imputation methods to reduce the impact of non response at both the occasions in two-occasion successive (rotation) sampling. Utilizing the auxiliary information, which is only available at the current occasion, estimators have been proposed for estimating the population mean at the current occasion. Estimators for the current occasion are also derived as a particular case when there is non response either on the first occasion or second occasion. Behaviors of the proposed estimators are studied and their respective optimum replacement policies are also discussed. To study the effectiveness of the suggested imputation methods, performances of the proposed estimators are compared in two different situations, with and without non response. The results obtained are demonstrated with the help of empirical studies.     

Concurrent Design for Process Quality,Statistical Tolerance,and SPC

The rapid response to the requirements of customers and markets promotes the concurrent engineering (CE) technique in product and process design. The decision making for process quality target, SPC method, sampling plan, and control chart parameter design can be done at the stage of process quality plan based on historical data and process knowledge database. Therefore, it is a reasonable trend to introduce the concepts and achievements on process quality evaluation and process capability analysis, CE, and SPC techniques into process plan and tolerance design. A new systematic method for concurrent design of process quality, statistical tolerance (ST), and control chart is presented based on a NSFC research program. A set of standardized process quality indices (PQIs) for variables is introduced for meeting the measurement and evaluation to process yield, process centering, and quality loss. This index system that has relatively strong compatibility and adaptability is based on raisonne grading by using the series of preferred numbers and arithmetical progression. The expected process quality based on this system can be assured by a standardized interface between PQIs and SPC, that is, quality-oriented statistical tolerance zone. A quality-oriented ST and SPC approach that quantitatively specifies what a desired process is and how to assure it will realize the optimal control for a process toward a predetermined quality target.     

An Enhanced Double MEWMA Controller for Drifted MIMO Systems

For a drifted multiple-input and multiple-output (MIMO) system, the double multivariate exponentially weighted moving average (dMEWMA) controller is a popular run-to-run (RTR) controller for adjusting the process mean to a desired target. The stability and performance of dMEWMA controller had been widely studied in literature. Although the dMEWMA controller (with suitable discount matrices) can guarantee long-term stability, it usually requires a moderately large number of runs to bring the process output to approach its desired target if the initial recipe is not chosen appropriately. Due to the initial recipe possibly having an infinite number of feasible solutions for MIMO systems, “how to determine an optimal setting for the initial recipe” turns out to be an interesting research topic. In this article, by solving a constrained optimization problem, we first obtain an optimal initial setting for the input recipe. Then, motivated by this setting, we propose an enhanced dMEWMA controller. The long-term stability conditions and short-term performance of the proposed controller are also addressed. Given a fixed and finite production run, it reveals that the proposed controller has the ability of reducing total mean squared error (TMSE) better than the conventional dMEWMA controller.     

A New Control Scheme Always Better Than X-Bar Chart

A new control scheme is proposed by borrowing the idea of the Benjamini–Hochberg procedure for controlling the false discovery rate in multiple testing. It is shown theoretically that the proposed 2-span control scheme outperforms the Shewhart X-bar chart in terms of the average run length under any size of mean shifts. Some simulations are carried out to demonstrate that the proposed scheme having various span sizes always outperforms the X-bar chart in terms of the average run lengths.     

A Nonparametric Synthetic Control Chart Using Sign Statistic

This article presents a synthetic control chart for detection of shifts in the process median. The synthetic chart is a combination of sign chart and conforming run-length chart. The performance evaluation of the proposed chart indicates that the synthetic chart has a higher power of detecting shifts in process median than the Shewhart charts based on sign statistic as well as the classical Shewhart X-bar chart for various symmetric distributions. The improvement is significant for shifts of moderate to large shifts in the median. The robustness studies of the proposed synthetic control chart against outliers indicate that the proposed synthetic control chart is robust against contamination by outliers.     

A Distribution-Free Control Chart Based on Order Statistics

In this article, we introduce a new distribution-free Shewhart-type control chart that takes into account the location of a single order statistic of the test sample (such as the median) as well as the number of observations in that test sample that lie between the control limits. Exact formulae for the alarm rate, the run length distribution, and the average run length (ARL) are all derived. A key advantage of the chart is that, due to its nonparametric nature, the false alarm rate and in-control run length distribution are the same for all continuous process distributions, and so will be naturally robust. Tables are provided for the implementation of the chart for some typical ARL values and false alarm rates. The empirical study carried out reveals that the new chart is preferable from a robustness point of view in comparison to a classical Shewhart-type chart and also the nonparametric chart of Chakraborti et al. (2004 Chakraborti , S. , van der Laan , P. , van de Wiel , M. A. ( 2004 ). A class of distribution-free control charts . J. Roy. Statist. Soc. Ser. C-Appl. Statist. 53 ( 3 ): 443 – 462 .[Web of Science ®] , [Google Scholar]).