Reconsideration of the F-test of the analysis of variance: the semi-bayesian significance test

The usual F-test of the analysis of variance is reconsidered within the Bayesian framework, In terms of predictive distributions, This leads to the notion of semi-Bayesian significance test, so called because it consists in only probabilizing the space of nuisance parameters, thus bringing a general principle for “eliminating” nuisance parameters, or more exactly incorporating information about these parameters. The approach is shown to extend the F-tests, by allowing the testing of hypotheses of non-zero effects.     

Order statistics from the linear-exponential distribution,part I: increasing hazard rate case

For the linear-exponential distribution with increasing hazard rate, exact and explicit expressions for means, product moments and percentage points of order statistics are obtained. Some recurrence relations for both single and product moments of order statistics are also derived. These recurrence relations would enable one to obtain all the higher order moments of order statistics for all sample sizes from those of the lower order     

Improved deviance goodness of fit statistics for a gamma regression model

A gamma regression model with an exponential link function for the means Is considered. Moment properties of the deviance statistics based on maximum likelihood and weighted least squares fits are used to define modified deviance statistics which provide alternative global goodness of fit tests. The null distribution properties of the deviances and modified deviances are compared with those of the approximating chi-square distribution and It is shown that the use of the modified deviances gives much better control over the significance levels of the tests.     

On an application of the diffusion approximation of the generalized birth and death process for stochastic population projection

Assuming that both birth and death rates are density and time dependent, a diffusion approximation of the generalized birth and death process has been considered in this paper to obtain a suitable stochastic population model describing the population size and its moments. A simple method of estimating the parameters of the model Is discussed. The predictions of the expected size of the population, and the variance are made and compared with the corresponding census figures as well as with another deterministic projection series made for the corresponding period.     

Statistical analysis of a two-unit dependent repairable system

Maximum likelihood estimators are investigated a for lr-out-of 2:G repairable system when failures and repairs are statistically dependent. Under two censoring schemes Accelerated Life Testing Procedure (ALTP) is used to obtain the estimates. Information matrices are supplied and a special case when the failure and repair phenomenon are independent of each other is considered.     

Sequential estimation problems for negative exponential populations

The literature on sequential estimation problems for negative exponential populations has been reviewed here, We attempt to bring in all the published and unpublished materials known to us in a fairly coherent fashion. Both the concepts and theoretical findings are discussed.     

A class of distribution-free tests for two-way layout

In this article a class of distribution-free tests for the hypothesis of no row (treatment) effect in a two-way layout design, with several observations per cell, is proposed. The tests are based on U-statistics, constructed by considering minima of all possible subsamples of same size from each cell.The proposed class of tests is compared with the parametric test, Mack and Skillings test and Yate's test for two-way layout, in terms of Pitman ARE sense. It is seen that for the case of equal number of observations per cell, the proposed tests have better efficiency for exponential and uniform error distributions.     

Geeta distribution and its properties

A new discrete distribution defined over all the positive integers and with the name of Geeta distribution is described. It is L-shaped like the logarithmic series distribution, Yule distribution and the discrete Pareto distribution but is far more versatile than them as it has two parameters. It belongs to the classes of location parameter distributions, modified power series distributions, Lagrange series distributions and exponential distributions. Its mean fi, variance a2 and two recurrence formulae for higher central moments are obtained. Convolution theorem and variations in the model with changes in the parameters have been considered. ML estimators, MVU estimators and estimators based of mean and variance and on mean and first frequency have been derived.     

New class of location-parameter discrete probability distributions and their characterizations

A new class of location-parameter discrete probability distributions (LDPD) has been defined where the population mean is the location parameter. It has been shown that some single parameter discrete distributions do not belong to this class and all discrete probability distributions belonging to this class can be characterized by their variances only. Expressions are given for the first four central moments and a recurrence formula for higher central moments has been obtained. Eight theorems are given to characterize the various distributions in the LDPD class.