On the α-risks for shewhart control charts

The performance of the usual Shewhart control charts for monitoring process means and variation can be greatly affected by nonnormal data or subgroups that are correlated. Define the α_k-risk for a Shewhart chart to be the probability that at least one “out-of-control” subgroup occurs in k subgroups when the control limits are calculated from the k subgroups. Simulation results show that the α_k-risks can be quite large even for a process with normally distributed, independent subgroups. When the data are nonnormal, it is shown that the α_k-risk increases dramatically. A method is also developed for simulating an “in-control” process with correlated subgroups from an autoregressive model. Simulations with this model indicate marked changes in the α_k-risks for the Shewhart charts utilizing this type of correlated process data. Therefore, in practice a process should be investigated thoroughly regarding whether or not it is generating normal, independent data before out-of-control points on the control charts are interpreted to be due to some real assignable cause.     

Short run spc based upon the second order dynamic linear model for trend detection

Recently, several new applications of control chart procedures for short production runs have been introduced. Bothe (1989) and Burr (1989) proposed the use of control chart statistics which are obtained by scaling the quality characteristic by target values or process estimates of a location and scale parameter. The performance of these control charts can be significantly affected by the use of incorrect scaling parameters, resulting in either an excessive "false alarm rate," or insensitivity to the detection of moderate shifts in the process. To correct for these deficiencies, Quesenberry (1990, 1991) has developed the Q-Chart which is formed from running process estimates of the sample mean and variance. For the case where both the process mean and variance are unknown, the Q-chaxt statistic is formed from the standard inverse Z-transformation of a t-statistic. Q-charts do not perform correctly, however, in the presence of special cause disturbances at process startup. This has recently been supported by results published by Del Castillo and Montgomery (1992), who recommend the use of an alternative control chart procedure which is based upon a first-order adaptive Kalman filter model Consistent with the recommendations by Castillo and Montgomery, we propose an alternative short run control chart procedure which is based upon the second order dynamic linear model (DLM). The control chart is shown to be useful for the early detection of unwanted process trends. Model and control chart parameters are updated sequentially in a Bayesian estimation framework, providing the greatest degree of flexibility in the level of prior information which is incorporated into the model. The result is a weighted moving average control chart statistic which can be used to provide running estimates of process capability. The average run length performance of the control chart is compared to the optimal performance of the exponentially weighted moving average (EWMA) chart, as reported by Gan (1991). Using a simulation approach, the second order DLM control chart is shown to provide better overall performance than the EWMA for short production run applications     

Hayter and Tsui's test with double sampling for the vector mean of multivariate normal population

Abstract

In this paper, we introduce a version of Hayter and Tsui's statistical test with double sampling for the vector mean of a population under multivariate normal assumption. A study showed that this new test was more or as efficient than the well-known Hotelling's T² with double sampling. Some nice features of Hayter and Tsui's test are its simplicity of implementation and its capability of identifying the errant variables when the null hypothesis is rejected. Taking that into consideration, a new control chart called HTDS is also introduced as a tool to monitor multivariate process vector mean when using double sampling.     

The robust economic statistical design of the Hotelling's T2 chart

ABSTRACT

Economic statistical designs aim at minimizing the cost of process monitoring when a specific scenario or a set of estimated process and cost parameters is given. But, in practice the process may be affected by more than one scenario which may lead to severe cost penalties if the wrong design is used. Here, we investigate the robust economic statistical design (RESD) of the T² chart in an attempt to reduce these cost penalties when there are multiple scenarios. Our method is to employ the genetic algorithm (GA) optimization method to minimize the total expected monitoring cost across all distinct scenarios. We illustrate the effectiveness of the method using two numerical examples. Simulation studies indicate that robust economic statistical designs should be encouraged in practice.     

A Design of s Control Charts with a Combined Double Sampling and Variable Sampling Interval Scheme

In this paper, we propose new estimation techniques in connection with the system of S-distributions. Besides “exact” maximum likelihood (ML), we propose simulated ML and a characteristic function-based procedure. The “exact” and simulated likelihoods can be used to provide numerical, MCMC-based Bayesian inferences.     

Grey Predictive Process Control Charts

The present article intends to develop some imputation methods to reduce the impact of non response at both the occasions in two-occasion successive (rotation) sampling. Utilizing the auxiliary information, which is only available at the current occasion, estimators have been proposed for estimating the population mean at the current occasion. Estimators for the current occasion are also derived as a particular case when there is non response either on the first occasion or second occasion. Behaviors of the proposed estimators are studied and their respective optimum replacement policies are also discussed. To study the effectiveness of the suggested imputation methods, performances of the proposed estimators are compared in two different situations, with and without non response. The results obtained are demonstrated with the help of empirical studies.     

Concurrent Design for Process Quality,Statistical Tolerance,and SPC

The rapid response to the requirements of customers and markets promotes the concurrent engineering (CE) technique in product and process design. The decision making for process quality target, SPC method, sampling plan, and control chart parameter design can be done at the stage of process quality plan based on historical data and process knowledge database. Therefore, it is a reasonable trend to introduce the concepts and achievements on process quality evaluation and process capability analysis, CE, and SPC techniques into process plan and tolerance design. A new systematic method for concurrent design of process quality, statistical tolerance (ST), and control chart is presented based on a NSFC research program. A set of standardized process quality indices (PQIs) for variables is introduced for meeting the measurement and evaluation to process yield, process centering, and quality loss. This index system that has relatively strong compatibility and adaptability is based on raisonne grading by using the series of preferred numbers and arithmetical progression. The expected process quality based on this system can be assured by a standardized interface between PQIs and SPC, that is, quality-oriented statistical tolerance zone. A quality-oriented ST and SPC approach that quantitatively specifies what a desired process is and how to assure it will realize the optimal control for a process toward a predetermined quality target.