A Bayesian way of monitoring the linear profiles using CUSUM control charts

In statistical process control applications, profiles functions are considered an efficient way of representing quality of products or processes. Classical and Bayesian thoughts are two chief sources of defining control charting structures for profiles monitoring. This Study introduces novel Bayesian CUSUM control structures for profiles monitoring. The comprehensive comparative study identifies that the proposed Bayesian CUSUM control charts under conjugate priors has better expected performance than competing methods. The implementation of Bayesian structures requires detailed information about process parameters which come up with considerable benefits. In addition, simulative example and case study further justified the superiority of proposed techniques.     

ON THE EVALUATION OF CONTROL CHART LIMITS BASED ON PREDICTIVE DISTRIBUTIONS

ABSTRACT

We propose a Bayesian approach to obtaining control charts when there is parameter uncertainty. Our approach consists of two stages, (i) construction of the control chart where we use a predictive distribution based on a Bayesian approach to derive the rejection region, and (ii) evaluation of the control chart where we use a sampling theory approach to examine the performance of the control chart under various hypothetical specifications for the data generation model.     

Multivariate Saddlepoint test for the wrapped normal model

In this article we show the effectiveness and the accuracy of the test statistic based on the expnnent of the saddlepoint approximation for the density of M-estimators, proposed by Robinson, Ronchetti and Young (1999), for testing simultaneous hypotheses on the mean and on the variance of a wrapped normal distribution. We base this test statistic on the trigonometric method of moments estimator proposed by Gatto and Jammalamadaka (l999b), which admits the M-estimator representation necessary for this test. This test statistic has an approximate chi-squared distribution, asympiotically up to the second order, and the high accuracy of this approximation is shown by numerical simulations.     

弯曲管道疏通中能通过的钻头长度的研究

研究了在简化假设下,在弯曲管道中能通过管道的钻头最大长度,并得出结论,为实际问题提供了理论上的依据。     

PVC管扩口定长系统的改进

介绍了一种新型的扩口定长系统,该系统利用光电开关、旋转编码器、计数器实现零件的定位,并利用计数器的原理将滚轮旋转信息转换为工作所要的计长仪信号,记录工程所需的长度.结果表明:该系统可以把误差由原来的几十毫米降低到±1毫米,有效地提高了成品的加工精度.     

Statistical control charts for monitoring the mean of a stationary process

Recently statistical process control (SPC) methodologies have been developed to accommodate autocorrelated data. A primary method to deal with autocorrelated data is the use of residual charts. Although this methodology has the advantage that it can be applied to any autocorrelated data it needs time series modeling efforts. In addition for a X residual chart the detection capability is sometimes small compared to the X chart and EWMA chart. Zhang (1998) proposed the EWMAST chart which is constructed by charting the EWMA statistic for stationary processes to monitor the process mean. The performance of the EWMAST chart the X chart the X residual chart and other charts were compared in Zhang (1998). In this paper comparisons are made among the EWMAST chart the CUSUM residual chart and EWMA residual chart as well as the X residual chart and X chart via the average run length.     

Economic-Statistical Design of EWMA Control Charts Based on Taguchi's Loss Function

This paper proposes an economic-statistical design of the EWMA chart with time-varying control limits in which the Taguchi's quadratic loss function is incorporated into the economic-statistical design based on Lorenzen and Vance's economical model. A nonlinear programming with statistical performance constraints is developed and solved to minimize the expected total quality cost per unit time. This model, which is divided into three parts, depends on whether production continues during the period when the assignable cause is being searched for and/or repaired. Through a computational procedure, the optimal decision variables, including the sample size, the sampling interval, the control limit width, and the smoothing constant, can be solved for by each model. It is showed that the optimal economic-statistical design solution can be found from the set of optimal solutions obtained from the statistical design, and both the optimal sample size and sampling interval always decrease as the magnitude of shift increases.     

An NP Control Chart Using Double Inspections

The np control chart is used widely in Statistical Process Control (SPC) for attributes. It is difficult to design an np chart that simultaneously satisfies a requirement on false alarm rate and has high detection effectiveness. This is mainly because one is often unable to make the in-control Average Run Length ARL₀ of an np chart close to a specified or desired value. This article proposes a new np control chart which is able to overcome the problems suffered by the conventional np chart. It is called the Double Inspection (DI) np chart, because it uses a double inspection scheme to decide the process status (in control or out of control). The first inspection decides the process status according to the number of non-conforming units found in a sample; and the second inspection makes a decision based on the location of a particular non-conforming unit in the sample. The double inspection scheme makes the in-control ARL₀ very close to a specified value and the out-of-control Average Run Length ARL₁ quite small. As a result, the requirement on a false alarm rate is satisfied and the detection effectiveness also achieves a high level. Moreover, the DI np chart retains the operational simplicity of the np chart to a large degree and achieves the performance improvement without requiring extra inspection (testing whether a unit is conforming or not).     

Modified Shewhart Charts for High Yield Processes

The conventional Shewhart p or np chart is not effective for monitoring a high yield process, a process in which the defect level is close to zero. An improved Shewhart np chart for monitoring high yield processes is proposed. A review of control charts for monitoring high yield processes is first given. The run length performance of the proposed Shewhart chart is then compared with other high yield control charts. A simple procedure for designing the chart for processes subjected to sampling or 100% continuous inspection is provided and this allows the chart to be implemented easily on the factory floor. The practical aspects of implementation of the Shewhart chart are discussed. An application of the Shewhart chart based on a real data set is demonstrated.