On the simple step-stress model for two-parameter exponential distribution

In this paper, we consider the simple step-stress model for a two-parameter exponential distribution, when both the parameters are unknown and the data are Type-II censored. It is assumed that under two different stress levels, the scale parameter only changes but the location parameter remains unchanged. It is observed that the maximum likelihood estimators do not always exist. We obtain the maximum likelihood estimates of the unknown parameters whenever they exist. We provide the exact conditional distributions of the maximum likelihood estimators of the scale parameters. Since the construction of the exact confidence intervals is very difficult from the conditional distributions, we propose to use the observed Fisher Information matrix for this purpose. We have suggested to use the bootstrap method for constructing confidence intervals. Bayes estimates and associated credible intervals are obtained using the importance sampling technique. Extensive simulations are performed to compare the performances of the different confidence and credible intervals in terms of their coverage percentages and average lengths. The performances of the bootstrap confidence intervals are quite satisfactory even for small sample sizes.     

Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring

In reliability analysis, accelerated life-testing allows for gradual increment of stress levels on test units during an experiment. In a special class of accelerated life tests known as step-stress tests, the stress levels increase discretely at pre-fixed time points, and this allows the experimenter to obtain information on the parameters of the lifetime distributions more quickly than under normal operating conditions. Moreover, when a test unit fails, there are often more than one fatal cause for the failure, such as mechanical or electrical. In this article, we consider the simple step-stress model under Type-II censoring when the lifetime distributions of the different risk factors are independently exponentially distributed. Under this setup, we derive the maximum likelihood estimators (MLEs) of the unknown mean parameters of the different causes under the assumption of a cumulative exposure model. The exact distributions of the MLEs of the parameters are then derived through the use of conditional moment generating functions. Using these exact distributions as well as the asymptotic distributions and the parametric bootstrap method, we discuss the construction of confidence intervals for the parameters and assess their performance through Monte Carlo simulations. Finally, we illustrate the methods of inference discussed here with an example.     

Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes

Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows the experimenter to obtain failure data more quickly at increased stress levels than under normal operating conditions. A step-stress model is one special class of ALT, and in this article we consider a simple step-stress model under the cumulative exposure model with lognormally distributed lifetimes in the presence of Type-I censoring. We then discuss inferential methods for the unknown parameters of the model by the maximum likelihood estimation method. Some numerical methods, such as the Newton–Raphson and quasi-Newton methods, are discussed for solving the corresponding non-linear likelihood equations. Next, we discuss the construction of confidence intervals for the unknown parameters based on (i) the asymptotic normality of the maximum likelihood estimators (MLEs), and (ii) parametric bootstrap resampling technique. A Monte Carlo simulation study is carried out to examine the performance of these methods of inference. Finally, a numerical example is presented in order to illustrate all the methods of inference developed here.     

Asymptotic Comparison Between Constant-stress Testing and Step-stress Testing for Type-I Censored Data from Exponential Distribution

By running the life tests at higher stress levels than normal operating conditions, accelerated life testing quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. In constant-stress testing, a unit is tested at a fixed stress level until failure or the termination time point of the test, while step-stress testing allows the experimenter to gradually increase the stress levels at some pre-fixed time points during the test. In this article, the optimal k-level constant-stress and step-stress accelerated life tests are compared for the exponential failure data under Type-I censoring. The objective is to quantify the advantage of using the step-stress testing relative to the constant-stress one. A log-linear relationship between the mean lifetime parameter and stress level is assumed and the cumulative exposure model holds for the effect of changing stress in step-stress testing. The optimal design point is then determined under C-optimality, D-optimality, and A-optimality criteria. The efficiency of step-stress testing compared to constant-stress testing is discussed in terms of the ratio of optimal objective functions based on the information matrix.     

Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing

This article considers a k level step-stress accelerated life testing (ALT) on series system products, where independent Weibull-distributed lifetimes are assumed for the components. Due to cost considerations or environmental restrictions, causes of system failures are masked and type-I censored observations might occur in the collected data. Bayesian approach combined with auxiliary variables is developed for estimating the parameters of the model. Further, the reliability and hazard rate functions of the system and components are estimated at a specified time at use stress level. The proposed method is illustrated through a numerical example based on two priors and various masking probabilities.     

Exponential progressive step-stress life-testing with link function based on Box–Cox transformation

In order to quickly extract information on the life of a product, accelerated life-tests are usually employed. In this article, we discuss a k-stage step-stress accelerated life-test with M-stress variables when the underlying data are progressively Type-I group censored. The life-testing model assumed is an exponential distribution with a link function that relates the failure rate and the stress variables in a linear way under the Box–Cox transformation, and a cumulative exposure model for modelling the effect of stress changes. The classical maximum likelihood method as well as a fully Bayesian method based on the Markov chain Monte Carlo (MCMC) technique is developed for inference on all the parameters of this model. Numerical examples are presented to illustrate all the methods of inference developed here, and a comparison of the ML and Bayesian methods is also carried out.     

On classical and Bayesian order restricted inference for multiple exponential step stress model

In this article, we consider the multiple step stress model based on the cumulative exposure model assumption. Here, it is assumed that for a given stress level, the lifetime of the experimental units follows exponential distribution and the expected lifetime decreases as the stress level increases. We mainly focus on the order restricted inference of the unknown parameters of the lifetime distributions. First we consider the order restricted maximum likelihood estimators (MLEs) of the model parameters. It is well known that the order restricted MLEs cannot be obtained in explicit forms. We propose an algorithm that stops in finite number of steps and it provides the MLEs. We further consider the Bayes estimates and the associated credible intervals under the squared error loss function. Due to the absence of explicit form of the Bayes estimates, we propose to use the importance sampling technique to compute Bayes estimates. We provide an extensive simulation study in case of three stress levels mainly to see the performance of the proposed methods. Finally the analysis of one real data set has been provided for illustrative purposes.     

Exact Inference for a Simple Step-stress Model with Generalized Type-I Hybrid Censored Data from the Exponential Distribution

In this article, the simple step-stress model is considered based on generalized Type-I hybrid censored data from the exponential distribution. The maximum likelihood estimators (MLEs) of the unknown parameters are derived assuming a cumulative exposure model. We then derive the exact distributions of the MLEs of the parameters using conditional moment generating functions. The Bayesian estimators of the parameters are derived and then compared with the MLEs. We also derive confidence intervals for the parameters using these exact distributions, asymptotic distributions of the MLEs, Bayesian, and the parametric bootstrap methods. The problem of determining the optimal stress-changing point is discussed and the MLEs of the pth quantile and reliability functions at the use condition are obtained. Finally, Monte Carlo simulation and some numerical results are presented for illustrating all the inferential methods developed here.     

Weibull lagged effect step-stress model with competing risks

In many survival analysis studies, failure can come from one of several competing risks. Additionally, where survival times are lengthy, researchers can increase stress levels to cause units to fail faster. One type of accelerated testing is a step-stress test where the increase is presented in quantum jumps at predetermined time points. If the impact of the increase is not immediately attained, an interim lag period is modeled. In this article, we propose a two-competing risk step-stress model with a lag period where each independent risk follows a Weibull lifetime distribution, the interim lag period is linear, and the attainment point is assumed known. We obtain the maximum likelihood estimators and the observed information matrix; we construct confidence intervals and provide estimates of coverage probabilities using large sample theory, percentile bootstrap, and bias-corrected accelerated (BCa) bootstrap methods.     

LSE method using the CHSS model

Testing the reliability at a nominal stress level may lead to extensive test time. Estimations of reliability parameters can be obtained faster thanks to step-stress accelerated life tests (ALT). Usually, a transfer functional defined among a given class of parametric functions is required, but Bagdonavi?ius and Nikulin showed that ALT tests are still possible without any assumption about this functional. When shape and scale parameters of the lifetime distribution change with the stress level, they suggested an ALT method using a model called CHanging Shape and Scale (CHSS). They estimated the lifetime parameters at the nominal stress with maximum likelihood estimation (MLE). However, this method usually requires an initialization of lifetime parameters, which may be difficult when no similar product has been tested before. This paper aims to face this issue by using an iterating least square estimation (LSE) method. It will enable one to initialize the optimization required to carry out the MLE and it will give estimations that can sometimes be better than those given by MLE.